JP2017120239A - 粒子検出センサ - Google Patents
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- JP2017120239A JP2017120239A JP2015257505A JP2015257505A JP2017120239A JP 2017120239 A JP2017120239 A JP 2017120239A JP 2015257505 A JP2015257505 A JP 2015257505A JP 2015257505 A JP2015257505 A JP 2015257505A JP 2017120239 A JP2017120239 A JP 2017120239A
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- 238000012986 modification Methods 0.000 description 8
- 230000004048 modification Effects 0.000 description 8
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- 230000007423 decrease Effects 0.000 description 4
- 239000000443 aerosol Substances 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
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- 238000013459 approach Methods 0.000 description 3
- 238000000149 argon plasma sintering Methods 0.000 description 3
- 239000000470 constituent Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 229920000122 acrylonitrile butadiene styrene Polymers 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- -1 pollen Substances 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 238000009423 ventilation Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
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- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
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- 239000010931 gold Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0403—Mechanical elements; Supports for optical elements; Scanning arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1434—Optical arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
- G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
-
- G—PHYSICS
- G08—SIGNALLING
- G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
- G08B17/00—Fire alarms; Alarms responsive to explosion
- G08B17/10—Actuation by presence of smoke or gases, e.g. automatic alarm devices for analysing flowing fluid materials by the use of optical means
- G08B17/103—Actuation by presence of smoke or gases, e.g. automatic alarm devices for analysing flowing fluid materials by the use of optical means using a light emitting and receiving device
- G08B17/107—Actuation by presence of smoke or gases, e.g. automatic alarm devices for analysing flowing fluid materials by the use of optical means using a light emitting and receiving device for detecting light-scattering due to smoke
-
- G—PHYSICS
- G08—SIGNALLING
- G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
- G08B17/00—Fire alarms; Alarms responsive to explosion
- G08B17/10—Actuation by presence of smoke or gases, e.g. automatic alarm devices for analysing flowing fluid materials by the use of optical means
- G08B17/11—Actuation by presence of smoke or gases, e.g. automatic alarm devices for analysing flowing fluid materials by the use of optical means using an ionisation chamber for detecting smoke or gas
- G08B17/113—Constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
- G01N15/075—Investigating concentration of particle suspensions by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N2015/0042—Investigating dispersion of solids
- G01N2015/0046—Investigating dispersion of solids in gas, e.g. smoke
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N2015/1486—Counting the particles
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- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
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- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Business, Economics & Management (AREA)
- Emergency Management (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
【解決手段】検知領域DAに光を投光する投光素子10と、検知領域DAにおける粒子による投光素子10からの光の散乱光を受光する受光素子20と、受光素子20を支持する第1支持部材81aと、投光素子10を支持し、第1支持部材81aとは線膨張係数が異なる第2支持部材81bとを備え、第1支持部材81aは、受光素子20が配置される第1配置部81a1と、第2支持部材81bが配置される第2配置部81bとを有し、第1配置部81a1と第2配置部81a2とは、投光素子10の光軸J1又は受光素子20の光軸J2からの距離が異なる位置に設けられている。
【選択図】図8
Description
実施の形態に係る粒子検出センサ1について、図1〜図5を用いて説明する。図1は、実施の形態に係る粒子検出センサ1の外観斜視図である。図2は、第1筐体部81を外した状態での同粒子検出センサ1の斜視図である。図3〜図5は、同粒子検出センサ1の断面図であり、図3はYZ平面における断面図、図4は図2のIV−IV線に沿ったXY平面における断面図、図5は図2のV−V線に沿ったXY平面における断面図である。なお、図3では、投光素子10から出射した光の光線の軌跡を示している。
以上、本発明に係る粒子検出センサについて、実施の形態に基づいて説明したが、本発明は、上記の実施の形態に限定されるものではない。
10 投光素子
20 受光素子
50 投光レンズ
81a 第1支持部材
81a1 第1配置部
81a2 第2配置部
81b 第2支持部材
Claims (7)
- 検知領域に光を投光する投光素子と、
前記検知領域における粒子による前記投光素子からの光の散乱光を受光する受光素子と、
前記受光素子を支持する第1支持部材と、
前記投光素子を支持し、前記第1支持部材とは線膨張係数が異なる第2支持部材とを備え、
前記第1支持部材は、前記受光素子が配置される第1配置部と、前記第2支持部材が配置される第2配置部とを有し、
前記第1配置部と前記第2配置部とは、前記投光素子の光軸又は前記受光素子の光軸からの距離が異なる位置に設けられている、
粒子検出センサ。 - 前記第1支持部材の線膨張係数は、第2支持部材の線膨張係数よりも大きく、
前記投光素子から光が出ていない状態において、前記第1配置部と前記投光素子の光軸との距離は、前記第2配置部と前記投光素子の光軸との距離よりも大きい、
請求項1に記載の粒子検出センサ。 - 前記第1支持部材の線膨張係数は、第2支持部材の線膨張係数よりも小さく、
前記投光素子から光が出ていない状態において、前記第1配置部と前記投光素子の光軸との距離は、前記第2配置部と前記投光素子の光軸との距離よりも小さい、
請求項1に記載の粒子検出センサ。 - 前記第1支持部材と前記第2支持部材とは複数箇所で直接又は間接的に接続されている
請求項1〜3のいずれか1項に記載の粒子検出センサ。 - さらに、前記投光素子から出射する光を前記検知領域に集光する投光レンズを備え、
前記投光レンズは、前記第2支持部材とは異なる部材に支持されている
請求項1〜4のいずれか1項に記載の粒子検出センサ。 - 前記投光レンズは、前記第1支持部材に支持されている
請求項5に記載の粒子検出センサ。 - 前記投光素子から出射する光の任意断面の光強度分布は、ガウシアン分布である
請求項1〜6のいずれか1項に記載の粒子検出センサ。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015257505A JP6620983B2 (ja) | 2015-12-28 | 2015-12-28 | 粒子検出センサ |
US15/388,614 US9885602B2 (en) | 2015-12-28 | 2016-12-22 | Particle sensor |
DE102016125401.0A DE102016125401A1 (de) | 2015-12-28 | 2016-12-22 | Teilchensensor |
CN201611222497.7A CN107036940A (zh) | 2015-12-28 | 2016-12-27 | 粒子检测传感器 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015257505A JP6620983B2 (ja) | 2015-12-28 | 2015-12-28 | 粒子検出センサ |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017120239A true JP2017120239A (ja) | 2017-07-06 |
JP6620983B2 JP6620983B2 (ja) | 2019-12-18 |
Family
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Application Number | Title | Priority Date | Filing Date |
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JP2015257505A Active JP6620983B2 (ja) | 2015-12-28 | 2015-12-28 | 粒子検出センサ |
Country Status (4)
Country | Link |
---|---|
US (1) | US9885602B2 (ja) |
JP (1) | JP6620983B2 (ja) |
CN (1) | CN107036940A (ja) |
DE (1) | DE102016125401A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019044251A1 (ja) * | 2017-08-29 | 2019-03-07 | パナソニックIpマネジメント株式会社 | 粒子検出システム及び粒子検出方法 |
WO2019176608A1 (ja) * | 2018-03-15 | 2019-09-19 | オムロン株式会社 | 粒子センサおよび電子機器 |
Families Citing this family (9)
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EP3576062A4 (en) * | 2017-01-26 | 2020-09-02 | Hochiki Corporation | ALARM DEVICE |
CN110346254A (zh) * | 2018-04-05 | 2019-10-18 | Itm半导体有限公司 | 灰尘探测装置及其制造方法 |
CN112585447B (zh) * | 2018-08-21 | 2024-06-28 | ams有限公司 | 颗粒物传感器 |
US11079321B2 (en) | 2018-09-28 | 2021-08-03 | Stmicroelectronics S.R.L. | NDIR detector device for detecting gases having an infrared absorption spectrum |
US11073467B2 (en) | 2018-09-28 | 2021-07-27 | Stmicroelectronics S.R.L. | Miniaturized optical particle detector |
JP7066001B2 (ja) * | 2018-10-29 | 2022-05-12 | 京セラ株式会社 | 計測装置 |
WO2020249803A1 (en) * | 2019-06-12 | 2020-12-17 | Ams Ag | Particulate matter sensor |
EP3828529A1 (en) * | 2019-11-27 | 2021-06-02 | Carrier Corporation | Smoke detector for aspiration smoke detector system |
US11474018B2 (en) * | 2019-12-05 | 2022-10-18 | Carrier Corporation | Fluorescence enhanced LIDAR based particulate detector |
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JP2007183362A (ja) * | 2006-01-05 | 2007-07-19 | Sumitomo Electric Ind Ltd | 光モジュールの組立方法及び組立装置 |
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US20120050737A1 (en) * | 2010-08-24 | 2012-03-01 | Sony Corporation | Fine particle measurement apparatus and optical axis calibration method |
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2015
- 2015-12-28 JP JP2015257505A patent/JP6620983B2/ja active Active
-
2016
- 2016-12-22 US US15/388,614 patent/US9885602B2/en not_active Expired - Fee Related
- 2016-12-22 DE DE102016125401.0A patent/DE102016125401A1/de not_active Withdrawn
- 2016-12-27 CN CN201611222497.7A patent/CN107036940A/zh active Pending
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JPH04115051U (ja) * | 1991-03-26 | 1992-10-12 | 山武ハネウエル株式会社 | 光電式粉塵濃度計 |
JP2007183362A (ja) * | 2006-01-05 | 2007-07-19 | Sumitomo Electric Ind Ltd | 光モジュールの組立方法及び組立装置 |
JP2009116966A (ja) * | 2007-11-07 | 2009-05-28 | Hitachi Media Electoronics Co Ltd | 光ピックアップ装置 |
US20100034070A1 (en) * | 2008-08-08 | 2010-02-11 | Satoshi Arai | Optical pickup device and laser welding structure of optical components |
US20120050737A1 (en) * | 2010-08-24 | 2012-03-01 | Sony Corporation | Fine particle measurement apparatus and optical axis calibration method |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019044251A1 (ja) * | 2017-08-29 | 2019-03-07 | パナソニックIpマネジメント株式会社 | 粒子検出システム及び粒子検出方法 |
JPWO2019044251A1 (ja) * | 2017-08-29 | 2020-02-27 | パナソニックIpマネジメント株式会社 | 粒子検出システム及び粒子検出方法 |
WO2019176608A1 (ja) * | 2018-03-15 | 2019-09-19 | オムロン株式会社 | 粒子センサおよび電子機器 |
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Publication number | Publication date |
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JP6620983B2 (ja) | 2019-12-18 |
US20170184447A1 (en) | 2017-06-29 |
CN107036940A (zh) | 2017-08-11 |
US9885602B2 (en) | 2018-02-06 |
DE102016125401A1 (de) | 2017-06-29 |
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