JP6250762B2 - レーザ吸収分光計のレーザ動作点の最適化 - Google Patents
レーザ吸収分光計のレーザ動作点の最適化 Download PDFInfo
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Description
透過率=検出器シグナル/ベースライン
透過百分率=(検出器シグナル/ベースライン)×100
吸収百分率=(1−透過率)×100
Claims (28)
- レーザ吸収分光計のレーザデバイスの第1のレーザパラメータの動作値を最適化するための方法であって、前記レーザデバイスから放出されるレーザ光の波長は、前記レーザデバイスの前記第1のレーザパラメータ及び第2のレーザパラメータのいずれかを調節することによって変更可能であり、前記レーザ吸収分光計は、前記レーザデバイスから受けたレーザ光の強度を測定するように構成されている光強度検出器を備え、前記方法は、
前記第1のレーザパラメータの複数の値のそれぞれに関して、
前記第2のレーザパラメータの値の範囲にわたって前記光強度検出器で受けた光強度の測定値を得る段階と、
前記光強度の測定値の極値を特定する段階と、
前記極値のピーク位置を特定する段階と、を含み、
前記第1のレーザパラメータの変化に伴い特定された前記ピーク位置の変化に連続傾向がある、前記第1のレーザパラメータの前記複数の値の中の前記第1のレーザパラメータの値の範囲を特定する段階と、
前記第1のレーザパラメータの前記動作値を、前記第1のレーザパラメータの特定された前記値の範囲内となるように設定する段階と、を含む方法。 - 前記第1のレーザパラメータの特定された前記値の範囲が、前記第1のレーザパラメータの変化に伴い特定された前記ピーク位置を定義する関数が連続関数である、前記第1のレーザパラメータの前記複数の値の中の前記第1のレーザパラメータの値の範囲である、請求項1に記載の方法。
- 前記連続傾向が、線形連続傾向である、請求項1又は2に記載の方法。
- 特定された前記ピーク位置が、特定された前記極値に対応する前記第2のレーザパラメータの値に少なくとも部分的に基づく、請求項1〜3のいずれかに記載の方法。
- 特定された前記ピーク位置が、特定された前記極値に対応する前記第2のレーザパラメータの前記値である、請求項4に記載の方法。
- 前記第1のレーザパラメータの変化に伴い特定された前記ピーク位置の変化に連続傾向があり、特定された前記極値のそれぞれのピーク強度が、閾値許容範囲内と同じである、前記第1のレーザパラメータの前記複数の値の中の前記第1のレーザパラメータの値の範囲を特定する段階をさらに含む、請求項1〜5のいずれかに記載の方法。
- 前記ピーク強度が、ピーク高さ及び/又はピーク面積のうちの少なくとも1つに部分的に基づく、請求項6に記載の方法。
- 前記第1のレーザパラメータの変化に伴い特定された前記ピーク位置の変化に連続傾向があり、前記第1のレーザパラメータの前記複数の値のそれぞれで特定された極値数が、予測される極値数と一致する、前記第1のレーザパラメータの前記複数の値の中の前記第1のレーザパラメータの値の範囲を特定する段階をさらに含む、請求項1〜7のいずれかに記載の方法。
- 前記極値が、ピーク検出アルゴリズムを用いて特定される、請求項1〜8のいずれかに記載の方法。
- 前記第1のレーザパラメータの値の2つ以上の範囲が、前記第1のレーザパラメータのさらなる複数の値の範囲内で特定され、
前記第1のレーザパラメータの前記動作値を、前記第1のレーザパラメータの特定された前記2つ以上の範囲の最も大きいものに含まれるように設定する段階をさらに含む、請求項1〜9のいずれかに記載の方法。 - 前記第1のレーザパラメータの前記動作値が、前記第1のレーザパラメータの特定された前記値の範囲のいずれかの極限値よりも、前記第1のレーザパラメータの特定された前記値の範囲の中心に近い値に設定される、請求項1〜10のいずれかに記載の方法。
- 前記第1のレーザパラメータの前記動作値が、前記第1のレーザパラメータの特定された前記値の範囲の中心の許容閾値内に設定される、請求項1〜10のいずれかに記載の方法。
- 前記レーザデバイスは、レーザダイオードを備え、
前記第1のレーザパラメータが前記レーザダイオードの温度であり、前記第2のレーザパラメータが前記レーザダイオードの注入電流であるか、又は、
前記第1のレーザパラメータが前記レーザダイオードの注入電流であり、前記第2のレーザパラメータが前記レーザダイオードの温度である、請求項1〜12のいずれかに記載の方法。 - 前記レーザデバイスが、前記レーザデバイスから放出される前記レーザ光を生成するために一緒に構成される、第1のレーザダイオードと第2のレーザダイオードとを備え、
前記第1のレーザパラメータが前記第1のレーザダイオードのパラメータであり、前記第2のレーザパラメータが前記第2のレーザダイオードのパラメータである、請求項1〜12のいずれかに記載の方法。 - 前記第1のレーザパラメータが前記第1のレーザダイオードの注入電流であり、前記第2のレーザパラメータが前記第2のレーザダイオードへの注入電流である、請求項14に記載の方法。
- 前記第1のレーザパラメータが前記第1のレーザダイオードの温度であり、前記第2のレーザパラメータが前記第2のレーザダイオードへの注入電流である、請求項14に記載の方法。
- 前記第1のレーザダイオードが波長安定化レーザダイオードであり、前記第2のレーザダイオードが分布帰還型レーザダイオードである、請求項14〜16のいずれかに記載の方法。
- 前記光強度検出器で受ける光強度の前記測定値が、前記光強度検出器によって受ける光パワーと前記レーザデバイスから放出される光パワーとの比を示す、請求項1〜17のいずれかに記載の方法。
- 前記レーザ吸収分光計が、試料ガスを格納するための吸収セルをさらに備え、前記レーザ吸収分光計は、使用時に、前記レーザデバイスから放出されるレーザ光が吸収セルを通過して前記光強度検出器に達するように構成されている、請求項1〜18のいずれかに記載の方法。
- 使用時に、前記レーザデバイスから放出されるレーザ光が、試料ガスを格納する前記吸収セルを通過して前記光強度検出器に達し、特定された前記極値が、前記試料ガスの吸収ピークに対応する、請求項19に記載の方法。
- 前記レーザ吸収分光計が、エタロンと試料ガスを格納するための吸収セルとをさらに備え、前記吸収分光計は、使用時に、前記レーザデバイスから放出されたレーザ光が前記エタロンを通過するか、又は前記吸収セルを通過して、前記光強度検出器に達するように構成されている、請求項1〜18のいずれかに記載の方法。
- 前記第1のレーザパラメータの前記複数の値のそれぞれについて、
光強度の前記測定値で複数の極値を特定する段階と、
前記複数の極値のそれぞれについて、それぞれのピーク位置を特定する段階と、をさらに含み、
前記第1のレーザパラメータの特定された前記値の範囲が、前記第1のレーザパラメータの変化に伴い特定された前記複数のピーク位置の各ピーク位置の変化に連続傾向がある、前記第1のレーザパラメータの前記複数の値の中の前記第1のレーザパラメータの値の範囲である、請求項1〜21のいずれかに記載の方法。 - 請求項1〜22のいずれかに記載の方法を行うように構成される、電子デバイス。
- プロセッサと、ソフトウェアプログラムを記憶するメモリと、を備えた電子デバイスであって、
前記ソフトウェアプログラムは、前記プロセッサによって実行されると、前記プロセッサに、請求項1〜22のいずれかに記載の方法を行わせる、電子デバイス。 - レーザ吸収分光計であって、
レーザ光を放出するためのレーザデバイスであって、前記レーザ光の波長が、第1のレーザパラメータ及び第2のレーザパラメータのいずれかを調節することによって変更可能である、レーザデバイスと、
前記レーザデバイスから受けるレーザ光の強度を測定するように構成された光強度検出器と、
請求項23又は24に記載の前記電子デバイスと、を備える、レーザ吸収分光計。 - 試料ガスを格納するための吸収セルをさらに備え、
前記レーザ吸収分光計が、使用時に、前記レーザデバイスから放出されたレーザ光が前記吸収セルを通過して前記光強度検出器に達するように構成されている、請求項25に記載のレーザ吸収分光計。 - エタロンと、
試料ガスを格納するための吸収セルと、をさらに備え、
前記レーザ吸収分光計は、使用時に、前記レーザデバイスから放出されたレーザ光が、前記エタロン、又は前記吸収セルを通過して、前記光強度検出器に達するように設定されるように構成されている、請求項25に記載のレーザ吸収分光計。 - 電子デバイスのプロセッサで実行されると、請求項1〜22のいずれかに記載の方法を行うように構成される、ソフトウェアプログラム。
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