JP3925811B2 - 液晶パネルの試験方法及び試験装置 - Google Patents
液晶パネルの試験方法及び試験装置 Download PDFInfo
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- JP3925811B2 JP3925811B2 JP2004265096A JP2004265096A JP3925811B2 JP 3925811 B2 JP3925811 B2 JP 3925811B2 JP 2004265096 A JP2004265096 A JP 2004265096A JP 2004265096 A JP2004265096 A JP 2004265096A JP 3925811 B2 JP3925811 B2 JP 3925811B2
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- Prior art keywords
- liquid crystal
- crystal panel
- light
- laser
- observation light
- Prior art date
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- 239000004973 liquid crystal related substance Substances 0.000 title claims description 153
- 238000012360 testing method Methods 0.000 title claims description 58
- 238000010998 test method Methods 0.000 title claims description 12
- 239000000758 substrate Substances 0.000 claims description 25
- 230000001678 irradiating effect Effects 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 7
- 230000005540 biological transmission Effects 0.000 claims description 3
- 230000006866 deterioration Effects 0.000 description 21
- 230000003287 optical effect Effects 0.000 description 21
- 238000011156 evaluation Methods 0.000 description 15
- 230000010287 polarization Effects 0.000 description 14
- 239000010408 film Substances 0.000 description 13
- 238000010586 diagram Methods 0.000 description 9
- 238000003384 imaging method Methods 0.000 description 9
- 238000001514 detection method Methods 0.000 description 7
- 230000001105 regulatory effect Effects 0.000 description 5
- 230000001133 acceleration Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 229910052736 halogen Inorganic materials 0.000 description 3
- 150000002367 halogens Chemical class 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- 238000012356 Product development Methods 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000004904 shortening Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 239000004988 Nematic liquid crystal Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- ZZUFCTLCJUWOSV-UHFFFAOYSA-N furosemide Chemical compound C1=C(Cl)C(S(=O)(=O)N)=CC(C(O)=O)=C1NCC1=CC=CO1 ZZUFCTLCJUWOSV-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/69—Arrangements or methods for testing or calibrating a device
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nonlinear Science (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Liquid Crystal (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Description
Claims (2)
- 一対の基板と当該基板間に介在する液晶層とを含んでなる液晶パネルの耐光性を試験するための方法であって、
レーザ光をその波長、照射エネルギー又は照射時間のうち少なくとも1つを可変パラメータとして設定して前記液晶パネルの試験対象領域に照射する第1工程と、
観察光を前記液晶パネルに照射し、当該液晶パネルを通過した当該観察光の状態を検出する第2工程と、
前記レーザ光の前記可変パラメータの設定に応じた前記観察光の状態の差異に基づいて前記液晶パネルの耐光性を評価する第3工程と、
を含み、
前記レーザ光を前記観察光として兼用し、前記第1工程及び前記第2工程を並行して行う、液晶パネルの試験方法。 - 一対の基板と当該基板間に介在する液晶層とを含んでなる液晶パネルの耐光性を試験するための装置であって、
レーザ光をその波長、照射エネルギー又は照射時間のうち少なくとも1つを可変パラメータとして設定して出力可能なレーザ発振器と、
前記液晶パネルの試験対象領域に前記レーザ発振器から出力される前記レーザ光が照射されるように当該レーザ光と前記液晶パネルとの相対位置を設定する位置設定手段と、
前記液晶パネルの光透過状態を観測するための観察光を当該液晶パネルに照射する観察光出力手段と、
前記液晶パネルを通過した後の前記観察光の状態を検出する検出手段と、
を備え
前記レーザ光が前記観察光を兼ねる、液晶パネルの試験装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004265096A JP3925811B2 (ja) | 2004-09-13 | 2004-09-13 | 液晶パネルの試験方法及び試験装置 |
US11/190,029 US7307444B2 (en) | 2004-09-13 | 2005-07-26 | Testing method and testing apparatus for liquid crystal panel |
CNB2005100998748A CN100447549C (zh) | 2004-09-13 | 2005-09-08 | 液晶板的试验方法以及试验装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004265096A JP3925811B2 (ja) | 2004-09-13 | 2004-09-13 | 液晶パネルの試験方法及び試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006078946A JP2006078946A (ja) | 2006-03-23 |
JP3925811B2 true JP3925811B2 (ja) | 2007-06-06 |
Family
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Application Number | Title | Priority Date | Filing Date |
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JP2004265096A Expired - Fee Related JP3925811B2 (ja) | 2004-09-13 | 2004-09-13 | 液晶パネルの試験方法及び試験装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7307444B2 (ja) |
JP (1) | JP3925811B2 (ja) |
CN (1) | CN100447549C (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101007842B1 (ko) * | 2008-04-16 | 2011-01-13 | 이순희 | 착유용 유축구 |
US8854616B2 (en) * | 2011-08-03 | 2014-10-07 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Visual inspection apparatus for glass substrate of liquid crystal display and inspection method thereof |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5330865A (en) * | 1976-09-03 | 1978-03-23 | Hitachi Ltd | Electron microscope provided with sample irradiating electron beam quantity measuring unit |
JPH0760471A (ja) | 1993-08-26 | 1995-03-07 | Okuma Mach Works Ltd | レーザ加工機のビーム形状整形装置 |
JP2685425B2 (ja) * | 1994-09-30 | 1997-12-03 | 株式会社東芝 | 液晶素子評価方法 |
JPH1062734A (ja) * | 1996-08-22 | 1998-03-06 | Sony Corp | 液晶表示装置の欠陥画素補正方法および欠陥画素補正装置 |
EP0989737A3 (en) * | 1998-09-21 | 2003-09-24 | Konica Corporation | Image recording apparatus |
JP2001004526A (ja) | 1999-06-22 | 2001-01-12 | Sony Corp | 耐光性試験方法及び試験装置 |
JP2001110861A (ja) | 1999-10-06 | 2001-04-20 | Seiko Epson Corp | 半導体膜の検査方法、薄膜トランジスタの製造方法、および半導体膜の検査装置 |
JP4027552B2 (ja) * | 1999-12-07 | 2007-12-26 | 株式会社日立ハイテクノロジーズ | 透明基板検査装置 |
JP2001215108A (ja) | 2000-02-02 | 2001-08-10 | Seiko Epson Corp | 電気光学装置用基板の検査方法及び検査装置 |
JP2002162360A (ja) * | 2000-11-22 | 2002-06-07 | Seiko Epson Corp | 液晶パネルの評価方法及び評価装置 |
US6665033B2 (en) | 2000-11-30 | 2003-12-16 | International Business Machines Corporation | Method for forming alignment layer by ion beam surface modification |
JP2002196344A (ja) | 2000-12-26 | 2002-07-12 | Toshiba Corp | 液晶表示装置の製造方法とレーザ成膜方法およびレーザ成膜装置 |
JP2003043504A (ja) | 2001-07-31 | 2003-02-13 | Fujitsu Ltd | 液晶表示パネルの製造装置及び製造方法 |
JP4280597B2 (ja) | 2003-02-04 | 2009-06-17 | 日東電工株式会社 | 位相差板の製造方法 |
JP4062527B2 (ja) * | 2003-05-09 | 2008-03-19 | 株式会社島津製作所 | Tftアレイ検査装置 |
-
2004
- 2004-09-13 JP JP2004265096A patent/JP3925811B2/ja not_active Expired - Fee Related
-
2005
- 2005-07-26 US US11/190,029 patent/US7307444B2/en active Active
- 2005-09-08 CN CNB2005100998748A patent/CN100447549C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
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US20060055931A1 (en) | 2006-03-16 |
CN1749724A (zh) | 2006-03-22 |
JP2006078946A (ja) | 2006-03-23 |
US7307444B2 (en) | 2007-12-11 |
CN100447549C (zh) | 2008-12-31 |
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