JP2007023273A - Epoxy resin molding compound for sealing use and electronic component device - Google Patents

Epoxy resin molding compound for sealing use and electronic component device Download PDF

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JP2007023273A
JP2007023273A JP2006167586A JP2006167586A JP2007023273A JP 2007023273 A JP2007023273 A JP 2007023273A JP 2006167586 A JP2006167586 A JP 2006167586A JP 2006167586 A JP2006167586 A JP 2006167586A JP 2007023273 A JP2007023273 A JP 2007023273A
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epoxy resin
sealing
resin molding
molding material
component
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Hisanori Watanabe
尚紀 渡辺
Seiichi Akagi
清一 赤城
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Showa Denko Materials Co Ltd
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Hitachi Chemical Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an epoxy resin molding compound for sealing use realizing high flame retardancy, excellent in moldability such as fluidity, and also exhibiting high resistance to resin deterioration at high temperatures and semiconductor insert member deterioration, etc., and to provide an electronic component device equipped with elements sealed with this molding compound. <P>SOLUTION: The epoxy resin molding compound for sealing use comprises (A) an epoxy resin including an epoxy resin obtained by glycidyl etherification of at least either one dimer of hydroxynaphthalene and dihydroxynaphthalene, (B) a curing agent comprising an aromatic monomer compound having two or more phenolic hydroxy groups and (C) an inorganic filler. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、封止用エポキシ樹脂成形材料、及びこの封止用エポキシ樹脂成形材料で封止した素子を備えた電子部品装置に関する。   The present invention relates to an epoxy resin molding material for sealing, and an electronic component device including an element sealed with the epoxy resin molding material for sealing.

従来から、トランジスタ、IC、LSI等の電子部品装置の素子封止の分野では生産性、コスト等の面から樹脂封止が主流となり、エポキシ樹脂成形材料が広く用いられている。この理由としては、エポキシ樹脂が電気特性、耐湿性、耐熱性、機械特性、インサート品との接着性などの諸特性にバランスがとれているためである。   Conventionally, in the field of element sealing of electronic component devices such as transistors, ICs, and LSIs, resin sealing has been the mainstream in terms of productivity and cost, and epoxy resin molding materials have been widely used. This is because epoxy resins are balanced in various properties such as electrical properties, moisture resistance, heat resistance, mechanical properties, and adhesiveness with inserts.

自動車分野用途の電子機器には、従来より、耐熱性(耐高温放置特性)や耐温度サイクル性等において、パーソナルコンピュータ、家電等のいわゆる民生用途に比べて厳しい信頼性が求められることが多かったが、近年、省資源化・環境保護等の観点から、いわゆるハイブリッド車、燃料電池車等の開発が盛んとなるに及び、これらに使用される電子機器には、特に耐熱性等において一段と厳しい信頼性が求められる状況が予想されている。
また、やはり環境保護の観点から、封止用エポキシ樹脂成形材料にこれまで難燃剤として使用されてきたハロゲン化エポキシ樹脂やアンチモン化合物の低減または全廃等、いわゆるノンハロゲン化・ノンアンチモン化の要求も強まっている。ハロゲン化エポキシ樹脂やアンチモン化合物はまた、プラスチック封止ICの高温放置特性に悪影響を及ぼすことが知られており、この観点からもハロゲン化エポキシ樹脂・アンチモン化合物の低減・全廃が望まれている。
Conventionally, electronic devices for use in the automobile field have often been required to have stricter reliability in heat resistance (temperature-resistant standing characteristics) and temperature cycle resistance compared to so-called consumer applications such as personal computers and home appliances. However, in recent years, from the viewpoint of resource saving and environmental protection, so-called hybrid vehicles, fuel cell vehicles, etc. have been actively developed. The situation where sex is required is expected.
Also from the viewpoint of environmental protection, the demand for so-called non-halogenation and non-antimony conversion, such as reduction or complete elimination of halogenated epoxy resins and antimony compounds that have been used as flame retardants in sealing epoxy resin molding materials, has increased. ing. Halogenated epoxy resins and antimony compounds are also known to have an adverse effect on the high temperature storage characteristics of plastic encapsulated ICs. From this viewpoint, reduction or total elimination of halogenated epoxy resins and antimony compounds is desired.

電子機器の耐熱性を高める一般的な手法としては、パッケージのガラス転移点を高める等の手法が挙げられ、具体的には、例えば封止用成形材料でトリフェニルメタン型エポキシ樹脂とトリフェニルメタン型フェノール樹脂等、いわゆる多官能型エポキシ樹脂と多官能型フェノール樹脂とを組み合わせる等の手法が知られているが、この手法は、クロルイオンを主とする不純物の増加を招くことが多い。クロルイオン等の不純物の増加に対しては、特定のイオン捕捉剤を併用することでこれを解決しようとの報告(例えば特許文献1参照。)もあるが、その効果は必ずしも充分ではない。   General techniques for increasing the heat resistance of electronic devices include techniques such as increasing the glass transition point of the package. Specifically, for example, triphenylmethane type epoxy resin and triphenylmethane are used as molding molding materials. A technique such as combining a so-called polyfunctional epoxy resin and a polyfunctional phenol resin, such as a type phenol resin, is known, but this technique often leads to an increase in impurities mainly composed of chloro ions. Although there is a report (for example, refer to Patent Document 1) that an increase in impurities such as chloro ions can be solved by using a specific ion scavenger in combination, the effect is not always sufficient.

上記多官能型エポキシ樹脂と多官能型フェノール樹脂とで構成される封止用エポキシ樹脂成形材料はまた、相対的に難燃性に劣り、ノンハロゲン・ノンアンチモン系にて難燃性を付与しようとした場合、一般に多量の難燃剤の添加が必要となることが多い。ハロゲン化エポキシ樹脂やアンチモン化合物を用いずに難燃化を達成する手法の一つとしては、有機リン系化合物を添加する方法(例えば特許文献2参照。)、金属水酸化物を添加する方法(例えば特許文献3参照。)等の提案がなされているが、それぞれガラス転移点の低下を招く、成形性に悪影響を及ぼす等の問題を必ずしも解決できていない。
特許第3292456号公報 特開平9−235449号公報 特開平9−241483号公報
The sealing epoxy resin molding material composed of the above polyfunctional epoxy resin and polyfunctional phenolic resin is also relatively inferior in flame retardancy and tries to impart flame retardancy in a non-halogen / non-antimony system. In general, it is often necessary to add a large amount of flame retardant. As one of the methods for achieving flame retardancy without using a halogenated epoxy resin or an antimony compound, a method of adding an organophosphorus compound (see, for example, Patent Document 2), a method of adding a metal hydroxide ( For example, Patent Document 3) has been proposed, but problems such as a decrease in glass transition point and an adverse effect on formability have not been solved.
Japanese Patent No. 3292456 JP 9-235449 A Japanese Patent Laid-Open No. 9-241383

本発明はかかる状況に鑑みなされたもので、良好な難燃性を実現し、流動性等の成形性に優れ、高温下での樹脂劣化及び半導体インサートの部材劣化等にも優れた耐熱性を示す封止用エポキシ樹脂成形材料、及びこれにより封止した素子を備えた電子部品装置を提供しようとするものである。   The present invention has been made in view of such circumstances, and realizes good flame retardancy, excellent moldability such as fluidity, and excellent heat resistance such as resin deterioration at high temperatures and semiconductor insert member deterioration. It is an object of the present invention to provide an epoxy resin molding material for sealing, and an electronic component device including an element sealed thereby.

本発明者らは上記の課題を解決するために鋭意検討を重ねた結果、封止用エポキシ樹脂成形材料に、特定の構造を有するエポキシ樹脂と特定の構造を有する硬化剤、及び無機充填剤を用いることにより上記の目的を達成しうることを見い出し、本発明を完成するに至った。   As a result of intensive studies in order to solve the above problems, the present inventors have determined that an epoxy resin molding material for sealing, an epoxy resin having a specific structure, a curing agent having a specific structure, and an inorganic filler are used. It has been found that the above object can be achieved by using it, and the present invention has been completed.

本発明は、以下(1)〜(6)に関する。
(1)(A)成分として、ヒドロキシナフタレン及びジヒドロキシナフタレンの少なくともいずれかの2量体をグリシジルエーテル化して得られるエポキシ樹脂を含むエポキシ樹脂、(B)成分として、2個以上のフェノール系水酸基を有する芳香族モノマー化合物を含む硬化剤、(C)成分として無機充填剤を含有する封止用エポキシ樹脂成形材料。
The present invention relates to the following (1) to (6).
(1) An epoxy resin containing an epoxy resin obtained by glycidyl etherification of at least one dimer of hydroxynaphthalene or dihydroxynaphthalene as the component (A), and two or more phenolic hydroxyl groups as the component (B) A curing agent containing an aromatic monomer compound having an epoxy resin molding material for sealing containing an inorganic filler as the component (C).

(2)前記芳香族モノマー化合物のアルキル基及びアルキレン基の分子内質量比率が合計で20%以下である前記(1)記載の封止用エポキシ樹脂成形材料。
(3)(B)成分の硬化剤が、2個以上のフェノール系水酸基を有し、かつ、アルキル基及びアルキレン基のいずれをも含まない芳香族モノマー化合物を含有する前記(1)または(2)に記載の封止用エポキシ樹脂成形材料。
(4)(D)成分として、さらに下記一般式(I)で表されるハイドロタルサイト類化合物を含有する、前記(1)〜(3)のいずれかに記載の封止用エポキシ樹脂成形材料。
(化1)
Mg1−XAl(OH)(An−X/n・mHO ・・・(I)
(ただし、一般式(I)で、0<X≦0.5、mは0又は正の数、An−はn価の陰イオンを表す。)
(5)ハロゲン系難燃剤及びアンチモン系難燃剤を含まない前記(1)〜(4)のいずれかに記載の封止用エポキシ樹脂成形材料。
(2) The epoxy resin molding material for sealing according to (1), wherein the intramolecular mass ratio of the alkyl group and the alkylene group of the aromatic monomer compound is 20% or less in total.
(3) The (1) or (2), wherein the curing agent of the component (B) contains an aromatic monomer compound having two or more phenolic hydroxyl groups and containing neither an alkyl group nor an alkylene group. The epoxy resin molding material for sealing as described in).
(4) The epoxy resin molding material for sealing according to any one of (1) to (3), which further contains a hydrotalcite compound represented by the following general formula (I) as the component (D): .
(Chemical formula 1)
Mg 1-X Al X (OH) 2 (A n− ) X / n · mH 2 O (I)
(However, in the general formula (I), 0 <X ≦ 0.5, m is 0 or a positive number, A n-represents an n-valent anion.)
(5) The epoxy resin molding material for sealing according to any one of (1) to (4), which does not contain a halogen flame retardant and an antimony flame retardant.

(6)前記(1)〜(5)のいずれかに記載の封止用エポキシ樹脂成形材料により封止された素子を備えた電子部品装置。 (6) An electronic component device including an element sealed with the sealing epoxy resin molding material according to any one of (1) to (5).

本発明になる封止用エポキシ樹脂成形材料は、ハロゲン化エポキシ樹脂やアンチモン化合物を用いることなく良好な難燃性を実現し、流動性等の成形性、耐熱性等の信頼性に優れ、この封止用エポキシ樹脂成形材料を用いてIC、LSI等の電子部品を封止すれば、成形性や信頼性に優れた電子部品装置を得ることができ、その工業的価値は大である。   The epoxy resin molding material for sealing according to the present invention realizes good flame retardancy without using a halogenated epoxy resin or an antimony compound, and is excellent in moldability such as fluidity and reliability such as heat resistance. If an electronic component such as an IC or LSI is sealed using an epoxy resin molding material for sealing, an electronic component device having excellent moldability and reliability can be obtained, and its industrial value is great.

本発明の封止用エポキシ樹脂成形材料では、特に高い耐熱性を実現する為に、(A)成分のエポキシ樹脂として、ヒドロキシナフタレン及びジヒドロキシナフタレンの少なくともいずれかの2量体をグリシジルエーテル化して得られるエポキシ樹脂を単独又は二種以上併用して含んでいる。高い耐熱性実現の為には、ヒドロキシナフタレン及びジヒドロキシナフタレンの2量体をグリシジルエーテル化して得られる3官能のエポキシ樹脂を用いることが好ましく、ジヒドロキシナフタレンの2量体をグリシジルエーテル化して得られる4官能のエポキシ樹脂を用いることがより好ましく、これらの混合物を用いても良い。   The epoxy resin molding material for sealing of the present invention is obtained by glycidyl etherification of at least one dimer of hydroxynaphthalene and dihydroxynaphthalene as the epoxy resin of component (A) in order to achieve particularly high heat resistance. These epoxy resins are used alone or in combination of two or more. In order to achieve high heat resistance, it is preferable to use a trifunctional epoxy resin obtained by glycidyl etherification of a dimer of hydroxynaphthalene and dihydroxynaphthalene, and 4 obtained by glycidyl etherification of a dihydroxynaphthalene dimer. It is more preferable to use a functional epoxy resin, and a mixture thereof may be used.

上記したエポキシ樹脂は、硬化物に高いガラス転移点を与えるとともに、高温下で熱分解等を起こし易いと言われるアルキル基やアルキレン基が相対的に少なく、樹脂の熱劣化といった点でも有利である。ジヒドロキシナフタレンの2量体をグリシジルエーテル化して得られるエポキシ樹脂を主成分とするエポキシ樹脂としては、市販品としてHP−4700(大日本インキ化学工業株式会社製商品名)等が入手可能である。   The above-mentioned epoxy resin gives a high glass transition point to the cured product and has relatively few alkyl groups and alkylene groups which are said to easily cause thermal decomposition at high temperatures, and is advantageous in terms of thermal degradation of the resin. . As an epoxy resin mainly composed of an epoxy resin obtained by glycidyl etherification of a dihydroxynaphthalene dimer, HP-4700 (trade name, manufactured by Dainippon Ink & Chemicals, Inc.) is available as a commercial product.

本発明の効果を充分得る為には、前記ヒドロキシナフタレン及びジヒドロキシナフタレンの少なくともいずれかの2量体をグリシジルエーテル化して得られるエポキシ樹脂を(A)成分全体の50質量%以上とすることが好ましく、60質量%以上とすることがより好ましく、70質量%以上とすることが特に好ましい。50質量%未満だと、特に高温下での樹脂の熱劣化に対して不利となる可能性がある。   In order to sufficiently obtain the effects of the present invention, it is preferable that the epoxy resin obtained by glycidyl etherification of at least one dimer of hydroxynaphthalene and dihydroxynaphthalene is 50% by mass or more of the total component (A). More preferably, the content is 60% by mass or more, and particularly preferably 70% by mass or more. If it is less than 50% by mass, it may be disadvantageous for the thermal deterioration of the resin particularly at high temperatures.

本発明では、(A)成分のエポキシ樹脂として、前記2量体をグリシジルエーテル化して得られるエポキシ樹脂の他に、封止用エポキシ樹脂成形材料に一般に使用されているエポキシ樹脂を特に制限なく併用することが可能である。併用可能な樹脂として、例えばフェノールノボラック型エポキシ樹脂、オルソクレゾールノボラック型エポキシ樹脂をはじめとするフェノール、クレゾール、キシレノール、レゾルシン、カテコール、ビスフェノールA、ビスフェノールF等のフェノール類及び/又はα−ナフトール、β−ナフトール、ジヒドロキシナフタレン等のナフトール類とホルムアルデヒド、アセトアルデヒド、プロピオンアルデヒド、ベンズアルデヒド、サリチルアルデヒド等のアルデヒド基を有する化合物とを酸性触媒下で縮合又は共縮合させて得られるノボラック樹脂をエポキシ化したもの;ビスフェノールA、ビスフェノールF、ビスフェノールS、ビスフェノールA/D等のジグリシジルエーテル;アルキル置換又は非置換のビフェノールのジグリシジルエーテルであるビフェニル型エポキシ樹脂;フェノール類とジメトキシパラキシレン又はビス(メトキシメチル)ビフェニルから合成されるフェノール・アラルキル型樹脂やビフェニレン骨格フェノール・アラルキル型樹脂、ナフトール・アラルキル型樹脂等アラルキル型樹脂のエポキシ化物;スチルベン型エポキシ樹脂;ハイドロキノン型エポキシ樹脂;フタル酸、ダイマー酸等の多塩基酸とエピクロルヒドリンの反応により得られるグリシジルエステル型エポキシ樹脂;ジアミノジフェニルメタン、イソシアヌル酸等のポリアミンとエピクロルヒドリンの反応により得られるグリシジルアミン型エポキシ樹脂;ジシクロペンタジエンとフェノール類の共縮合樹脂のエポキシ化物であるジシクロペンタジエン型エポキシ樹脂;トリフェノールメタン型エポキシ樹脂トリメチロールプロパン型エポキシ樹脂;テルペン変性エポキシ樹脂;オレフィン結合を過酢酸等の過酸で酸化して得られる線状脂肪族エポキシ樹脂;脂環族エポキシ樹脂;及びこれらのエポキシ樹脂をシリコーン、アクリロニトリル、ブタジエン、イソプレン系ゴム、ポリアミド系樹脂等により変性したエポキシ樹脂などが挙げられる。   In the present invention, as the epoxy resin of component (A), in addition to the epoxy resin obtained by glycidyl etherification of the dimer, an epoxy resin generally used for an epoxy resin molding material for sealing is used in combination without any particular limitation. Is possible. Examples of resins that can be used in combination include phenol novolac type epoxy resins, orthocresol novolac type epoxy resins, and other phenols such as phenol, cresol, xylenol, resorcin, catechol, bisphenol A, bisphenol F, and / or α-naphthol, β -Epoxidized novolak resin obtained by condensation or cocondensation of naphthols such as naphthol and dihydroxynaphthalene and compounds having an aldehyde group such as formaldehyde, acetaldehyde, propionaldehyde, benzaldehyde and salicylaldehyde under an acidic catalyst; Diglycidyl ethers such as bisphenol A, bisphenol F, bisphenol S, bisphenol A / D; diglycidyl ether of alkyl-substituted or unsubstituted biphenol Biphenyl-type epoxy resin that is ether; epoxy of aralkyl type resin such as phenol / aralkyl type resin, biphenylene skeleton phenol / aralkyl type resin, naphthol / aralkyl type resin synthesized from phenol and dimethoxyparaxylene or bis (methoxymethyl) biphenyl Stilbene type epoxy resin; hydroquinone type epoxy resin; glycidyl ester type epoxy resin obtained by reaction of polybasic acid such as phthalic acid and dimer acid and epichlorohydrin; obtained by reaction of polyamine such as diaminodiphenylmethane and isocyanuric acid and epichlorohydrin Glycidylamine type epoxy resin; dicyclopentadiene type epoxy resin that is an epoxidized product of co-condensation resin of dicyclopentadiene and phenols; triphenol Tan type epoxy resin Trimethylolpropane type epoxy resin; Terpene modified epoxy resin; Linear aliphatic epoxy resin obtained by oxidizing olefinic bond with peracid such as peracetic acid; Alicyclic epoxy resin; and these epoxy resins Examples thereof include epoxy resins modified with silicone, acrylonitrile, butadiene, isoprene rubber, polyamide resin, and the like.

本発明では、高温下での樹脂の熱劣化を防止する観点から、(B)成分の硬化剤として、2個以上のフェノール系水酸基を有する芳香族モノマー化合物(以下、芳香族モノマーともいう。)を単独又は併用して含む硬化剤を用いる。この芳香族モノマーは、前記ヒドロキシナフタレン及びジヒドロキシナフタレンの少なくともいずれかの2量体をグリシジルエーテル化して得られるエポキシ樹脂と同様に、アルキル基やアルキレン基が相対的に少ないため、高温下での樹脂の熱劣化防止に有利である。
芳香族モノマーのアルキル基及びアルキレン基の分子内質量比率は、合計で20%以下であるのが好ましい。また、この分子内質量比率は低いほど好ましいため、2個以上のフェノール系水酸基を有し、かつ、アルキル基及びアルキレン基のいずれをも含有しない芳香族モノマー化合物を単独又は併用して用いることが好ましい。
In the present invention, from the viewpoint of preventing thermal degradation of the resin under high temperature, an aromatic monomer compound having two or more phenolic hydroxyl groups (hereinafter also referred to as aromatic monomer) as a curing agent for the component (B). Is used alone or in combination. Since this aromatic monomer has relatively few alkyl groups and alkylene groups, as in the case of an epoxy resin obtained by glycidyl etherification of at least one of the dimers of hydroxynaphthalene and dihydroxynaphthalene, the aromatic monomer is a resin at high temperatures. It is advantageous for preventing thermal degradation of
The total mass ratio of the alkyl group and the alkylene group of the aromatic monomer is preferably 20% or less. In addition, since this intramolecular mass ratio is preferably as low as possible, an aromatic monomer compound having two or more phenolic hydroxyl groups and containing neither an alkyl group nor an alkylene group may be used alone or in combination. preferable.

この2個以上のフェノール系水酸基を有する芳香族モノマー化合物は、前記芳香族モノマーとアルデヒド基を有する化合物とを酸性触媒下で縮合又は共縮合させて得られるノボラック型樹脂、同じく、前記芳香族モノマーとジメトキシパラキシレン又はビス(メトキシメチル)ビフェニルから合成されるアラルキル型樹脂等と比較し、アルキル基やアルキレン基の相対的に少ない硬化物を与えることができる。   The aromatic monomer compound having two or more phenolic hydroxyl groups is a novolak resin obtained by condensation or cocondensation of the aromatic monomer and a compound having an aldehyde group in the presence of an acidic catalyst, as well as the aromatic monomer. Compared with an aralkyl type resin synthesized from dimethoxyparaxylene or bis (methoxymethyl) biphenyl, a cured product having relatively few alkyl groups or alkylene groups can be provided.

前記2個以上のフェノール系水酸基を有する芳香族モノマー化合物の例として、例えば、カテコールやレゾルシン、ヒドロキノン等のジヒドロキシベンゼン類やその誘導体、トリヒドロキシベンゼン類やその誘導体、ジヒドロキシナフタレンやその誘導体、ジヒドロキシアントラセンやその誘導体等を挙げることが可能であるが、原材料の入手の容易さ、コスト、成形材料の流動性等の観点からは、カテコールやレゾルシン、ヒドロキノン等のジヒドロキシベンゼン類を用いることが好ましく、硬化物に高いガラス転移点を与えるヒドロキノンを用いることが特に好ましい。   Examples of the aromatic monomer compound having two or more phenolic hydroxyl groups include, for example, dihydroxybenzenes and derivatives thereof such as catechol, resorcin, and hydroquinone, trihydroxybenzenes and derivatives thereof, dihydroxynaphthalene and derivatives thereof, and dihydroxyanthracene. In view of the availability of raw materials, cost, flowability of molding materials, etc., it is preferable to use dihydroxybenzenes such as catechol, resorcin, hydroquinone, etc. It is particularly preferable to use hydroquinone which gives a high glass transition point to the product.

本発明の効果を充分得る為には、前記芳香族モノマーを(B)成分全体の50質量%以上とすることが好ましく、60質量%以上とすることがより好ましく、70質量%以上とすることが特に好ましい。50質量%未満だと、特に高温下での樹脂の熱劣化に対して不利となる可能性がある。   In order to sufficiently obtain the effects of the present invention, the aromatic monomer is preferably 50% by mass or more of the total component (B), more preferably 60% by mass or more, and 70% by mass or more. Is particularly preferred. If it is less than 50% by mass, it may be disadvantageous for the thermal deterioration of the resin particularly at high temperatures.

本発明では、(B)成分として、前記芳香族モノマーの他に、封止用エポキシ樹脂成形材料に一般に使用されている硬化剤を特に制限なく併用することができる。併用可能な硬化剤として、例えばフェノール、クレゾール、レゾルシン、カテコール、ビスフェノールA、ビスフェノールF、フェニルフェノール、アミノフェノール等のフェノール類及び/又はα−ナフトール、β−ナフトール、ジヒドロキシナフタレン等のナフトール類とホルムアルデヒド、ベンズアルデヒド、サリチルアルデヒド等のアルデヒド基を有する化合物とを酸性触媒下で縮合又は共縮合させて得られるノボラック型フェノール樹脂、フェノール類及び/又はナフトール類とジメトキシパラキシレン又はビス(メトキシメチル)ビフェニルから合成されるフェノール・アラルキル樹脂等のアラルキル型樹脂、ジシクロペンタジエン型フェノール樹脂、テルペン変性フェノール樹脂、トリフェニルメタン型フェノール樹脂等が挙げられる。   In the present invention, as the component (B), in addition to the aromatic monomer, a curing agent generally used for an epoxy resin molding material for sealing can be used in combination without any particular limitation. Examples of curing agents that can be used in combination include phenols such as phenol, cresol, resorcin, catechol, bisphenol A, bisphenol F, phenylphenol, aminophenol, and / or naphthols such as α-naphthol, β-naphthol, dihydroxynaphthalene, and formaldehyde. From novolak-type phenol resins, phenols and / or naphthols and dimethoxyparaxylene or bis (methoxymethyl) biphenyl obtained by condensation or cocondensation with a compound having an aldehyde group, such as benzaldehyde and salicylaldehyde, under an acidic catalyst Examples include synthesized aralkyl resins such as phenol / aralkyl resins, dicyclopentadiene phenol resins, terpene-modified phenol resins, and triphenylmethane phenol resins. It is done.

(A)成分のエポキシ樹脂と(B)成分の硬化剤との当量比、すなわち、エポキシ樹脂中のエポキシ基数/硬化剤中の水酸基数の比は、特に制限はないが、それぞれの未反応分を少なく抑えるために0.5〜2の範囲に設定されることが好ましく、0.6〜1.5がより好ましい。成形性や信頼性に優れる封止用エポキシ樹脂成形材料を得るためには0.8〜1.2の範囲に設定されることがさらに好ましい。   The equivalent ratio of the (A) component epoxy resin and the (B) component curing agent, that is, the ratio of the number of epoxy groups in the epoxy resin / the number of hydroxyl groups in the curing agent is not particularly limited. Is preferably set in the range of 0.5 to 2, more preferably 0.6 to 1.5. In order to obtain an epoxy resin molding material for sealing which is excellent in moldability and reliability, it is more preferable to set in the range of 0.8 to 1.2.

本発明における(C)無機充填剤は、吸湿性、線膨張係数低減、熱伝導性向上及び強度向上等の他、高い耐熱性や難燃性を確保する為の成分である。無機充填剤としては、例えば、溶融シリカ、結晶シリカ、アルミナ、ジルコン、珪酸カルシウム、炭酸カルシウム、チタン酸カリウム、炭化珪素、窒化珪素、窒化アルミニウム、窒化ホウ素、ベリリア、ジルコニア、ジルコン、フォステライト、ステアタイト、スピネル、ムライト、チタニア等の粉体、又はこれらを球形化したビーズ、ガラス繊維などが挙げられ、これらは単独で用いても2種以上を併用して用いてもよい。さらに、本発明の効果を失わない範囲で、難燃効果のある水酸化アルミニウム、水酸化マグネシウム等の金属水酸化物系無機充填剤を添加してもよい。流動性、線膨張係数低減の観点からは、結晶シリカ、溶融シリカを用いることが好ましく、溶融シリカを用いることがより好ましく、球状溶融シリカを用いることが特に好ましい。   The (C) inorganic filler in the present invention is a component for ensuring high heat resistance and flame retardancy in addition to hygroscopicity, reduction of linear expansion coefficient, improvement of thermal conductivity and improvement of strength. Examples of inorganic fillers include fused silica, crystalline silica, alumina, zircon, calcium silicate, calcium carbonate, potassium titanate, silicon carbide, silicon nitride, aluminum nitride, boron nitride, beryllia, zirconia, zircon, fosterite, steer. Examples thereof include powders such as tight, spinel, mullite, and titania, or beads formed by spheroidizing these, and glass fibers. These may be used alone or in combination of two or more. Furthermore, you may add metal hydroxide type inorganic fillers, such as aluminum hydroxide and magnesium hydroxide which have a flame-retardant effect, in the range which does not lose the effect of this invention. From the viewpoint of reducing fluidity and linear expansion coefficient, it is preferable to use crystalline silica or fused silica, more preferably fused silica, and particularly preferably spherical fused silica.

本発明における(C)成分、無機充填剤の配合量は、封止用エポキシ樹脂成形材料全体の70〜95質量%とすることが好ましい。70質量%未満では信頼性が、95質量%を超えると流動性等の成形性が、それぞれ悪化する可能性がある。   It is preferable that the compounding quantity of (C) component and an inorganic filler in this invention shall be 70-95 mass% of the whole epoxy resin molding material for sealing. If it is less than 70% by mass, the reliability may be deteriorated, and if it exceeds 95% by mass, moldability such as fluidity may be deteriorated.

本発明では(A)〜(C)成分以外にも、(D)成分、下記一般式(I)で表されるハイドロタルサイト類化合物を添加すると、特に高温放置下での半導体内部部材の劣化防止に効果的である。
(化2)
Mg1−XAl(OH)(An−X/n・mHO ・・・(I)
(ただし、一般式(I)で、0<X≦0.5、mは0又は正の数、An−はn価の陰イオンを表す。)
In the present invention, in addition to the components (A) to (C), when the component (D) and the hydrotalcite compound represented by the following general formula (I) are added, deterioration of the semiconductor internal member particularly when left at high temperature It is effective for prevention.
(Chemical formula 2)
Mg 1-X Al X (OH) 2 (A n− ) X / n · mH 2 O (I)
(However, in the general formula (I), 0 <X ≦ 0.5, m is 0 or a positive number, A n-represents an n-valent anion.)

一般式(I)で表される化合物は、いわゆるハイドロタルサイトと呼ばれる層状複水酸化物であり、Mg(OH)のMg2+の一部をAl3+で置換することにより生ずる正八面体構造をホスト層とし、この正電荷を補償する陰イオン層と層間水からなるゲスト層が、ホスト層と交互に積層した構造を有する。ハイドロタルサイトは、陰イオン層の陰イオンが、外部の陰イオンと容易に交換する為、陰イオン捕捉能を有する。 The compound represented by the general formula (I) is a layered double hydroxide called a so-called hydrotalcite, and has an octahedral structure formed by substituting a part of Mg 2+ of Mg (OH) 2 with Al 3+. The host layer has a structure in which an anion layer that compensates for this positive charge and a guest layer made of interlayer water are alternately stacked with the host layer. Hydrotalcite has an anion trapping ability because the anion in the anion layer is easily exchanged with an external anion.

耐熱性の観点からは、一般式(I)で表される化合物の中でも「An−」が炭酸イオン(CO 2−)である化合物が好ましい。「An−」が炭酸イオン(CO 2−)である化合物は、一般式(I)でX=0.25(すなわち、(1−X)/X=3)、m=0.5である化合物として天然にも産出する他、一般式(I)で(1−X)/X=4.3、mがほぼ0である化合物 DHT−4A(協和化学工業株式会社製商品名)、一般式(I)で(1−X)/X=4、mがほぼ0である化合物 アルカマイザー1(同じく協和化学工業株式会社製商品名)等を市場で入手可能であり、これらはいずれも本発明に好適に用いることが可能である。 From the viewpoint of heat resistance, among the compounds represented by the general formula (I), a compound in which “A n− ” is a carbonate ion (CO 3 2− ) is preferable. A compound in which “A n− ” is a carbonate ion (CO 3 2− ) is represented by the general formula (I) where X = 0.25 (that is, (1-X) / X = 3), m = 0.5 In addition to being naturally produced as a compound, the compound DHT-4A (trade name, manufactured by Kyowa Chemical Industry Co., Ltd.), in general formula (I), (1-X) /X=4.3 and m is almost 0 The compound (1-X) / X = 4 in the formula (I) and m is almost 0 Alkamizer 1 (also a trade name, manufactured by Kyowa Chemical Industry Co., Ltd.) is available on the market. It can be suitably used in the invention.

一般式(I)で表される化合物は、封止用エポキシ樹脂成形材料中への分散性やイオン捕捉能の点から、比表面積が3m/g以上であることが好ましく、5m/g以上であることがより好ましく、7m/g以上であることが特に好ましい。また、その平均粒径は5μm以下であることが好ましく、3μm以下であることがより好ましく、1μm以下であることが特に好ましい。比表面積が3m/g未満、あるいは平均粒径が5μmを超えると、いずれもイオン捕捉能が不充分となる可能性がある。なお、ここで「比表面積」とは、湯浅アイオニクス株式会社製ガス吸着流動式粉体測定装置モノソープを用いたBET法による測定値を指し、平均粒径とは、株式会社堀場製作所製レーザ回折/散乱式粒度分布測定装置LA−920を用い、水溶媒中で測定したメジアン径を指す。 Compound represented by the general formula (I), from the viewpoint of dispersibility and ion trapping ability of the encapsulating epoxy resin molding material, it is preferable that a specific surface area of 3m 2 / g or more, 5 m 2 / g More preferably, it is more preferably 7 m 2 / g or more. The average particle size is preferably 5 μm or less, more preferably 3 μm or less, and particularly preferably 1 μm or less. If the specific surface area is less than 3 m 2 / g or the average particle diameter exceeds 5 μm, the ion trapping ability may be insufficient. Here, the “specific surface area” means a measured value by the BET method using a gas adsorption flow type powder measuring device monosoap manufactured by Yuasa Ionics Co., Ltd., and the average particle size is a laser manufactured by Horiba, Ltd. The median diameter measured in an aqueous solvent using a diffraction / scattering particle size distribution analyzer LA-920.

一般式(I)で表される化合物はまた、エポキシシランやイソシアネートシラン等、(A)成分または(B)成分と反応性を有するアルコキシシラン等で予備処理を行ってから用いても良い。   The compound represented by the general formula (I) may also be used after pretreatment with an alkoxysilane having reactivity with the component (A) or the component (B) such as epoxysilane or isocyanatesilane.

(D)成分の添加量は、(A)成分の全量に対し0.5〜10質量%程度とすることが好ましい。0.5質量%未満だと本発明の効果、特に高い耐熱性の実現が困難となる可能性があり、10質量%を超えると封止用エポキシ樹脂成形材料の成形性を悪化させる可能性等が発生する。   It is preferable that the addition amount of (D) component shall be about 0.5-10 mass% with respect to the whole quantity of (A) component. If the amount is less than 0.5% by mass, it may be difficult to achieve the effects of the present invention, particularly high heat resistance. If the amount exceeds 10% by mass, the moldability of the epoxy resin molding material for sealing may deteriorate. Will occur.

本発明では上記した(A)〜(D)成分以外にも、生産性の向上等を目的に、封止用エポキシ樹脂成形材料に通常用いられる硬化促進剤を、特に制限なく、用いることができる。使用可能な硬化促進剤を例示すれば、トリブチルホスフィン、メチルジフェニルホスフィン、トリフェニルホスフィン、トリス(4−メチルフェニル)ホスフィン、ジフェニルホスフィン、フェニルホスフィン等の有機ホスフィン、及びこれらの有機ホスフィンに無水マレイン酸、1,4−ベンゾキノン、2,5−トルキノン、1,4−ナフトキノン、2,3−ジメチルベンゾキノン、2,6−ジメチルベンゾキノン、2,3−ジメトキシ−5−メチル−1,4−ベンゾキノン、2,3−ジメトキシ−1,4−ベンゾキノン、フェニル−1,4−ベンゾキノン等のキノン化合物、ジアゾフェニルメタン、フェノール樹脂等のπ結合をもつ化合物を付加してなる分子内分極を有する化合物等の有機リン化合物、テトラフェニルホスホニウムテトラフェニルボレート、トリフェニルホスフィンテトラフェニルボレート、2−エチル−4−メチルイミダゾールテトラフェニルボレート、N−メチルモルホリンテトラフェニルボレート等のテトラフェニルボロン塩及びこれらの誘導体などの有機リン系硬化促進剤、1,8−ジアザ−ビシクロ(5,4,0)ウンデセン−7、1,5−ジアザ−ビシクロ(4,3,0)ノネン、5,6−ジブチルアミノ−1,8−ジアザ−ビシクロ(5,4,0)ウンデセン−7等のシクロアミジン化合物等のアミン系硬化促進剤、2−メチルイミダゾール、2−フェニルイミダゾール、2−フェニル−4−メチルイミダゾール等のイミダゾール系硬化促進剤等を挙げることが可能で、これらは単独で使用しても2種以上を併用して使用しても構わない。流動特性や硬化性等の成形性、耐高温放置特性等の信頼性の観点からは、有機ホスフィンとキノン化合物との付加物が好ましい。   In the present invention, in addition to the components (A) to (D) described above, for the purpose of improving productivity and the like, a curing accelerator usually used for an epoxy resin molding material for sealing can be used without any particular limitation. . Examples of usable curing accelerators include organic phosphines such as tributylphosphine, methyldiphenylphosphine, triphenylphosphine, tris (4-methylphenyl) phosphine, diphenylphosphine, and phenylphosphine, and maleic anhydride to these organic phosphines. 1,4-benzoquinone, 2,5-toluquinone, 1,4-naphthoquinone, 2,3-dimethylbenzoquinone, 2,6-dimethylbenzoquinone, 2,3-dimethoxy-5-methyl-1,4-benzoquinone, 2 Organic compounds such as compounds having intramolecular polarization formed by adding a quinone compound such as 1,3-dimethoxy-1,4-benzoquinone and phenyl-1,4-benzoquinone, a compound having a π bond such as diazophenylmethane and phenol resin Phosphorus compounds, tetraphenylphosphonium teto Organophosphorus curing accelerators such as tetraphenylboron salts such as phenylborate, triphenylphosphinetetraphenylborate, 2-ethyl-4-methylimidazoletetraphenylborate, N-methylmorpholinetetraphenylborate and derivatives thereof, 8-diaza-bicyclo (5,4,0) undecene-7, 1,5-diaza-bicyclo (4,3,0) nonene, 5,6-dibutylamino-1,8-diaza-bicyclo (5,4 , 0) Amine curing accelerators such as cycloamidine compounds such as undecene-7, imidazole curing accelerators such as 2-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, etc. These may be used alone or in combination of two or more. From the viewpoint of reliability such as moldability such as flow characteristics and curability, and high temperature storage resistance, an adduct of an organic phosphine and a quinone compound is preferable.

硬化促進剤の配合量は、硬化促進効果が達成される量であれば特に制限されるものではないが、(A)成分の全量に対して0.1〜10質量%が好ましい。0.1質量%未満では短時間での硬化性に劣る傾向があり、10質量%を超えると硬化速度が速すぎて未充填等により良好な成形品を得ることが困難になる傾向がある。   Although the compounding quantity of a hardening accelerator will not be restrict | limited especially if the hardening acceleration effect is achieved, 0.1-10 mass% is preferable with respect to the whole quantity of (A) component. If it is less than 0.1% by mass, the curability in a short time tends to be inferior, and if it exceeds 10% by mass, the curing rate tends to be too high and it becomes difficult to obtain a good molded product due to unfilling or the like.

本発明では又、成形時の金型からの円滑な離型性を確保する為に、ステアリン酸、モンタン酸等の高級脂肪酸系ワックス、ステアリン酸エステル、モンタン酸エステル等の高級脂肪酸エステル系ワックス、ポリエチレンをはじめとするポリオレフィン等、封止用エポキシ樹脂成形材料に用いられる従来公知の離型剤を単独、又は併用して用いることができる。   In the present invention, in order to ensure smooth releasability from the mold during molding, higher fatty acid waxes such as stearic acid and montanic acid, higher fatty acid ester waxes such as stearic acid ester and montanic acid ester, Conventionally known release agents used for epoxy resin molding materials for sealing, such as polyolefin including polyethylene, can be used alone or in combination.

離型剤の配合量は、(A)成分の全量に対し0.01〜10質量%とすることが好ましい。0.01質量%未満では金型からの円滑な離型性が、10質量%を超えるとリードフレームや素子との密着力に起因するパッケージの信頼性確保が、それぞれ困難となる可能性がある。   It is preferable that the compounding quantity of a mold release agent shall be 0.01-10 mass% with respect to the whole quantity of (A) component. If it is less than 0.01% by mass, the mold releasability from the mold exceeds 10% by mass, and it may be difficult to ensure the reliability of the package due to the adhesion between the lead frame and the element. .

本発明の封止用エポキシ樹脂成形材料には、樹脂成分と無機充填剤との接着性を高めるために、必要に応じて、エポキシシラン、メルカプトシラン、アミノシラン、アルキルシラン、ウレイドシラン、ビニルシラン等の各種シラン系化合物、チタン系化合物、アルミニウムキレート類、アルミニウム/ジルコニウム系化合物等の公知のカップリング剤を添加することができる。これらは単独で用いても、2種以上を併用して用いても構わない。カップリング剤の配合量は、無機充填剤に対して0.05〜5質量%であることが好ましく、0.1〜2.5質量%がより好ましい。0.05質量%未満では耐湿性が低下する傾向があり、5質量%を超えるとパッケージの成形性が低下する傾向がある。   In the epoxy resin molding material for sealing of the present invention, epoxy silane, mercapto silane, amino silane, alkyl silane, ureido silane, vinyl silane, etc. are used as necessary to enhance the adhesion between the resin component and the inorganic filler. Various known coupling agents such as various silane compounds, titanium compounds, aluminum chelates, and aluminum / zirconium compounds can be added. These may be used alone or in combination of two or more. The blending amount of the coupling agent is preferably 0.05 to 5% by mass and more preferably 0.1 to 2.5% by mass with respect to the inorganic filler. If it is less than 0.05% by mass, the moisture resistance tends to decrease, and if it exceeds 5% by mass, the moldability of the package tends to decrease.

本発明の封止用エポキシ樹脂成形材料には、さらに、その効果を損なわない範囲で、カーボンブラック、有機染料、有機顔料、酸化チタン、鉛丹、ベンガラ等の着色剤、イミダゾール、トリアゾール、テトラゾール、トリアジン等及びこれらの誘導体、アントラニル酸、マロン酸、リンゴ酸、マレイン酸、アミノフェノール、キノリン等及びこれらの誘導体、脂肪族酸アミド化合物、ジチオカルバミン酸塩、チアジアゾール誘導体等の接着促進剤などを必要に応じて配合することができる。   In the epoxy resin molding material for sealing of the present invention, carbon black, organic dye, organic pigment, colorant such as titanium oxide, red lead, bengara, imidazole, triazole, tetrazole, Triazines and their derivatives, anthranilic acid, malonic acid, malic acid, maleic acid, aminophenol, quinoline, etc. and their derivatives, aliphatic acid amide compounds, dithiocarbamate, thiadiazole derivatives, etc. It can be blended accordingly.

本発明の成形材料においては、特に耐熱性の観点から、ハロゲン化エポキシ樹脂等のハロゲン系難燃剤の含有量と、三酸化アンチモン、四酸化アンチモン、五酸化アンチモン等のアンチモン系難燃剤の含有量とは、いずれも成形材料全体の0.1質量%以下であることが好ましい。ハロゲン系難燃剤及びアンチモン系難燃剤のいずれも含まないことがより好ましい。   In the molding material of the present invention, particularly from the viewpoint of heat resistance, the content of halogenated flame retardants such as halogenated epoxy resins and the content of antimony flame retardants such as antimony trioxide, antimony tetroxide, and antimony pentoxide. Is preferably 0.1% by mass or less of the entire molding material. More preferably, neither halogen-based flame retardant nor antimony-based flame retardant is included.

本発明の封止用エポキシ樹脂成形材料は、各種原材料を均一に分散混合できるのであれば、いかなる手法を用いても調製できるが、一般的な手法として、所定の配合量の原材料をミキサー等によって十分混合した後、ミキシングロール、ニーダ、押出機等によって溶融混練した後、冷却、粉砕する方法を挙げることができる。成形条件に合うような寸法及び質量でタブレット化すると使いやすい。   The epoxy resin molding material for sealing of the present invention can be prepared by any method as long as various raw materials can be uniformly dispersed and mixed. However, as a general method, a raw material having a predetermined blending amount is mixed with a mixer or the like. A method of sufficiently cooling and pulverizing after mixing and melting and kneading with a mixing roll, a kneader, an extruder or the like can be mentioned. It is easy to use if it is tableted with dimensions and mass that match the molding conditions.

また、本発明の封止用エポキシ樹脂成形材料は、各種有機溶剤に溶かして液状封止用エポキシ樹脂成形材料として使用することもでき、この液状封止用エポキシ樹脂成形材料を板又はフィルム上に薄く塗布し、樹脂の硬化反応が余り進まないような条件で有機溶剤を飛散させることによって得られるシートあるいはフィルム状の封止用エポキシ樹脂成形材料として使用することもできる。   Moreover, the epoxy resin molding material for sealing of the present invention can be dissolved in various organic solvents and used as a liquid epoxy resin molding material for liquid sealing. This liquid epoxy resin molding material for liquid sealing can be used on a plate or a film. It can also be used as an epoxy resin molding material for sealing in the form of a sheet or film obtained by coating thinly and scattering the organic solvent under conditions that do not allow the resin curing reaction to proceed so much.

本発明で得られる封止用エポキシ樹脂成形材料により素子を封止して得られる電子部品装置としては、リードフレーム、配線済みのテープキャリア、配線板、ガラス、シリコンウエハ等の支持部材に、半導体チップ、トランジスタ、ダイオード、サイリスタ等の能動素子、コンデンサ、抵抗体、コイル等の受動素子等の素子を搭載し、必要な部分を本発明の封止用エポキシ樹脂成形材料で封止した、電子部品装置などが挙げられる。このような電子部品装置としては、例えば、リードフレーム上に半導体素子を固定し、ボンディングパッド等の素子の端子部とリード部をワイヤボンディングやバンプで接続した後、本発明の封止用エポキシ樹脂成形材料を用いてトランスファ成形などにより封止してなる、DIP(Dual Inline Package)、PLCC(Plastic Leaded Chip Carrier)、QFP(Quad Flat Package)、SOP(Small Outline Package)、SOJ(Small Outline J‐lead package)、TSOP(Thin Small Outline Package)、TQFP(Thin Quad Flat Package)等の一般的な樹脂封止型IC、テープキャリアにバンプで接続した半導体チップを、本発明の封止用エポキシ樹脂成形材料で封止したTCP(Tape Carrier Package)、配線板やガラス上に形成した配線に、ワイヤボンディング、フリップチップボンディング、はんだ等で接続した半導体チップ、トランジスタ、ダイオード、サイリスタ等の能動素子及び/又はコンデンサ、抵抗体、コイル等の受動素子を、本発明の封止用エポキシ樹脂成形材料で封止したCOB(Chip On Board)モジュール、ハイブリッドIC、マルチチップモジュール、配線板接続用の端子を形成した有機基板に素子を搭載し、バンプまたはワイヤボンディングにより素子と有機基板に形成された配線を接続した後、本発明の封止用エポキシ樹脂成形材料で素子を封止したBGA(Ball Grid Array)、CSP(Chip Size Package)などが挙げられる。また、プリント回路板にも本発明の封止用エポキシ樹脂成形材料は有効に使用できる。   As an electronic component device obtained by sealing an element with the sealing epoxy resin molding material obtained in the present invention, a lead frame, a wired tape carrier, a wiring board, glass, a silicon wafer, a support member such as a semiconductor Electronic components equipped with active elements such as chips, transistors, diodes, thyristors, etc., and passive elements such as capacitors, resistors, coils, etc., and the necessary parts are sealed with the sealing epoxy resin molding material of the present invention Examples thereof include devices. As such an electronic component device, for example, a semiconductor element is fixed on a lead frame, and a terminal portion and a lead portion of an element such as a bonding pad are connected by wire bonding or bump, and then the epoxy resin for sealing of the present invention is used. DIP (Dual Inline Package), PLCC (Plastic Leaded Chip Carrier), QFP (Quad Flat Package), SOP (Small Outline Package), SOJ (Small Outli), which are sealed by molding using a molding material. General resin-sealed type I such as lead package, TSOP (Thin Small Outline Package), TQFP (Thin Quad Flat Package), etc. A semiconductor chip connected to a tape carrier with a bump is sealed with a tape carrier package (TCP) sealed with an epoxy resin molding material of the present invention, wiring formed on a wiring board or glass, wire bonding, flip chip bonding COB (Chip) in which active elements such as semiconductor chips, transistors, diodes, thyristors and / or passive elements such as capacitors, resistors, coils, etc., which are connected by solder, etc., are sealed with the sealing epoxy resin molding material of the present invention On Board) A device is mounted on an organic substrate on which a module, a hybrid IC, a multi-chip module, and a wiring board connection terminal are formed, and the device is connected to the wiring formed on the organic substrate by bump or wire bonding. Device with epoxy molding compound for sealing Sealed BGA (Ball Grid Array), CSP (Chip Size Package), etc. are mentioned. Moreover, the epoxy resin molding material for sealing of the present invention can also be used effectively for printed circuit boards.

本発明の封止用エポキシ樹脂成形材料を用いて素子を封止する方法としては、低圧トランスファ成形法が最も一般的であるが、インジェクション成形法、圧縮成形法等を用いてもよい。封止用エポキシ樹脂成形材料が常温で液状又はペースト状の場合は、ディスペンス方式、注型方式、印刷方式等が挙げられる。   As a method for sealing an element using the epoxy resin molding material for sealing of the present invention, a low-pressure transfer molding method is the most common, but an injection molding method, a compression molding method, or the like may be used. When the sealing epoxy resin molding material is liquid or pasty at normal temperature, a dispensing method, a casting method, a printing method, and the like can be given.

また、素子を直接樹脂封止する一般的な封止方法ばかりではなく、素子に直接電子部品封止用エポキシ樹脂成形材料が接触しない形態である中空パッケージの方式もあり、中空パッケージ用の封止用エポキシ樹脂成形材料としても好適に使用できる。   Also, not only a general sealing method for directly sealing an element with a resin, but also a hollow package system in which an epoxy resin molding material for sealing an electronic component is not in direct contact with the element, sealing for a hollow package Also suitable for use as an epoxy resin molding material.

以下、実施例によって本発明をより具体的に説明するが、本発明の範囲は以下の実施例によって限定されるものではない。   EXAMPLES Hereinafter, although an Example demonstrates this invention more concretely, the scope of the present invention is not limited by a following example.

(実施例1〜5、及び比較例1〜8)
以下、各実施例及び各比較例で使用した各種原材料を示す。
(A)エポキシ樹脂
エポキシ樹脂1:ジヒドロキシナフタレン2量体のエポキシ化物を主成分とするエポキシ樹脂(エポキシ当量163、軟化点90℃、大日本インキ化学工業株式会社製商品名HP−4700)
エポキシ樹脂2:エポキシ当量196、融点106℃のビフェニル型エポキシ樹脂(ジャパンエポキシレジン株式会社製、商品名エピコートYX−4000H)
エポキシ樹脂3:エポキシ当量170、軟化点60℃のトリフェニルメタン型エポキシ樹脂(ジャパンエポキシレジン株式会社製、商品名エピコート1032H60)
(B)硬化剤
硬化剤1:カテコール(1,2−ジヒドロキシベンゼン)モノマー
硬化剤2:レゾルシン(1,3−ジヒドロキシベンゼン)モノマー
硬化剤3:ヒドロキノン(1,4−ジヒドロキシベンゼン)モノマー
硬化剤4:硬化剤1を、酸性触媒下ホルマリンととも共縮合したカテコールノボラック(軟化点105℃、水酸基当量60)
硬化剤5:軟化点83℃、水酸基当量103のトリフェニルメタン型フェノール樹脂(明和化成株式会社製、商品名MEH−7500)
硬化剤6:軟化点67℃、水酸基当量203のビフェニル・アラルキル樹脂(明和化成株式会社製、商品名MEH−7851)
(C)無機充填剤
無機充填剤1:平均粒径30μmの球状シリカ(電気化学工業株式会社製商品名FB−950)
無機充填剤2:平均粒径0.5μmの球状シリカ(株式会社アドマテックス製商品名SO−25R)
無機充填剤3:平均粒径3μm、比表面積3m/gの水酸化マグネシウム(神島化学工業株式会社製商品名マグシーズEP−1A)
(D)ハイドロタルサイト類化合物
協和化学工業株式会社製商品名アルカマイザー1(一般式(I)で(1−X)/X=4、mがほぼ0、比表面積8m/g)
(その他添加剤等)
硬化促進剤:トリフェニルホスフィンとp−ベンゾキノンとの付加物
離型剤:酸化型ポリエチレンワックス
カップリング剤:γ−グリシドキシプロピルトリメトキシシラン(エポキシシラン)
着色剤:カーボンブラック
(Examples 1-5 and Comparative Examples 1-8)
Hereinafter, various raw materials used in each example and each comparative example are shown.
(A) Epoxy resin Epoxy resin 1: Epoxy resin mainly composed of an epoxidized product of dihydroxynaphthalene dimer (epoxy equivalent 163, softening point 90 ° C., trade name HP-4700, manufactured by Dainippon Ink & Chemicals, Inc.)
Epoxy resin 2: biphenyl type epoxy resin having an epoxy equivalent of 196 and a melting point of 106 ° C. (trade name Epicoat YX-4000H, manufactured by Japan Epoxy Resin Co., Ltd.)
Epoxy resin 3: Triphenylmethane type epoxy resin having an epoxy equivalent of 170 and a softening point of 60 ° C. (trade name Epicoat 1032H60 manufactured by Japan Epoxy Resin Co., Ltd.)
(B) Curing agent Curing agent 1: Catechol (1,2-dihydroxybenzene) monomer Curing agent 2: Resorcin (1,3-dihydroxybenzene) monomer Curing agent 3: Hydroquinone (1,4-dihydroxybenzene) monomer Curing agent 4 : Catechol novolak obtained by co-condensing curing agent 1 with formalin under acidic catalyst (softening point 105 ° C., hydroxyl group equivalent 60)
Curing agent 5: Triphenylmethane type phenol resin having a softening point of 83 ° C. and a hydroxyl equivalent weight of 103 (Maywa Kasei Co., Ltd., trade name: MEH-7500)
Curing agent 6: Biphenyl aralkyl resin having a softening point of 67 ° C. and a hydroxyl group equivalent of 203 (product name MEH-7851 manufactured by Meiwa Kasei Co., Ltd.)
(C) Inorganic filler Inorganic filler 1: spherical silica having an average particle size of 30 μm (trade name FB-950, manufactured by Denki Kagaku Kogyo Co., Ltd.)
Inorganic filler 2: Spherical silica with an average particle size of 0.5 μm (trade name SO-25R manufactured by Admatechs Co., Ltd.)
Inorganic filler 3: Magnesium hydroxide having an average particle size of 3 μm and a specific surface area of 3 m 2 / g (trade name Magseeds EP-1A manufactured by Kamishima Chemical Co., Ltd.)
(D) Hydrotalcite compound Kyowa Chemical Industry Co., Ltd. trade name Alkamizer 1 ((1-X) / X = 4 in general formula (I), m is almost 0, specific surface area 8 m 2 / g)
(Other additives)
Curing accelerator: Adduct of triphenylphosphine and p-benzoquinone Mold release agent: Oxidized polyethylene wax Coupling agent: γ-glycidoxypropyltrimethoxysilane (epoxysilane)
Colorant: Carbon black

これらを、それぞれ下記表1及び表2に示す質量部で配合し、混練温度80℃、混練時間10分の条件でロール混練を行い、実施例及び比較例の封止用エポキシ樹脂成形材料を作製した。   These are blended in parts by mass shown in Table 1 and Table 2 below, and roll kneading is performed under conditions of a kneading temperature of 80 ° C. and a kneading time of 10 minutes to produce sealing epoxy resin molding materials of Examples and Comparative Examples. did.

Figure 2007023273
Figure 2007023273

Figure 2007023273
Figure 2007023273

作製した実施例及び比較例の封止用エポキシ樹脂成形材料を、次の各試験により評価した。評価結果を表3及び表4に示した。なお、封止用エポキシ樹脂成形材料の成形は、トランスファ成形機により、金型温度180℃、成形圧力6.9MPa、硬化時間90秒の条件で行った。後硬化は175℃で6時間行った。
(1)スパイラルフロー(流動性の指標)
EMMI−1−66に順じてスパイラルフロー測定用金型を用いて、封止用エポキシ樹脂成形材料を上記条件で成形し、流動距離(cm)を求めた。
(2)ガラス転移点
JIS K 7197に従い、上記の成形及び後硬化をして得た硬化物を試験片に用い、TMA(Thermal Mechanical Analysis)によりガラス転移点と熱膨張係数α1を求めた。試験片サイズは4×4×20mm、測定時の測定温度領域は室温(25℃)より250℃、昇温速度は5℃/分とした。試験時の荷重は20gとした。ガラス転移点は、40〜80℃の領域より延長される線と200〜240℃より延長される線の交点より求めた。
(3)耐熱性
SOP‐28p(42アロイ リードフレーム)にTEG−ML1020チップ(Line/Space=20μm/20μm領域2ヶ所:1.90×4.20mm、Line/Space=10μm/10μm領域2ヶ所:1.90×4.20mm)を搭載し、リードフレームとチップとをφ20μmの金線により接続した。その後、上記で作製した封止用エポキシ樹脂成形材料による封止を行い、後硬化の後、195℃環境中に1000時間放置した。各成形材料による作製パッケージN=10のうち、放置後の電気導通の有無を測定し、計4配線のうち、1配線でも導通不具合のあるパッケージをNGパッケージとしてカウントした。
(4)難燃性
成形及び後硬化して得た試験片により、94UL規格に従い、試験厚み1/8インチでの試験を行い、難燃性の判定を行った。
The produced epoxy resin molding materials for sealing of Examples and Comparative Examples were evaluated by the following tests. The evaluation results are shown in Tables 3 and 4. The epoxy resin molding material for sealing was molded by a transfer molding machine under conditions of a mold temperature of 180 ° C., a molding pressure of 6.9 MPa, and a curing time of 90 seconds. Post-curing was performed at 175 ° C. for 6 hours.
(1) Spiral flow (fluidity index)
The sealing epoxy resin molding material was molded under the above conditions using a spiral flow measurement mold in accordance with EMMI-1-66, and the flow distance (cm) was determined.
(2) Glass transition point According to JIS K7197, the cured product obtained by the above molding and post-curing was used as a test piece, and the glass transition point and the thermal expansion coefficient α1 were determined by TMA (Thermal Mechanical Analysis). The test piece size was 4 × 4 × 20 mm, the measurement temperature region during measurement was 250 ° C. from room temperature (25 ° C.), and the temperature increase rate was 5 ° C./min. The load during the test was 20 g. The glass transition point was calculated | required from the intersection of the line extended from a 40-80 degreeC area | region, and the line extended from 200-240 degreeC.
(3) Heat resistance SOP-28p (42 alloy lead frame) with TEG-ML1020 chip (Line / Space = 20 μm / 20 μm area 2 places: 1.90 × 4.20 mm, Line / Space = 10 μm / 10 μm area 2 places: 1.90 × 4.20 mm) was mounted, and the lead frame and the chip were connected by a gold wire of φ20 μm. Then, sealing with the epoxy resin molding material for sealing produced above was performed, and after post-curing, it was left in an environment of 195 ° C. for 1000 hours. Of the manufactured packages N = 10 made of each molding material, the presence or absence of electrical continuity after being left was measured, and among the total of 4 wirings, the package having continuity failure even in one wiring was counted as an NG package.
(4) Flame retardance Using a test piece obtained by molding and post-curing, a test with a test thickness of 1/8 inch was performed according to the 94 UL standard to determine flame retardancy.

Figure 2007023273
Figure 2007023273

Figure 2007023273
Figure 2007023273

本発明の(A)成分、または(B)成分を含まない比較例1〜8は、スパイラルフロー等の成形性、耐熱性、難燃性のいずれか、あるいは複数の項目に劣る。これに対し、(A)〜(C)成分のいずれをも含む実施例1〜5は、上記項目のいずれにも優れ、さらに(D)成分を含む実施例1〜3、5は、耐熱性に特に優れることがわかる。   Comparative Examples 1 to 8 that do not contain the component (A) or the component (B) of the present invention are inferior to any one of moldability such as spiral flow, heat resistance, flame retardancy, or a plurality of items. On the other hand, Examples 1 to 5 including any of the components (A) to (C) are excellent in any of the above items, and Examples 1 to 3 and 5 including the component (D) are heat resistant. It can be seen that it is particularly excellent.

Claims (6)

(A)成分として、ヒドロキシナフタレン及びジヒドロキシナフタレンの少なくともいずれかの2量体をグリシジルエーテル化して得られるエポキシ樹脂を含むエポキシ樹脂、(B)成分として、2個以上のフェノール系水酸基を有する芳香族モノマー化合物を含む硬化剤、(C)成分として無機充填剤を含有する封止用エポキシ樹脂成形材料。   As the component (A), an epoxy resin containing an epoxy resin obtained by glycidyl etherification of at least one dimer of hydroxynaphthalene and dihydroxynaphthalene; as the component (B), an aromatic having two or more phenolic hydroxyl groups An epoxy resin molding material for sealing containing a curing agent containing a monomer compound and an inorganic filler as component (C). 前記芳香族モノマー化合物のアルキル基及びアルキレン基の分子内質量比率が合計で20%以下である請求項1記載の封止用エポキシ樹脂成形材料。   The epoxy resin molding material for sealing according to claim 1, wherein the total mass ratio of the alkyl group and the alkylene group of the aromatic monomer compound is 20% or less. (B)成分の硬化剤が、2個以上のフェノール系水酸基を有し、かつアルキル基及びアルキレン基のいずれをも含まない芳香族モノマー化合物を含有する請求項1または2に記載の封止用エポキシ樹脂成形材料。   The sealing agent according to claim 1 or 2, wherein the curing agent of component (B) contains an aromatic monomer compound having two or more phenolic hydroxyl groups and containing neither an alkyl group nor an alkylene group. Epoxy resin molding material. (D)成分として、さらに下記一般式(I)で表されるハイドロタルサイト類化合物を含有する請求項1〜3のいずれかに記載の封止用エポキシ樹脂成形材料。
(化1)
Mg1−XAl(OH)(An−X/n・mHO ・・・(I)
(ただし、一般式(I)で、0<X≦0.5、mは0又は正の数、An−はn価の陰イオンを表す。)
The epoxy resin molding material for sealing according to any one of claims 1 to 3, further comprising a hydrotalcite compound represented by the following general formula (I) as the component (D).
(Chemical formula 1)
Mg 1-X Al X (OH) 2 (A n− ) X / n · mH 2 O (I)
(However, in the general formula (I), 0 <X ≦ 0.5, m is 0 or a positive number, A n-represents an n-valent anion.)
ハロゲン系難燃剤及びアンチモン系難燃剤を含まない請求項1〜4のいずれかに記載の封止用エポキシ樹脂成形材料。   The epoxy resin molding material for sealing according to any one of claims 1 to 4, which does not contain a halogen flame retardant and an antimony flame retardant. 請求項1〜5のいずれかに記載の封止用エポキシ樹脂成形材料により封止された素子を備えた電子部品装置。   The electronic component apparatus provided with the element sealed with the epoxy resin molding material for sealing in any one of Claims 1-5.
JP2006167586A 2005-06-17 2006-06-16 Epoxy resin molding compound for sealing use and electronic component device Pending JP2007023273A (en)

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JP2009235177A (en) * 2008-03-26 2009-10-15 Sumitomo Bakelite Co Ltd Semiconductor-sealing epoxy resin composition and semiconductor device
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JP2009292996A (en) * 2008-06-09 2009-12-17 Sumitomo Bakelite Co Ltd Semiconductor sealing epoxy resin composition and semiconductor device
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JP2009108301A (en) * 2007-10-09 2009-05-21 Hitachi Chem Co Ltd Epoxy resin composition for sealing and electronic component device
JP2009235177A (en) * 2008-03-26 2009-10-15 Sumitomo Bakelite Co Ltd Semiconductor-sealing epoxy resin composition and semiconductor device
JP2009242572A (en) * 2008-03-31 2009-10-22 Nippon Steel Chem Co Ltd Epoxy resin composition and molded product
JP2009292996A (en) * 2008-06-09 2009-12-17 Sumitomo Bakelite Co Ltd Semiconductor sealing epoxy resin composition and semiconductor device
JP2010248369A (en) * 2009-04-15 2010-11-04 Hitachi Chem Co Ltd Manufacturing method for epoxy resin, epoxy resin composition, and electronic component device
JP2010248368A (en) * 2009-04-15 2010-11-04 Hitachi Chem Co Ltd Manufacturing method for epoxy resin, epoxy resin composition, and electronic component device
WO2012053661A1 (en) * 2010-10-22 2012-04-26 新日鐵化学株式会社 High-molecular-weight epoxy resin and resin film, resin composition, and cured article using high-molecular-weight epoxy resin
JP2012092158A (en) * 2010-10-22 2012-05-17 Nippon Steel Chem Co Ltd High molecular weight epoxy resin, resin film using the high molecular weight epoxy resin, resin composition, and cured product
WO2012133587A1 (en) * 2011-03-28 2012-10-04 日立化成工業株式会社 Resin composition, resin sheet, cured resin sheet, resin sheet laminate, cured resin sheet laminate and method for manufacturing same, semiconductor device, and led device
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JPWO2012133587A1 (en) * 2011-03-28 2014-07-28 日立化成株式会社 Resin composition, resin sheet, resin sheet cured product, resin sheet laminate, resin sheet laminate cured product and method for manufacturing the same, semiconductor device, and LED device
WO2015141797A1 (en) * 2014-03-20 2015-09-24 日立化成株式会社 Resin composition, resin sheet, resin sheet cured product, resin sheet laminate, resin sheet laminate cured product and method for producing same, semiconductor device, and led device.
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