HUP0201871A2 - Diode comprising a metal semiconductor contact and a method for the production thereof - Google Patents

Diode comprising a metal semiconductor contact and a method for the production thereof

Info

Publication number
HUP0201871A2
HUP0201871A2 HU0201871A HUP0201871A HUP0201871A2 HU P0201871 A2 HUP0201871 A2 HU P0201871A2 HU 0201871 A HU0201871 A HU 0201871A HU P0201871 A HUP0201871 A HU P0201871A HU P0201871 A2 HUP0201871 A2 HU P0201871A2
Authority
HU
Hungary
Prior art keywords
zone
diode
conductivity type
electrode
same conductivity
Prior art date
Application number
HU0201871A
Other languages
English (en)
Inventor
Goerlach
Original Assignee
Bosch Gmbh Robert
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bosch Gmbh Robert filed Critical Bosch Gmbh Robert
Publication of HUP0201871A2 publication Critical patent/HUP0201871A2/hu

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
    • H01L29/1608—Silicon carbide
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66053—Multistep manufacturing processes of devices having a semiconductor body comprising crystalline silicon carbide
    • H01L29/6606—Multistep manufacturing processes of devices having a semiconductor body comprising crystalline silicon carbide the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66083—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices
    • H01L29/6609—Diodes
    • H01L29/66143—Schottky diodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861—Diodes
    • H01L29/872—Schottky diodes

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

A találmány tárgya dióda, fém félvezető kontaktussal és eljárás annakelőállítására. A találmány szerinti dióda magába foglal két fémeselektróda (5, 6) között elrendezett (5. 6) elvezető szubsztrátoterősen adalékolt első zónával (3), amely ohmos átvezetést képez azelső elektródához (6), ugyanolyan vezetőképesség típusú, gyengénadalékolt második zónát (1), amely egyenirányító átvezetést képez amásodik elektródához (5), ugyanolyan vezetőképesség típusú harmadikzónát (2), amely gyengébben adalékolt, mint a második zóna (3), ahol aharmadik zóna (2) az első és a második (1, 3) zónát egymástólelválasztja és a második zóna (1) a második elektróda (5 és a harmadikzóna (2) közé van bezárva. A találmány szerinti eljárás soránfélvezető szubsztrát harmadik zónájának (2) felületét, az erősenadalékolt első zónával (3) és a gyengén adalékolt, azonosvezetőképesség típusú harmadik zónával (2) veszik körül, azonosvezetőképesség típusú második zónát (1), mely erősebben adalékolt,mint a harmadik zóna (2), hozunk létre, és a felületen fémeselektródot (5) választanak ki, amely a második zónát (1) maga és aharmadik zóna (2) közé zárja be. Ó
HU0201871A 1999-07-03 2000-06-03 Diode comprising a metal semiconductor contact and a method for the production thereof HUP0201871A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19930781A DE19930781B4 (de) 1999-07-03 1999-07-03 Diode mit Metall-Halbleiterkontakt und Verfahren zu ihrer Herstellung
PCT/DE2000/001812 WO2001003204A1 (de) 1999-07-03 2000-06-03 Diode mit metall-halbleiterkontakt und verfahren zu ihrer herstellung

Publications (1)

Publication Number Publication Date
HUP0201871A2 true HUP0201871A2 (en) 2003-01-28

Family

ID=7913590

Family Applications (1)

Application Number Title Priority Date Filing Date
HU0201871A HUP0201871A2 (en) 1999-07-03 2000-06-03 Diode comprising a metal semiconductor contact and a method for the production thereof

Country Status (7)

Country Link
US (1) US6727525B1 (hu)
EP (1) EP1198844B1 (hu)
JP (1) JP2003504855A (hu)
CZ (1) CZ20026A3 (hu)
DE (2) DE19930781B4 (hu)
HU (1) HUP0201871A2 (hu)
WO (1) WO2001003204A1 (hu)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2002351686B2 (en) * 2002-01-15 2008-04-10 Robert Bosch Gmbh Semiconductor arrangement comprising a pn-transition and method for producing a semiconductor arrangement
US6825073B1 (en) * 2003-09-17 2004-11-30 Chip Integration Tech Co., Ltd. Schottky diode with high field breakdown and low reverse leakage current
US7189610B2 (en) * 2004-10-18 2007-03-13 Semiconductor Components Industries, L.L.C. Semiconductor diode and method therefor
DE102004063180B4 (de) * 2004-12-29 2020-02-06 Robert Bosch Gmbh Verfahren zum Herstellen von Halbleiterchips aus einem Siliziumwafer und damit hergestellte Halbleiterbauelemente
JP4613682B2 (ja) * 2005-05-09 2011-01-19 住友電気工業株式会社 炭化珪素半導体装置およびその製造方法
JP4715324B2 (ja) * 2005-06-20 2011-07-06 住友電気工業株式会社 整流素子
US7560355B2 (en) * 2006-10-24 2009-07-14 Vishay General Semiconductor Llc Semiconductor wafer suitable for forming a semiconductor junction diode device and method of forming same
KR101438468B1 (ko) * 2008-07-31 2014-09-05 휴렛-팩커드 디벨롭먼트 컴퍼니, 엘.피. 다층의 재구성가능한 스위치
JP2010283403A (ja) * 2010-09-27 2010-12-16 Sumitomo Electric Ind Ltd 整流素子およびその製造方法
RU2484553C2 (ru) * 2011-04-11 2013-06-10 ООО "ПСиЭл" Ограничитель напряжения с отрицательным участком динамического сопротивления
CN108198857A (zh) * 2017-12-28 2018-06-22 北京世纪金光半导体有限公司 一种集成凸块状肖特基二极管的碳化硅mosfet器件元胞结构
KR102563890B1 (ko) * 2018-10-05 2023-08-10 한국전기연구원 SiC 반도체의 깊은 준위 결함 제거 방법

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4837227B1 (hu) * 1968-12-20 1973-11-09
FR2077474B1 (hu) * 1969-12-24 1973-10-19 Labo Electronique Physique
GB1558506A (en) * 1976-08-09 1980-01-03 Mullard Ltd Semiconductor devices having a rectifying metalto-semicondductor junction
JPS5378788A (en) * 1976-12-23 1978-07-12 Hitachi Ltd Temperature-compensation-type constant voltage element
JPS5394767A (en) * 1977-01-31 1978-08-19 Hitachi Ltd Manufacture of semiconductor device
JPS5555578A (en) * 1978-10-18 1980-04-23 Matsushita Electronics Corp Method of fabricating schottky barrier type semiconductor device
JPS6084878A (ja) * 1983-10-17 1985-05-14 Hitachi Ltd 負性抵抗特性をもつ半導体装置およびその製造方法
CA1285334C (en) * 1987-01-13 1991-06-25 Rick C. Jerome Schottky barrier diode with highly doped surface region
JPH03276679A (ja) * 1990-03-26 1991-12-06 Yokogawa Electric Corp ショットキーバリアダイオード
JP2809826B2 (ja) * 1990-06-29 1998-10-15 三菱電機株式会社 半導体装置の製造方法
JPH08264811A (ja) * 1995-03-27 1996-10-11 Toshiba Corp ショットキーバリアダイオード
JPH09107072A (ja) * 1995-10-12 1997-04-22 Fujitsu Ltd 半導体装置およびその製造方法
DE19705728C2 (de) * 1997-02-14 1999-01-21 Gen Semiconductor Ireland Macr Schottky-Diode und Verfahren zu deren Herstellung
JP2950282B2 (ja) * 1997-04-24 1999-09-20 日本電気株式会社 半導体装置の製造方法
EP0935816B1 (en) * 1997-09-03 2006-04-05 Koninklijke Philips Electronics N.V. Method of manufacturing a semiconductor device with a schottky junction
JP2000252479A (ja) * 1999-03-01 2000-09-14 Fuji Electric Co Ltd ショットキーバリアダイオードおよびその製造方法
JP3627572B2 (ja) * 1999-05-13 2005-03-09 松下電器産業株式会社 ショットキバリアダイオード

Also Published As

Publication number Publication date
WO2001003204A1 (de) 2001-01-11
US6727525B1 (en) 2004-04-27
DE50014143D1 (de) 2007-04-19
EP1198844B1 (de) 2007-03-07
DE19930781B4 (de) 2006-10-12
EP1198844A1 (de) 2002-04-24
JP2003504855A (ja) 2003-02-04
CZ20026A3 (cs) 2002-05-15
DE19930781A1 (de) 2001-01-11

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Legal Events

Date Code Title Description
FD9A Lapse of provisional protection due to non-payment of fees