HU192083B - Testing probe for testing printed wiring and printed circuit panels - Google Patents

Testing probe for testing printed wiring and printed circuit panels Download PDF

Info

Publication number
HU192083B
HU192083B HU844408A HU440884A HU192083B HU 192083 B HU192083 B HU 192083B HU 844408 A HU844408 A HU 844408A HU 440884 A HU440884 A HU 440884A HU 192083 B HU192083 B HU 192083B
Authority
HU
Hungary
Prior art keywords
needle
spring
stem
probe
test probe
Prior art date
Application number
HU844408A
Other languages
English (en)
Hungarian (hu)
Other versions
HUT38731A (en
Inventor
Botond Kiss
Gabor Kelety
Original Assignee
Bhg Hiradastech Vallalat
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bhg Hiradastech Vallalat filed Critical Bhg Hiradastech Vallalat
Priority to HU844408A priority Critical patent/HU192083B/hu
Priority to DE19853518626 priority patent/DE3518626A1/de
Publication of HUT38731A publication Critical patent/HUT38731A/hu
Publication of HU192083B publication Critical patent/HU192083B/hu

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/50—Fixed connections
    • H01R12/51—Fixed connections for rigid printed circuits or like structures
    • H01R12/55—Fixed connections for rigid printed circuits or like structures characterised by the terminals
    • H01R12/58—Fixed connections for rigid printed circuits or like structures characterised by the terminals terminals for insertion into holes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
HU844408A 1984-11-29 1984-11-29 Testing probe for testing printed wiring and printed circuit panels HU192083B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
HU844408A HU192083B (en) 1984-11-29 1984-11-29 Testing probe for testing printed wiring and printed circuit panels
DE19853518626 DE3518626A1 (de) 1984-11-29 1985-05-23 Pruefsonde zur kontrolle von leiterplatten

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HU844408A HU192083B (en) 1984-11-29 1984-11-29 Testing probe for testing printed wiring and printed circuit panels

Publications (2)

Publication Number Publication Date
HUT38731A HUT38731A (en) 1986-06-30
HU192083B true HU192083B (en) 1987-05-28

Family

ID=10967886

Family Applications (1)

Application Number Title Priority Date Filing Date
HU844408A HU192083B (en) 1984-11-29 1984-11-29 Testing probe for testing printed wiring and printed circuit panels

Country Status (2)

Country Link
DE (1) DE3518626A1 (de)
HU (1) HU192083B (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3832410C2 (de) * 1987-10-09 1994-07-28 Feinmetall Gmbh Kontaktvorrichtung
EP0508561B1 (de) * 1991-04-11 1996-07-17 METHODE ELECTRONICS, Inc. Gerät zum elektronischen Testen von gedruckten Leiterplatten oder ähnlichem
DE19511565A1 (de) * 1995-03-29 1996-10-02 Atg Test Systems Gmbh Prüfadapter
CN106645830B (zh) * 2016-11-30 2023-07-14 元启工业技术有限公司 一种偏心头定位探针针板装置
CN109188033A (zh) * 2018-10-15 2019-01-11 东莞市盈之宝电子科技有限公司 一种新式探针
DE102020213296A1 (de) * 2020-10-21 2022-04-21 Leoni Bordnetz-Systeme Gmbh Elektroverbindung, Isoliergehäuse für eine solche, Verfahren und Werkzeug für ein solches

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3434095A (en) * 1967-04-17 1969-03-18 Itt Programming switch
US3753103A (en) * 1971-11-17 1973-08-14 Crystal Protronics Ass Electrical circuit test probe having spring biased probe assembly
US3805006A (en) * 1972-10-13 1974-04-16 Gen Motors Corp Resilient electrical contact assembly
US4463310A (en) * 1980-07-11 1984-07-31 Rca Corporation Apparatus for detecting the presence of components on a printed circuit board
DE3136896A1 (de) * 1981-09-17 1983-04-14 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Vorrichtung zum pruefen einer elektronischen leiterplatte

Also Published As

Publication number Publication date
HUT38731A (en) 1986-06-30
DE3518626A1 (de) 1986-05-28
DE3518626C2 (de) 1991-07-18

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Legal Events

Date Code Title Description
HU90 Patent valid on 900628
HMM4 Cancellation of final prot. due to non-payment of fee