GB1343529A - Method of x-ray crystal analysis and an x-ray goniometer for performing the method - Google Patents

Abstract

1343529 X-ray apparatus STOE & CIE GmbH 18 Aug 1971 [18 Aug 1970] 38803/71 Heading H5R An X-ray eponiometer includes a collimator 12 for the X-ray beam X, and a pivotable unit in the form of a hinged parallelogram with rails 21 and 22 pivotable on bearings 19 and 20 and connected to a wobble mechanism, and supporting a crystal support 18 for holding a crystal K and rotating it about the axis A, and orthogonally directed alternative supports U and J for a camera unit which includes a disc-shaped film magazine, whereby with the film rotated parallel to the axis A Buerger photographs may be taken, while with the film supported normal to that axis de-Jong-Bauman photographs may be obtained. At the end of rail 22 adjacent to the crystal mount 18 is a bearing for an arcuate bracket 31 the other end of which is joined by a pivot 17 to a slide 25a which is adjustable along a segment 25 which is itself mounted for rotation by a motor about an axis 26 coincident with the beam X. For producing a Buerger photograph, the diaphragm 30 and camera B are positioned in planes parallel to the axis A, as shown in Fig. 1, and slide 25a is secured to the segment 25 by screw 39 at a desired angle Á to the beam X, whereafter rotation of the arc 25 about axis 26 causes rails 21 and 22 to wobble through Œ Á. For a de-Jong-Bauman photograph, the apparatus is arranged as in Fig. 2, with the slide 25a, and hence the rails 21 and 22, set to a desired angle, and with the camera B and a diaphragm 34 positioned normal to the crystal rotation axis, the crystal and the film being synchronously rotated about their respective axes by an electric motor. The camera mounts are adjustable to permit variation of the distance between the film plane and the crystal, so that the scale of the Buerger and the de-Jong-Bauman photographs may be made the same.