JP2009528682A5 - - Google Patents

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JP2009528682A5
JP2009528682A5 JP2008556573A JP2008556573A JP2009528682A5 JP 2009528682 A5 JP2009528682 A5 JP 2009528682A5 JP 2008556573 A JP2008556573 A JP 2008556573A JP 2008556573 A JP2008556573 A JP 2008556573A JP 2009528682 A5 JP2009528682 A5 JP 2009528682A5
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group
phase
particles
nanoflakes
elements
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JP2008556573A
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JP2009528682A (en
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Priority claimed from US11/361,103 external-priority patent/US20070169809A1/en
Priority claimed from US11/361,497 external-priority patent/US20070163638A1/en
Priority claimed from US11/361,515 external-priority patent/US20070163640A1/en
Priority claimed from US11/361,522 external-priority patent/US20070166453A1/en
Priority claimed from US11/361,521 external-priority patent/US20070163383A1/en
Priority claimed from US11/361,433 external-priority patent/US7700464B2/en
Priority claimed from US11/394,849 external-priority patent/US20070163641A1/en
Priority claimed from US11/395,668 external-priority patent/US8309163B2/en
Priority claimed from US11/395,438 external-priority patent/US20070163643A1/en
Application filed filed Critical
Priority claimed from PCT/US2007/062766 external-priority patent/WO2007101138A2/en
Publication of JP2009528682A publication Critical patent/JP2009528682A/en
Publication of JP2009528682A5 publication Critical patent/JP2009528682A5/ja
Pending legal-status Critical Current

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Claims (19)

粒子の約50%以上がIB族元素、IIIA族元素、およびVIA族元素のうちの少なくとも1つから選ばれる少なくとも1つの元素を含む非球状の平面形状フレークであるとともに、前記インクに含まれるIB族元素、IIIA族元素およびVIA族元素の全体量は、前記インク中で所望の化学量論比を有している、粒子からインクを調製する工程と、About 50% or more of the particles are non-spherical planar flakes containing at least one element selected from at least one of group IB elements, group IIIA elements, and group VIA elements, and IB contained in the ink A total amount of Group elements, Group IIIA elements and Group VIA elements having a desired stoichiometric ratio in the ink, and preparing the ink from particles;
前駆体層を形成すべく前記インクにより基板をコーティングする工程と、Coating a substrate with the ink to form a precursor layer;
高密度の薄膜を形成すべく好適な雰囲気下で前記前駆体層を加工する1つ以上の工程とを備える方法。And one or more steps of processing the precursor layer under a suitable atmosphere to form a high density thin film.
前記インクは分散された形態にある、請求項1に記載の方法。The method of claim 1, wherein the ink is in a dispersed form. 少なくとも前記インク中の一部の前記粒子が少なくとも1つのIB−IIIA族元素の金属間合金相を含む金属間ナノフレーク粒子である、請求項1又は2に記載の方法。3. The method of claim 1 or 2, wherein at least some of the particles in the ink are intermetallic nanoflakes particles comprising an intermetallic alloy phase of at least one IB-IIIA element. 前記金属間相が最終固溶体相及び固溶体相のいずれでもない、請求項3に記載の方法。The method of claim 3, wherein the intermetallic phase is neither a final solid solution phase nor a solid solution phase. 金属間粒子に含まれるIB族元素が、全粒子中のIB族元素の約50モル%未満である請求項1に記載の方法。The method of claim 1, wherein the group IB element contained in the intermetallic particles is less than about 50 mol% of the group IB element in all particles. 前記金属間物質がCuThe intermetallic substance is Cu 1 InIn 2 、δ相のCu, Δ phase Cu 1 InIn 2 、δ相のCu, Δ phase Cu 1 InIn 2 とCuAnd Cu 1616 InIn 9 で定義される相の中間の組成、CuAn intermediate composition of the phase defined by Cu, 1 GaGa 2 、中間固溶体のCuIntermediate solid solution Cu 1 GaGa 2 、Cu, Cu 6868 GaGa 3838 、Cu, Cu 7070 GaGa 3030 、Cu, Cu 7575 GaGa 2525 、前記最終固溶体とその隣の中間固溶体の中間の相の組成のCu−Ga、γ, Cu-Ga, γ of the composition of the intermediate phase between the final solid solution and the adjacent intermediate solid solution 1 相(約31.8〜約39.8重量%Ga)の組成のCu−Ga、γCu—Ga, γ of composition of phase (about 31.8 to about 39.8 wt% Ga) 2 相(約36.0〜約39.9重量%Ga)の組成のCu−Ga、γCu—Ga, γ of composition of phase (about 36.0 to about 39.9 wt% Ga) 3 相(約39.7〜約−44.9重量%Ga)の組成のCu−Ga、θ相(約66.7〜約68.7重量%Ga)の組成のCu−Ga、γCu-Ga having a composition of a phase (about 39.7 to about -44.9 wt% Ga), Cu-Ga having a composition of a θ phase (about 66.7 to about 68.7 wt% Ga), γ 2 相とγPhase and γ 3 相の中間の組成のCu−Ga、最終固溶体とγCu-Ga with intermediate composition between phases, final solid solution and γ 1 相の中間の組成のCu−Ga、及びCuに富むCu−Gaからなる群のいずれか1つを含む請求項1に記載の方法。The method according to claim 1, comprising any one of the group consisting of Cu—Ga having an intermediate composition of phases and Cu—Ga rich in Cu. IIIA族元素としてガリウムが懸濁ナノ球体の形状で組み込まれる請求項3に記載の方法。4. The method of claim 3, wherein gallium is incorporated as a group IIIA element in the form of suspended nanospheres. 前記ガリウムのナノ球体が溶液中の液体ガリウムのエマルジョンを生成すThe gallium nanospheres produce an emulsion of liquid gallium in solution
ることにより形成される請求項7記載の方法。8. The method of claim 7, wherein the method is formed by:
前記ガリウムが室温未満の温度まで急冷される請求項7記載の方法。The method of claim 7, wherein the gallium is quenched to a temperature below room temperature. さらに、アルミニウム、テルル、または硫黄から選ばれる1つ以上の元素状粒子の混合物を添加する工程を備える、請求項1に記載の方法。The method of claim 1, further comprising adding a mixture of one or more elemental particles selected from aluminum, tellurium, or sulfur. 前記好適な雰囲気が、セレン、硫黄、テルル、HThe preferred atmosphere is selenium, sulfur, tellurium, H 2 、CO、H, CO, H 2 Se、HSe, H 2 S、Ar、およびNS, Ar, and N 2 からなるグループのうちの少なくとも1つの元素または化合物、または前記の組合せまたは混合物を含む請求項1に記載の方法。The method of claim 1 comprising at least one element or compound of the group consisting of: or a combination or mixture of said. 一以上のクラスの前記粒子がアルミニウム(Al)、硫黄(S)、ナトリウム(Na)、カリウム(K)、またはリチウム(Li)からなるグループから選ばれる一以上の無機物質によりドープされる請求項1に記載の方法。The one or more classes of the particles are doped with one or more inorganic materials selected from the group consisting of aluminum (Al), sulfur (S), sodium (Na), potassium (K), or lithium (Li). The method according to 1. 粒子の約過半数がIB族元素、IIIA族元素、およびVIA族元素から選ばれる少なくとも1つの元素を含む非球状の平面形状ナノフレークである、請求項1に記載の方法。The method of claim 1, wherein about a majority of the particles are non-spherical planar nanoflakes comprising at least one element selected from Group IB elements, Group IIIA elements, and Group VIA elements. さらに、前記ナノフレークをセレンおよび/またはセレン化物を含む少なくとも1つの層でコーティングすることを含む請求項13に記載の方法。14. The method of claim 13, further comprising coating the nanoflakes with at least one layer comprising selenium and / or selenides. 前記ナノフレークが少なくとも10以上のアスペクト比を有する請求項13に記載の方法。The method of claim 13, wherein the nanoflakes have an aspect ratio of at least 10 or more. 前記ナノフレークが少なくとも15以上のアスペクト比を有する請求項13に記載の方法。The method of claim 13, wherein the nanoflakes have an aspect ratio of at least 15 or greater. 前記ナノフレークがナトリウムを含む請求項13に記載の方法。The method of claim 13, wherein the nanoflakes comprise sodium. 前記ナノフレークがCu−Na、In−Na、Ga−Na、Cu−In−Na、Cu−Ga−Na、In−Ga−Na、Na−Se、Cu−Se−Na、In−Se−Na、Ga−Se−Na、Cu−In−Se−Na、Cu−Ga−Se−Na、In−Ga−Se−Na、Cu−In−Ga−Se−Na、Na−S、Cu−S−Na、In−S−Na、Ga−S−Na、Cu−In−S−Na、Cu−Ga−S−Na、In−Ga−S−Na、またはCu−In−Ga−S−Naのうち少なくとも1つの物質を含む請求項13に記載の方法。The nanoflakes are Cu-Na, In-Na, Ga-Na, Cu-In-Na, Cu-Ga-Na, In-Ga-Na, Na-Se, Cu-Se-Na, In-Se-Na, Ga-Se-Na, Cu-In-Se-Na, Cu-Ga-Se-Na, In-Ga-Se-Na, Cu-In-Ga-Se-Na, Na-S, Cu-S-Na, At least one of In-S-Na, Ga-S-Na, Cu-In-S-Na, Cu-Ga-S-Na, In-Ga-S-Na, or Cu-In-Ga-S-Na. 14. The method of claim 13, comprising one substance. 請求項1〜18のいずれか一項に記載の方法に従って製造される、太陽電池。The solar cell manufactured according to the method as described in any one of Claims 1-18.
JP2008556573A 2006-02-23 2007-02-23 High throughput semiconductor precursor layer printing with intermetallic nanoflakes particles Pending JP2009528682A (en)

Applications Claiming Priority (10)

Application Number Priority Date Filing Date Title
US11/361,522 US20070166453A1 (en) 2004-02-19 2006-02-23 High-throughput printing of chalcogen layer
US11/361,521 US20070163383A1 (en) 2004-02-19 2006-02-23 High-throughput printing of nanostructured semiconductor precursor layer
US11/361,433 US7700464B2 (en) 2004-02-19 2006-02-23 High-throughput printing of semiconductor precursor layer from nanoflake particles
US11/361,103 US20070169809A1 (en) 2004-02-19 2006-02-23 High-throughput printing of semiconductor precursor layer by use of low-melting chalcogenides
US11/361,515 US20070163640A1 (en) 2004-02-19 2006-02-23 High-throughput printing of semiconductor precursor layer by use of chalcogen-rich chalcogenides
US11/361,497 US20070163638A1 (en) 2004-02-19 2006-02-23 Photovoltaic devices printed from nanostructured particles
US11/395,668 US8309163B2 (en) 2004-02-19 2006-03-30 High-throughput printing of semiconductor precursor layer by use of chalcogen-containing vapor and inter-metallic material
US11/394,849 US20070163641A1 (en) 2004-02-19 2006-03-30 High-throughput printing of semiconductor precursor layer from inter-metallic nanoflake particles
US11/395,438 US20070163643A1 (en) 2004-02-19 2006-03-30 High-throughput printing of chalcogen layer and the use of an inter-metallic material
PCT/US2007/062766 WO2007101138A2 (en) 2006-02-23 2007-02-23 High-throughput printing of semiconductor precursor layer from inter-metallic nanoflake particles

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JP2012220990A Division JP2013033987A (en) 2006-02-23 2012-10-03 High-throughput printing of semiconductor precursor layer with inter-metallic nanoflake particle

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JP2009528682A JP2009528682A (en) 2009-08-06
JP2009528682A5 true JP2009528682A5 (en) 2010-04-15

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JP2008556573A Pending JP2009528682A (en) 2006-02-23 2007-02-23 High throughput semiconductor precursor layer printing with intermetallic nanoflakes particles
JP2012220990A Pending JP2013033987A (en) 2006-02-23 2012-10-03 High-throughput printing of semiconductor precursor layer with inter-metallic nanoflake particle

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EP (1) EP1997150A2 (en)
JP (2) JP2009528682A (en)
CN (2) CN101443919B (en)
WO (1) WO2007101138A2 (en)

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