JP2004093345A5 - - Google Patents

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Publication number: JP2004093345A5
Authority: JP; Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Pending

Application number

JP2002254749A

Other versions

JP2004093345A (ja

Filing date

2002-08-30

Publication date

2005-09-22

2002-08-30 Application filed filed Critical

2002-08-30 Priority to JP2002254749A priority Critical patent/JP2004093345A/ja

2002-08-30 Priority claimed from JP2002254749A external-priority patent/JP2004093345A/ja

2003-02-11 Priority to TW092102722A priority patent/TWI230511B/zh

2003-02-12 Priority to US10/364,500 priority patent/US6934648B2/en

2003-04-10 Priority to DE10316568A priority patent/DE10316568A1/de

2003-05-12 Priority to CN03123802.5A priority patent/CN1253720C/zh

2004-03-25 Publication of JP2004093345A publication Critical patent/JP2004093345A/ja

2005-09-22 Publication of JP2004093345A5 publication Critical patent/JP2004093345A5/ja

Status Pending legal-status Critical Current

Links

JP2002254749A 2002-08-30 2002-08-30 ジッタ測定回路 Pending JP2004093345A (ja)

Priority Applications (5)

Application Number	Priority Date	Filing Date	Title
JP2002254749A JP2004093345A (ja)	2002-08-30	2002-08-30	ジッタ測定回路
TW092102722A TWI230511B (en)	2002-08-30	2003-02-11	Jitter measurement circuit for measuring jitter of target signal on the basis of sampling data string obtained by using ideal cyclic signal
US10/364,500 US6934648B2 (en)	2002-08-30	2003-02-12	Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal
DE10316568A DE10316568A1 (de)	2002-08-30	2003-04-10	Jitter-Messschaltung
CN03123802.5A CN1253720C (zh)	2002-08-30	2003-05-12	基于以理想周期信号得到的取样数据串来测量抖动的电路

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP2002254749A JP2004093345A (ja)	2002-08-30	2002-08-30	ジッタ測定回路

Publications (2)

Publication Number	Publication Date
JP2004093345A JP2004093345A (ja)	2004-03-25
JP2004093345A5 true JP2004093345A5 (ja)	2005-09-22

Family

ID=31712264

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP2002254749A Pending JP2004093345A (ja)	2002-08-30	2002-08-30	ジッタ測定回路

Country Status (5)

Country	Link
US (1)	US6934648B2 (ja)
JP (1)	JP2004093345A (ja)
CN (1)	CN1253720C (ja)
DE (1)	DE10316568A1 (ja)
TW (1)	TWI230511B (ja)

Families Citing this family (21)

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Publication number	Priority date	Publication date	Assignee	Title
JP4150759B2 (ja) *	2003-03-18	2008-09-17	テクトロニクス・インコーポレイテッド	クロック再生方法及びジッタ測定方法
US7668233B2 (en) *	2004-07-28	2010-02-23	Circadiant Systems, Inc.	Method of determining jitter and apparatus for determining jitter
JP4528659B2 (ja) *	2005-03-30	2010-08-18	パナソニック株式会社	クロックジッタ算出装置、クロックジッタ算出方法、およびクロックジッタ算出プログラム
US7460592B2 (en) *	2005-05-04	2008-12-02	Advantest Corporation	Apparatus for measuring jitter and method of measuring jitter
US7991045B2 (en) *	2005-06-10	2011-08-02	Hon Hai Precision Industry Co., Ltd.	Device and method for testing signal-receiving sensitivity of an electronic subassembly
US7912117B2 (en) *	2006-09-28	2011-03-22	Tektronix, Inc.	Transport delay and jitter measurements
US7277805B2 (en) *	2006-01-06	2007-10-02	International Business Machines Corporation	Jitter measurements for repetitive clock signals
US7856330B2 (en) *	2006-02-27	2010-12-21	Advantest Corporation	Measuring apparatus, testing apparatus, and electronic device
US7421355B2 (en)	2006-02-27	2008-09-02	Advantest Corporation	Measuring apparatus, measuring method, testing apparatus, testing method, and electronic device
US7970565B2 (en)	2006-02-27	2011-06-28	Advantest Corporation	Measuring device, test device, electronic device, program, and recording medium
US8442788B2 (en)	2006-02-27	2013-05-14	Advantest Corporation	Measuring device, test device, electronic device, measuring method, program, and recording medium
US7398169B2 (en)	2006-02-27	2008-07-08	Advantest Corporation	Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
US7286947B1 (en)	2006-04-13	2007-10-23	International Business Machines Corporation	Method and apparatus for determining jitter and pulse width from clock signal comparisons
US7684478B2 (en) *	2006-06-30	2010-03-23	International Business Machines Corporation	Generating an eye diagram of integrated circuit transmitted signals
US7389192B2 (en) *	2006-06-30	2008-06-17	International Business Machines Corporation	Determining data signal jitter via asynchronous sampling
US7383160B1 (en) *	2006-06-30	2008-06-03	International Business Machines Corporation	Method and apparatus for constructing a synchronous signal diagram from asynchronously sampled data
US8006141B2 (en) *	2009-06-30	2011-08-23	Freescale Semiconductor, Inc.	Method for speeding up serial data tolerance testing
US20120213098A1 (en) *	2011-02-21	2012-08-23	Future Wireless Tech LLC	Real-time and synchronization Internet of things analyzer System Architecture
US20140306689A1 (en)	2013-04-10	2014-10-16	Texas Instruments, Incorporated	High resolution current pulse analog measurement
CN103840803B (zh) *	2013-12-04	2017-01-04	中国航空工业集团公司第六三一研究所	一种离散量抖动屏蔽的实现方法
US9568548B1 (en)	2015-10-14	2017-02-14	International Business Machines Corporation	Measurement of signal delays in microprocessor integrated circuits with sub-picosecond accuracy using frequency stepping

Family Cites Families (24)

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Publication number	Priority date	Publication date	Assignee	Title
US5557196A (en) *	1993-08-25	1996-09-17	Advantest Corporation	Jitter analyzer
US6240130B1 (en) *	1997-07-30	2001-05-29	Texas Instruments Incorporated	Method and apparatus to measure jitter.
DE69923160T2 (de) *	1998-01-30	2005-12-29	Wavecrest Corp., Edina	Jitter analysator und verfahren zur jitter analyse
US6167359A (en) *	1998-06-12	2000-12-26	Lucent Technologies Inc.	Method and apparatus for characterizing phase noise and timing jitter in oscillators
US6621860B1 (en) *	1999-02-08	2003-09-16	Advantest Corp	Apparatus for and method of measuring a jitter
JP2000292469A (ja)	1999-04-09	2000-10-20	Teratekku:Kk	ジッタ測定装置
US6640193B2 (en) *	1999-12-15	2003-10-28	Texas Instruments Incorporated	Method and system for measuring jitter
US20010037189A1 (en) *	2000-01-20	2001-11-01	Dan Onu	Method of estimating phase noise spectral density and jitter in a periodic signal
US6519281B1 (en) *	2000-01-31	2003-02-11	Agilent Technologies, Inc.	Jitter measurement
US6460001B1 (en) *	2000-03-29	2002-10-01	Advantest Corporation	Apparatus for and method of measuring a peak jitter
US6735538B1 (en) *	2000-03-29	2004-05-11	Advantest Corporation	Apparatus and method for measuring quality measure of phase noise waveform
US6366374B2 (en) *	2000-04-26	2002-04-02	Optovation (Canada) Corp.	AC performance monitor with no clock recovery
US6598004B1 (en) *	2000-08-28	2003-07-22	Advantest Corporation	Jitter measurement apparatus and its method
US6970528B2 (en) *	2000-10-17	2005-11-29	Texas Instruments Incorporated	Method and apparatus to measure jitter
US6525523B1 (en) *	2000-11-24	2003-02-25	Advantest Corporation	Jitter measurement apparatus and its method
US6775321B1 (en) *	2000-10-31	2004-08-10	Advantest Corporation	Apparatus for and method of measuring a jitter
US20020136337A1 (en) *	2001-03-20	2002-09-26	Abhijit Chatterjee	Method and apparatus for high-resolution jitter measurement
WO2003007578A1 (fr) *	2001-07-13	2003-01-23	Anritsu Corporation	Instrument de mesure de la resistance a la gigue et procede permettant une mesure efficace et une evaluation adequate de la caracteristique de resistance a la gigue.
US6671652B2 (en) *	2001-12-26	2003-12-30	Hewlett-Packard Devlopment Company, L.P.	Clock skew measurement circuit on a microprocessor die
US7054358B2 (en) *	2002-04-29	2006-05-30	Advantest Corporation	Measuring apparatus and measuring method
US20030210029A1 (en) *	2002-05-07	2003-11-13	Billy Antheunisse	Coherent clock measurement unit
US20030219086A1 (en) *	2002-05-21	2003-11-27	Lecheminant Greg D.	Jitter identification using a wide bandwidth oscilloscope
US20040062301A1 (en) *	2002-09-30	2004-04-01	Takahiro Yamaguchi	Jitter measurement apparatus and jitter measurement method
GB2393794B (en) *	2002-10-01	2004-11-24	Motorola Inc	Module, system and method for testing a phase locked loop

2002
- 2002-08-30 JP JP2002254749A patent/JP2004093345A/ja active Pending
2003
- 2003-02-11 TW TW092102722A patent/TWI230511B/zh not_active IP Right Cessation
- 2003-02-12 US US10/364,500 patent/US6934648B2/en not_active Expired - Fee Related
- 2003-04-10 DE DE10316568A patent/DE10316568A1/de not_active Ceased
- 2003-05-12 CN CN03123802.5A patent/CN1253720C/zh not_active Expired - Fee Related

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