FR2958040B1 - Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique - Google Patents

Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique

Info

Publication number
FR2958040B1
FR2958040B1 FR1052096A FR1052096A FR2958040B1 FR 2958040 B1 FR2958040 B1 FR 2958040B1 FR 1052096 A FR1052096 A FR 1052096A FR 1052096 A FR1052096 A FR 1052096A FR 2958040 B1 FR2958040 B1 FR 2958040B1
Authority
FR
France
Prior art keywords
altitude
defects
installation
detecting
optical component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1052096A
Other languages
English (en)
Other versions
FR2958040A1 (fr
Inventor
Florian Henry
Fabrice Gibrat
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
S G C C
SGCC SAS
Original Assignee
S G C C
SGCC SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by S G C C, SGCC SAS filed Critical S G C C
Priority to FR1052096A priority Critical patent/FR2958040B1/fr
Priority to PCT/FR2011/050616 priority patent/WO2011117539A1/fr
Publication of FR2958040A1 publication Critical patent/FR2958040A1/fr
Application granted granted Critical
Publication of FR2958040B1 publication Critical patent/FR2958040B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G01N2021/8832—Structured background, e.g. for transparent objects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Geometry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FR1052096A 2010-03-23 2010-03-23 Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique Expired - Fee Related FR2958040B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1052096A FR2958040B1 (fr) 2010-03-23 2010-03-23 Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique
PCT/FR2011/050616 WO2011117539A1 (fr) 2010-03-23 2011-03-23 Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1052096A FR2958040B1 (fr) 2010-03-23 2010-03-23 Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique

Publications (2)

Publication Number Publication Date
FR2958040A1 FR2958040A1 (fr) 2011-09-30
FR2958040B1 true FR2958040B1 (fr) 2012-05-25

Family

ID=43033181

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1052096A Expired - Fee Related FR2958040B1 (fr) 2010-03-23 2010-03-23 Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique

Country Status (2)

Country Link
FR (1) FR2958040B1 (fr)
WO (1) WO2011117539A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106068450A (zh) * 2014-01-22 2016-11-02 蒂阿马公司 用于检测特别是折射缺陷的方法和装置

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2993662B1 (fr) * 2012-07-23 2015-05-15 Msc & Sgcc Procede et installation pour la detection notamment de defauts refractants
DE102014005281B4 (de) * 2014-04-09 2016-07-14 Rodenstock Gmbh Bestimmung der Position zumindest eines Brillenglases im Raum
US20160178535A1 (en) * 2014-12-17 2016-06-23 Xerox Corporation Inspection Device And Method
FR3039660B1 (fr) * 2015-07-30 2017-09-08 Essilor Int Methode de verification d'une caracteristique geometrique et d'une caracteristique optique d'une lentille ophtalmique detouree et dispositif associe
EP3388813B1 (fr) 2017-04-13 2021-09-29 Carl Zeiss Vision International GmbH Procédé de fabrication d'un verre de lunette selon au moins un ensemble de données relatives au bord du moule
JP2019105458A (ja) * 2017-12-08 2019-06-27 株式会社日立ハイテクファインシステムズ 欠陥検査装置及び欠陥検査方法
EP3588048A1 (fr) * 2018-06-21 2020-01-01 Essilor International (Compagnie Generale D'optique) Procédé pour détecter un défaut dans une zone d'intérêt d'une lentille optique
CN111080638B (zh) * 2019-12-27 2023-04-07 成都泓睿科技有限责任公司 一种检测模制瓶瓶底脏污的方法
GB2598283A (en) * 2020-07-07 2022-03-02 Eyoto Group Ltd Method and apparatus for inspecting the surface of a transparent object
US11650126B2 (en) 2020-09-22 2023-05-16 Indizen Optical Technologies S.L. Systems and methods for automatic visual inspection of defects in ophthalmic lenses
CN112326202B (zh) * 2020-10-23 2022-12-09 歌尔光学科技有限公司 虚拟现实设备的双目视差测试方法、装置及工装
FR3132352A1 (fr) 2022-01-28 2023-08-04 Tiama Procédés et systèmes opto-informatiques d’inspection en lumière traversante d’un récipient en verre
EP4382882A1 (fr) * 2022-12-08 2024-06-12 Essilor International Système de détermination d'une valeur d'un paramètre caractéristique d'un défaut dans une lentille ophtalmique testé

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3926349A1 (de) * 1989-08-09 1991-02-14 Sick Optik Elektronik Erwin Optische fehlerinspektionsvorrichtung
DE19944354C5 (de) * 1999-09-16 2011-07-07 Häusler, Gerd, Prof. Dr., 91056 Verfahren und Vorrichtung zur Vermessung von spiegelnden oder transparenten Prüflingen
US6512239B1 (en) * 2000-06-27 2003-01-28 Photon Dynamics Canada Inc. Stereo vision inspection system for transparent media
DE102004020419B3 (de) * 2004-04-23 2005-10-20 3D Shape Gmbh Verfahren und Vorrichtung zur Bestimmung der Form und der lokalen Oberflächennormalen spiegelnder Oberflächen
US20060066846A1 (en) * 2004-09-29 2006-03-30 Telco Testing Systems, Llc Apparatus and method for detection of contaminant particles or component defects
KR100919166B1 (ko) * 2007-04-02 2009-09-28 한국과학기술원 스테레오 모아레를 이용한 3차원 형상 측정장치 및 그 방법
EP1980843A1 (fr) 2007-04-13 2008-10-15 Essilor International (Compagnie Generale D'optique) Procédé et appareil de détection de défauts dans des composants optiques
EP2101143A1 (fr) * 2008-03-10 2009-09-16 Technische Universität Carolo-Wilhelmina zu Braunschweig Procédé et dispositif destinés à la saisie de la forme d'objets réfractifs transparents

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106068450A (zh) * 2014-01-22 2016-11-02 蒂阿马公司 用于检测特别是折射缺陷的方法和装置
CN106068450B (zh) * 2014-01-22 2019-12-27 蒂阿马公司 用于检测特别是折射缺陷的方法和装置

Also Published As

Publication number Publication date
FR2958040A1 (fr) 2011-09-30
WO2011117539A1 (fr) 2011-09-29

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Effective date: 20141128