JP6761479B2 - レーザ照射装置、薄膜トランジスタおよび薄膜トランジスタの製造方法 - Google Patents
レーザ照射装置、薄膜トランジスタおよび薄膜トランジスタの製造方法 Download PDFInfo
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- 239000010409 thin film Substances 0.000 title claims description 192
- 238000004519 manufacturing process Methods 0.000 title claims description 16
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 68
- 239000011521 glass Substances 0.000 claims description 58
- 239000000758 substrate Substances 0.000 claims description 58
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 32
- 229920005591 polysilicon Polymers 0.000 claims description 32
- 238000000034 method Methods 0.000 claims description 14
- 230000001678 irradiating effect Effects 0.000 claims description 6
- 230000037230 mobility Effects 0.000 description 15
- 230000003287 optical effect Effects 0.000 description 14
- 230000005540 biological transmission Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 9
- 239000004973 liquid crystal related substance Substances 0.000 description 9
- 230000008878 coupling Effects 0.000 description 6
- 238000010168 coupling process Methods 0.000 description 6
- 238000005859 coupling reaction Methods 0.000 description 6
- 239000010408 film Substances 0.000 description 5
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 238000005224 laser annealing Methods 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
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Description
図1は、本発明の第1の実施形態におけるレーザ照射装置10の構成例を示す図である。
本発明の第2の実施形態は、マイクロレンズアレイ13の代わりに、1個の投影レンズ18を用いて、レーザアニールを行う場合の実施形態である。
11 レーザ光源
12 カップリング光学系
13 マイクロレンズアレイ
14 レーザ光
15 投影マスクパターン
16 透過領域
17 マイクロレンズ
18 投影レンズ
20 薄膜トランジスタ
21 アモルファスシリコン薄膜
22 ポリシリコン薄膜
23 ソース
24 ドレイン
30 ガラス基板
Claims (8)
- レーザ光を発生する光源と、
ガラス基板上の複数の薄膜トランジスタの各々の前記薄膜トランジスタに含まれるソース電極とドレイン電極との間に被着されたアモルファスシリコン薄膜の所定の領域にレーザ光を照射して、ポリシリコン薄膜を形成する投影レンズと、
前記投影レンズ上に設けられ、前記複数の薄膜トランジスタの各々に対して前記レーザ光が照射されるように複数の開口部が設けられ、前記開口部は一の薄膜トランジスタに対応する投影マスクパターンと、を備え、
前記投影レンズは、所定の方向に移動する前記ガラス基板上の前記複数の薄膜トランジスタに対して、前記投影マスクパターンを介して前記レーザ光を照射し、
前記投影マスクパターンは、前記移動する方向に直交する一列において前記開口部が連続しないように設けられ、前記レーザ光が照射された前記複数の薄膜トランジスタにおいて、隣接する薄膜トランジスタの隣接するアモルファスシリコン薄膜に対し前記投影マスクパターンを介して異なるレーザ光が照射される
ことを特徴とするレーザ照射装置。 - 前記投影レンズは、前記レーザ光を分離可能なマイクロレンズアレイに含まれる複数のマイクロレンズであり、
前記投影マスクパターンは、前記移動する方向に直交する一列のマイクロレンズのうち、前記開口部を介してレーザ光を照射するマイクロレンズが互いに隣接しないように、当該開口部が設けられる
ことを特徴とする請求項1に記載のレーザ照射装置。 - 前記光源から照射されたレーザ光は、一回の照射において、前記直交する一列に対応するマイクロレンズを介して、前記複数の薄膜トランジスタに照射され、
前記投影マスクパターンは、前記一列に対応するマイクロレンズのうち、互いに隣接しないマイクロレンズを介してレーザ光が照射されるように、前記開口部が設けられることを特徴とする請求項2に記載のレーザ照射装置。 - 前記投影レンズは、前記複数の薄膜トランジスタの各々に対して、所定数のレーザ光を照射し、
前記投影マスクパターンは、前記移動する方向に対して、所定数の開口部が設けられることを特徴とする請求項1乃至3のいずれか記載のレーザ照射装置。 - レーザ光を発生する第1のステップと、
ガラス基板上の複数の薄膜トランジスタの各々の前記薄膜トランジスタに含まれるソース電極とドレイン電極との間に被着されたアモルファスシリコン薄膜の所定の領域にレーザ光を照射して、ポリシリコン薄膜を形成するに際して、複数の開口部を含み前記開口部は一の薄膜トランジスタに対応する投影マスクパターンが設けられた投影レンズを用いて、前記レーザ光を照射する第2のステップと、
前記レーザ光が照射されるごとに、前記ガラス基板を所定の方向に移動する第3のステップと、を含み、
第2のステップにおいて、前記移動する方向に直交する一列において、前記開口部が連続しないように配置された前記投影マスクパターンを介して、前記複数の薄膜トランジスタにおいて、隣接する薄膜トランジスタの隣接するアモルファスシリコン薄膜に対して前記投影マスクパターンを介して異なる前記レーザ光を照射する
ことを特徴とする薄膜トランジスタの製造方法。 - 前記投影レンズは、前記レーザ光を分離可能なマイクロレンズアレイに含まれる複数のマイクロレンズであり、
第2のステップにおいて、前記移動する方向に直交する一列のマイクロレンズのうち、前記開口部を介してレーザ光を照射するマイクロレンズが互いに隣接しないように、当該開口部が設けられた前記投影マスクパターンを介して、前記レーザ光を照射する
ことを特徴とする請求項5に記載の薄膜トランジスタの製造方法。 - 前記投影マスクパターンは、前記一列に対応するマイクロレンズのうち、互いに隣接しないマイクロレンズを介してレーザ光が照射されるように、前記開口部が設けられ、
前記第2のステップにおいて、前記レーザ光は、一回の照射において、直交方向の一列に対応するマイクロレンズを介して、前記複数の薄膜トランジスタに照射され、
ことを特徴とする請求項6に記載の薄膜トランジスタの製造方法。 - 第2のステップにおいて、前記移動する方向に対して所定数の開口部が設けられた投影マスクパターンを介して、前記複数の薄膜トランジスタの各々に対して、当該所定数のレーザ光を照射する
ことを特徴とする請求項5乃至7のいずれかに記載の薄膜トランジスタの製造方法。
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JP5030382B2 (ja) * | 2002-08-19 | 2012-09-19 | ザ トラスティーズ オブ コロンビア ユニヴァーシティ イン ザ シティ オブ ニューヨーク | 基板上のフィルム領域を処理して、こうした領域内及びその端部領域をほぼ均一にするレーザ結晶化プロセス及びシステム |
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US8440581B2 (en) | 2009-11-24 | 2013-05-14 | The Trustees Of Columbia University In The City Of New York | Systems and methods for non-periodic pulse sequential lateral solidification |
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KR101073551B1 (ko) * | 2009-11-16 | 2011-10-17 | 삼성모바일디스플레이주식회사 | 레이저 마스크 및 이를 이용한 순차적 측면 고상 결정화 방법 |
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