JP4458786B2 - 液晶表示装置およびその検査方法 - Google Patents
液晶表示装置およびその検査方法 Download PDFInfo
- Publication number
- JP4458786B2 JP4458786B2 JP2003272931A JP2003272931A JP4458786B2 JP 4458786 B2 JP4458786 B2 JP 4458786B2 JP 2003272931 A JP2003272931 A JP 2003272931A JP 2003272931 A JP2003272931 A JP 2003272931A JP 4458786 B2 JP4458786 B2 JP 4458786B2
- Authority
- JP
- Japan
- Prior art keywords
- signal line
- signal
- wiring
- liquid crystal
- crystal display
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims description 41
- 238000000034 method Methods 0.000 title claims description 15
- 238000007689 inspection Methods 0.000 title description 29
- 239000000758 substrate Substances 0.000 claims description 57
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 21
- 239000010409 thin film Substances 0.000 claims description 9
- 229910021417 amorphous silicon Inorganic materials 0.000 description 16
- 238000004519 manufacturing process Methods 0.000 description 11
- 239000003990 capacitor Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
Images
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- Liquid Crystal (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
2…対向基板
3…液晶層
4…対向電極
11…走査線
12…信号線
13…薄膜トランジスタ
14…画素電極
15…補助容量
16…補助容量線
18…走査線駆動回路
19…信号線駆動回路
19b…アナログスイッチ
21〜25…OLBパッド
31…アレイ基板上配線
32…選択信号線
33…映像信号配線
34…ダイオード
41…電流計
42…電圧源
Claims (4)
- 交差するように配線された複数の信号線および複数の走査線と、
多結晶シリコンで形成された薄膜トランジスタを前記信号線と前記走査線の各交差部分に設けた画素と、
前記複数の走査線の一方の端に接続された走査線駆動回路と、
前記信号線の一方の端にk本(kは3以上の整数)ずつの信号線に対応して1本ずつ接続された映像信号配線と、k本ずつの信号線のうちの1本を選択するための選択信号線とで形成される信号線駆動回路と、
各信号線毎に信号線の他方の端に2個ずつ異なる向きで接続されたダイオードと、
前記信号線に前記ダイオードを介して接続される配線とをアレイ基板上に形成し、
前記配線は2k本あり隣接する前記信号線には異なる前記配線が接続されていることを特徴とする液晶表示装置。 - 請求項1記載の液晶表示装置に対して、
k本ずつの信号線のうちの1本を選択するための選択信号を前記選択信号線に印加するステップと、
選択された信号線に接続されている映像信号配線と当該信号線に2個のダイオードを介してそれぞれ接続されている配線との間に所定の電圧を印加するステップと、
信号線および映像信号配線に流れる電流を測定するステップと、
を有することを特徴とする液晶表示装置の検査方法。 - 選択された信号線に接続されているダイオードがオン状態となるように、当該ダイオードに接続されている配線の電位を設定することを特徴とする請求項2記載の液晶表示装置の検査方法。
- 前記電流を測定するステップにおいて、隣接する信号線または映像信号配線に前記ダイオードを介して接続されているそれぞれの配線に流れる電流の大きさによって、当該信号線または当該映像信号配線の断線、あるいは隣接する信号線または映像信号配線との短絡を検出することを特徴とする請求項3記載の液晶表示装置の検査方法。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2003272931A JP4458786B2 (ja) | 2003-07-10 | 2003-07-10 | 液晶表示装置およびその検査方法 |
Applications Claiming Priority (1)
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JP2003272931A JP4458786B2 (ja) | 2003-07-10 | 2003-07-10 | 液晶表示装置およびその検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005031546A JP2005031546A (ja) | 2005-02-03 |
JP4458786B2 true JP4458786B2 (ja) | 2010-04-28 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2003272931A Expired - Fee Related JP4458786B2 (ja) | 2003-07-10 | 2003-07-10 | 液晶表示装置およびその検査方法 |
Country Status (1)
Country | Link |
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JP (1) | JP4458786B2 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5508693B2 (ja) * | 2008-06-30 | 2014-06-04 | 株式会社東芝 | 表示装置 |
KR102564466B1 (ko) * | 2016-09-30 | 2023-08-07 | 엘지디스플레이 주식회사 | 신호라인 검사회로가 구비된 영상 표시패널 및 이를 포함한 영상 표시장치 |
CN112305449A (zh) * | 2019-07-24 | 2021-02-02 | 苏州清越光电科技股份有限公司 | 一种发光元件不良检测治具及屏体短路检测方法 |
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2003
- 2003-07-10 JP JP2003272931A patent/JP4458786B2/ja not_active Expired - Fee Related
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