HK27596A - Data processor - Google Patents
Data processorInfo
- Publication number
- HK27596A HK27596A HK27596A HK27596A HK27596A HK 27596 A HK27596 A HK 27596A HK 27596 A HK27596 A HK 27596A HK 27596 A HK27596 A HK 27596A HK 27596 A HK27596 A HK 27596A
- Authority
- HK
- Hong Kong
- Prior art keywords
- data processor
- processor
- data
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F15/00—Digital computers in general; Data processing equipment in general
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F15/00—Digital computers in general; Data processing equipment in general
- G06F15/76—Architectures of general purpose stored program computers
- G06F15/78—Architectures of general purpose stored program computers comprising a single central processing unit
- G06F15/7807—System on chip, i.e. computer system on a single chip; System in package, i.e. computer system on one or more chips in a single package
- G06F15/7814—Specially adapted for real time processing, e.g. comprising hardware timers
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Computing Systems (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Microcomputers (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61092031A JPH0821028B2 (ja) | 1986-04-23 | 1986-04-23 | デ−タ処理装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
HK27596A true HK27596A (en) | 1996-02-23 |
Family
ID=14043163
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK27596A HK27596A (en) | 1986-04-23 | 1996-02-15 | Data processor |
Country Status (6)
Country | Link |
---|---|
US (2) | US4989208A (xx) |
EP (1) | EP0243113B1 (xx) |
JP (1) | JPH0821028B2 (xx) |
KR (1) | KR950012515B1 (xx) |
DE (1) | DE3750704T2 (xx) |
HK (1) | HK27596A (xx) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63108741A (ja) * | 1986-10-27 | 1988-05-13 | Nec Corp | 半導体集積回路装置 |
US5416919A (en) * | 1989-07-19 | 1995-05-16 | Sharp Kabushiki Kaisha | Semiconductor integrated circuit with functional blocks capable of being individually tested externally |
DE69031257T2 (de) * | 1989-09-21 | 1998-02-12 | Texas Instruments Inc | Integrierte Schaltung mit einem eingebetteten digitalen Signalprozessor |
US5030904A (en) * | 1990-02-13 | 1991-07-09 | Hewlett-Packard Company | Diagnostic system for integrated circuits using existing pads |
US5185882A (en) * | 1990-04-27 | 1993-02-09 | Westinghouse Electric Corp. | Bit-slice microprocessor test system |
JP2619112B2 (ja) * | 1990-05-16 | 1997-06-11 | 株式会社東芝 | 情報処理装置のテスト容易化回路 |
JP2806075B2 (ja) * | 1991-06-06 | 1998-09-30 | 日本電気株式会社 | マイクロコンピュータ |
JPH0566959A (ja) * | 1991-09-09 | 1993-03-19 | Sony Corp | 電子機器 |
ATE175043T1 (de) * | 1992-03-27 | 1999-01-15 | Siemens Ag | Integrierter mikroprozessor |
US5359547A (en) * | 1992-06-26 | 1994-10-25 | Digital Equipment Corporation | Method and apparatus for testing processor-based computer modules |
US5951703A (en) * | 1993-06-28 | 1999-09-14 | Tandem Computers Incorporated | System and method for performing improved pseudo-random testing of systems having multi driver buses |
GB2282244B (en) * | 1993-09-23 | 1998-01-14 | Advanced Risc Mach Ltd | Integrated circuit |
JPH0877035A (ja) * | 1994-09-06 | 1996-03-22 | Toshiba Corp | 中央処理装置及びマイクロコンピュータ |
JP3141787B2 (ja) * | 1996-08-28 | 2001-03-05 | 日本電気株式会社 | マイクロコンピュータ |
US5897324A (en) * | 1997-02-03 | 1999-04-27 | Atop Technologies, Inc. | Multimedia-book operable with removable data storage media implemented with universal interfacing book-adapting processor |
DE10338677B3 (de) * | 2003-08-22 | 2005-04-21 | Infineon Technologies Ag | Verfahren zum Testen einer zu testenden Schaltungseinheit und Testvorrichtung |
US7086131B2 (en) | 2004-05-14 | 2006-08-08 | Victaulic Company | Deformable mechanical pipe coupling |
CN110727225B (zh) * | 2019-10-24 | 2020-12-04 | 珠海格力电器股份有限公司 | 可自动控制的线路连接控制装置、方法及can控制*** |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2406250A1 (fr) * | 1977-10-17 | 1979-05-11 | Texas Instruments France | Dispositif d'acces direct a une memoire associee a un microprocesseur |
JPS5793422A (en) * | 1980-11-29 | 1982-06-10 | Omron Tateisi Electronics Co | Dma controller |
JPS57121751A (en) * | 1981-01-20 | 1982-07-29 | Matsushita Electric Ind Co Ltd | Microprocessor |
JPS5835661A (ja) * | 1981-08-27 | 1983-03-02 | Toshiba Corp | ワンチツプマイクロコンピユ−タ |
EP0126785B1 (de) * | 1983-05-25 | 1989-03-08 | Ibm Deutschland Gmbh | Prüf- und Diagnoseeinrichtung für Digitalrechner |
JPS60189047A (ja) * | 1984-03-07 | 1985-09-26 | Hitachi Ltd | デ−タ処理装置 |
JPS60211561A (ja) * | 1984-04-06 | 1985-10-23 | Hitachi Ltd | マイクロコンピユ−タ |
JPS60233757A (ja) * | 1984-05-07 | 1985-11-20 | Hitachi Ltd | マイクロ・コンピユ−タ |
US4701921A (en) * | 1985-10-23 | 1987-10-20 | Texas Instruments Incorporated | Modularized scan path for serially tested logic circuit |
US4710931A (en) * | 1985-10-23 | 1987-12-01 | Texas Instruments Incorporated | Partitioned scan-testing system |
KR880014482A (ko) * | 1987-05-27 | 1988-12-24 | 미다 가쓰시게 | 반도체 집적회로 장치 |
DE3820728A1 (de) * | 1988-06-18 | 1989-12-21 | Philips Patentverwaltung | Verfahren zum pruefen eines festwertspeichers und anordnung zur durchfuehrung des verfahrens |
-
1986
- 1986-04-23 JP JP61092031A patent/JPH0821028B2/ja not_active Expired - Lifetime
-
1987
- 1987-03-24 KR KR1019870002692A patent/KR950012515B1/ko not_active IP Right Cessation
- 1987-04-16 EP EP87303396A patent/EP0243113B1/en not_active Expired - Lifetime
- 1987-04-16 DE DE3750704T patent/DE3750704T2/de not_active Expired - Fee Related
- 1987-04-20 US US07/039,695 patent/US4989208A/en not_active Expired - Lifetime
-
1990
- 1990-09-19 US US07/584,608 patent/US5142536A/en not_active Expired - Lifetime
-
1996
- 1996-02-15 HK HK27596A patent/HK27596A/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0243113B1 (en) | 1994-11-02 |
JPS62249264A (ja) | 1987-10-30 |
DE3750704T2 (de) | 1995-03-16 |
DE3750704D1 (de) | 1994-12-08 |
EP0243113A2 (en) | 1987-10-28 |
KR950012515B1 (ko) | 1995-10-18 |
US4989208A (en) | 1991-01-29 |
KR870010444A (ko) | 1987-11-30 |
JPH0821028B2 (ja) | 1996-03-04 |
EP0243113A3 (en) | 1989-11-02 |
US5142536A (en) | 1992-08-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |