JP6799470B2 - スポット形状検出装置 - Google Patents
スポット形状検出装置 Download PDFInfo
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- JP6799470B2 JP6799470B2 JP2017010376A JP2017010376A JP6799470B2 JP 6799470 B2 JP6799470 B2 JP 6799470B2 JP 2017010376 A JP2017010376 A JP 2017010376A JP 2017010376 A JP2017010376 A JP 2017010376A JP 6799470 B2 JP6799470 B2 JP 6799470B2
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- 238000003384 imaging method Methods 0.000 claims description 36
- 238000001514 detection method Methods 0.000 claims description 14
- 238000013459 approach Methods 0.000 claims description 3
- 238000012545 processing Methods 0.000 description 8
- 230000003287 optical effect Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 238000002679 ablation Methods 0.000 description 1
- 230000002745 absorbent Effects 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/073—Shaping the laser spot
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0266—Field-of-view determination; Aiming or pointing of a photometer; Adjusting alignment; Encoding angular position; Size of the measurement area; Position tracking; Photodetection involving different fields of view for a single detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0403—Mechanical elements; Supports for optical elements; Scanning arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0414—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using plane or convex mirrors, parallel phase plates, or plane beam-splitters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0418—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using attenuators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/044—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using shutters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0444—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using means for replacing an element by another, e.g. for replacing a filter or grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0448—Adjustable, e.g. focussing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0462—Slit arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4242—Modulated light, e.g. for synchronizing source and detector circuit
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Laser Beam Processing (AREA)
- Lasers (AREA)
Description
2:基台
3、4:支持フレーム
5:ミラーホルダ回転軸
51a:前端部
51b:後端部
52:歯付きプーリ
6:ミラーホルダ
6a〜6q:反射孔
6a’〜6q’:ミラー
7:モータ
8:モータ回転軸
82:歯付きプーリ
9:エンコーダ
91:回転ホイール
91a〜91q:スリット
92:トリガ発生器
93:発光素子
94:受光素子
m:表示手段
V:歯付きベルト
Claims (4)
- レーザー発振器から発振されたレーザー光線のスポット形状を検出するスポット形状検出装置であって、
レーザー発振器が発振するレーザー光線を集光する集光レンズと、該集光レンズの集光点と該集光レンズとの間に配置されるビームスプリッターと、複数のミラーを同心円上に配設した回転体と、該回転体を所定の周期で回転する駆動源と、該回転体に配設された複数のミラーによって順次反射されるレーザー光線の戻り光を該ビームスプリッターで分岐する方向に配設され該戻り光のスポット形状を撮像する撮像手段と、該撮像手段によって撮像された画像を該複数のミラーに関連付けて表示する表示手段と、から少なくとも構成され、
該複数のミラーは、該撮像手段の撮像位置に該集光点が徐々に近づき該撮像位置に至り該撮像位置から徐々に遠ざかるように該回転体に配設されている、スポット形状検出装置。 - 該回転体の各ミラーによるレーザー光線の反射時期に同期して該撮像手段のシャッターが作動するように構成された請求項1に記載のスポット形状検出装置。
- 各ミラーにレーザー光線が照射され反射している時間を最長として、該撮像手段のシャッターの開放時間が調整されることにより該撮像手段で捕えられる該レーザー光線の戻り光の明るさが調整される請求項1、又は2に記載のスポット形状検出装置。
- 該集光レンズの前に減衰フィルターが配設される請求項1乃至3のいずれかに記載のスポット形状検出装置。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017010376A JP6799470B2 (ja) | 2017-01-24 | 2017-01-24 | スポット形状検出装置 |
TW106143651A TWI741098B (zh) | 2017-01-24 | 2017-12-13 | 點形狀檢測裝置 |
CN201810029001.7A CN108340071B (zh) | 2017-01-24 | 2018-01-12 | 光斑形状检测装置 |
KR1020180005182A KR102260929B1 (ko) | 2017-01-24 | 2018-01-15 | 스폿 형상 검출 장치 |
DE102018200981.3A DE102018200981A1 (de) | 2017-01-24 | 2018-01-23 | Detektionsvorrichtung für eine Fleckform |
US15/878,178 US10132619B2 (en) | 2017-01-24 | 2018-01-23 | Spot shape detection apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017010376A JP6799470B2 (ja) | 2017-01-24 | 2017-01-24 | スポット形状検出装置 |
Publications (2)
Publication Number | Publication Date |
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JP2018118267A JP2018118267A (ja) | 2018-08-02 |
JP6799470B2 true JP6799470B2 (ja) | 2020-12-16 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2017010376A Active JP6799470B2 (ja) | 2017-01-24 | 2017-01-24 | スポット形状検出装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US10132619B2 (ja) |
JP (1) | JP6799470B2 (ja) |
KR (1) | KR102260929B1 (ja) |
CN (1) | CN108340071B (ja) |
DE (1) | DE102018200981A1 (ja) |
TW (1) | TWI741098B (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10520360B1 (en) * | 2018-07-31 | 2019-12-31 | Northrop Grumman Systems Corporation | Automated power-in-the-bucket measurement apparatus for large aperture laser systems |
CN109781253A (zh) * | 2019-01-24 | 2019-05-21 | 中国科学院理化技术研究所 | 一种光束同步探测装置 |
CN109822231A (zh) * | 2019-02-15 | 2019-05-31 | 英特尔产品(成都)有限公司 | 检测用于晶圆划片的激光光束的质量的方法和装置 |
CN110706474B (zh) * | 2019-10-17 | 2022-05-24 | 深圳创维-Rgb电子有限公司 | 红外发射功能的检测***、方法、装置、设备及存储介质 |
CN111390377B (zh) * | 2020-03-27 | 2021-08-20 | 伊诺福科光学技术有限公司 | 一种用于激光加工的表面自动聚焦方法及***、存储介质 |
CN113639858B (zh) * | 2021-07-21 | 2024-03-26 | 武汉华臻志创科技有限公司 | 一种大视场高功率激光光束质量检测方法 |
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JPS5355896A (en) | 1976-11-01 | 1978-05-20 | Yagi Shiyouten Kk | Device of operating center board in yacht |
JPS5726999A (en) | 1980-07-25 | 1982-02-13 | Toshiba Corp | Electrostatic type pickup cartridge |
JPS61205808A (ja) * | 1985-03-11 | 1986-09-12 | Hitachi Ltd | 形状検出装置 |
JPH0216438A (ja) * | 1988-07-04 | 1990-01-19 | Hitachi Ltd | 異物検査装置及びその方法 |
JP2732225B2 (ja) * | 1994-10-03 | 1998-03-25 | 株式会社篠崎製作所 | レーザ光オートアラインメント装置 |
JPH10305420A (ja) | 1997-03-04 | 1998-11-17 | Ngk Insulators Ltd | 酸化物単結晶からなる母材の加工方法、機能性デバイスの製造方法 |
JPH10267624A (ja) * | 1997-03-27 | 1998-10-09 | Ono Sokki Co Ltd | 三次元形状測定装置 |
US6313910B1 (en) * | 1998-09-11 | 2001-11-06 | Dataray, Inc. | Apparatus for measurement of optical beams |
JP3408805B2 (ja) | 2000-09-13 | 2003-05-19 | 浜松ホトニクス株式会社 | 切断起点領域形成方法及び加工対象物切断方法 |
JP4375710B2 (ja) * | 2003-05-09 | 2009-12-02 | パルステック工業株式会社 | 3次元形状測定装置および3次元形状測定方法 |
EP1906172A4 (en) * | 2005-07-15 | 2014-01-08 | Olympus Corp | LIGHT METER |
JP2008216054A (ja) * | 2007-03-05 | 2008-09-18 | Hitachi High-Technologies Corp | 被検査物の検査装置及び被検査物の検査方法 |
JP5117920B2 (ja) * | 2008-04-28 | 2013-01-16 | 株式会社ディスコ | レーザー加工装置 |
JP5118580B2 (ja) * | 2008-08-22 | 2013-01-16 | 株式会社ディスコ | 高さ位置検出装置および高さ位置検出方法 |
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JP5797963B2 (ja) * | 2011-07-25 | 2015-10-21 | 株式会社ディスコ | レーザー光線のスポット形状検出方法 |
CN102589684A (zh) * | 2011-12-14 | 2012-07-18 | 长春理工大学 | 一种红外激光测量像面对准装置 |
JP6030299B2 (ja) * | 2011-12-20 | 2016-11-24 | 株式会社ディスコ | レーザー加工装置 |
JP5902490B2 (ja) | 2012-01-25 | 2016-04-13 | 株式会社ディスコ | レーザー光線のスポット形状検出方法およびスポット形状検出装置 |
JP6328521B2 (ja) * | 2014-08-18 | 2018-05-23 | 株式会社ディスコ | レーザー光線のスポット形状検出方法 |
-
2017
- 2017-01-24 JP JP2017010376A patent/JP6799470B2/ja active Active
- 2017-12-13 TW TW106143651A patent/TWI741098B/zh active
-
2018
- 2018-01-12 CN CN201810029001.7A patent/CN108340071B/zh active Active
- 2018-01-15 KR KR1020180005182A patent/KR102260929B1/ko active IP Right Grant
- 2018-01-23 DE DE102018200981.3A patent/DE102018200981A1/de active Pending
- 2018-01-23 US US15/878,178 patent/US10132619B2/en active Active
Also Published As
Publication number | Publication date |
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US20180209783A1 (en) | 2018-07-26 |
CN108340071B (zh) | 2021-06-08 |
DE102018200981A1 (de) | 2018-07-26 |
US10132619B2 (en) | 2018-11-20 |
CN108340071A (zh) | 2018-07-31 |
KR20180087147A (ko) | 2018-08-01 |
TW201837998A (zh) | 2018-10-16 |
KR102260929B1 (ko) | 2021-06-03 |
TWI741098B (zh) | 2021-10-01 |
JP2018118267A (ja) | 2018-08-02 |
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