JP2007115739A5 - - Google Patents

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Publication number
JP2007115739A5
JP2007115739A5 JP2005302709A JP2005302709A JP2007115739A5 JP 2007115739 A5 JP2007115739 A5 JP 2007115739A5 JP 2005302709 A JP2005302709 A JP 2005302709A JP 2005302709 A JP2005302709 A JP 2005302709A JP 2007115739 A5 JP2007115739 A5 JP 2007115739A5
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Japan
Prior art keywords
manufacturing
semiconductor device
conductive layer
laser beam
composition
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JP2005302709A
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Japanese (ja)
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JP4732118B2 (en
JP2007115739A (en
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Priority to JP2005302709A priority Critical patent/JP4732118B2/en
Priority claimed from JP2005302709A external-priority patent/JP4732118B2/en
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Publication of JP2007115739A5 publication Critical patent/JP2007115739A5/ja
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Publication of JP4732118B2 publication Critical patent/JP4732118B2/en
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Claims (10)

導電性粒子を含む組成物を基板上に塗布し、
酸素雰囲気において前記組成物に第1のレーザ光を照射して第1の導電層を形成し、
窒素、希ガス、水素のいずれかの雰囲気において、前記第1の導電層に第2のレーザ光を照射して第2の導電層を形成し、
前記第2の導電層上に絶縁層を形成することを特徴とする半導体装置の作製方法。
Applying a composition containing conductive particles on a substrate,
Irradiating the composition with a first laser beam in an oxygen atmosphere to form a first conductive layer;
Irradiating the first conductive layer with a second laser beam in an atmosphere of nitrogen, rare gas, or hydrogen to form a second conductive layer;
A method for manufacturing a semiconductor device, wherein an insulating layer is formed over the second conductive layer.
導電性粒子を含む組成物を基板上に塗布し、Applying a composition containing conductive particles on a substrate,
酸素雰囲気において前記組成物に第1のレーザ光を照射することによって、前記組成物よりも導電性粒子の密度が高く、表面が平滑な第1の導電層を形成し、By irradiating the composition with a first laser beam in an oxygen atmosphere, a first conductive layer having a higher density of conductive particles than the composition and a smooth surface is formed.
窒素、希ガス、水素のいずれかの雰囲気において、前記第1の導電層に第2のレーザ光を照射することによって、前記第1の導電層よりも抵抗値が低い第2の導電層を形成し、By irradiating the first conductive layer with a second laser beam in an atmosphere of nitrogen, rare gas, or hydrogen, a second conductive layer having a resistance value lower than that of the first conductive layer is formed. And
前記第2の導電層上に絶縁層を形成することを特徴とする半導体装置の作製方法。A method for manufacturing a semiconductor device, wherein an insulating layer is formed over the second conductive layer.
請求項1または2において前記第2の導電層は、配線、アンテナ、または電極として機能することを特徴とする半導体装置の作製方法。 The method for manufacturing a semiconductor device according to claim 1 , wherein the second conductive layer functions as a wiring, an antenna, or an electrode. 請求項1乃至3のいずれか一項において前記絶縁層はゲート絶縁層、発光物質を含む層または液晶層であることを特徴とする半導体装置の作製方法。 4. The method for manufacturing a semiconductor device according to claim 1 , wherein the insulating layer is a gate insulating layer , a layer containing a light-emitting substance, or a liquid crystal layer . 請求項乃至のいずれか一項において、前記組成物は、遮光性を有することを特徴とする半導体装置の作製方法。 In any one of claims 1 to 4, wherein the composition is a method for manufacturing a semiconductor device characterized by having a light-shielding property. 請求項において、前記第1のレーザ光及び第2のレーザ光は、可視領域または赤外領域のレーザ光であることを特徴とする半導体装置の作製方法。 6. The method for manufacturing a semiconductor device according to claim 5 , wherein the first laser beam and the second laser beam are laser beams in a visible region or an infrared region. 請求項乃至のいずれか一項において、前記第2の導電層は、透光性を有することを特徴とする半導体装置の作製方法。 In any one of claims 1 to 4, wherein the second conductive layer, a method for manufacturing a semiconductor device, characterized in that a light-transmitting. 請求項において、前記第1のレーザ光及び第2のレーザ光は、紫外領域のレーザ光であることを特徴とする半導体装置の作製方法。 8. The method for manufacturing a semiconductor device according to claim 7 , wherein the first laser beam and the second laser beam are laser beams in an ultraviolet region. 請求項乃至のいずれか一項において、前記酸素雰囲気は、10〜100vol%の酸素を含むことを特徴とする半導体装置の作製方法。 In any one of claims 1 to 8, wherein the oxygen atmosphere, a method for manufacturing a semiconductor device characterized by containing oxygen 10~100vol%. 請求項1乃至9のいずれか一において、前記第2のレーザ光のエネルギーまたはパワーは、前記第1のレーザ光のエネルギーまたはパワーよりも大きいことを特徴とする半導体装置の作製方法。10. The method for manufacturing a semiconductor device according to claim 1, wherein the energy or power of the second laser light is larger than the energy or power of the first laser light.
JP2005302709A 2005-10-18 2005-10-18 Method for manufacturing semiconductor device Expired - Fee Related JP4732118B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005302709A JP4732118B2 (en) 2005-10-18 2005-10-18 Method for manufacturing semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005302709A JP4732118B2 (en) 2005-10-18 2005-10-18 Method for manufacturing semiconductor device

Publications (3)

Publication Number Publication Date
JP2007115739A JP2007115739A (en) 2007-05-10
JP2007115739A5 true JP2007115739A5 (en) 2008-10-23
JP4732118B2 JP4732118B2 (en) 2011-07-27

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JP2005302709A Expired - Fee Related JP4732118B2 (en) 2005-10-18 2005-10-18 Method for manufacturing semiconductor device

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Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8334537B2 (en) * 2007-07-06 2012-12-18 Semiconductor Energy Laboratory Co., Ltd. Light-emitting device
JP2009290112A (en) * 2008-05-30 2009-12-10 Fujifilm Corp Conductive inorganic film, method for manufacturing thereof, wiring board, and semiconductor device
FR2958075B1 (en) * 2010-03-24 2012-03-23 Univ Paris Curie METHOD FOR PRODUCING A METAL ELECTRODE ON THE SURFACE OF A HYDROPHOBIC MATERIAL
JP2012023285A (en) * 2010-07-16 2012-02-02 Seiko Instruments Inc Method of manufacturing tft using photosensitive application-type electrode material
CN105006656B (en) * 2015-07-24 2017-09-29 哈尔滨工业大学 Automatically controlled scanning wave guide wave leakage antenna based on liquid crystal

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3690552B2 (en) * 1997-05-02 2005-08-31 株式会社アルバック Metal paste firing method
JP2002339076A (en) * 2001-05-16 2002-11-27 Jsr Corp Method for forming metallic copper thin film and composition for forming copper thin film
JP4932150B2 (en) * 2003-10-21 2012-05-16 株式会社半導体エネルギー研究所 Manufacturing method of semiconductor element

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