HK1008252A1 - Image processing process - Google Patents

Image processing process

Info

Publication number: HK1008252A1
Authority: HK; Hong Kong
Prior art keywords: image processing; processing process; image; processing
Prior art date: 1996-06-25

Application number

HK98109115A

Other languages

English (en)

Inventor

Kazunari Yoshimura

Ryosuke Mitaka

Kuninori Nakamura

Yasuyuki Yuki

Original Assignee

Matsushita Electric Works Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1996-06-25

Filing date

1998-07-13

Publication date

1999-05-07

1998-07-13 Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd

1999-05-07 Publication of HK1008252A1 publication Critical patent/HK1008252A1/xx

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
Immunology (AREA)
Pathology (AREA)
Engineering & Computer Science (AREA)
Multimedia (AREA)
Signal Processing (AREA)
Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Image Processing (AREA)
Length Measuring Devices By Optical Means (AREA)

HK98109115A 1996-06-25 1998-07-13 Image processing process HK1008252A1 (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP18548696A JP3312849B2 (ja)	1996-06-25	1996-06-25	物体表面の欠陥検出方法

Publications (1)

Publication Number	Publication Date
HK1008252A1 true HK1008252A1 (en)	1999-05-07

Family

ID=16171619

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
HK98109115A HK1008252A1 (en)	1996-06-25	1998-07-13	Image processing process

Country Status (5)

Country	Link
US (1)	US5946029A (de)
JP (1)	JP3312849B2 (de)
CN (1)	CN1105995C (de)
DE (1)	DE19726094B4 (de)
HK (1)	HK1008252A1 (de)

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JP3228197B2 (ja) *	1997-10-15	2001-11-12	株式会社デンソー	光学情報読取装置および記録媒体
JP3525760B2 (ja) *	1998-09-25	2004-05-10	松下電工株式会社	表面形状計測装置
US6542180B1 (en) *	2000-01-07	2003-04-01	Mitutoyo Corporation	Systems and methods for adjusting lighting of a part based on a plurality of selected regions of an image of the part
SE0003904L (sv) *	2000-05-05	2001-11-06	Roger Tuomas	Sätt att mäta ytråhet
AU2001295059A1 (en) *	2000-09-22	2002-04-02	Applied Science Fiction	Multiple-orientation image defect detection and correction
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US7027165B2 (en) *	2001-04-06	2006-04-11	Akzo Nobel N.V.	Method and device for surface evaluation
JP2002347246A (ja) *	2001-05-29	2002-12-04	Kyocera Corp	インクジェット記録ヘッド
US20020186878A1 (en) *	2001-06-07	2002-12-12	Hoon Tan Seow	System and method for multiple image analysis
DE102004062462A1 (de) *	2004-12-20	2007-05-03	Daimlerchrysler Ag	Verfahren und Vorrichtung zur automatischen Positionierung einer Beleuchtungseinheit und einer Kamera bei Bildverarbeitungssystemen
GB2424697A (en) *	2005-03-30	2006-10-04	Mv Res Ltd	Image processing in machine vision systems
DE102005050882B4 (de) *	2005-10-21	2008-04-30	Isra Vision Systems Ag	System und Verfahren zur optischen Inspektion von Glasscheiben
US8054500B2 (en) *	2006-10-10	2011-11-08	Hewlett-Packard Development Company, L.P.	Acquiring three-dimensional structure using two-dimensional scanner
JP5084398B2 (ja) *	2007-08-24	2012-11-28	キヤノン株式会社	測定装置、測定方法、及び、プログラム
JP5536979B2 (ja) *	2007-09-13	2014-07-02	株式会社井上製作所	ロールミルのロール洗浄のエンドポイント検査装置
JP4999642B2 (ja) *	2007-11-02	2012-08-15	中国電力株式会社	配電設備の劣化診断装置
US20100295939A1 (en) *	2008-01-28	2010-11-25	Innovative Imaging, Inc	Table gauge
BRPI0917910B1 (pt) *	2008-08-26	2019-08-20	Kabushiki Kaisha Bridgestone	Método e aparelho para detectar desigualdade de superfície de um objeto sob inspeção
JP5626559B2 (ja) *	2010-02-09	2014-11-19	アイシン精機株式会社	欠陥判定装置および欠陥判定方法
DE102010060851A1 (de) *	2010-11-29	2012-05-31	Breitmeier Messtechnik Gmbh	Verfahren zur Analyse der Mikrostruktur von Werkstückoberflächen
DE102010060852B4 (de) *	2010-11-29	2013-11-21	Breitmeier Messtechnik Gmbh	Vorrichtung und Verfahren zur Erfassung einer Oberflächenstruktur einer Oberfläche eines Werkstücks
JP5728353B2 (ja) *	2011-09-29	2015-06-03	株式会社Ｓｃｒｅｅｎホールディングス	画像取得装置および画像取得方法
JP5728348B2 (ja) *	2011-09-21	2015-06-03	株式会社Ｓｃｒｅｅｎホールディングス	パターン画像表示装置およびパターン画像表示方法
KR20130056473A (ko) *	2011-11-22	2013-05-30	동우 화인켐 주식회사	광학 검사 시스템용 진동 노이즈 보정 장치 및 방법
JP5857682B2 (ja) *	2011-11-29	2016-02-10	Ｊｆｅスチール株式会社	Ｈ形鋼の疵検出方法及び装置
US20140240489A1 (en) *	2013-02-26	2014-08-28	Corning Incorporated	Optical inspection systems and methods for detecting surface discontinuity defects
JP6212926B2 (ja) *	2013-04-26	2017-10-18	住友金属鉱山株式会社	物体検査装置及び物体検査方法
EP3017273B1 (de) *	2013-07-01	2019-03-27	SAC Sirius Advanced Cybernetics GmbH	Verfahren und vorrichtung zur optischen formerfassung und/oder prüfung eines gegenstandes
DE102013221334A1 (de)	2013-10-21	2015-04-23	Volkswagen Aktiengesellschaft	Verfahren und Messvorrichtung zum Bewerten von Strukturunterschieden einer reflektierenden Oberfläche
JP2015200604A (ja) *	2014-04-09	2015-11-12	パナソニックＩｐマネジメント株式会社	欠陥検出方法及び欠陥検出装置
CN107003251B (zh) *	2014-11-18	2020-08-28	三菱化学株式会社	金属板的修补方法和铸模的制造方法
JP2017067633A (ja) *	2015-09-30	2017-04-06	キヤノン株式会社	検査装置および物品製造方法
JP2017110975A (ja)	2015-12-15	2017-06-22	キヤノン株式会社	計測装置、システム、計測方法、決定方法及びプログラム
US11169095B2 (en) *	2016-05-30	2021-11-09	Bobst Mex Sa	Surface inspection system and method using multiple light sources and a camera offset therefrom
CA3049647A1 (en) *	2017-01-10	2018-07-19	Sunspring America, Inc.	Optical method for identifying defects on tube surfaces
JP6782449B2 (ja) *	2017-03-24	2020-11-11	パナソニックＩｐマネジメント株式会社	表面検査方法及びその装置
CN111213047A (zh) *	2017-05-22	2020-05-29	深圳配天智能技术研究院有限公司	一种视觉检测参数的确定方法、视觉检测设备以及视觉检测***
WO2019003337A1 (ja) *	2017-06-28	2019-01-03	日産自動車株式会社	塗装欠陥検査装置及び塗装欠陥検査方法
WO2019079867A1 (pt) *	2017-10-27	2019-05-02	Vettorazzi Leandro	Sistema e método de automatização para triagem de cabides retornáveis
CN109328456B (zh) *	2017-11-30	2020-10-16	深圳配天智能技术研究院有限公司	一种拍摄装置及拍摄位置寻优的方法
JP7170491B2 (ja) *	2018-10-12	2022-11-14	キヤノン株式会社	異物検出装置、露光装置及び物品の製造方法
JP7151469B2 (ja) *	2018-12-26	2022-10-12	東レ株式会社	シート欠陥検査装置
JP2022001851A (ja) *	2020-06-22	2022-01-06	株式会社安永	欠陥検査装置
CN111983983B (zh) *	2020-08-07	2023-10-10	东北大学	一种热轧钢板热处理板形智能控制方法及***
CN112557398A (zh) *	2020-11-24	2021-03-26	创新奇智(北京)科技有限公司	一种不干胶的胶面的质检***及其质检方法和装置
DE112021006586A5 (de) *	2020-12-21	2024-02-22	Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein	Bestimmung von Störungen eines Objektoberflächenverlaufs mit Hilfe farbiger Reflexionen
CN118190940B (zh) *	2024-05-20	2024-07-12	蓝冰河(常州)精密测量技术有限责任公司	一种物体表面一致性检测方法和***

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JPS61264209A (ja) *	1985-05-17	1986-11-22	Kawasaki Steel Corp	表面検査装置
JPS6383873A (ja) *	1986-09-27	1988-04-14	Sony Corp	形状測定装置
DE4123916C2 (de) *	1990-07-19	1998-04-09	Reinhard Malz	Verfahren und Vorrichtung zum beleuchtungsdynamischen Erkennen und Klassifizieren von Oberflächenmerkmalen und -defekten eines Objektes
US5515452A (en) *	1992-12-31	1996-05-07	Electroglas, Inc.	Optical character recognition illumination method and system
DE4493589T1 (de) *	1993-05-24	1996-05-09	Komatsu Mfg Co Ltd	Biegewinkelerfassungsvorrichtung und Vorrichtung zur Erkennung einer geraden Linie und Vorrichtung zur Einstellung einer Biegewinkelerfassungsposition
US5631733A (en) *	1995-01-20	1997-05-20	Photon Dynamics, Inc.	Large area defect monitor tool for manufacture of clean surfaces
US5781649A (en) *	1996-04-15	1998-07-14	Phase Metrics, Inc.	Surface inspection of a disk by diffraction pattern sampling

1996
- 1996-06-25 JP JP18548696A patent/JP3312849B2/ja not_active Expired - Fee Related
1997
- 1997-06-02 US US08/867,101 patent/US5946029A/en not_active Expired - Fee Related
- 1997-06-19 DE DE19726094A patent/DE19726094B4/de not_active Expired - Lifetime
- 1997-06-25 CN CN97113761A patent/CN1105995C/zh not_active Expired - Lifetime
1998
- 1998-07-13 HK HK98109115A patent/HK1008252A1/xx not_active IP Right Cessation

Also Published As

Publication number	Publication date
DE19726094B4 (de)	2008-01-31
CN1105995C (zh)	2003-04-16
CN1170177A (zh)	1998-01-14
DE19726094A1 (de)	1998-03-12
JP3312849B2 (ja)	2002-08-12
US5946029A (en)	1999-08-31
JPH109838A (ja)	1998-01-16

Legal Events

Date	Code	Title	Description
2004-12-15	PF	Patent in force
2017-07-14	PE	Patent expired	Effective date: 20170624

Publication	Publication Date	Title
HK1008252A1 (en)	1999-05-07	Image processing process
GB9619119D0 (en)	1996-10-23	Processing image
GB2310557B (en)	2000-05-10	Image processing apparatus
GB9518530D0 (en)	1995-11-08	Image processing
GB9719694D0 (en)	1997-11-19	Image processing apparatus
GB2320388B (en)	1999-03-31	Image processing apparatus
EP0710929A3 (de)	1996-07-03	Akustisch-gestützte Bildverarbeitung
GB2312129B (en)	2000-07-12	Image processing
GB9618556D0 (en)	1996-10-16	Image processing
GB9410093D0 (en)	1994-07-06	Image processing
GB2328355B (en)	2002-04-17	Image processing apparatus
GB9410784D0 (en)	1994-07-20	Image processing
GB2327827B (en)	1999-06-30	Image processing apparatus
GB2307819B (en)	2000-01-26	Image processing
GB2328127B (en)	2002-04-10	Image processing apparatus
GB2317299B (en)	2000-11-29	Image processing
GB2346498B (en)	2000-09-13	Image processing
GB2351199B (en)	2001-04-04	Image processing
GB2320831B (en)	2001-03-28	Image processing
GB9607808D0 (en)	1996-06-19	Image processing
GB9619173D0 (en)	1996-10-23	Image processing
GB9614194D0 (en)	1996-09-04	Image processing
GB9607807D0 (en)	1996-06-19	Image processing
GB2328356B (en)	2002-03-20	Image processing apparatus
GB9407294D0 (en)	1994-06-08	Image processing