JP6401747B2 - 半導体スイッチ制御装置 - Google Patents
半導体スイッチ制御装置 Download PDFInfo
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- JP6401747B2 JP6401747B2 JP2016131731A JP2016131731A JP6401747B2 JP 6401747 B2 JP6401747 B2 JP 6401747B2 JP 2016131731 A JP2016131731 A JP 2016131731A JP 2016131731 A JP2016131731 A JP 2016131731A JP 6401747 B2 JP6401747 B2 JP 6401747B2
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- 239000004065 semiconductor Substances 0.000 title claims description 73
- 230000005856 abnormality Effects 0.000 claims description 9
- 238000003745 diagnosis Methods 0.000 claims description 8
- 238000013021 overheating Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 description 15
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/12—Regulating voltage or current wherein the variable actually regulated by the final control device is ac
- G05F1/40—Regulating voltage or current wherein the variable actually regulated by the final control device is ac using discharge tubes or semiconductor devices as final control devices
- G05F1/44—Regulating voltage or current wherein the variable actually regulated by the final control device is ac using discharge tubes or semiconductor devices as final control devices semiconductor devices only
- G05F1/45—Regulating voltage or current wherein the variable actually regulated by the final control device is ac using discharge tubes or semiconductor devices as final control devices semiconductor devices only being controlled rectifiers in series with the load
- G05F1/455—Regulating voltage or current wherein the variable actually regulated by the final control device is ac using discharge tubes or semiconductor devices as final control devices semiconductor devices only being controlled rectifiers in series with the load with phase control
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66992—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by the variation of applied heat
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/74—Thyristor-type devices, e.g. having four-zone regenerative action
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J7/00—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
- H02J7/0029—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries with safety or protection devices or circuits
- H02J7/0031—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries with safety or protection devices or circuits using battery or load disconnect circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
- H03K17/0822—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/72—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices having more than two PN junctions; having more than three electrodes; having more than one electrode connected to the same conductivity region
- H03K17/722—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices having more than two PN junctions; having more than three electrodes; having more than one electrode connected to the same conductivity region with galvanic isolation between the control circuit and the output circuit
- H03K17/723—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices having more than two PN junctions; having more than three electrodes; having more than one electrode connected to the same conductivity region with galvanic isolation between the control circuit and the output circuit using transformer coupling
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J1/00—Circuit arrangements for dc mains or dc distribution networks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K2017/0806—Modifications for protecting switching circuit against overcurrent or overvoltage against excessive temperature
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0054—Gating switches, e.g. pass gates
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Automation & Control Theory (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Electromagnetism (AREA)
- Radar, Positioning & Navigation (AREA)
- Electronic Switches (AREA)
Description
電気自動車やハイブリッド電気自動車等の車両電源システム100は、図1に示すように、直流を交流に変換し電力を駆動モータに供給するインバータ21等の高電圧負荷2と、当該高電圧負荷2を駆動するための電源である高電圧バッテリ3とが搭載され、保安を目的として高電圧バッテリ3と高電圧負荷2との間に流れる電流を通電又は遮断する半導体スイッチ制御装置1(1A、1B)が設けられている。
次に、実施形態2に係る半導体スイッチ制御装置1Cについて説明する。なお、実施形態2の半導体スイッチ制御装置1Cは、実施形態1の半導体スイッチ制御装置1と同様の構成には同一符号を付し、詳細な説明は省略する。半導体スイッチ制御装置1Cは、プリチャージ回路33によりプリチャージ制御が行われている場合に、順方向電流Ibを用いずにFET12のボディダイオードD2の順方向電圧VfaからボディダイオードD2の温度を判定する点で実施形態1と異なる。半導体スイッチ制御装置1Cは、温度計算部51及び過熱検知部52の代わりにコンパレータ54を備える。コンパレータ54は、図6に示すように、差動増幅回路20から出力されるボディダイオードD2の順方向電圧VfaとボディダイオードD2の温度を判定するための電圧閾値Vtとを比較し、比較結果を出力する比較器である。ここで、電圧閾値Vtは、例えば、プリチャージ電流の大きさに基づいて予め設定される。コンパレータ54は、ボディダイオードD2の順方向電圧VfaとボディダイオードD2の電圧閾値Vtとを比較し、ボディダイオードD2の順方向電圧Vfaが電圧閾値Vtより低い場合、ボディダイオードD2の温度が相対的に高いのでFET12が過熱状態であることを示す過熱遮断信号を制御部50に出力する。制御部50は、コンパレータ54から過熱遮断信号が出力されると、FET11が過熱状態であると判定し、FET11をOFFに設定する。一方、コンパレータ54は、ボディダイオードD2の順方向電圧Vfaが電圧閾値Vtより高い場合、ボディダイオードD2の温度が相対的に低いので過熱遮断信号を制御部50に出力しない。このように、実施形態2に係る半導体スイッチ制御装置1Cは、プリチャージ制御が行われている場合、順方向電流Ibを用いずにFET12のボディダイオードD2の順方向電圧VfaからボディダイオードD2の温度を判定する。なお、制御部50は、プリチャージ制御を行う場合、図7に示すように、FET12をOFFに設定した状態で、時刻t10でFET11にプリチャージ電圧を印加し、定電流である順方向電流Ibを流す。
次に、変形例について説明する。半導体スイッチ制御装置1は、マイナス側メインリレー10Bの温度状態を判定する例について説明したが、プラス側メインリレー10Aの温度状態を判定する構成としてもよい。
2 高電圧負荷(負荷)
3 高電圧バッテリ(電源)
10A プラス側メインリレー(半導体スイッチモジュール)
10B マイナス側メインリレー(半導体スイッチモジュール)
11 FET(逆方向スイッチ)
12 FET(順方向スイッチ)
33 プリチャージ回路
40 電流検出部
50 制御部
D1、D2 ボディダイオード
I、Ia、Ib 電流、順方向電流
Vt 電圧閾値(閾値)
Claims (2)
- 電源と負荷との間に設置され、前記電源と前記負荷との間に流れる電流を通電又は遮断する半導体スイッチモジュールと、
前記半導体スイッチモジュールを制御し一定のプリチャージ電流を流して突入電流を防ぐプリチャージ回路と、
前記半導体スイッチモジュールを制御する制御部と、を備え、
前記半導体スイッチモジュールは、
前記電流が流れる方向である順方向にボディダイオードが配置される順方向スイッチと、
前記順方向スイッチと隣接して配置され、前記電流が流れる方向とは逆方向にボディダイオードが配置される逆方向スイッチと、を有し、
前記順方向スイッチと前記逆方向スイッチとは、
ソース端子同士が直列に接続され、一方のドレイン端子が前記電源に接続され、他方のドレイン端子が前記負荷に接続されるか、又は、
ドレイン端子同士が直列に接続され、一方のソース端子が前記電源に接続され、他方のソース端子が前記負荷に接続され、
前記プリチャージ回路は、
前記半導体スイッチモジュールの異常を診断する診断期間後の電圧よりも小さいプリチャージ電圧を前記逆方向スイッチに印加して前記一定のプリチャージ電流を流し、
前記制御部は、
前記プリチャージ回路によりプリチャージ制御が行われている場合、前記順方向スイッチの前記ボディダイオードの順方向電圧と、前記順方向スイッチの前記ボディダイオードの温度を判定するための閾値とから前記半導体スイッチモジュールの過熱を判定することを特徴とする半導体スイッチ制御装置。 - 前記制御部は、
前記半導体スイッチモジュールの温度状態を判定する前に、前記順方向スイッチの前記ボディダイオードの順方向電圧が当該順方向電圧の基準となる基準電圧の範囲外である場合、前記順方向スイッチが故障であると判定し、前記逆方向スイッチをオフして前記電流を遮断する請求項1に記載の半導体スイッチ制御装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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JP2016131731A JP6401747B2 (ja) | 2016-07-01 | 2016-07-01 | 半導体スイッチ制御装置 |
US15/621,746 US10296024B2 (en) | 2016-07-01 | 2017-06-13 | Semiconductor switch control device |
DE102017210457.0A DE102017210457A1 (de) | 2016-07-01 | 2017-06-22 | Halbleiterschalter-Steuervorrichtung |
CN201710516844.5A CN107565518B (zh) | 2016-07-01 | 2017-06-29 | 半导体开关控制装置 |
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JP2016131731A JP6401747B2 (ja) | 2016-07-01 | 2016-07-01 | 半導体スイッチ制御装置 |
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JP2018007030A JP2018007030A (ja) | 2018-01-11 |
JP6401747B2 true JP6401747B2 (ja) | 2018-10-10 |
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US (1) | US10296024B2 (ja) |
JP (1) | JP6401747B2 (ja) |
CN (1) | CN107565518B (ja) |
DE (1) | DE102017210457A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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US10840899B2 (en) * | 2017-01-31 | 2020-11-17 | Nidec Corporation | Motor drive device and electric power steering device |
DE112018006195T5 (de) * | 2017-12-04 | 2020-08-27 | Gs Yuasa International Ltd. | Ladesteuervorrichtung, energiespeichervorrichtung und ladeverfahren |
JP7118531B2 (ja) * | 2018-04-26 | 2022-08-16 | 矢崎総業株式会社 | 電源装置 |
DE102018222554A1 (de) * | 2018-12-20 | 2020-06-25 | Robert Bosch Gmbh | Vorrichtung und Verfahren zum richtungsabhängigen Betreiben eines elektrochemischen Energiespeichers |
DE102019204134A1 (de) * | 2019-03-26 | 2020-10-01 | Vitesco Technologies Germany Gmbh | Phasenstrombestimmung mit Hilfe des Einschaltwiderstandes und der Sperrschichttemperatur eines Feldeffekttransistors |
JP7074717B2 (ja) * | 2019-04-25 | 2022-05-24 | 矢崎総業株式会社 | 電力供給システム |
US11349294B2 (en) * | 2020-01-29 | 2022-05-31 | Eaton Intelligent Power Limited | Solid state circuit interrupter |
US11239649B2 (en) | 2020-01-29 | 2022-02-01 | Eaton Intelligent Power Limited | Solid state circuit interrupter |
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JP3087705B2 (ja) * | 1997-11-10 | 2000-09-11 | 日本電気株式会社 | バッテリー逆接続保護付きipdを備えた駆動装置 |
US6392859B1 (en) * | 1999-02-14 | 2002-05-21 | Yazaki Corporation | Semiconductor active fuse for AC power line and bidirectional switching device for the fuse |
JP3845261B2 (ja) * | 2001-02-28 | 2006-11-15 | 矢崎総業株式会社 | 自動車用電気負荷駆動制御装置 |
JP2003019964A (ja) * | 2001-07-09 | 2003-01-21 | Yazaki Corp | ステアリングヒーター |
JP2004117260A (ja) * | 2002-09-27 | 2004-04-15 | Nissan Motor Co Ltd | 半導体モジュールの温度検出装置 |
DE102006022158A1 (de) * | 2006-05-12 | 2007-11-15 | Beckhoff Automation Gmbh | Leistungsschaltung mit Kurzschlussschutzschaltung |
JP2008052564A (ja) * | 2006-08-25 | 2008-03-06 | Advics:Kk | 負荷駆動装置 |
JP5061935B2 (ja) * | 2008-02-12 | 2012-10-31 | ミツミ電機株式会社 | 電池パック |
JP5804763B2 (ja) | 2011-05-02 | 2015-11-04 | 三菱電機株式会社 | 空気調和装置用制御装置 |
JP5743739B2 (ja) | 2011-06-22 | 2015-07-01 | 株式会社東芝 | 蓄電装置 |
US8941418B2 (en) * | 2011-11-16 | 2015-01-27 | Mediatek Inc. | Driving circuits with power MOS breakdown protection and driving methods thereof |
JP5790606B2 (ja) * | 2012-08-20 | 2015-10-07 | 株式会社デンソー | 過熱保護回路 |
JP2015065767A (ja) | 2013-09-25 | 2015-04-09 | 東芝ライテック株式会社 | 整流回路、電子回路及び電子機器 |
JP2015095442A (ja) * | 2013-11-14 | 2015-05-18 | 株式会社オートネットワーク技術研究所 | スイッチ診断装置、スイッチ回路及びスイッチ診断方法 |
JP5784251B1 (ja) | 2015-01-20 | 2015-09-24 | 秀一 佐竹 | 唾液分泌促進マウスピース |
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2016
- 2016-07-01 JP JP2016131731A patent/JP6401747B2/ja active Active
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2017
- 2017-06-13 US US15/621,746 patent/US10296024B2/en active Active
- 2017-06-22 DE DE102017210457.0A patent/DE102017210457A1/de active Pending
- 2017-06-29 CN CN201710516844.5A patent/CN107565518B/zh active Active
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Publication number | Publication date |
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CN107565518B (zh) | 2019-03-15 |
US20180004237A1 (en) | 2018-01-04 |
DE102017210457A1 (de) | 2018-01-04 |
US10296024B2 (en) | 2019-05-21 |
JP2018007030A (ja) | 2018-01-11 |
CN107565518A (zh) | 2018-01-09 |
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