JP2005114675A - 吸光式分析計 - Google Patents
吸光式分析計 Download PDFInfo
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- JP2005114675A JP2005114675A JP2003352463A JP2003352463A JP2005114675A JP 2005114675 A JP2005114675 A JP 2005114675A JP 2003352463 A JP2003352463 A JP 2003352463A JP 2003352463 A JP2003352463 A JP 2003352463A JP 2005114675 A JP2005114675 A JP 2005114675A
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- 238000010521 absorption reaction Methods 0.000 title claims abstract description 26
- 230000003287 optical effect Effects 0.000 claims abstract description 123
- 230000031700 light absorption Effects 0.000 claims description 4
- 238000005259 measurement Methods 0.000 abstract description 26
- 239000000470 constituent Substances 0.000 abstract description 2
- MWUXSHHQAYIFBG-UHFFFAOYSA-N Nitric oxide Chemical compound O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 30
- 238000002835 absorbance Methods 0.000 description 19
- 239000012530 fluid Substances 0.000 description 14
- 230000035945 sensitivity Effects 0.000 description 14
- 230000000694 effects Effects 0.000 description 11
- 238000001745 non-dispersive infrared spectroscopy Methods 0.000 description 10
- 238000001514 detection method Methods 0.000 description 8
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 4
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 229910002091 carbon monoxide Inorganic materials 0.000 description 3
- 238000002485 combustion reaction Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- RAHZWNYVWXNFOC-UHFFFAOYSA-N Sulphur dioxide Chemical compound O=S=O RAHZWNYVWXNFOC-UHFFFAOYSA-N 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 2
- 239000003546 flue gas Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000011780 sodium chloride Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910016036 BaF 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- OYLGJCQECKOTOL-UHFFFAOYSA-L barium fluoride Chemical compound [F-].[F-].[Ba+2] OYLGJCQECKOTOL-UHFFFAOYSA-L 0.000 description 1
- 229910001632 barium fluoride Inorganic materials 0.000 description 1
- 230000008033 biological extinction Effects 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- WQGWDDDVZFFDIG-UHFFFAOYSA-N pyrogallol Chemical compound OC1=CC=CC(O)=C1O WQGWDDDVZFFDIG-UHFFFAOYSA-N 0.000 description 1
- 238000011896 sensitive detection Methods 0.000 description 1
- 239000013076 target substance Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/05—Flow-through cuvettes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
- G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Measuring Cells (AREA)
Abstract
【解決手段】 光源部、試料セル部および複数の検出器を構成要素として含む吸光式分析計において、該光源部と1の検出器との中間に集光部材を設け、前記光学部材の内壁面に前記光源部から光の一部を導出する部位、つまり光導出口を有し、該光導出口から導出した光が他の検出器に入射することを特徴とする。ここで、集光部材が、光源部と試料セル部との中間にあることが好適である。また、他の検出器用に用いる光学素子を、光導出口に設けるとともに、集光部材により形成される光路に近接して配することが好適である。
【選択図】 図1
Description
I0 /I = A×log(εcd) ・・・式1
図1に、本発明にかかる吸光度分析計の基本的な光学系の第1の構成例を示す。図1において、光源用電源(図示せず)からの電力を受けた光源部1、集光部材5、試料セル部2a、光学素子7aおよび検出器3aからなる光路と、集光部材5の内壁面の一部から光導出路6を介して、試料セル部2b、光学素子7bおよび検出器3bからなる光路を有した光学系を形成している。ここで、流体は順次試料セル部2aから2bに導入されるが、流体切換部4を用いて試料流体Sと基準流体Rを一定周期で切換えることによって、各試料セル部2a、2b内での赤外線の吸収量の変化分のみを各検出器3a、3bによって交流信号として取り出すことができる(流体変調)。各検出器出力は、上述のように、前置増幅器等(図示せず)で増幅された後、信号処理部(図示せず)に入力され整流等の信号処理の後、濃度演算されて表示部(図示せず)に濃度表示される。
2 試料セル部
3 検出器
4 流体切換部
5 集光部材
6 光導出路
7 光学素子(光学フィルタ)
8 光学素子部
9 光学窓
Claims (3)
- 光源部、試料セル部および複数の検出器を構成要素として含む吸光式分析計において、前記光源部と1の検出器との中間に集光部材を設け、該集光部材の内壁面に前記光源部から光の一部を導出する部位、つまり光導出口を有し、該光導出口から導出した光が他の検出器に入射することを特徴とする吸光式分析計。
- 集光部材が、光源部と試料セル部との中間にあることを特徴とする請求項1に記載の吸光式分析計。
- 他の検出器用に用いる光学素子を、光導出口に設けるとともに、集光部材により形成される光路に近接して配することを特徴とする請求項1または2に記載の吸光式分析計。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003352463A JP4218954B2 (ja) | 2003-10-10 | 2003-10-10 | 吸光式分析計 |
CNB2004100797903A CN100343653C (zh) | 2003-10-10 | 2004-09-13 | 吸光式分析仪 |
US10/958,011 US7227642B2 (en) | 2003-10-10 | 2004-10-04 | Absorbance monitor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003352463A JP4218954B2 (ja) | 2003-10-10 | 2003-10-10 | 吸光式分析計 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005114675A true JP2005114675A (ja) | 2005-04-28 |
JP4218954B2 JP4218954B2 (ja) | 2009-02-04 |
Family
ID=34509721
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Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003352463A Expired - Fee Related JP4218954B2 (ja) | 2003-10-10 | 2003-10-10 | 吸光式分析計 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7227642B2 (ja) |
JP (1) | JP4218954B2 (ja) |
CN (1) | CN100343653C (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2018097071A1 (ja) * | 2016-11-28 | 2018-05-31 | 京セラ株式会社 | センサ用配線基板、センサ用パッケージおよびセンサ装置 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2043767B1 (en) | 2006-07-14 | 2020-03-25 | Wisconsin Alumni Research Foundation | Adsorptive membranes for trapping viruses |
US20080100845A1 (en) * | 2006-10-27 | 2008-05-01 | Optek-Danulat Gmbh | Inline photometer device and calibration method |
DE102010030549B4 (de) * | 2010-06-25 | 2016-04-28 | Siemens Aktiengesellschaft | Nichtdispersiver Gasanalysator |
GB201120769D0 (en) | 2011-12-02 | 2012-01-11 | Biochrom Ltd | Improvements in and relating to devices for recieving liquid samples |
CN104849213B (zh) * | 2014-02-19 | 2017-12-29 | 赛默飞世尔(上海)仪器有限公司 | 光源以及光学测量*** |
US9728057B2 (en) | 2014-05-27 | 2017-08-08 | Kidde Technologies, Inc. | Pneumatic detection using a liquefied compressed gas |
CN111982305A (zh) * | 2020-08-27 | 2020-11-24 | 杭州海康威视数字技术股份有限公司 | 温度测量方法、装置及计算机存储介质 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3918994C1 (ja) * | 1989-06-10 | 1990-06-13 | Draegerwerk Ag, 2400 Luebeck, De | |
DE3932838C2 (de) * | 1989-09-30 | 1996-03-07 | Hartmann & Braun Ag | Nichtdispersiver Infrarot-Gasanalysator |
US5282473A (en) * | 1992-11-10 | 1994-02-01 | Critikon, Inc. | Sidestream infrared gas analyzer requiring small sample volumes |
JP2903457B2 (ja) | 1993-11-20 | 1999-06-07 | 株式会社堀場製作所 | ガス分析計およびガス分析機構 |
US5693945A (en) * | 1994-07-30 | 1997-12-02 | Horiba Ltd. | Gas analyzer |
JPH0843302A (ja) * | 1994-07-30 | 1996-02-16 | Horiba Ltd | 紫外線分析計 |
DE19601873C2 (de) * | 1995-03-04 | 1999-02-11 | Horiba Ltd | Gasanalysator |
-
2003
- 2003-10-10 JP JP2003352463A patent/JP4218954B2/ja not_active Expired - Fee Related
-
2004
- 2004-09-13 CN CNB2004100797903A patent/CN100343653C/zh not_active Expired - Fee Related
- 2004-10-04 US US10/958,011 patent/US7227642B2/en active Active
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2018097071A1 (ja) * | 2016-11-28 | 2018-05-31 | 京セラ株式会社 | センサ用配線基板、センサ用パッケージおよびセンサ装置 |
JPWO2018097071A1 (ja) * | 2016-11-28 | 2019-10-17 | 京セラ株式会社 | センサ用配線基板、センサ用パッケージおよびセンサ装置 |
US11105738B2 (en) | 2016-11-28 | 2021-08-31 | Kyocera Corporation | Sensor wiring substrate, sensor package, and sensor device |
Also Published As
Publication number | Publication date |
---|---|
JP4218954B2 (ja) | 2009-02-04 |
US20050082483A1 (en) | 2005-04-21 |
CN1605854A (zh) | 2005-04-13 |
US7227642B2 (en) | 2007-06-05 |
CN100343653C (zh) | 2007-10-17 |
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