JP2000505985A - X線画像センサマトリックス及び補正ユニットを有するx線検査装置 - Google Patents
X線画像センサマトリックス及び補正ユニットを有するx線検査装置Info
- Publication number
- JP2000505985A JP2000505985A JP10528607A JP52860798A JP2000505985A JP 2000505985 A JP2000505985 A JP 2000505985A JP 10528607 A JP10528607 A JP 10528607A JP 52860798 A JP52860798 A JP 52860798A JP 2000505985 A JP2000505985 A JP 2000505985A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- image signal
- correction
- correction value
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
- H04N5/321—Transforming X-rays with video transmission of fluoroscopic images
- H04N5/325—Image enhancement, e.g. by subtraction techniques using polyenergetic X-rays
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/626—Reduction of noise due to residual charges remaining after image readout, e.g. to remove ghost images or afterimages
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1. − X線画像から初期画像信号を得るX線画像センサマトリックス(1)と、 − 初期画像信号から補正された画像信号を得る補正ユニット(2)と を有するX線検査装置であって、 − 補正ユニット(2)は − 補正値を記憶するメモリ(3)と、 − 初期画像信号の信号レベルと該補正値の少なくとも幾つかから補正された 画像信号の信号レベルを計算する計算ユニット(4)と を含むことを特徴とするX線装置。 2. − 補正ユニット(2)は露出パラメータに基づきメモリ(3)から補正値を 選択する選択ユニット(5)を含む ことを特徴とする請求項1記載のX線検査装置。 3. − 補正ユニット(2)は本質的にX線がX線センサマトリックスに入射しな いときにX線センサマトリックス(1)から基準画像信号を発生するよう配置さ れ、 − 選択ユニット(5)は基準画像信号に基づき補正値を選択するよう配置さ れる ことを特徴とする請求項2記載のX線検査装置。 4. − 計算ユニット(4)は記憶された補正値から正確な補正値を計算するよう 配置され、 − 計算ユニット(4)は初期画像信号の信号レベルと該正確な補正値から補 正された画像信号の信号レベルを計算するよう配置される ことを特徴とする請求項1乃至3のうちのいずれか一項記載のX線検査装置。 5. − 計算ユニット(4)は記憶された補正値の間の該計算された補正値を補間 するよう配置される ことを特徴とする請求項4記載のX線検査装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP96203692 | 1996-12-23 | ||
EP96203692.7 | 1996-12-23 | ||
PCT/IB1997/001595 WO1998028911A2 (en) | 1996-12-23 | 1997-12-23 | X-ray examination apparatus with x-ray image sensor matrix and correction unit |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2000505985A true JP2000505985A (ja) | 2000-05-16 |
JP2000505985A5 JP2000505985A5 (ja) | 2005-08-11 |
JP4346687B2 JP4346687B2 (ja) | 2009-10-21 |
Family
ID=8224756
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52860798A Expired - Fee Related JP4346687B2 (ja) | 1996-12-23 | 1997-12-23 | X線画像センサマトリックス及び補正ユニットを有するx線検査装置 |
Country Status (5)
Country | Link |
---|---|
US (2) | US6246746B1 (ja) |
EP (1) | EP0888686B1 (ja) |
JP (1) | JP4346687B2 (ja) |
DE (1) | DE69738105T2 (ja) |
WO (1) | WO1998028911A2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008237920A (ja) * | 2000-10-10 | 2008-10-09 | Toshiba Corp | X線診断装置 |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6353654B1 (en) * | 1999-12-30 | 2002-03-05 | General Electric Company | Method and apparatus for compensating for image retention in an amorphous silicon imaging detector |
US6404853B1 (en) * | 2001-11-02 | 2002-06-11 | Ge Medical Systems Global Technology Company, Llc | Method for identifying and correcting pixels with excess pixel lag in a solid state x-ray detector |
DE10312450A1 (de) * | 2003-03-20 | 2004-10-07 | Siemens Ag | Verfahren zur Kompensation von Bildstörungen bei Strahlungsbildaufnahmen sowie Strahlungsbildaufnahmevorrichtung |
JP3931152B2 (ja) * | 2003-04-10 | 2007-06-13 | オリンパス株式会社 | 撮像装置の評価方法、画像補正方法、および撮像装置 |
EP1692656B1 (en) * | 2003-12-02 | 2013-09-25 | Philips Intellectual Property & Standards GmbH | A device and method for correcting defects in x-ray images |
US20060011853A1 (en) * | 2004-07-06 | 2006-01-19 | Konstantinos Spartiotis | High energy, real time capable, direct radiation conversion X-ray imaging system for Cd-Te and Cd-Zn-Te based cameras |
DE102005017491B4 (de) * | 2005-04-15 | 2007-03-15 | Siemens Ag | Verfahren zum Erzeugen eines gainkorrigierten Röntgenbildes |
US7485850B2 (en) * | 2006-07-27 | 2009-02-03 | Varian Medical Systems, Inc. | Gain/lag artifact correction algorithm and software |
US8290222B2 (en) * | 2006-08-29 | 2012-10-16 | Siemens Medical Solutions Usa, Inc. | Systems and methods of image processing utilizing resizing of data |
US9131730B2 (en) * | 2010-01-07 | 2015-09-15 | Aiger Group Ag | System and apparatus for registration of different objects in rod shaped articles |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4359759A (en) * | 1980-04-21 | 1982-11-16 | Technicare Corporation | Bias lighting in a radiographic apparatus and method |
DE69429142T2 (de) * | 1993-09-03 | 2002-08-22 | Koninklijke Philips Electronics N.V., Eindhoven | Roentgenbildaufnehmer |
EP0642264B1 (en) | 1993-09-03 | 2001-11-21 | Koninklijke Philips Electronics N.V. | Image detection device |
DE4420833C2 (de) * | 1994-06-15 | 1996-11-07 | Siemens Ag | Echtzeit-Röntgenfernsehbildsystem mit einem CCD-Festkörperbildsensor |
JP3377323B2 (ja) * | 1995-02-09 | 2003-02-17 | 株式会社モリタ製作所 | 医療用x線撮影装置 |
DE19516832C1 (de) * | 1995-05-08 | 1996-11-28 | Siemens Ag | Bildsystem für eine Röntgendiagnostikeinrichtung |
JPH10504166A (ja) * | 1995-06-16 | 1998-04-14 | フィリップス エレクトロニクス エヌ ベー | 副画像からの画像合成方法及び装置 |
WO1997024868A1 (en) * | 1995-12-27 | 1997-07-10 | Philips Electronics N.V. | X-ray examination apparatus including an image pick-up apparatus with a correction unit |
-
1997
- 1997-12-23 WO PCT/IB1997/001595 patent/WO1998028911A2/en active IP Right Grant
- 1997-12-23 JP JP52860798A patent/JP4346687B2/ja not_active Expired - Fee Related
- 1997-12-23 EP EP97947194A patent/EP0888686B1/en not_active Expired - Lifetime
- 1997-12-23 DE DE69738105T patent/DE69738105T2/de not_active Expired - Fee Related
- 1997-12-23 US US09/125,482 patent/US6246746B1/en not_active Expired - Fee Related
-
2001
- 2001-04-04 US US09/826,256 patent/US20010012331A1/en not_active Abandoned
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008237920A (ja) * | 2000-10-10 | 2008-10-09 | Toshiba Corp | X線診断装置 |
Also Published As
Publication number | Publication date |
---|---|
US20010012331A1 (en) | 2001-08-09 |
JP4346687B2 (ja) | 2009-10-21 |
EP0888686A2 (en) | 1999-01-07 |
WO1998028911A3 (en) | 1998-09-03 |
DE69738105D1 (de) | 2007-10-18 |
WO1998028911A2 (en) | 1998-07-02 |
US6246746B1 (en) | 2001-06-12 |
DE69738105T2 (de) | 2008-05-29 |
EP0888686B1 (en) | 2007-09-05 |
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