IT1399258B1 - Procedimento di fabbricazione di un dispositivo di rilevazione ottica. - Google Patents
Procedimento di fabbricazione di un dispositivo di rilevazione ottica.Info
- Publication number
- IT1399258B1 IT1399258B1 ITTO2009A000001A ITTO20090001A IT1399258B1 IT 1399258 B1 IT1399258 B1 IT 1399258B1 IT TO2009A000001 A ITTO2009A000001 A IT TO2009A000001A IT TO20090001 A ITTO20090001 A IT TO20090001A IT 1399258 B1 IT1399258 B1 IT 1399258B1
- Authority
- IT
- Italy
- Prior art keywords
- manufacture
- detection device
- optical detection
- optical
- detection
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B2207/00—Coding scheme for general features or characteristics of optical elements and systems of subclass G02B, but not including elements and systems which would be classified in G02B6/00 and subgroups
- G02B2207/101—Nanooptics
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49826—Assembling or joining
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Biophysics (AREA)
- Biochemistry (AREA)
- Optics & Photonics (AREA)
- Analytical Chemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Glass Compositions (AREA)
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITTO2009A000001A IT1399258B1 (it) | 2009-01-07 | 2009-01-07 | Procedimento di fabbricazione di un dispositivo di rilevazione ottica. |
CN2009801578834A CN102893141A (zh) | 2009-01-07 | 2009-12-31 | 制造光学检测器件的方法 |
PCT/IB2009/056004 WO2010079410A1 (en) | 2009-01-07 | 2009-12-31 | Method of manufacturing an optical detection device |
EP09807469A EP2409137A1 (en) | 2009-01-07 | 2009-12-31 | Method of manufacturing an optical detection device |
US13/143,702 US20110265305A1 (en) | 2009-01-07 | 2009-12-31 | Method of manufacturing an optical detection device |
JP2011544935A JP5581337B2 (ja) | 2009-01-07 | 2009-12-31 | 光学検出デバイスを作製する方法 |
CA2749300A CA2749300A1 (en) | 2009-01-07 | 2009-12-31 | Method of manufacturing an optical detection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITTO2009A000001A IT1399258B1 (it) | 2009-01-07 | 2009-01-07 | Procedimento di fabbricazione di un dispositivo di rilevazione ottica. |
Publications (2)
Publication Number | Publication Date |
---|---|
ITTO20090001A1 ITTO20090001A1 (it) | 2010-07-08 |
IT1399258B1 true IT1399258B1 (it) | 2013-04-11 |
Family
ID=41078278
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ITTO2009A000001A IT1399258B1 (it) | 2009-01-07 | 2009-01-07 | Procedimento di fabbricazione di un dispositivo di rilevazione ottica. |
Country Status (7)
Country | Link |
---|---|
US (1) | US20110265305A1 (it) |
EP (1) | EP2409137A1 (it) |
JP (1) | JP5581337B2 (it) |
CN (1) | CN102893141A (it) |
CA (1) | CA2749300A1 (it) |
IT (1) | IT1399258B1 (it) |
WO (1) | WO2010079410A1 (it) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6461904B2 (ja) * | 2013-03-11 | 2019-01-30 | ケーエルエー−テンカー コーポレイション | 表面増強電場を用いた欠陥検出 |
CN106062537A (zh) * | 2013-12-24 | 2016-10-26 | 阿卜杜拉国王科技大学 | 包括纳米结构的分析设备 |
JP2016161548A (ja) * | 2015-03-05 | 2016-09-05 | 国立大学法人京都大学 | 探針の製造方法及び探針 |
CN110945344B (zh) * | 2017-06-01 | 2023-09-12 | 港大科桥有限公司 | 具有梯度纳米结构的传感器及其使用方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19952018C1 (de) * | 1999-10-28 | 2001-08-23 | Martin Moeller | Verfahren zur Herstellung von im Nanometerbereich oberflächendekorierten Substraten |
DE10142224C2 (de) * | 2001-08-29 | 2003-11-06 | Infineon Technologies Ag | Verfahren zum Erzeugen von Hohlräumen mit Submikrometer-Abmessungen in einer Halbleitereinrichtung mittels eines Quellvorgangs |
KR101168654B1 (ko) * | 2004-05-19 | 2012-07-25 | 브이피 호울딩 엘엘씨 | 표면 증강 라만 산란에 의한 화학기의 증강된 검출을 위한 층상의 플라즈몬 구조를 가진 광센서 |
JP2006038506A (ja) * | 2004-07-23 | 2006-02-09 | Fuji Photo Film Co Ltd | 微細構造体 |
TW200620451A (en) * | 2004-11-09 | 2006-06-16 | Univ Osaka | Method for forming hole in crystal substrate, and crystal substrate having hole formed by the method |
US7397043B2 (en) | 2005-01-26 | 2008-07-08 | Nomadics, Inc. | Standoff optical detection platform based on surface plasmon-coupled emission |
JP2008026109A (ja) * | 2006-07-20 | 2008-02-07 | Fujifilm Corp | 微細構造体及びその製造方法、センサデバイス及びラマン分光用デバイス |
IT1394445B1 (it) * | 2008-08-29 | 2012-06-15 | Calmed S R L | Dispositivo concentratore e localizzatore di un soluto e procedimento per concentrare e localizzare un soluto |
-
2009
- 2009-01-07 IT ITTO2009A000001A patent/IT1399258B1/it active
- 2009-12-31 EP EP09807469A patent/EP2409137A1/en not_active Withdrawn
- 2009-12-31 CA CA2749300A patent/CA2749300A1/en not_active Abandoned
- 2009-12-31 JP JP2011544935A patent/JP5581337B2/ja not_active Expired - Fee Related
- 2009-12-31 US US13/143,702 patent/US20110265305A1/en not_active Abandoned
- 2009-12-31 WO PCT/IB2009/056004 patent/WO2010079410A1/en active Application Filing
- 2009-12-31 CN CN2009801578834A patent/CN102893141A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
EP2409137A1 (en) | 2012-01-25 |
WO2010079410A1 (en) | 2010-07-15 |
JP2012514748A (ja) | 2012-06-28 |
CN102893141A (zh) | 2013-01-23 |
US20110265305A1 (en) | 2011-11-03 |
JP5581337B2 (ja) | 2014-08-27 |
ITTO20090001A1 (it) | 2010-07-08 |
CA2749300A1 (en) | 2010-07-15 |
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