JP2006120844A - Semiconductor light-emitting device - Google Patents

Semiconductor light-emitting device Download PDF

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JP2006120844A
JP2006120844A JP2004306988A JP2004306988A JP2006120844A JP 2006120844 A JP2006120844 A JP 2006120844A JP 2004306988 A JP2004306988 A JP 2004306988A JP 2004306988 A JP2004306988 A JP 2004306988A JP 2006120844 A JP2006120844 A JP 2006120844A
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light
emitting device
light emitting
sealing resin
semiconductor light
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JP4602736B2 (en
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Masakazu Ohashi
正和 大橋
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Fujikura Ltd
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Fujikura Ltd
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/45099—Material
    • H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144—Gold (Au) as principal constituent
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item

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Abstract

<P>PROBLEM TO BE SOLVED: To provide a semiconductor light-emitting device having a structure capable of a long-time reliability after prolonged storage, while suppressing the load on a wire for forming conducting wirings between a light-emitting element and an electrode or on wire connecting points. <P>SOLUTION: The semiconductor light-emitting device comprises at least the semiconductor light-emitting element electrically connected to a pair of electrodes, and sealing resin for covering the semiconductor light-emitting element. By forming a protective layer which is applied with a static-free treatment and has a high translucency within a light emission region on the surface of the sealing resin layer, adherence of dust, etc. to the sealing resin layer can be reduced. Consequently, the emission intensity of the light-emitting device can be sustained for long periods of time. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、表面実装型の半導体発光装置に関し、特に、長期保管後の長期信頼性に耐え得る構造を備えた半導体発光装置に関する。   The present invention relates to a surface mount semiconductor light emitting device, and more particularly to a semiconductor light emitting device having a structure capable of withstanding long-term reliability after long-term storage.

近年の移動体通信機器、携帯型通信機器の発展により、これら機器の小型化に伴い実装部品の小型化も進められている。このような機器に実装する半導体発光装置（以下、単に発光装置と呼ぶ。）の一例として、図３に示すようなプリント基板に直接部品を実装する、いわゆる表面実装型の発光装置１０がある。図３は、この発光装置１０の構造を示す断面図である。   With the recent development of mobile communication devices and portable communication devices, miniaturization of mounted components has been promoted along with the miniaturization of these devices. As an example of a semiconductor light emitting device (hereinafter simply referred to as a light emitting device) mounted on such a device, there is a so-called surface mount type light emitting device 10 in which components are directly mounted on a printed board as shown in FIG. FIG. 3 is a cross-sectional view showing the structure of the light emitting device 10.

この発光装置１０は、基板１６と、この基板１６上に設けられる第１の電極１３ａと第２の電極１３ｂと、この第１の電極１３ａに載置される発光素子１４と、この発光素子１４の図示していない上部電極と第２の電極１３ｂを導通配線するワイヤー１５と、発光素子１４及びワイヤー１５の周囲に立設される基材１２と、この基材１２で覆われてなる中央部の凹部分に充填される封止樹脂１１とで構成されている。   The light-emitting device 10 includes a substrate 16, a first electrode 13 a and a second electrode 13 b provided on the substrate 16, a light-emitting element 14 placed on the first electrode 13 a, and the light-emitting element 14. A wire 15 for conducting and wiring between the upper electrode (not shown) and the second electrode 13b, a light emitting element 14 and a base material 12 standing around the wire 15, and a central portion covered with the base material 12 And the sealing resin 11 filled in the concave portion.

このような発光装置１０は、凹部分の内部に設けられる発光素子１４が湿気を含む空気中に暴露されると、発光強度の低下や突然発光しなくなるいわゆる突然死など、寿命が短くなるという問題を有していることから、凹部分に可視光での透過率が良好な樹脂を用いて封止を行うことにより、発光装置の発光特性と信頼性を維持している。   Such a light-emitting device 10 has a problem that when the light-emitting element 14 provided inside the concave portion is exposed to air containing moisture, the lifetime is shortened, such as a decrease in light emission intensity or a so-called sudden death that stops sudden light emission. Therefore, the light emitting characteristics and reliability of the light emitting device are maintained by sealing the resin with a resin having good visible light transmittance in the concave portion.

ところで、この表面実装型の発光装置１０は、例えばプリント基板上に実装する際に、クリーム半田が塗布された電極端子上にこの発光装置１０が配置され、この状態でリフローはんだ装置に導入されて窯内温度２６０℃程度で加熱されることによりリフローされる。   By the way, when the surface-mounted light emitting device 10 is mounted on a printed circuit board, for example, the light emitting device 10 is arranged on an electrode terminal coated with cream solder, and is introduced into the reflow soldering device in this state. Reflow is performed by heating at a furnace temperature of about 260 ° C.

そのため封止樹脂１１にエポキシ樹脂などを用いると、この高温加熱により基材１２から封止樹脂１１が剥離することや、封止樹脂１１自体にクラックなどが入り、結果として通電量に対して発光強度が適切でない場合や、通電しても発光しないなどの不具合が生ずる。このようなことから耐熱性の高いシリコン樹脂、或いはシリコンゴムを使用する発光装置の開発が進められている（特許文献１）。   Therefore, when an epoxy resin or the like is used for the sealing resin 11, the sealing resin 11 is peeled off from the base material 12 by this high-temperature heating, or cracks or the like enter the sealing resin 11 itself. Problems such as inadequate intensity and no light emission even when energized occur. For these reasons, development of a light-emitting device using silicon resin or silicon rubber having high heat resistance has been advanced (Patent Document 1).

また図３に示すように、発光素子１４は導電性接着剤や金線によるワイヤーボンドなどの方法で第２の電極１３ｂである金属板に接続されている。前述したように凹部分に封止樹脂１１を流し込み、熱硬化樹脂であれば加熱、紫外線硬化樹脂であれば紫外線を照射して樹脂を硬化させるが、これら硬化された樹脂が一定以上の硬さを有すると、この樹脂内に、硬化時に発生する内部歪が原因でワイヤー１５や、導電性接着剤により接続されているワイヤー１５と第２の電極１３ｂの接続点、及びワイヤー１５と発光素子１４の接続点に負荷がかかり破壊する恐れがある。この破壊発生の確率は一定の確率で起こる。このようなことから従来一般には、封止樹脂１１に軟質の樹脂を使用することが多い。軟質の樹脂であれば、多少の内部歪が発生してもワイヤー１５を断線させる可能性を低下させることができる。
特開平１０−２９４４８７号公報 As shown in FIG. 3, the light emitting element 14 is connected to a metal plate as the second electrode 13b by a method such as wire bonding using a conductive adhesive or a gold wire. As described above, the sealing resin 11 is poured into the concave portion, and if it is a thermosetting resin, it is heated, and if it is an ultraviolet curable resin, the resin is cured by irradiating it with ultraviolet rays. In the resin, due to internal strain generated during curing, the wire 15, the connection point between the wire 15 connected by the conductive adhesive and the second electrode 13 b, and the wire 15 and the light emitting element 14 are included. There is a risk of damage due to the load on the connection point. This probability of destruction occurs with a certain probability. Therefore, in general, a soft resin is often used for the sealing resin 11 in general. If it is soft resin, even if some internal distortion generate | occur | produces, the possibility of disconnecting the wire 15 can be reduced.
JP-A-10-294487

上述したように、ワイヤー１５の破壊、及び導電性接着剤の接続点における剥離を防止するために、封止樹脂１１に軟質のシリコン樹脂を用いたいという要望がある。   As described above, there is a desire to use a soft silicone resin for the sealing resin 11 in order to prevent breakage of the wire 15 and peeling at the connection point of the conductive adhesive.

しかしながら、軟質のシリコン樹脂は、その表面にタックと呼ばれるべたつきが発生するため、製品使用時にこの封止樹脂表面に埃などのゴミが吸着するという問題がある。べたつきが発生する部分は、表面実装型の発光装置１０の発光面である。このような埃などの異物の付着量に応じて、発光素子１４からの光の透過率は低下するため、引いては製品としての発光強度が低下するという問題に繋がる。   However, the soft silicon resin has a stickiness called “tack” on its surface, which causes a problem that dust such as dust is adsorbed on the surface of the sealing resin when the product is used. The portion where stickiness occurs is the light emitting surface of the surface-mounted light emitting device 10. The transmittance of light from the light emitting element 14 decreases according to the amount of foreign matter such as dust, which leads to a problem that the light emission intensity as a product decreases.

そこで、このような問題の対策一例として従来は、発光装置１０が実装されたプリント回路基板全体を筐体（図示せず）で囲うなどの工夫がなされていた。これにより埃などのゴミの吸着を低下させることができるようになったが、その反面、筐体等を設けることによるコストアップを招くという問題が生じた。また更に、筐体等を設けることにより製品の小型化も達成しづらいという問題もあった。   Thus, conventionally, as an example of measures against such a problem, a device such as enclosing the entire printed circuit board on which the light emitting device 10 is mounted with a housing (not shown) has been made. As a result, the adsorption of dust such as dust can be reduced. However, on the other hand, there is a problem that the cost increases due to the provision of a housing or the like. Furthermore, there is a problem that it is difficult to achieve downsizing of the product by providing a housing or the like.

本発明は、上記課題を鑑みてなされたものであり、その目的は、長期保管後の長期信頼性に耐え得る構造を有し、且つ細線のワイヤーやワイヤーと電極の接続点にかかる負荷を抑制することができる半導体発光装置を提供することにある。   The present invention has been made in view of the above problems, and its purpose is to have a structure that can withstand long-term reliability after long-term storage, and to suppress a load on a thin wire or a connection point between a wire and an electrode. An object of the present invention is to provide a semiconductor light emitting device that can be used.

上記課題を解決するために、請求項１記載の本発明は、一対の電極に電気的に接続された半導体発光素子と、この半導体発光素子を覆う封止樹脂を少なくとも備える半導体発光装置であって、封止樹脂の表面であり、且つ光の出射領域内に静電気防止処理を施した高光透過性を有する保護層を備えることを要旨とする。   In order to solve the above problems, the present invention according to claim 1 is a semiconductor light emitting device comprising at least a semiconductor light emitting element electrically connected to a pair of electrodes, and a sealing resin covering the semiconductor light emitting element. The gist of the present invention is to provide a protective layer having a high light transmittance which is a surface of the sealing resin and which has been subjected to antistatic treatment in the light emission region.

請求項２記載の本発明は、請求項１記載の発光装置において、封止樹脂は、主原材料がシリコンからなり、且つ日本工業規格で規定されるＪＩＳ Ａ ６０以下の硬度を有する樹脂であることを要旨とする。   According to a second aspect of the present invention, in the light emitting device according to the first aspect, the sealing resin is a resin whose main raw material is made of silicon and has a hardness of JIS A 60 or less as defined by Japanese Industrial Standards. Is the gist.

本発明によれば、長期保管後の長期信頼性に耐え得る構造を有し、且つ細線のワイヤーやワイヤーと電極の接続点にかかる負荷を抑制することができる半導体発光装置を提供することができる。   ADVANTAGE OF THE INVENTION According to this invention, it can provide the semiconductor light-emitting device which has the structure which can endure long-term reliability after long-term storage, and can suppress the load concerning the connection point of a thin wire or a wire and an electrode. .

以下、本発明の実施の形態を図面を参照して説明する。   Hereinafter, embodiments of the present invention will be described with reference to the drawings.

図１は、本発明の実施の形態に係る半導体発光装置（以下、単に発光装置という）１の断面図である。本発光装置１の構成において、従来と同じ構成部分は同符号を付している。   FIG. 1 is a cross-sectional view of a semiconductor light emitting device (hereinafter simply referred to as a light emitting device) 1 according to an embodiment of the present invention. In the configuration of the light emitting device 1, the same components as those in the past are denoted by the same reference numerals.

本発明の発光装置１は、平坦面を有する基板１６と、この基板１６上に設けられる一対の第１及び第２の電極１３ａ及び１３ｂと、第１の電極１３ａ上に載置される発光素子１４と、この発光素子１４の図示していない上部電極と第２の電極１３ｂを導通配線するワイヤー１５と、発光素子１４及びワイヤー１５の周囲に立設される基材１２と、この基材１２で覆われて形成される凹部分に充填される封止樹脂１１とで少なくとも構成され、封止樹脂１１の面上には静電気防止処理を施した光透過性の高い保護層２が設けられている。   The light-emitting device 1 of the present invention includes a substrate 16 having a flat surface, a pair of first and second electrodes 13a and 13b provided on the substrate 16, and a light-emitting element placed on the first electrode 13a. 14, a wire 15 for conducting wiring between the upper electrode (not shown) of the light emitting element 14 and the second electrode 13 b, a base material 12 erected around the light emitting element 14 and the wire 15, and the base material 12 And at least a sealing resin 11 filled in a concave portion formed by being covered with, and on the surface of the sealing resin 11, a protective layer 2 having a high light transmittance subjected to an antistatic treatment is provided. Yes.

本発明の特徴のひとつは、封止樹脂１１の面上に静電気防止処理が施された保護層２を設ける点にある。これにより従来は封止樹脂１１の表面上にタックが発生していたが、このタックを保護層２で覆うことができるので、粉塵、埃などの異物の吸着を抑制することができる。その結果、従来よりも光の透過率を向上させることができ、ひいては発光装置としての発光強度を長期保存後でも従来より向上させることができるようになる。   One of the features of the present invention is that the protective layer 2 subjected to antistatic treatment is provided on the surface of the sealing resin 11. As a result, tack has conventionally been generated on the surface of the sealing resin 11, but since this tack can be covered with the protective layer 2, adsorption of foreign matters such as dust and dust can be suppressed. As a result, the light transmittance can be improved as compared with the conventional case, and as a result, the light emission intensity as the light emitting device can be improved as compared with the conventional case even after long-term storage.

また保護層２を設けることにより、従来通り封止樹脂１１に軟質のシリコン樹脂を使用することができるようになる。これにより発光素子１４及び発光素子１４に接続した細線のワイヤー１５の破断発生の確率を大幅に低減させることができる。   In addition, by providing the protective layer 2, a soft silicon resin can be used for the sealing resin 11 as in the past. Thereby, the probability of the occurrence of breakage of the light emitting element 14 and the thin wire 15 connected to the light emitting element 14 can be greatly reduced.

ここで封止樹脂１１の材料は、光の透過率の観点からシリコン樹脂が望ましい。その硬度は、日本工業規格で規定されているＪＩＳ Ａ 硬度６０以下であることが好ましい。   Here, the material of the sealing resin 11 is preferably a silicon resin from the viewpoint of light transmittance. The hardness is preferably JIS A hardness 60 or less as defined in Japanese Industrial Standards.

一方、封止樹脂１１の表面上に形成する保護層２の材質はシリコンが望ましく、その厚みは、光の透過率の観点から５０〜３００μｍが適当である。本実施の形態においては、具体的に厚みを２００μｍとし、硬度は日本工業規格で規定されているＪＩＳ Ａ ７０以上とした。この保護層２の表面には、静電気による塵、粉塵の吸着を防止するための静電気防止層３が設けられている。   On the other hand, the material of the protective layer 2 formed on the surface of the sealing resin 11 is desirably silicon, and the thickness is suitably 50 to 300 μm from the viewpoint of light transmittance. In the present embodiment, the thickness is specifically set to 200 μm, and the hardness is set to JIS A 70 or more as defined in the Japanese Industrial Standard. The surface of the protective layer 2 is provided with an antistatic layer 3 for preventing the adsorption of dust and dust due to static electricity.

この静電気防止層３は、発光装置１としての機能を保持するために、光の透過率は９０％以上であることが望ましい。また静電気防止層３の表面固有抵抗は１０12Ω以下とし、光の透過率が９０％以上のものであれば材料は特に限定せず、如何なる材料で構成されていても良い。静電気防止剤の一例としては、リン酸エステル系、４級アンモニウム塩素などが挙げられる。 The antistatic layer 3 desirably has a light transmittance of 90% or more in order to maintain the function as the light emitting device 1. The surface resistance of the antistatic layer 3 is 10 12 Ω or less, and the material is not particularly limited as long as the light transmittance is 90% or more, and any material may be used. As an example of the antistatic agent, phosphate ester type, quaternary ammonium chlorine and the like can be mentioned.

また静電気防止層３は、その光透過率の観点から厚みは５０μｍ以内であることが適当である。静電気防止層３が形成される領域は、少なくとも光の出射面とする。これにより製品としての発光強度を維持しつつ、保護層２上に形成された静電気防止層３の表面が塵、粉塵などに曝されても、これらの吸着を著しく抑制することができる。   The thickness of the antistatic layer 3 is suitably 50 μm or less from the viewpoint of light transmittance. The region where the antistatic layer 3 is formed is at least a light emission surface. Thereby, even if the surface of the antistatic layer 3 formed on the protective layer 2 is exposed to dust, dust or the like while maintaining the light emission intensity as a product, it is possible to remarkably suppress the adsorption of these.

このような上記構成を有する発光装置において、封止樹脂１１の硬度を異なる数種のシリコン樹脂で作製して、各発光装置についてヒートサイクル試験を実施した。その結果を図２に示す。   In the light emitting device having such a configuration, the sealing resin 11 was made of several kinds of silicon resins having different hardnesses, and a heat cycle test was performed on each light emitting device. The result is shown in FIG.

封止樹脂１１の硬度をそれぞれＪＩＳ Ａ 硬度６０、７０、８０の３種類とし、この封止樹脂１１の表面にＪＩＳ Ａ 硬度９０の保護層２を設け、更に保護層２表面に静電気防止層３を設けた。このような構成を有する発光素子を２０個づつ用意した。これらを１２５℃、−６５℃の２種類の温度で３０分間ごとに切替可能なヒートサイクル試験器で試験した。   The sealing resin 11 has three types of hardness, JIS A hardness 60, 70 and 80, respectively, and a protective layer 2 having a JIS A hardness of 90 is provided on the surface of the sealing resin 11, and the antistatic layer 3 is further provided on the surface of the protective layer 2. Was provided. Twenty light emitting elements having such a configuration were prepared. These were tested with a heat cycle tester capable of switching at two temperatures of 125 ° C. and −65 ° C. every 30 minutes.

その結果、硬度６０の発光装置は、２０個全ての発光装置から発光が確認できた。しかし硬度７０の場合は２０個中１個が未発光であった。また硬度８０の場合も２０個中２個が未発光であった。   As a result, light emission from the light emitting device having a hardness of 60 was confirmed from all 20 light emitting devices. However, in the case of hardness 70, 1 out of 20 did not emit light. When the hardness was 80, 2 out of 20 did not emit light.

上記の試験結果から、封止樹脂１１の硬度が６０以下であれば１００％の確率で発光することが示された。従って、発光素子１４を覆う封止樹脂１１を備える発光装置において、封止樹脂１１は硬度６０以下のシリコン樹脂とし、保護層２は、ＪＩＳ Ａ 硬度７０以上のシリコン樹脂とすることで、製品としての発光強度を維持した発光装置を提供することができる。   From the above test results, it was shown that if the hardness of the sealing resin 11 is 60 or less, light is emitted with a probability of 100%. Therefore, in the light emitting device including the sealing resin 11 covering the light emitting element 14, the sealing resin 11 is a silicon resin having a hardness of 60 or less, and the protective layer 2 is a silicon resin having a JIS A hardness of 70 or more. It is possible to provide a light emitting device that maintains the emission intensity.

尚、本実施の形態においては、発光素子１４の発光波長を特に限定していないが、発光波長は４００ｎｍから６５０ｎｍのうち何れの波長を出力するものでも適用できる。   In the present embodiment, the emission wavelength of the light-emitting element 14 is not particularly limited, but any emission wavelength from 400 nm to 650 nm can be applied.

そこで、図３を参照して、発光波長４００ｎｍから６５０ｎｍの発光強度の測定結果を示す。また合わせて長期保存後の長期信頼性を説明する。   Then, with reference to FIG. 3, the measurement result of the emitted light intensity of light emission wavelength 400nm to 650nm is shown. The long-term reliability after long-term storage is also explained.

図３（ａ）は、赤色発光素子（発光波長λ＝６２０ｎｍ）の発光強度を、経過時間（横軸）に対する相対発光強度（ａ．ｕ）（縦軸）で表したものである。グラフＡは、静電気防止層３なしの場合の発光強度変化であり、グラフＢは、静電気防止層３を設けた場合の発光強度変化である。   FIG. 3A shows the emission intensity of the red light emitting element (emission wavelength λ = 620 nm) as relative emission intensity (au) (vertical axis) with respect to the elapsed time (horizontal axis). Graph A shows the change in emission intensity when the antistatic layer 3 is not provided, and graph B shows the change in emission intensity when the antistatic layer 3 is provided.

ここで発光装置１に適用した封止樹脂１１（ＪＩＳ Ａ 硬度６０以下、光透過度９０％以上）は、可視光領域での光透過率が高い。すなわち、樹脂のそのもの又は添加剤などの何れにおいてもこの領域の波長の光を吸収しないため、可視光領域での吸収が生じない。そのシリコン樹脂に光を照射し続けるような連続的なＬＥＤとしての点灯試験を実施した結果、上述したようにシリコン樹脂等が光を吸収しないため、光による分解などの樹脂の分解反応が起きず、図３（ａ）に示すように、そのシリコン樹脂を封止樹脂１１として用いたＬＥＤの長期信頼性５０００時間経過後であっても高くなると評価できる。   Here, the sealing resin 11 (JIS A hardness 60 or less, light transmittance 90% or more) applied to the light emitting device 1 has high light transmittance in the visible light region. That is, neither the resin itself nor the additive absorbs light having a wavelength in this region, so that absorption in the visible light region does not occur. As a result of conducting a lighting test as a continuous LED that keeps irradiating light to the silicon resin, as described above, the silicon resin does not absorb light, so that the decomposition reaction of the resin such as decomposition by light does not occur. As shown in FIG. 3A, it can be evaluated that the long-term reliability of the LED using the silicon resin as the sealing resin 11 is increased even after 5000 hours.

一方、図３（ｂ）は、青色発光素子（発光波長λ＝４６０ｎｍ）の発光強度を、経過時間（横軸）に対する相対発光強度（ａ．ｕ）（縦軸）で表したものである。グラフＣは、静電気防止層３なしの場合の発光強度変化であり、グラフＤは、静電気防止層３を設けた場合の発光強度変化である。またグラフＥは、保護層２をエポキシ樹脂にした場合の発光強度変化である。   On the other hand, FIG. 3B shows the emission intensity of the blue light emitting element (emission wavelength λ = 460 nm) as a relative emission intensity (au) (vertical axis) with respect to the elapsed time (horizontal axis). Graph C shows a change in emission intensity when no antistatic layer 3 is provided, and graph D shows a change in emission intensity when the antistatic layer 3 is provided. Graph E shows the change in emission intensity when the protective layer 2 is an epoxy resin.

同図に示されている通り、グラフＣ、Ｄは、グラフＡ、Ｂとほぼ同じ結果となった。すなわり、封止樹脂１１にシリコン樹脂を使用した場合は、異なる光（発光波長）を発光する素子を用いても、その波長に依存することなく、一定の発光強度が得られる。   As shown in the figure, the graphs C and D had almost the same results as the graphs A and B. In other words, when a silicon resin is used for the sealing resin 11, even if an element that emits different light (emission wavelength) is used, a constant emission intensity can be obtained without depending on the wavelength.

一方で、グラフＥに示すように、一般的な発光素子の封止樹脂として用いられているエポキシ樹脂は、その主成分である樹脂と添加剤は何れも４５０ｎｍ以下の波長を吸収し、光の透過率をやや低下させる。そのため、紫外線領域の波長の光となるとその光は全く透過しなくなる。これは、添加剤、樹脂そのものに短波長の光を吸収する構造が存在していることに起因している。このような短波長の光を吸収すると樹脂は化学的な分解を起こすため、長期的な観点からは樹脂が劣化し、ＬＥＤとしては発光強度を低下させる恐れがある。   On the other hand, as shown in the graph E, the epoxy resin used as a sealing resin for a general light-emitting element absorbs a wavelength of 450 nm or less for both the main component resin and additive, Slightly decreases the transmittance. Therefore, when the light has a wavelength in the ultraviolet region, the light is not transmitted at all. This is because the additive and the resin itself have a structure that absorbs light of a short wavelength. When such short-wavelength light is absorbed, the resin is chemically decomposed, so that the resin is deteriorated from a long-term viewpoint, and the light emission intensity of the LED may be reduced.

以上の通り本発明によれば、一対の電極に電気的に接続された半導体発光素子と、この半導体発光素子を覆う封止樹脂を少なくとも備える半導体発光装置であって、封止樹脂の表面で、且つ光の出射領域内に静電気防止処理が施された光透過性の高い保護層を設けることで、べたつく表層が空気中に曝されないので粉塵、埃などの付着量を低下させることができる。これにより埃などの付着量に応じて低下していた光の透過率の低下を抑制することができるので、結果として、製品の長期保管後の長期信頼性を招来することができるようになる。   As described above, according to the present invention, there is provided a semiconductor light emitting device including at least a semiconductor light emitting element electrically connected to a pair of electrodes and a sealing resin covering the semiconductor light emitting element, on the surface of the sealing resin, In addition, by providing a protective layer with high light transmittance that has been subjected to antistatic treatment in the light emission region, the sticky surface layer is not exposed to the air, so that the amount of adhesion of dust, dust, etc. can be reduced. As a result, it is possible to suppress a decrease in light transmittance that has been reduced in accordance with the amount of adhesion of dust and the like, and as a result, long-term reliability after long-term storage of the product can be brought about.

また、封止樹脂の材料として軟質の樹脂を適用することができるので、粉塵、埃などの付着を低下させつつ、ワイヤーとこのワイヤーと発光素子の接続点及びワイヤーと電極の接続点に加わる負荷を抑制させることができる。その結果、発光素子に取り付けたワイヤーや、発光素子を取り付けているダイボンドが外れる恐れを原理上大きく低減させることができる。   Also, since a soft resin can be applied as the material of the sealing resin, the load applied to the connection point between the wire and the wire and the light emitting element and the connection point between the wire and the electrode while reducing the adhesion of dust, dust, etc. Can be suppressed. As a result, the possibility that the wire attached to the light emitting element or the die bond attached with the light emitting element may be reduced in principle.

更に、封止樹脂層にシリコン樹脂を用いるので、紫色〜青色の発光波長範囲での光による封止樹脂の劣化がしづらくなる。   Furthermore, since a silicone resin is used for the sealing resin layer, it becomes difficult for the sealing resin to be deteriorated by light in a violet to blue emission wavelength range.

本発明の実施の形態に係る発光装置の構成を示す断面図である。It is sectional drawing which shows the structure of the light-emitting device which concerns on embodiment of this invention. 本発明の実施の形態に係る発光装置のヒートサイクル試験結果を示す表である。It is a table | surface which shows the heat cycle test result of the light-emitting device which concerns on embodiment of this invention. 本発明の実施の形態に係る発光装置に具備される発光素子の発光波長に対する発光強度の関係をグラフ化したものであり、（ａ）は、赤色発光素子の発光強度特性を示し、（ｂ）は、青色発光素子の発光強度特性を示している。FIG. 4 is a graph showing the relationship between the light emission intensity and the light emission wavelength of the light emitting element included in the light emitting device according to the embodiment of the present invention, wherein (a) shows the light emission intensity characteristics of the red light emitting element; Indicates the emission intensity characteristics of the blue light emitting element. 従来の発光装置の構成を示す断面図である。It is sectional drawing which shows the structure of the conventional light-emitting device.

符号の説明Explanation of symbols

１…発光装置
２…保護層
３…保護膜
１０…発光装置
１１…封止樹脂
１２…基材
１３ａ…第１の電極
１３ｂ…第２の電極
１４…発光素子
１５…ワイヤー
１６…基板 DESCRIPTION OF SYMBOLS 1 ... Light-emitting device 2 ... Protective layer 3 ... Protective film 10 ... Light-emitting device 11 ... Sealing resin 12 ... Base material 13a ... 1st electrode 13b ... 2nd electrode 14 ... Light-emitting element 15 ... Wire 16 ... Board | substrate

Claims (2)

一対の電極に電気的に接続された半導体発光素子と、該半導体発光素子を覆う封止樹脂を少なくとも備える半導体発光装置であって、
前記封止樹脂の表面であって、且つ光の出射領域内に静電気防止処理が施された高光透過性を有する保護層を備えることを特徴とする半導体発光装置。 A semiconductor light emitting device comprising at least a semiconductor light emitting element electrically connected to a pair of electrodes, and a sealing resin covering the semiconductor light emitting element,
A semiconductor light emitting device comprising a protective layer having a high light transmission property, which is a surface of the sealing resin and is subjected to antistatic treatment in a light emission region. 前記封止樹脂は、主原材料がシリコンからなり、且つ日本工業規格で規定されるＪＩＳ Ａ ６０以下の硬度を有する樹脂であることを特徴とする請求項１記載の半導体発光装置。   2. The semiconductor light emitting device according to claim 1, wherein the sealing resin is a resin whose main raw material is made of silicon and has a hardness of JIS A 60 or less as defined by Japanese Industrial Standards.
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