JP2023022051A - 直流回路の故障を予測するための方法および装置 - Google Patents
直流回路の故障を予測するための方法および装置 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2837—Characterising or performance testing, e.g. of frequency response
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0283—Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/153—Arrangements in which a pulse is delivered at the instant when a predetermined characteristic of an input signal is present or at a fixed time interval after this instant
- H03K5/1536—Zero-crossing detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
- G01R31/2858—Measuring of material aspects, e.g. electro-migration [EM], hot carrier injection
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- Environmental & Geological Engineering (AREA)
- Nonlinear Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Emergency Protection Circuit Devices (AREA)
- Inverter Devices (AREA)
- Power Conversion In General (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Relating To Insulation (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
縁部比=正弦(Sine)(T1 @N+-T1 @P1+)-正弦(L1 @N+-L1 @P1+)+正弦(T1 @N--T1 @P1-)-正弦(L1 @N--L1 @P1-)+正弦(T2 @N+-T2 @P1+)-正弦(L2 @N+-L2 @P1+)+正弦(T2 @N--T2 @P1-)-正弦(L2 @N--L2 @P1-)+…+正弦(T1+y @N+-T1+y @P1+)-正弦(L1+y @N+-L1+y @P1+)+正弦(T1+y @N--T1+y @P1-)-正弦(L1+y @N--L1+y @P1-)
周期比=(Tv1@N1-Tv1@P(x-1))/2+(Tv2P(x-1)-Tv2@P(x))/2+(Tv2@N1-Tv2@P(x-1))/2+(Tv2P(x-1)-Tv2@P(x))/2+…+(Tv(1+y)@N1-Tv(1+y)@P(x-1))/2+(Tv(1+y)P(x-1)-Tv(1+y)@P(x))/2
振幅比=(dV1 @N+[L1 @N+]-dV1 @N+[T1 @N+]+dV1 @N-[L1 @N-]-dV1 @N-[T1 @N-])/2+(dV2 @N+[L2 @N+]-dV2 @N+[T2 @N+]+dV2 @N-[L2 @N-]-dV2 @N-[T2 @N-])/2+…+(dV(1+y) @N+[L(1+y) @N+]-dV(1+y) @N+[T(1+y) @N+]+dV(1+y) @N-[L(1+y) @N-]-dV(1+y) @N-[T(1+y) @N-])/2
これらのデータ比に基づいて、アルゴリズムは、回路の推定故障点を予測することができる。典型的なアルゴリズムでは、検査中の回路に合わせて波形を調整した後、以下のように指定の比率を重み付けする。
出力(アルゴリズム)=縁部比+周期比×1.3+振幅比×0.7
これにより、検査中のDC回路に特有の、図5に示すような分析用の予測減衰曲線を作成するためにデータを正規化することができる。各回路には個別の共通しない構成要素があるため、各回路は別々に指定しなければならない。
Claims (5)
- DC回路のライフサイクルを予測する方法であって、
a)生成されたDCパルス列のゼロ交差点における振幅比歪み、周期比変動、および持続時間比変動の特性に関して特定の構成の特定のDC回路についてのベースラインを確立するステップと、
b)使用されていたDC回路について、ゼロ点交差領域で、ステップ(a)で使用されたDC回路の同一の対応する比率および係数を監視し求めるステップと、
c)減衰率分析曲線を確立するためにステップ(a)およびステップ(b)の対応する比率および係数を比較するステップであって、これにより、減衰率分析が、前記DC回路の予測寿命の最後を確立し、故障までの推定時間を予測するために使用され得る、ステップと
を含む方法。 - 個別の回路が、独立型であるか、またはシステム内の回路のネットワークの一部である、請求項1に記載の方法。
- ステップ(c)が、分析中の回路の劣化率、および故障までの回路の予測寿命を示す減衰曲線を作成する、請求項1に記載の方法。
- ステップ(c)から得られるデータが、完全な故障の後に回路をトラブルシューティングするために利用され得る方法1。
- 請求項1に記載の方法を実施するために適合された装置であって、
a)必要な場合に、必要な電力を生成するDC電源と、
b)パルス列を生成するパルス発生器と、
c)負パルス列を生成するパルスインバータと、
d)検査中の回路に特有のパルス波を生成する中央処理装置と、
e)パルス波が前記中央処理装置に送り返されるまで前記パルス波を記憶するためのメモリモジュールと、
f)減衰率分析曲線を作成するために比率、係数を求め、アルゴリズムを生成するための手段であって、前記減衰率分析曲線が、検査されているDC回路の予測寿命の最後を確立するために使用される、手段と
を備える装置。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201662422762P | 2016-11-16 | 2016-11-16 | |
US62/422,762 | 2016-11-16 | ||
PCT/US2017/061957 WO2018094006A1 (en) | 2016-11-16 | 2017-11-16 | Method and apparatus for predicting failures in direct current circuits |
JP2019524884A JP2019536025A (ja) | 2016-11-16 | 2017-11-16 | 直流回路の故障を予測するための方法および装置 |
Related Parent Applications (1)
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JP2019524884A Division JP2019536025A (ja) | 2016-11-16 | 2017-11-16 | 直流回路の故障を予測するための方法および装置 |
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JP2023022051A true JP2023022051A (ja) | 2023-02-14 |
JP2023022051A5 JP2023022051A5 (ja) | 2023-03-07 |
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JP2019524884A Pending JP2019536025A (ja) | 2016-11-16 | 2017-11-16 | 直流回路の故障を予測するための方法および装置 |
JP2022178021A Pending JP2023022051A (ja) | 2016-11-16 | 2022-11-07 | 直流回路の故障を予測するための方法および装置 |
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US (1) | US10848139B2 (ja) |
EP (1) | EP3542172B1 (ja) |
JP (2) | JP2019536025A (ja) |
KR (1) | KR20190087454A (ja) |
CN (1) | CN110249232B (ja) |
AU (1) | AU2017362981B2 (ja) |
BR (1) | BR112019009926B1 (ja) |
CA (1) | CA3043876A1 (ja) |
IL (1) | IL266656B (ja) |
MX (1) | MX2019005537A (ja) |
SA (1) | SA519401796B1 (ja) |
WO (1) | WO2018094006A1 (ja) |
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MX2019005537A (es) * | 2016-11-16 | 2019-08-29 | Smartkable Llc | Metodo y aparato para la prediccion de fallos en circuitos de corriente directa. |
CA3125633A1 (en) * | 2019-01-07 | 2020-07-16 | SmartKable, LLC | An apparatus and method for monitoring a circuit under load using a circuit breaker |
CN112406572B (zh) * | 2020-11-06 | 2022-05-13 | 广州小鹏自动驾驶科技有限公司 | 一种车辆充电口磨损检测方法及检测装置 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5222028A (en) | 1990-10-12 | 1993-06-22 | Westinghouse Electric Corp. | Pulse analysis system and method |
US5625539A (en) * | 1994-05-30 | 1997-04-29 | Sharp Kabushiki Kaisha | Method and apparatus for controlling a DC to AC inverter system by a plurality of pulse-width modulated pulse trains |
US6249137B1 (en) * | 1999-10-14 | 2001-06-19 | Qualitau, Inc. | Circuit and method for pulsed reliability testing |
US6724214B2 (en) * | 2002-09-13 | 2004-04-20 | Chartered Semiconductor Manufacturing Ltd. | Test structures for on-chip real-time reliability testing |
US7254514B2 (en) * | 2005-05-12 | 2007-08-07 | General Electric Company | Method and system for predicting remaining life for motors featuring on-line insulation condition monitor |
US7471161B2 (en) * | 2005-09-30 | 2008-12-30 | Intel Corporation | Signal degradation monitoring |
EP2041685A4 (en) | 2006-07-17 | 2011-09-14 | Ridgetop Group Inc | PROGNOSTIC HEALTH MONITORING IN POWER SUPPLIES WITH SWITCHABLE MODE AND VOLTAGE REGULATION |
US7873581B2 (en) | 2007-10-15 | 2011-01-18 | General Electric Company | Method and system for determining the reliability of a DC motor system |
US7710141B2 (en) * | 2008-01-02 | 2010-05-04 | International Business Machines Corporation | Method and apparatus for dynamic characterization of reliability wearout mechanisms |
US7956617B1 (en) | 2009-01-21 | 2011-06-07 | Northrop Grumman Systems Corporation | Testing circuits for degradation without removal from host equipment |
WO2011060424A1 (en) | 2009-11-16 | 2011-05-19 | Nrg Systems, Inc. | Data acquisition system for condition-based maintenance |
JP5321841B2 (ja) * | 2010-01-26 | 2013-10-23 | 株式会社東芝 | 半導体集積回路 |
US8779787B2 (en) | 2011-11-16 | 2014-07-15 | Arm Limited | Apparatus and method for determining variation in a predetermined physical property of a circuit |
CN103076533B (zh) * | 2012-12-28 | 2015-08-12 | 华北电力大学(保定) | 电网中线路参数和故障扰动的分析方法 |
WO2014130806A1 (en) | 2013-02-22 | 2014-08-28 | SmartKable, LLC | Method and apparatus for monitoring condition of a splice |
US9964583B2 (en) * | 2013-02-22 | 2018-05-08 | Smartkable Llc | Method and apparatus for predicting life cycle of a splice |
CN103983913A (zh) * | 2014-05-23 | 2014-08-13 | 中铁七局集团电务工程有限公司 | 便携式25hz相敏轨道电路模拟测试仪 |
CN204086454U (zh) * | 2014-08-12 | 2015-01-07 | 云南电网公司楚雄供电局 | 一种配网线路故障定位*** |
US9970971B2 (en) | 2014-09-23 | 2018-05-15 | The Boeing Company | Flashlamp degradation monitoring system and method |
KR20160092835A (ko) | 2015-01-28 | 2016-08-05 | 에스케이하이닉스 주식회사 | 열화 감지 회로 및 이를 포함하는 열화 조정 장치 |
IL266002B2 (en) * | 2016-10-19 | 2023-09-01 | Smartkable Llc | A method and system for predicting fusion lifetime |
MX2019005537A (es) * | 2016-11-16 | 2019-08-29 | Smartkable Llc | Metodo y aparato para la prediccion de fallos en circuitos de corriente directa. |
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CN110249232A (zh) | 2019-09-17 |
RU2019117814A (ru) | 2020-12-17 |
EP3542172A1 (en) | 2019-09-25 |
MX2019005537A (es) | 2019-08-29 |
RU2019117814A3 (ja) | 2021-03-29 |
SA519401796B1 (ar) | 2022-08-09 |
KR20190087454A (ko) | 2019-07-24 |
EP3542172A4 (en) | 2020-01-08 |
US10848139B2 (en) | 2020-11-24 |
US20200059225A1 (en) | 2020-02-20 |
IL266656A (en) | 2019-07-31 |
JP2019536025A (ja) | 2019-12-12 |
EP3542172B1 (en) | 2023-06-21 |
BR112019009926A2 (pt) | 2019-08-20 |
IL266656B (en) | 2022-06-01 |
CA3043876A1 (en) | 2018-05-24 |
AU2017362981A1 (en) | 2019-07-11 |
BR112019009926B1 (pt) | 2021-07-20 |
AU2017362981B2 (en) | 2023-11-09 |
WO2018094006A1 (en) | 2018-05-24 |
EP3542172C0 (en) | 2023-06-21 |
CN110249232B (zh) | 2021-10-22 |
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