JP5414164B2 - 基板検査装置及び方法 - Google Patents
基板検査装置及び方法 Download PDFInfo
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- JP5414164B2 JP5414164B2 JP2007238310A JP2007238310A JP5414164B2 JP 5414164 B2 JP5414164 B2 JP 5414164B2 JP 2007238310 A JP2007238310 A JP 2007238310A JP 2007238310 A JP2007238310 A JP 2007238310A JP 5414164 B2 JP5414164 B2 JP 5414164B2
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- G09G3/3233—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
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- General Physics & Mathematics (AREA)
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- Electroluminescent Light Sources (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Control Of El Displays (AREA)
Description
1)アノード/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/カソード
2)アノード/正孔バッファ層/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/カソード
3)アノード/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/電子バッファ層/カソード
4)アノード/正孔バッファ層/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/電子バッファ層/カソード
5)アノード/正孔注入層/正孔バッファ層/正孔輸送層/発光層/電子輸送層/電子注入層/カソード
6)アノード/正孔注入層/正孔輸送層/発光層/電子輸送層/電子バッファ層/電子注入層/カソード
1)アノード/正孔注入輸送層/発光層/電子輸送層/電子注入層/カソード
2)アノード/正孔バッファ層/正孔注入輸送層/発光層/電子輸送層/電子注入層/カソード
3)アノード/正孔注入層/正孔輸送層/発光層/電子注入輸送層/電子バッファ層/カソード
4)アノード/正孔バッファ層/正孔輸送層/発光層/電子注入輸送層/電子バッファ層/カソード
5)アノード/正孔注入輸送層/正孔バッファ層/発光層/電子輸送層/電子注入層/カソード
6)アノード/正孔注入層/正孔輸送層/発光層/電子バッファ層/電子注入輸送層/カソード
1)カソード/電子注入層/電子輸送層/発光層/正孔輸送層/正孔注入層/アノード
2)カソード/電子注入層/電子輸送層/発光層/正孔輸送層/正孔注入層/正孔バッファ層/アノード
3)カソード/電子バッファ層/電子注入層/電子輸送層/発光層/正孔輸送層/正孔注入層/アノード
4)カソード/電子バッファ層/電子注入層/電子輸送層/発光層/正孔輸送層/正孔バッファ層/アノード
5)カソード/電子注入層/電子輸送層/発光層/正孔輸送層/正孔バッファ層/正孔注入層/アノード
6)カソード/電子注入層/電子バッファ層/電子輸送層/発光層/正孔輸送層/正孔注入層/アノード
1)カソード/電子注入層/電子輸送層/発光層/正孔注入輸送層/アノード
2)カソード/電子注入層/電子輸送層/発光層/正孔注入輸送層/正孔バッファ層/アノード
3)カソード/電子バッファ層/電子注入輸送層/発光層/正孔輸送層/正孔注入層/アノード
4)カソード/電子バッファ層/電子注入輸送層/発光層/正孔輸送層/正孔バッファ層/アノード
5)カソード/電子注入層/電子輸送層/発光層/正孔バッファ層/正孔注入輸送層/アノード
6)カソード/電子注入輸送層/電子バッファ層/発光層/正孔輸送層/正孔注入層/アノード
440 有機電界発光表示パネル
500 感知補償部
510 比較器
520 レベルシフター
530 初期化レベルシフター
600 基板検査装置
710 電源電圧補償段階
720 降下電源電圧補償段階
730 電源電圧と降下電圧との比較出力段階
740 電圧補償段階
750 補償された電源電圧をパネルに印加する段階
Claims (21)
- 列方向に配列されている複数の走査線及び複数の発光制御線と、行方向に配列される複数のデータ線と、前記複数の走査線、前記複数のデータ線、及び前記複数の発光制御線によって定義される、有機発光ダイオードを含む複数の画素回路とを備えた有機電界発光表示パネルと、前記複数の走査線を制御する走査駆動部と、前記複数の発光制御線を制御する発光制御駆動部と、前記複数のデータ線を制御するデータ駆動部とからなる有機電界発光表示装置を2次元配列状に並べて検査する基板検査装置であって、前記有機電界発光表示装置に共通に印加される予定の電源電圧と前記電源電圧に電気的に繋がれる電源電圧感知線を通じて感知される降下電源電圧とをパネルごとに比べて、そのパネルごとの差分値を出力する比較器、及び
パネルごとのデータ電圧を前記比較器から出力されるパネルごとの差分値だけ補償して有機電界発光表示パネルに供給するレベルシフター回路を含めてなり、
各パネルの前記画素回路が、各パネルごとに印加される前記降下電源電圧と前記差分値だけ補償された各パネルごとのデータ電圧との差に基づく電流によって駆動される
ことを特徴とする基板検査装置。 - 初期化電圧を前記比較器から出力される差分値だけ補償して有機電界発光表示パネルに供給する初期化レベルシフター回路を含めてなることを特徴とする請求項1に記載の基板検査装置。
- 前記初期化電圧は、有機電界発光表示パネルの画素回路に伝達される初期化電圧であることを特徴とする請求項2に記載の基板検査装置。
- 前記データ電圧は、有機電界発光表示パネルの画素回路に伝達されるデータ電圧であることを特徴とする請求項1に記載の基板検査装置。
- 前記有機電界発光表示パネルは、電源電圧、初期化電圧及びデータ電圧に電気的に繋がれることを特徴とする請求項2に記載の基板検査装置。
- 前記有機電界発光表示パネルは、基板にマトリクス状に形成されることを特徴とする請求項1に記載の基板検査装置。
- 前記比較器、レベルシフター及び初期化レベルシフター回路は、前記基板に集積されて形成されることを特徴とする請求項6に記載の基板検査装置。
- 前記データ電圧は、赤色データ電圧、緑色データ電圧及び青色データ電圧であることを特徴とする請求項4に記載の基板検査装置。
- 比較器のオン/オフをスイッチングして、前記差分値を出力したり、前記降下電源電圧を選択的に出力するための比較器スイッチを含めてなることを特徴とする請求項1に記載の基板検査装置。
- 前記レベルシフター回路のオン/オフをスイッチングして前記データ電圧を前記差分値だけ補償して前記有機電界発光表示パネルに供給するための電圧スイッチを含めてなることを特徴とする請求項1に記載の基板検査装置。
- 前記初期化レベルシフター回路のオン/オフをスイッチングして前記初期化電圧を前記差分値だけ補償して前記有機電界発光表示パネルに供給するための初期化スイッチを含めてなることを特徴とする請求項2に記載の基板検査装置。
- 前記比較器から出力される電圧値に応じて、固定された一定電圧を出力する電圧差固定器を含めてなることを特徴とする請求項1に記載の基板検査装置。
- 列方向に配列されている複数の走査線及び複数の発光制御線と、行方向に配列される複数のデータ線と、前記複数の走査線、前記複数のデータ線、及び前記複数の発光制御線によって定義される、有機発光ダイオードを含む複数の画素回路とを備えた有機電界発光表示パネルと、前記複数の走査線を制御する走査駆動部と、前記複数の発光制御線を制御する発光制御駆動部と、前記複数のデータ線を制御するデータ駆動部とからなる有機電界発光表示装置を2次元配列状に並べて検査する基板検査方法であって、
電源電圧線を通じて供給される基板の電源電圧を感知する段階と、
電源電圧感知線を通じて感知される基板の降下電源電圧を感知する段階と、
前記電源電圧と前記降下電源電圧とを比べて差分値を出力する段階と、
前記出力された差分値だけ有機電界発光表示パネルの画素回路に伝達されるデータ電圧を補償する段階と、を含めてなり、
各パネルの前記画素回路が、各パネルごとに印加される前記降下電源電圧と前記差分値だけ補償された各パネルごとのデータ電圧との差に基づく電流によって駆動される
ことを特徴とする基板検査方法。 - 前記電源電圧と前記降下電源電圧とを比べて出力する段階は、前記電源電圧と前記降下電源電圧とを比べてその電圧差を出力する段階であることを特徴とする請求項13に記載の基板検査方法。
- 前記電源電圧と前記降下電源電圧とを比べて出力する段階以後に、前記出力された電圧だけ、前記有機電界発光表示パネルの画素回路を初期化するための初期化電圧を補償する段階を含めてなることを特徴とする請求項13に記載の基板検査方法。
- 前記データ電圧を補償する段階は、赤色データ電圧、緑色データ電圧及び青色データ電圧をすべて補償する段階であることを特徴とする請求項13に記載の基板検査方法。
- 前記出力された電圧だけデータ電圧を補償する段階は、レベルシフターにおいて前記電源電圧と前記降下電源電圧との差分値をダウンシフトさせた補償データ電圧を出力する段階であることを特徴とする請求項13に記載の基板検査方法。
- 前記出力された電圧だけ初期化電圧を補償する段階は、初期化レベルシフターにおいて前記電源電圧と前記降下電源電圧との差分値をダウンシフトさせた補償初期化電圧を出力する段階であることを特徴とする請求項15に記載の基板検査方法。
- 前記出力された電圧だけデータ電圧を補償する段階以後に、前記電源電圧と前記降下電源電圧とを比べてその差分値を固定して一定電圧を出力する段階を含めてなることを特徴とする請求項13に記載の基板検査方法。
- 出力された電圧だけデータ電圧を補償する段階以後に、前記補償データ電圧を前記有機電界発光表示パネルに供給する段階を含めてなることを特徴とする請求項17に記載の基板検査方法。
- 出力された電圧だけ初期化電圧を補償する段階以後に、前記補償初期化電圧を前記有機電界発光表示パネルに供給する段階を含めてなることを特徴とする請求項18に記載の基板検査方法。
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