JP4698680B2 - 高電圧機能を備えたピンエレクトロニクス - Google Patents
高電圧機能を備えたピンエレクトロニクス Download PDFInfo
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- JP4698680B2 JP4698680B2 JP2007548428A JP2007548428A JP4698680B2 JP 4698680 B2 JP4698680 B2 JP 4698680B2 JP 2007548428 A JP2007548428 A JP 2007548428A JP 2007548428 A JP2007548428 A JP 2007548428A JP 4698680 B2 JP4698680 B2 JP 4698680B2
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- pin
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- 238000012360 testing method Methods 0.000 claims description 94
- 238000000034 method Methods 0.000 claims description 22
- 230000007246 mechanism Effects 0.000 claims description 17
- 239000004020 conductor Substances 0.000 description 13
- 230000008569 process Effects 0.000 description 13
- 230000004044 response Effects 0.000 description 12
- 230000006870 function Effects 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 8
- 238000004590 computer program Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 230000007704 transition Effects 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000002457 bidirectional effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
Description
Claims (13)
- デバイスの試験に使用する集積回路(IC)であって、
出力を有するピンエレクトロニクス(PE)ドライバと、
ピンと、
前記PEドライバの出力及び前記ピンに接続されるバッファと、
を備え、
前記ピンにおいて測定される第1の電圧は前記出力において測定される第2の電圧より大きく、
前記バッファは、電圧源に接続される入力を有する第1の増幅器を備え、
前記バッファは、更に前記PEドライバの前記出力に接続される入力を有する第2の増幅器を備え、
前記バッファは、第1のモードにおいて前記第1の増幅器と前記ピンとの間に第1の電気接続を確立し、第2のモードにおいて前記第2の増幅器と前記ピンとの間に第2の電気接続を確立するように構成される切換機構を備える、
IC。 - 前記電圧源は、前記PEドライバによって使用される終端電圧に対応する、請求項1に記載のIC。
- 前記第1の増幅器の利得は1より大きい、請求項1に記載のIC。
- 前記第2の増幅器の利得は1である、請求項1に記載のIC。
- 前記第1のモード及び前記第2のモードは相互に排他的である、請求項1に記載のIC。
- 前記ピンエレクトロニクスドライバはトライステートであり、イネーブル入力信号を含み、前記切換機構は、前記第1のモード又は前記第2のモードを確立するための入力信号を含み、前記切換機構の前記入力信号及び前記イネーブル入力信号は同一である、請求項1に記載のIC。
- 前記切換機構は第1のスイッチ及び第2のスイッチを備える、請求項1に記載のIC。
- 被試験デバイスとともに使用する自動試験装置(ATE)であって、該ATEが、
第2の電圧を有する出力を有するピンエレクトロニクス(PE)ドライバと、
前記第2の電圧より大きい第1の電圧を有する高電圧ピンと、
前記PEドライバの出力及び前記高電圧ピンに接続されるバッファと、
からなる集積回路(IC)を備え、
前記バッファは、
前記PEドライバの出力に接続される入力を有する第1の増幅器と、
終端電圧に接続される入力を有する第2の増幅器と、
第1のモードにおいて前記第1の増幅器と前記高電圧ピンとの間に第1の電気接続を確立し、第2のモードにおいて前記第2の増幅器と前記高電圧ピンとの間に第2の電気接続を確立するように構成される切換機構と、
を備える、ATE。 - 前記第1の増幅器は1の利得を有する、請求項8に記載のATE。
- 前記第2の増幅器は1より大きい利得を有する、請求項8に記載のATE。
- 前記ピンエレクトロニクスドライバはトライステートであり、イネーブル入力信号を含み、前記切換機構は、前記第1のモード又は前記第2のモードを確立するための入力信号を含み、前記切換機構の前記入力信号及び前記イネーブル入力信号は同一である、請求項8に記載のATE。
- デバイスを試験する方法であって、
ピンエレクトロニクス(PE)ドライバの出力をバッファに接続し、
前記バッファは、
1の利得を有し、前記PEドライバの前記出力に接続される入力を含む第1の増幅器と、
1より大きい利得を有し、電圧源に接続される入力を含む第2の増幅器と、
を備え、さらに、
前記バッファをピンに接続し、
第1のモード又は第2のモードを示す信号を受け取り、
前記第1のモードにおいて前記第1の増幅器と前記ピンとの間に第1の電気接続を確立し、
前記第2のモードにおいて前記第2の増幅器と前記ピンとの間に第2の電気接続を確立し、
前記ピンにおいて前記PEドライバの出力における第2の電圧より大きい第1の電圧を入力する、
ことを含む方法。 - 前記第1のモード及び前記第2のモードは相互に排他的である、請求項12に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/023,023 | 2004-12-23 | ||
US11/023,023 US7102375B2 (en) | 2004-12-23 | 2004-12-23 | Pin electronics with high voltage functionality |
PCT/US2005/046332 WO2006071668A2 (en) | 2004-12-23 | 2005-12-16 | Pin electronics with high voltage functionality |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008525803A JP2008525803A (ja) | 2008-07-17 |
JP4698680B2 true JP4698680B2 (ja) | 2011-06-08 |
Family
ID=36610716
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007548428A Active JP4698680B2 (ja) | 2004-12-23 | 2005-12-16 | 高電圧機能を備えたピンエレクトロニクス |
Country Status (6)
Country | Link |
---|---|
US (1) | US7102375B2 (ja) |
EP (1) | EP1849018A4 (ja) |
JP (1) | JP4698680B2 (ja) |
KR (1) | KR100905507B1 (ja) |
CN (1) | CN101084444B (ja) |
WO (1) | WO2006071668A2 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7560947B2 (en) | 2005-09-28 | 2009-07-14 | Teradyne, Inc. | Pin electronics driver |
US7712000B2 (en) * | 2006-10-30 | 2010-05-04 | Verigy (Singapore) Pte. Ltd. | ATE architecture and method for DFT oriented testing |
KR101414980B1 (ko) * | 2008-06-30 | 2014-07-09 | 삼성전자주식회사 | 테스트 시스템 |
KR20120137963A (ko) * | 2011-06-14 | 2012-12-24 | 삼성전자주식회사 | 신호전송장치 및 이를 이용한 반도체 테스트 장치 |
US10976367B2 (en) * | 2018-12-13 | 2021-04-13 | Micron Technology, Inc. | Controller structural testing with automated test vectors |
WO2020214575A1 (en) * | 2019-04-16 | 2020-10-22 | Celerint, Llc | Device interface board compliance testing using impedance response profiling |
US11125817B2 (en) | 2019-10-14 | 2021-09-21 | Analog Devices, Inc. | Compound pin driver |
US11264906B2 (en) | 2019-12-13 | 2022-03-01 | Analog Devices, Inc. | Compound pin driver controller |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0170175U (ja) * | 1987-10-28 | 1989-05-10 | ||
US4998026A (en) * | 1989-04-19 | 1991-03-05 | Hewlett-Packard Company | Driver circuit for in-circuit overdrive/functional tester |
JPH03255377A (ja) * | 1990-03-05 | 1991-11-14 | Nec Corp | 集積回路の試験装置 |
JPH09325176A (ja) * | 1996-06-05 | 1997-12-16 | Advantest Corp | Ic試験装置 |
JPH116865A (ja) * | 1997-04-04 | 1999-01-12 | Hewlett Packard Co <Hp> | インターフェイス回路、試験装置及び信号入力方法 |
JPH11326441A (ja) * | 1998-05-20 | 1999-11-26 | Advantest Corp | 半導体試験装置 |
JP2001183431A (ja) * | 1999-04-06 | 2001-07-06 | Advantest Corp | 試験装置および試験方法 |
JP2002181904A (ja) * | 2000-10-02 | 2002-06-26 | Schlumberger Technol Inc | 高速集積回路デバイス検査インタフェースのための方法および装置 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
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US5200696A (en) | 1990-09-10 | 1993-04-06 | Ltx Corporation | Test system apparatus with Schottky diodes with programmable voltages |
US5101153A (en) | 1991-01-09 | 1992-03-31 | National Semiconductor Corporation | Pin electronics test circuit for IC device testing |
US5467024A (en) | 1993-11-01 | 1995-11-14 | Motorola, Inc. | Integrated circuit test with programmable source for both AC and DC modes of operation |
JPH07218596A (ja) | 1994-02-03 | 1995-08-18 | Mitsubishi Electric Corp | 半導体試験装置 |
US5521493A (en) | 1994-11-21 | 1996-05-28 | Megatest Corporation | Semiconductor test system including a novel driver/load circuit |
JP3457091B2 (ja) * | 1995-03-17 | 2003-10-14 | アジレント・テクノロジー株式会社 | 電圧電流特性測定装置 |
US6049901A (en) * | 1997-09-16 | 2000-04-11 | Stock; Mary C. | Test system for integrated circuits using a single memory for both the parallel and scan modes of testing |
TW495616B (en) * | 1999-04-06 | 2002-07-21 | Advantest Corp | Test device and method for electrically testing electronic device |
JP4119060B2 (ja) | 1999-10-01 | 2008-07-16 | 株式会社アドバンテスト | 試験装置 |
US6694462B1 (en) * | 2000-08-09 | 2004-02-17 | Teradyne, Inc. | Capturing and evaluating high speed data streams |
US6677775B2 (en) | 2001-01-10 | 2004-01-13 | Analog Devices, Inc. | Circuit testing device using a driver to perform electronics testing |
US6940271B2 (en) * | 2001-08-17 | 2005-09-06 | Nptest, Inc. | Pin electronics interface circuit |
US6885213B2 (en) | 2002-09-13 | 2005-04-26 | Logicvision, Inc. | Circuit and method for accurately applying a voltage to a node of an integrated circuit |
US6836136B2 (en) | 2002-12-18 | 2004-12-28 | Teradyne, Inc. | Pin driver for AC and DC semiconductor device testing |
US6828775B2 (en) | 2003-02-21 | 2004-12-07 | Semtech Corporation | High-impedance mode for precision measurement unit |
US6879175B2 (en) | 2003-03-31 | 2005-04-12 | Teradyne, Inc. | Hybrid AC/DC-coupled channel for automatic test equipment |
US7046014B2 (en) | 2004-02-27 | 2006-05-16 | Broadcom Corporation | ATE measurement technique for comparator threshold voltage |
-
2004
- 2004-12-23 US US11/023,023 patent/US7102375B2/en active Active
-
2005
- 2005-12-16 JP JP2007548428A patent/JP4698680B2/ja active Active
- 2005-12-16 KR KR1020077013818A patent/KR100905507B1/ko active IP Right Grant
- 2005-12-16 CN CN2005800440104A patent/CN101084444B/zh active Active
- 2005-12-16 EP EP05854966A patent/EP1849018A4/en not_active Withdrawn
- 2005-12-16 WO PCT/US2005/046332 patent/WO2006071668A2/en active Search and Examination
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0170175U (ja) * | 1987-10-28 | 1989-05-10 | ||
US4998026A (en) * | 1989-04-19 | 1991-03-05 | Hewlett-Packard Company | Driver circuit for in-circuit overdrive/functional tester |
JPH03255377A (ja) * | 1990-03-05 | 1991-11-14 | Nec Corp | 集積回路の試験装置 |
JPH09325176A (ja) * | 1996-06-05 | 1997-12-16 | Advantest Corp | Ic試験装置 |
JPH116865A (ja) * | 1997-04-04 | 1999-01-12 | Hewlett Packard Co <Hp> | インターフェイス回路、試験装置及び信号入力方法 |
JPH11326441A (ja) * | 1998-05-20 | 1999-11-26 | Advantest Corp | 半導体試験装置 |
JP2001183431A (ja) * | 1999-04-06 | 2001-07-06 | Advantest Corp | 試験装置および試験方法 |
JP2002181904A (ja) * | 2000-10-02 | 2002-06-26 | Schlumberger Technol Inc | 高速集積回路デバイス検査インタフェースのための方法および装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20070086393A (ko) | 2007-08-27 |
CN101084444B (zh) | 2010-11-24 |
WO2006071668A3 (en) | 2007-01-04 |
KR100905507B1 (ko) | 2009-07-01 |
US7102375B2 (en) | 2006-09-05 |
JP2008525803A (ja) | 2008-07-17 |
WO2006071668A2 (en) | 2006-07-06 |
US20060139048A1 (en) | 2006-06-29 |
EP1849018A4 (en) | 2008-04-16 |
EP1849018A2 (en) | 2007-10-31 |
CN101084444A (zh) | 2007-12-05 |
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