GB2601685B - Method for Realizing Superlubricity between AFM Probe with Conical Tip and Graphite Surface - Google Patents

Method for Realizing Superlubricity between AFM Probe with Conical Tip and Graphite Surface Download PDF

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Publication number
GB2601685B
GB2601685B GB2202742.9A GB202202742A GB2601685B GB 2601685 B GB2601685 B GB 2601685B GB 202202742 A GB202202742 A GB 202202742A GB 2601685 B GB2601685 B GB 2601685B
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United Kingdom
Prior art keywords
superlubricity
realizing
conical tip
graphite surface
afm probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB2202742.9A
Other versions
GB2601685A (en
GB202202742D0 (en
Inventor
Liu Dameng
Pang Hua
Sha Tiandong
Fang Liang
Li Jinjin
Luo Jianbin
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Tsinghua University
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Tsinghua University
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Publication date
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Publication of GB202202742D0 publication Critical patent/GB202202742D0/en
Publication of GB2601685A publication Critical patent/GB2601685A/en
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G01Q60/42—Functionalisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/26—Friction force microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
GB2202742.9A 2019-07-29 2019-11-25 Method for Realizing Superlubricity between AFM Probe with Conical Tip and Graphite Surface Active GB2601685B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201910688409.XA CN110488044B (en) 2019-07-29 2019-07-29 Method for realizing ultra-smoothness between AFM probe with conical tip and graphite surface
PCT/CN2019/120657 WO2021017331A1 (en) 2019-07-29 2019-11-25 Method for achieving ultra-lubricity between afm probe having conical tip and graphite surface

Publications (3)

Publication Number Publication Date
GB202202742D0 GB202202742D0 (en) 2022-04-13
GB2601685A GB2601685A (en) 2022-06-08
GB2601685B true GB2601685B (en) 2023-11-01

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ID=68548697

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2202742.9A Active GB2601685B (en) 2019-07-29 2019-11-25 Method for Realizing Superlubricity between AFM Probe with Conical Tip and Graphite Surface

Country Status (3)

Country Link
CN (1) CN110488044B (en)
GB (1) GB2601685B (en)
WO (1) WO2021017331A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110488044B (en) * 2019-07-29 2020-09-22 清华大学 Method for realizing ultra-smoothness between AFM probe with conical tip and graphite surface
CN111717881B (en) * 2020-05-29 2023-05-16 深圳清华大学研究院 Preparation method of ultra-smooth sliding block
CN111719128B (en) 2020-08-04 2021-06-01 中国科学院兰州化学物理研究所 Preparation method of ammonium thiomolybdate composite porous amorphous carbon ultra-smooth film
CN112661150B (en) * 2020-12-28 2023-07-04 深圳清华大学研究院 Method for manufacturing super-talc ink islands with uniform thickness
CN114236183A (en) * 2021-12-17 2022-03-25 湘潭大学 Preparation method of atomic force microscope probe wrapping two-dimensional material

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140023864A1 (en) * 2012-07-19 2014-01-23 Anirudha V. Sumant Superlubricating Graphene Films
CN106323866A (en) * 2016-08-15 2017-01-11 清华大学 Method for obtaining friction coefficient between dissimilar materials by using graphene film ball probe
CN106338355A (en) * 2016-08-16 2017-01-18 电子科技大学 Graphene surface adhesive force and frictional force test method
CN109030870A (en) * 2018-07-19 2018-12-18 清华大学 Two-dimensional layer material wraps up atomic force microscope probe and preparation method thereof and application
CN109406386A (en) * 2017-10-30 2019-03-01 西南交通大学 The design of profiled cross-section micro-cantilever beam probe and processing method applied to the measurement of nanoscale single-contact ultralow friction coefficient
CN110488044A (en) * 2019-07-29 2019-11-22 清华大学 A method of realizing superslide between the AFM probe and graphite surface of taper needle point

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102200543A (en) * 2010-03-24 2011-09-28 国家纳米技术与工程研究院 AFM (Atomic Force Microscope)-based device for performing nanoindentation measurement on surface of microparticle
CN102198927A (en) * 2011-04-22 2011-09-28 河南大学 Method for etching nanometer pattern on surface of crystalline silicon
WO2014090938A1 (en) * 2012-12-14 2014-06-19 Universitat Autonoma De Barcelona Conductive atomic force microscope tips coated with graphene
CN106324291B (en) * 2016-08-15 2018-10-30 清华大学 For the graphene film talent scout needle of atomic force microscope and the acquisition methods of friction coefficient
CN107032330B (en) * 2017-06-02 2019-04-05 大连理工大学 A kind of macroscopical superslide method of friction surface growth graphene
CN109406831B (en) * 2017-09-08 2021-02-19 西南交通大学 Design and processing method of rectangular micro-cantilever probe applied to nanoscale single-point contact ultralow friction coefficient measurement
CN108535516A (en) * 2018-02-05 2018-09-14 多氟多（焦作）新能源科技有限公司 A method of measuring pole piece SEI film thicknesses using atomic force microscope

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140023864A1 (en) * 2012-07-19 2014-01-23 Anirudha V. Sumant Superlubricating Graphene Films
CN106323866A (en) * 2016-08-15 2017-01-11 清华大学 Method for obtaining friction coefficient between dissimilar materials by using graphene film ball probe
CN106338355A (en) * 2016-08-16 2017-01-18 电子科技大学 Graphene surface adhesive force and frictional force test method
CN109406386A (en) * 2017-10-30 2019-03-01 西南交通大学 The design of profiled cross-section micro-cantilever beam probe and processing method applied to the measurement of nanoscale single-contact ultralow friction coefficient
CN109030870A (en) * 2018-07-19 2018-12-18 清华大学 Two-dimensional layer material wraps up atomic force microscope probe and preparation method thereof and application
CN110488044A (en) * 2019-07-29 2019-11-22 清华大学 A method of realizing superslide between the AFM probe and graphite surface of taper needle point

Also Published As

Publication number Publication date
CN110488044B (en) 2020-09-22
CN110488044A (en) 2019-11-22
GB2601685A (en) 2022-06-08
WO2021017331A1 (en) 2021-02-04
GB202202742D0 (en) 2022-04-13

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