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- JP2004528111A5 JP2004528111A5 JP2002585939A JP2002585939A JP2004528111A5 JP 2004528111 A5 JP2004528111 A5 JP 2004528111A5 JP 2002585939 A JP2002585939 A JP 2002585939A JP 2002585939 A JP2002585939 A JP 2002585939A JP 2004528111 A5 JP2004528111 A5 JP 2004528111A5
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Claims (30)
- 少なくとも1つの構造に関連する情報を得るための装置であって、
前記少なくとも1つの構造からの少なくとも1つの第1の電磁放射、及び基準からの少なくとも1つの第2の電磁放射を受信するように構成される少なくとも1つの第1の配列と、
少なくとも1つの前記第1の電磁放射又は前記第2の電磁放射に基づいて、前記少なくとも1つの構造の少なくとも1つの部位からの距離を決定するように構成される少なくとも1つの第2の配列と、を備え、
前記少なくとも1つの第2の配列は、距離の関数として、第3の電磁放射の電磁放射路長を制御するように更に構成され、
前記第3の電磁放射は、
i)前記少なくとも1つの構造から送信又は受信される電磁放射の少なくとも1つ、であるか、又は、
ii)前記基準から送信又は受信される電磁放射の少なくとも1つ、
の少なくとも1つである、装置。 - 前記少なくとも1つの部位は、前記少なくとも1つの構造の表面である、請求項1に記載の装置。
- 前記少なくとも1つの第2の配列は、ゼロ次処理、一次導関数処理、二次導関数処理、確率統計関数(例えば標準偏差)の決定、又は、当てはめ処理の、少なくとも1つを用いて、前記距離を決定する、請求項1に記載の装置。
- 前記少なくとも1つの構造は、生体構造を含む、請求項1に記載の装置。
- 前記少なくとも1つの第2の配列は、(i)前記制御された電磁放射路長に関する前記少なくとも1つの構造に関連する情報を得て、(ii)前記情報の関数として前記少なくとも1つの部位における少なくとも1つの画像を生成する、請求項1に記載の装置。
- 前記少なくとも1つの第2の配列は、前記少なくとも1つの部位の画像が生成されるときに、前記電磁放射路長を制御する、請求項1に記載の装置。
- 前記少なくとも1つの第2の配列は、前記少なくとも1つの第1の電磁放射に基づく前記少なくとも1つの部位からの長さを決定するように更に構成され、
ここで、前記少なくとも1つの第2の配列は、
前記少なくとも1つの構造から送信又は受信される少なくとも1つである前記少なくとも1つの第3の電磁放射の少なくとも1つの焦点距離を、前記長さの関数として、制御するように更に構成される、請求項1に記載の装置。 - 前記少なくとも1つの第2の配列は、
少なくとも1つの前記第1の電磁放射又は前記第2の電磁放射に基づいて、前記少なくとも1つの部位内における電磁放射の侵入深さを決定するように更に構成され、
ここで、前記少なくとも1つの第2の配列は、前記電磁放射路長の範囲を、前記侵入深さの関数として、制御するように更に構成される、請求項1に記載の装置。 - 少なくとも1つの構造に関連する情報を得るための装置であって、
前記少なくとも1つの構造からの少なくとも1つの第1の電磁放射を受信するように構成される少なくとも1つの第1の配列と、
少なくとも1つの前記第1の電磁放射に基づいて、前記少なくとも1つの構造の少なくとも1つの部位からの長さを決定するように構成される少なくとも1つの第2の配列と、を備え、
前記少なくとも1つの第2の配列は、前記長さの関数として、少なくとも1つの第2の電磁放射の少なくとも1つの焦点距離を制御するように更に構成され、
前記第2の電磁放射は、
前記少なくとも1つの構造から送信又は受信される電磁放射の少なくとも1つ、である、装置。 - 前記少なくとも1つの部位は、前記少なくとも1つの構造の表面である、請求項9に記載の装置。
- 前記少なくとも1つの第2の配列は、
前記第1の電磁放射又は基準から受信される第3の電磁放射の少なくとも1つに基づいて、前記少なくとも1つの部位からの距離を決定するように更に構成され、
ここで、
前記少なくとも1つの第2の配列は、前記距離の関数として、前記第2の電磁放射の電磁放射路長を制御するように更に構成され、
前記第2の電磁放射は、
i)前記少なくとも1つの構造から送信又は受信される電磁放射の少なくとも1つ、であるか、又は、
ii)前記基準から送信又は受信される電磁放射の少なくとも1つ、
の少なくとも1つである、請求項9に記載の装置。 - 前記少なくとも1つの第2の配列は、ゼロ次処理、一次導関数処理、二次導関数処理、確率統計関数(例えば標準偏差)の決定、又は、当てはめ処理の、少なくとも1つを用いて、前記距離を決定する、請求項11に記載の装置。
- 前記少なくとも1つの構造は、生体構造を含む、請求項9に記載の装置。
- 前記少なくとも1つの第2の配列は、(i)前記制御された電磁放射路長に関する前記少なくとも1つの構造に関連する情報を得て、(ii)前記情報の関数として前記少なくとも1つの部位における少なくとも1つの画像を生成する、請求項11に記載の装置。
- 前記少なくとも1つの第2の配列は、前記少なくとも1つの部位の画像が生成されるときに、前記電磁放射路長を制御する、請求項9に記載の装置。
- 前記少なくとも1つの第1の配列は、
基準からの少なくとも1つの第3の電磁放射を受信するように更に構成され、
ここで、前記少なくとも1つの第2の配列は、
前記第1の電磁放射又は前記第3の電磁放射の少なくとも1つに基づいて、前記少なくとも1つの部位からの距離を決定するように構成される、請求項9に記載の装置。 - 前記少なくとも1つの第2の配列は、
少なくとも1つの前記第1の電磁放射又は前記第3の電磁放射に基づいて、前記少なくとも1つの部位内における電磁放射の侵入深さを決定するように更に構成され、
ここで、前記少なくとも1つの第2の配列は、前記電磁放射路長の範囲を、前記侵入深さの関数として、制御するように更に構成される、請求項11に記載の装置。 - 少なくとも1つの構造に関連する情報を得るための装置であって、
前記少なくとも1つの構造からの少なくとも1つの第1の電磁放射、及び基準からの少なくとも1つの第2の電磁放射を受信するように構成される少なくとも1つの第1の配列と、
少なくとも1つの前記第1の電磁放射又は前記第2の電磁放射に基づいて、少なくとも1つの部位内における電磁放射の侵入深さを決定するように構成される少なくとも1つの第2の配列と、を備え、
ここで、
前記少なくとも1つの第2の配列は、前記侵入深さの関数として、第3の電磁放射の電磁放射路長の範囲を制御するように更に構成され、
前記第3の電磁放射は、
i)前記少なくとも1つの構造から送信又は受信される電磁放射の少なくとも1つ、であるか、又は、
ii)前記基準から送信又は受信される電磁放射の少なくとも1つ、
の少なくとも1つである、装置。 - 前記少なくとも1つの第2の配列は、
前記第1の電磁放射又は基準から受信される第3の電磁放射の少なくとも1つに基づいて、前記少なくとも1つの部位からの距離を決定するように更に構成され、
ここで、前記少なくとも1つの第2の配列は、前記距離の関数として、前記電磁放射路長を制御するように更に構成される、請求項18に記載の装置。 - 前記少なくとも1つの第2の配列は、ゼロ次処理、一次導関数処理、二次導関数処理、確率統計関数(例えば標準偏差)の決定、又は、当てはめ処理の、少なくとも1つを用いて、前記距離を決定する、請求項19に記載の装置。
- 前記少なくとも1つの第2の配列は、(i)前記制御された電磁放射路長に関する前記少なくとも1つの構造に関連する情報を得て、(ii)前記情報の関数として前記少なくとも1つの部位における少なくとも1つの画像を生成する、請求項19に記載の装置。
- 前記少なくとも1つの第2の配列は、
少なくとも1つの前記第1の電磁放射又は前記第3の電磁放射に基づいて、前記少なくとも1つの部位内における電磁放射の侵入深さを決定するように更に構成され、
ここで、前記少なくとも1つの第2の配列は、前記電磁放射路長の範囲を、前記侵入深さの関数として、制御するように更に構成される、請求項19に記載の装置。 - 前記少なくとも1つの構造は、生体構造を含む、請求項18に記載の装置。
- 前記少なくとも1つの第2の配列は、前記少なくとも1つの部位の画像が生成されるときに、前記電磁放射路長を制御する、請求項18に記載の装置。
- 前記少なくとも1つの第2の配列は、
少なくとも1つの前記第1の電磁放射又は前記第2の電磁放射に基づいて、前記少なくとも1つの部位からの前記距離を決定するように更に構成される、請求項18に記載の装置。 - 前記少なくとも1つの第2の配列は、前記少なくとも1つの第1の電磁放射に基づく前記少なくとも1つの部位からの長さを決定するように更に構成され、
ここで、前記少なくとも1つの第2の配列は、
前記少なくとも1つの構造から送信又は受信される少なくとも1つである前記少なくとも1つの第3の電磁放射の少なくとも1つの焦点距離を、前記長さの関数として、制御するように更に構成される、請求項18に記載の装置。 - 前記少なくとも1つの部位は、前記少なくとも1つの構造の表面である、請求項18に記載の装置。
- 少なくとも1つの構造に関連する情報を得るための方法であって、
前記少なくとも1つの構造からの少なくとも1つの第1の電磁放射、及び基準からの少なくとも1つの第2の電磁放射を受信すること、
少なくとも1つの前記第1の電磁放射又は前記第2の電磁放射に基づいて、前記少なくとも1つの構造の少なくとも1つの部位からの距離を決定すること、を含み、
前記距離の関数として、第3の電磁放射の電磁放射路長を制御こと、を更に含み、
前記第3の電磁放射は、
i)前記少なくとも1つの構造から送信又は受信される電磁放射の少なくとも1つ、であるか、又は、
ii)前記基準から送信又は受信される電磁放射の少なくとも1つ、
の少なくとも1つである、方法。 - 少なくとも1つの構造に関連する情報を得るための方法であって、
前記少なくとも1つの構造からの少なくとも1つの第1の電磁放射を受信すること、
少なくとも1つの前記第1の電磁放射に基づいて、前記少なくとも1つの構造の少なくとも1つの部位からの長さを決定すること、
前記長さの関数として、少なくとも1つの第2の電磁放射の少なくとも1つの焦点距離を制御こと、を含み、
前記第2の電磁放射は、
前記少なくとも1つの構造から送信又は受信される電磁放射の少なくとも1つ、である、方法。 - 少なくとも1つの構造に関連する情報を得るための方法であって、
前記少なくとも1つの構造からの少なくとも1つの第1の電磁放射、及び基準からの少なくとも1つの第2の電磁放射を受信すること、
少なくとも1つの前記第1の電磁放射又は前記第2の電磁放射に基づいて、少なくとも1つの部位内における電磁放射の侵入深さを決定すること、
前記侵入深さの関数として、第3の電磁放射の電磁放射路長の範囲を制御すること、を含み、 前記第3の電磁放射は、
i)前記少なくとも1つの構造から送信又は受信される電磁放射の少なくとも1つ、であるか、又は、
ii)前記基準から送信又は受信される電磁放射の少なくとも1つ、
の少なくとも1つである、方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US28747701P | 2001-04-30 | 2001-04-30 | |
PCT/US2002/013793 WO2002088684A1 (en) | 2001-04-30 | 2002-04-30 | Method and apparatus for improving image clarity and sensitivity in optical coherence tomography using dynamic feedback to control focal properties and coherence gating |
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JP2012282501A Division JP5738834B2 (ja) | 2001-04-30 | 2012-12-26 | 光干渉トモグラフィ装置及び機器の作動方法 |
Publications (2)
Publication Number | Publication Date |
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JP2004528111A JP2004528111A (ja) | 2004-09-16 |
JP2004528111A5 true JP2004528111A5 (ja) | 2008-01-24 |
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JP2002585939A Pending JP2004528111A (ja) | 2001-04-30 | 2002-04-30 | 焦点特性とコヒーレンス・ゲートを制御するために動的フィードバックを用いた、光干渉トモグラフィにおける写像性と感度を改善するための方法及び装置 |
JP2012282501A Expired - Lifetime JP5738834B2 (ja) | 2001-04-30 | 2012-12-26 | 光干渉トモグラフィ装置及び機器の作動方法 |
JP2015021997A Pending JP2015096240A (ja) | 2001-04-30 | 2015-02-06 | 焦点特性とコヒーレンス・ゲートを制御するために動的フィードバックを用いた、光干渉トモグラフィにおける写像性と感度を改善するための方法及び装置 |
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JP2012282501A Expired - Lifetime JP5738834B2 (ja) | 2001-04-30 | 2012-12-26 | 光干渉トモグラフィ装置及び機器の作動方法 |
JP2015021997A Pending JP2015096240A (ja) | 2001-04-30 | 2015-02-06 | 焦点特性とコヒーレンス・ゲートを制御するために動的フィードバックを用いた、光干渉トモグラフィにおける写像性と感度を改善するための方法及び装置 |
Country Status (4)
Country | Link |
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US (1) | US9897538B2 (ja) |
EP (4) | EP2333522A1 (ja) |
JP (3) | JP2004528111A (ja) |
WO (1) | WO2002088684A1 (ja) |
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-
2002
- 2002-04-30 US US10/136,813 patent/US9897538B2/en active Active
- 2002-04-30 EP EP10182894A patent/EP2333522A1/en not_active Withdrawn
- 2002-04-30 WO PCT/US2002/013793 patent/WO2002088684A1/en active Application Filing
- 2002-04-30 EP EP10182892.9A patent/EP2333521B1/en not_active Expired - Lifetime
- 2002-04-30 EP EP02734125.4A patent/EP1402244B1/en not_active Expired - Lifetime
- 2002-04-30 EP EP10182896.0A patent/EP2333523B1/en not_active Expired - Lifetime
- 2002-04-30 JP JP2002585939A patent/JP2004528111A/ja active Pending
-
2012
- 2012-12-26 JP JP2012282501A patent/JP5738834B2/ja not_active Expired - Lifetime
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2015
- 2015-02-06 JP JP2015021997A patent/JP2015096240A/ja active Pending
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