JP2021096961A - 減圧乾燥装置および減圧乾燥方法 - Google Patents
減圧乾燥装置および減圧乾燥方法 Download PDFInfo
- Publication number
- JP2021096961A JP2021096961A JP2019227773A JP2019227773A JP2021096961A JP 2021096961 A JP2021096961 A JP 2021096961A JP 2019227773 A JP2019227773 A JP 2019227773A JP 2019227773 A JP2019227773 A JP 2019227773A JP 2021096961 A JP2021096961 A JP 2021096961A
- Authority
- JP
- Japan
- Prior art keywords
- vacuum drying
- substrate
- stage
- head portion
- insertion hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001291 vacuum drying Methods 0.000 title claims abstract description 106
- 238000000034 method Methods 0.000 title claims abstract description 59
- 239000000758 substrate Substances 0.000 claims abstract description 114
- 238000003780 insertion Methods 0.000 claims abstract description 44
- 230000037431 insertion Effects 0.000 claims abstract description 44
- 239000007788 liquid Substances 0.000 claims abstract description 6
- 230000007246 mechanism Effects 0.000 claims description 87
- 230000008569 process Effects 0.000 claims description 48
- 230000003028 elevating effect Effects 0.000 claims description 24
- 230000001174 ascending effect Effects 0.000 claims description 10
- 239000011368 organic material Substances 0.000 description 11
- 238000001035 drying Methods 0.000 description 9
- 230000007723 transport mechanism Effects 0.000 description 9
- 238000005401 electroluminescence Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000002904 solvent Substances 0.000 description 4
- 230000006837 decompression Effects 0.000 description 3
- 230000014509 gene expression Effects 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000007641 inkjet printing Methods 0.000 description 3
- 238000000926 separation method Methods 0.000 description 3
- 239000004696 Poly ether ether ketone Substances 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 229920002530 polyetherether ketone Polymers 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/007—After-treatment
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B15/00—Machines or apparatus for drying objects with progressive movement; Machines or apparatus with progressive movement for drying batches of material in compact form
- F26B15/10—Machines or apparatus for drying objects with progressive movement; Machines or apparatus with progressive movement for drying batches of material in compact form with movement in a path composed of one or more straight lines, e.g. compound, the movement being in alternate horizontal and vertical directions
- F26B15/12—Machines or apparatus for drying objects with progressive movement; Machines or apparatus with progressive movement for drying batches of material in compact form with movement in a path composed of one or more straight lines, e.g. compound, the movement being in alternate horizontal and vertical directions the lines being all horizontal or slightly inclined
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B25/00—Details of general application not covered by group F26B21/00 or F26B23/00
- F26B25/02—Applications of driving mechanisms, not covered by another subclass
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B5/00—Drying solid materials or objects by processes not involving the application of heat
- F26B5/04—Drying solid materials or objects by processes not involving the application of heat by evaporation or sublimation of moisture under reduced pressure, e.g. in a vacuum
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/6875—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of individual support members, e.g. support posts or protrusions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/11—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Molecular Biology (AREA)
- Optics & Photonics (AREA)
- Drying Of Solid Materials (AREA)
- Electroluminescent Light Sources (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019227773A JP2021096961A (ja) | 2019-12-17 | 2019-12-17 | 減圧乾燥装置および減圧乾燥方法 |
TW109142744A TW202135212A (zh) | 2019-12-17 | 2020-12-04 | 減壓乾燥裝置以及減壓乾燥方法 |
KR1020200169631A KR20210077598A (ko) | 2019-12-17 | 2020-12-07 | 감압 건조 장치 및 감압 건조 방법 |
CN202011436834.9A CN112974180A (zh) | 2019-12-17 | 2020-12-10 | 减压干燥装置和减压干燥方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019227773A JP2021096961A (ja) | 2019-12-17 | 2019-12-17 | 減圧乾燥装置および減圧乾燥方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2021096961A true JP2021096961A (ja) | 2021-06-24 |
Family
ID=76344906
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019227773A Pending JP2021096961A (ja) | 2019-12-17 | 2019-12-17 | 減圧乾燥装置および減圧乾燥方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2021096961A (ko) |
KR (1) | KR20210077598A (ko) |
CN (1) | CN112974180A (ko) |
TW (1) | TW202135212A (ko) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003100732A (ja) * | 2001-09-26 | 2003-04-04 | Nec Yamagata Ltd | プラズマcvd装置のプリコート方法 |
JP3177614U (ja) * | 2012-05-31 | 2012-08-09 | 東京エレクトロン株式会社 | 減圧乾燥装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3989384B2 (ja) * | 2003-02-07 | 2007-10-10 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
JP2007073833A (ja) * | 2005-09-08 | 2007-03-22 | Dainippon Screen Mfg Co Ltd | 減圧乾燥装置及び基板乾燥方法 |
JP5089288B2 (ja) * | 2007-01-26 | 2012-12-05 | 大日本スクリーン製造株式会社 | 減圧乾燥装置 |
JP4850811B2 (ja) * | 2007-11-06 | 2012-01-11 | 東京エレクトロン株式会社 | 載置台、処理装置および処理システム |
JP6476215B2 (ja) | 2017-01-12 | 2019-02-27 | 東京エレクトロン株式会社 | 減圧乾燥装置、減圧乾燥方法及びベーク処理システム |
-
2019
- 2019-12-17 JP JP2019227773A patent/JP2021096961A/ja active Pending
-
2020
- 2020-12-04 TW TW109142744A patent/TW202135212A/zh unknown
- 2020-12-07 KR KR1020200169631A patent/KR20210077598A/ko unknown
- 2020-12-10 CN CN202011436834.9A patent/CN112974180A/zh active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003100732A (ja) * | 2001-09-26 | 2003-04-04 | Nec Yamagata Ltd | プラズマcvd装置のプリコート方法 |
JP3177614U (ja) * | 2012-05-31 | 2012-08-09 | 東京エレクトロン株式会社 | 減圧乾燥装置 |
Also Published As
Publication number | Publication date |
---|---|
CN112974180A (zh) | 2021-06-18 |
KR20210077598A (ko) | 2021-06-25 |
TW202135212A (zh) | 2021-09-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101871006B1 (ko) | 감압 건조 장치 및 감압 건조 방법 | |
JP4795899B2 (ja) | 基板載置機構および基板受け渡し方法 | |
JP5108557B2 (ja) | ロードロック装置および基板冷却方法 | |
JP6895772B2 (ja) | 検査装置およびコンタクト方法 | |
JP4849825B2 (ja) | 処理装置、位置合わせ方法、制御プログラムおよびコンピュータ記憶媒体 | |
JP6618876B2 (ja) | 基板処理装置、搬送方法およびサセプタ | |
TWI421969B (zh) | A substrate alignment device and a substrate storage unit | |
CN114570621B (zh) | 减压干燥装置 | |
JP2007073833A (ja) | 減圧乾燥装置及び基板乾燥方法 | |
JP2018040512A (ja) | 減圧乾燥装置、減圧乾燥システム、減圧乾燥方法 | |
JP2021096961A (ja) | 減圧乾燥装置および減圧乾燥方法 | |
JP6595276B2 (ja) | 基板処理装置および基板処理方法 | |
JP2007073827A (ja) | 減圧乾燥装置 | |
KR20120054004A (ko) | 기판 탑재 기구, 기판 처리 장치, 기판 탑재 기구의 제어 방법 및 기억 매체 | |
KR101927938B1 (ko) | 기판처리장치 및 기판처리방법 | |
KR20170055141A (ko) | 기판 처리장치 및 기판 처리방법 | |
JP2011058656A (ja) | 減圧乾燥装置及び減圧乾燥方法 | |
JP2020004839A (ja) | 半導体ワーク搬送装置 | |
JP6855334B2 (ja) | 基板処理装置及び基板処理方法 | |
JP2003129235A (ja) | スパッタリング方法 | |
JP2012074498A (ja) | 基板処理装置及び基板搬送方法並びにその方法を実施するためのプログラムを記憶する記憶媒体 | |
JP2023028831A (ja) | 減圧乾燥装置、減圧乾燥方法およびプログラム | |
TW202314944A (zh) | 基板處理裝置、基板處理系統以及基板處理方法 | |
JP2023036142A (ja) | 支持ピン、減圧乾燥装置および減圧乾燥方法 | |
KR100795549B1 (ko) | 기판 건조 장치 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20221003 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20230727 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20230801 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20240206 |