JP5792956B2 - ガス分析装置 - Google Patents
ガス分析装置 Download PDFInfo
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- JP5792956B2 JP5792956B2 JP2010547910A JP2010547910A JP5792956B2 JP 5792956 B2 JP5792956 B2 JP 5792956B2 JP 2010547910 A JP2010547910 A JP 2010547910A JP 2010547910 A JP2010547910 A JP 2010547910A JP 5792956 B2 JP5792956 B2 JP 5792956B2
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- 230000007246 mechanism Effects 0.000 claims description 44
- 238000000034 method Methods 0.000 claims description 8
- 238000007599 discharging Methods 0.000 claims description 4
- 230000006866 deterioration Effects 0.000 claims description 2
- 239000007789 gas Substances 0.000 description 174
- 238000005259 measurement Methods 0.000 description 12
- MWUXSHHQAYIFBG-UHFFFAOYSA-N Nitric oxide Chemical compound O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 6
- 229910002091 carbon monoxide Inorganic materials 0.000 description 4
- 230000010365 information processing Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 239000004677 Nylon Substances 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 229920001778 nylon Polymers 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000010926 purge Methods 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- 241000257465 Echinoidea Species 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 150000003464 sulfur compounds Chemical class 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
- G01N21/61—Non-dispersive gas analysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/72—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flame burners
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/76—Chemiluminescence; Bioluminescence
- G01N21/766—Chemiluminescence; Bioluminescence of gases
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0006—Calibrating gas analysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
- G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
- G01N33/0059—Avoiding interference of a gas with the gas to be measured
- G01N33/006—Avoiding interference of water vapour with the gas to be measured
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- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Combustion & Propulsion (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Sampling And Sample Adjustment (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
2・・・ゼロガス流路
21・・・ゼロガス流路の開閉バルブ(開閉機構)
3・・・スパンガス流路
31・・・スパンガス流路の開閉バルブ(開閉機構)
5・・・ガス分析計
61・・・バルブ制御部(開閉機構制御部)
Claims (5)
- サンプルガスに含まれる測定対象成分を分析するガス分析計と、
スパンガス供給源からのスパンガスを前記ガス分析計に導入可能に構成されるとともに、開閉機構が設けられたスパンガス流路と、
前記スパンガス供給源と前記スパンガス流路との間を連結するスパンガス供給ラインと、
ゼロガス供給源からのゼロガスを前記ガス分析計に導入可能に構成されるとともに、開閉機構が設けられたゼロガス流路と、
ゼロ校正及びスパン校正の開始を指示する校正開始信号を受け付けて、前記スパンガス流路の開閉機構及び前記ゼロガス流路の開閉機構を制御する開閉機構制御部と、を備えており、
前記開閉機構制御部が、前回の校正が行われてからスパンガスの劣化が予想される所定時間Aが経過した後に、新たな校正開始信号を受け付けた場合に、スパン校正開始前に、所定時間Bの間、前記スパンガス流路の開閉機構を開けるように構成されており、
前記所定時間Bが、前記スパンガス供給ライン及び前記スパンガス流路に滞留していたスパンガスを排出し、前記スパンガス供給ライン及びスパンガス流路中のスパンガスを新たなものに置換できる時間の長さに設定されていることを特徴とするガス分析装置。 - サンプルガス供給源からのサンプルガスを前記ガス分析計に導入可能に構成されるとともに、開閉機構が設けられたサンプルガス流路を備えており、
前記開閉機構制御部が、前記サンプルガス流路の開閉機構をも制御するものであり、スパン校正終了後に、前記サンプルガス流路の開閉機構を開けるように前記サンプルガス流路の開閉機構を制御する請求項1記載のガス分析装置。 - サンプルガスに含まれる測定対象成分を分析するガス分析計と、スパンガス供給源からのスパンガスを前記ガス分析計に導入可能に構成されるとともに、開閉機構が設けられたスパンガス流路と、前記スパンガス供給源と前記スパンガス流路との間を連結するスパンガス供給ラインと、を備えたガス分析装置をスパン校正する方法であって、
前回のスパン校正が行われてからスパンガスの劣化が予想される所定時間Aが経過している場合、前記スパンガス流路の開閉機構を開けて、前記スパンガス供給ライン及び前記スパンガス流路に滞留していたスパンガスを排出できる所定量のスパンガスを前記ガス供給ライン及び前記スパンガス流路に流して、前記ガス供給ライン及び前記スパンガス流路に滞留していたスパンガスを排出し、前記スパンガス供給ライン及びスパンガス流路中のスパンガスを新たなものに置換してから、スパン校正を行うことを特徴とするガス分析装置のスパン校正方法。 - 前記開閉機構制御部が、前記所定時間B経過後、前記スパンガス流路の開閉機構を閉じてから前記ゼロガス流路の開閉機構を開け、
ゼロ校正終了後に、前記ゼロガス流路の開閉機構を閉じてから前記スパンガス流路の開閉機構を開けるように構成されている請求項1又は2記載のガス分析装置。 - 前記開閉機構制御部が、前回の校正が行われてから所定時間Aが経過する前に、新たな校正開始信号を受け付けた場合には、スパンガスの排出をせずに前記ゼロガス流路の開閉機構を開け、
ゼロ校正終了後に、記ゼロガス流路の開閉機構を閉じてから前記スパンガス流路の開閉機構を開けるように構成されている請求項1、2又は4いずれかに記載のガス分析装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010547910A JP5792956B2 (ja) | 2009-12-25 | 2010-12-07 | ガス分析装置 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
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JP2009295887 | 2009-12-25 | ||
JP2009295887 | 2009-12-25 | ||
PCT/JP2010/071865 WO2011077938A1 (ja) | 2009-12-25 | 2010-12-07 | ガス分析装置 |
JP2010547910A JP5792956B2 (ja) | 2009-12-25 | 2010-12-07 | ガス分析装置 |
Publications (2)
Publication Number | Publication Date |
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JPWO2011077938A1 JPWO2011077938A1 (ja) | 2013-05-02 |
JP5792956B2 true JP5792956B2 (ja) | 2015-10-14 |
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JP2010547910A Active JP5792956B2 (ja) | 2009-12-25 | 2010-12-07 | ガス分析装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9347875B2 (ja) |
EP (1) | EP2518466B1 (ja) |
JP (1) | JP5792956B2 (ja) |
CN (1) | CN102686994B (ja) |
WO (1) | WO2011077938A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20160111763A (ko) * | 2015-03-17 | 2016-09-27 | 주식회사본길 | 불꽃 이온화 검출을 기반으로 한 배기 가스 측정 방법 및 장치 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5729285B2 (ja) * | 2011-12-06 | 2015-06-03 | 株式会社島津製作所 | 燃焼排ガス分析装置 |
US9228865B2 (en) * | 2012-04-23 | 2016-01-05 | Xenon, Inc. | Multi-analyzer and multi-reference sample validation system and method |
US20150096349A1 (en) * | 2012-05-14 | 2015-04-09 | Pen Inc. | Optimize analyte dynamic range in gas chromatography |
JP5795285B2 (ja) * | 2012-05-22 | 2015-10-14 | 株式会社堀場製作所 | 分析計校正システム及び排ガス分析システム |
WO2014123028A1 (ja) * | 2013-02-05 | 2014-08-14 | 株式会社日立国際電気 | クリーニング方法 |
CN104267154B (zh) * | 2014-10-17 | 2016-07-13 | 河南省计量科学研究院 | 气体分析仪校准装置 |
CN104764693B (zh) * | 2015-04-09 | 2018-01-05 | 重庆工商大学 | 带自动量程校准的便携式红外气体分析仪及校准方法 |
CN106092840B (zh) * | 2016-05-31 | 2017-05-03 | 北京理工大学 | 一种大型污染源废气排放测试方法 |
CN106053306B (zh) * | 2016-05-31 | 2017-05-03 | 北京理工大学 | 一种大型污染源废气排放测试*** |
CN106770940B (zh) * | 2016-12-09 | 2019-07-05 | 潍柴动力股份有限公司 | 一种气体分析仪***的检查装置 |
JP6744205B2 (ja) * | 2016-12-16 | 2020-08-19 | 日本製鉄株式会社 | 元素分析装置及び元素分析方法 |
JP6743790B2 (ja) * | 2017-09-19 | 2020-08-19 | 横河電機株式会社 | 検査方法及び検査システム |
JP7325006B2 (ja) * | 2018-03-30 | 2023-08-14 | パナソニックIpマネジメント株式会社 | ガス成分計測装置 |
CN108760591A (zh) * | 2018-04-10 | 2018-11-06 | 天津世纪动力科技发展有限公司 | 一种车辆尾气污染物测量装置 |
CN110187062A (zh) * | 2019-06-06 | 2019-08-30 | 上海蓝魂环保科技有限公司 | 一种船舶尾气在线检测分析设备和检测分析方法 |
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JP2001013045A (ja) * | 1999-06-29 | 2001-01-19 | Dkk Corp | 校正用ガス調製装置及びガス分析装置 |
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JP2005069874A (ja) * | 2003-08-25 | 2005-03-17 | Shimadzu Corp | ガス濃度測定装置 |
JP2009042184A (ja) * | 2007-08-10 | 2009-02-26 | Kimoto Denshi Kogyo Kk | ガス計測器 |
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2010
- 2010-12-07 US US13/518,693 patent/US9347875B2/en not_active Expired - Fee Related
- 2010-12-07 CN CN201080059301.1A patent/CN102686994B/zh not_active Expired - Fee Related
- 2010-12-07 WO PCT/JP2010/071865 patent/WO2011077938A1/ja active Application Filing
- 2010-12-07 JP JP2010547910A patent/JP5792956B2/ja active Active
- 2010-12-07 EP EP10839172.3A patent/EP2518466B1/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH10300640A (ja) * | 1997-04-28 | 1998-11-13 | Shimadzu Corp | 環境大気用二酸化硫黄測定装置の校正方法 |
JP2001013045A (ja) * | 1999-06-29 | 2001-01-19 | Dkk Corp | 校正用ガス調製装置及びガス分析装置 |
JP2001349812A (ja) * | 2000-06-08 | 2001-12-21 | Horiba Ltd | ガス分析計の干渉影響の低減方法 |
JP2005069874A (ja) * | 2003-08-25 | 2005-03-17 | Shimadzu Corp | ガス濃度測定装置 |
JP2009042184A (ja) * | 2007-08-10 | 2009-02-26 | Kimoto Denshi Kogyo Kk | ガス計測器 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20160111763A (ko) * | 2015-03-17 | 2016-09-27 | 주식회사본길 | 불꽃 이온화 검출을 기반으로 한 배기 가스 측정 방법 및 장치 |
KR101699277B1 (ko) * | 2015-03-17 | 2017-02-13 | 주식회사본길 | 불꽃 이온화 검출을 기반으로 한 배기 가스 측정 방법 및 장치 |
Also Published As
Publication number | Publication date |
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WO2011077938A1 (ja) | 2011-06-30 |
EP2518466B1 (en) | 2020-01-22 |
US9347875B2 (en) | 2016-05-24 |
CN102686994B (zh) | 2015-09-16 |
EP2518466A1 (en) | 2012-10-31 |
JPWO2011077938A1 (ja) | 2013-05-02 |
CN102686994A (zh) | 2012-09-19 |
EP2518466A4 (en) | 2017-12-27 |
US20120260715A1 (en) | 2012-10-18 |
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