FR2885910A1 - Composition aqueuse de nettoyage pour le traitement du cuivre de semi-conducteurs - Google Patents
Composition aqueuse de nettoyage pour le traitement du cuivre de semi-conducteursInfo
- Publication number
- FR2885910A1 FR2885910A1 FR0651858A FR0651858A FR2885910A1 FR 2885910 A1 FR2885910 A1 FR 2885910A1 FR 0651858 A FR0651858 A FR 0651858A FR 0651858 A FR0651858 A FR 0651858A FR 2885910 A1 FR2885910 A1 FR 2885910A1
- Authority
- FR
- France
- Prior art keywords
- chemicomechanical
- water
- cleaning composition
- organic base
- containing nitrogen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 title abstract 4
- -1 heterocyclic organic base Chemical class 0.000 title abstract 4
- 238000004140 cleaning Methods 0.000 title abstract 2
- 229910052757 nitrogen Inorganic materials 0.000 title abstract 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 title abstract 2
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3218—Alkanolamines or alkanolimines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3281—Heterocyclic compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
Abstract
L'invention concerne une composition aqueuse de nettoyage utilisée en post-planarisation mécano-chimique qui comprend (a) 0,1 à 15 % en masse d'une base organique hétérocyclique contenant de l'azote ; (b) 0,1 à 35 % en masse d'une alcool amine ; et (c) de l'eau. Par contact avec des plaquettes semi-conductrices contenant du cuivre qui ont été traitées par planarisation mécano-chimique pendant une durée efficace, la composition aqueuse de nettoyage peut efficacement retirer les contaminants résiduels de la surface des plaquettes et conférer simultanément aux plaquettes semiconductrices contenant du cuivre une meilleure rugosité.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094116223A TWI282363B (en) | 2005-05-19 | 2005-05-19 | Aqueous cleaning composition for semiconductor copper processing |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2885910A1 true FR2885910A1 (fr) | 2006-11-24 |
FR2885910B1 FR2885910B1 (fr) | 2012-02-03 |
Family
ID=37388370
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0651858A Expired - Fee Related FR2885910B1 (fr) | 2005-05-19 | 2006-05-19 | Composition aqueuse de nettoyage pour le traitement du cuivre de semi-conducteurs |
Country Status (8)
Country | Link |
---|---|
US (1) | US8063006B2 (fr) |
JP (1) | JP4475538B2 (fr) |
KR (1) | KR101083474B1 (fr) |
DE (1) | DE102006023506B4 (fr) |
FR (1) | FR2885910B1 (fr) |
IT (1) | ITMI20060968A1 (fr) |
SG (1) | SG127840A1 (fr) |
TW (1) | TWI282363B (fr) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2633163C (fr) * | 2005-12-12 | 2013-11-19 | Vitech International, Inc. | Compositions nettoyantes, non corrosives et polyvalentes, et leurs procedes d'utilisation |
KR100729235B1 (ko) * | 2006-06-01 | 2007-06-15 | 삼성전자주식회사 | 프로브 카드용 세정액 조성물 및 이를 이용한 프로브카드의 세정 방법 |
TWI437093B (zh) * | 2007-08-03 | 2014-05-11 | Epoch Material Co Ltd | 半導體銅製程用水相清洗組合物 |
JP6066552B2 (ja) * | 2011-12-06 | 2017-01-25 | 関東化學株式会社 | 電子デバイス用洗浄液組成物 |
JP6751015B2 (ja) | 2013-03-15 | 2020-09-02 | キャボット マイクロエレクトロニクス コーポレイション | 銅の化学的機械的平坦化後のための水性清浄化組成物 |
JP6203525B2 (ja) | 2013-04-19 | 2017-09-27 | 関東化學株式会社 | 洗浄液組成物 |
US10961624B2 (en) * | 2019-04-02 | 2021-03-30 | Gelest Technologies, Inc. | Process for pulsed thin film deposition |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6825156B2 (en) * | 2002-06-06 | 2004-11-30 | Ekc Technology, Inc. | Semiconductor process residue removal composition and process |
JPH10171130A (ja) * | 1996-12-10 | 1998-06-26 | Fuji Film Oorin Kk | フォトレジスト剥離液 |
US6268323B1 (en) * | 1997-05-05 | 2001-07-31 | Arch Specialty Chemicals, Inc. | Non-corrosive stripping and cleaning composition |
JPH11349925A (ja) | 1998-06-05 | 1999-12-21 | Fujimi Inc | エッジポリッシング用組成物 |
JP4224651B2 (ja) * | 1999-02-25 | 2009-02-18 | 三菱瓦斯化学株式会社 | レジスト剥離剤およびそれを用いた半導体素子の製造方法 |
DE19947845A1 (de) * | 1999-10-05 | 2001-04-12 | Basf Ag | Verfahren zum Entfernen von COS aus einem Kohlenwasserstoff-Fluidstrom und Waschflüssikgkeit zur Verwendung in derartigen Verfahren |
US6992050B2 (en) * | 2000-06-28 | 2006-01-31 | Nec Corporation | Stripping agent composition and method of stripping |
MY143399A (en) * | 2001-07-09 | 2011-05-13 | Avantor Performance Mat Inc | Microelectronic cleaning compositons containing ammonia-free fluoride salts for selective photoresist stripping and plasma ash residue cleaning |
DE10210729A1 (de) * | 2002-03-12 | 2003-10-02 | Basf Ag | Verfahren zum Entsäuern eines Fluidstroms und Waschflüssigkeit zur Verwendung in einem derartigen Verfahren |
JP4304909B2 (ja) * | 2002-04-03 | 2009-07-29 | 東ソー株式会社 | 洗浄剤及びそれを用いた洗浄方法 |
JP2004101849A (ja) * | 2002-09-09 | 2004-04-02 | Mitsubishi Gas Chem Co Inc | 洗浄剤組成物 |
US6803353B2 (en) * | 2002-11-12 | 2004-10-12 | Atofina Chemicals, Inc. | Copper chemical mechanical polishing solutions using sulfonated amphiprotic agents |
JP4359754B2 (ja) * | 2003-07-03 | 2009-11-04 | 三菱瓦斯化学株式会社 | 基板の洗浄剤 |
DE10338563A1 (de) | 2003-08-22 | 2005-03-17 | Basf Ag | Verfahren zum Entsäuern eines Fluidstroms mittels Membraneinheiten aus inerten Gehäusen |
US7247566B2 (en) * | 2003-10-23 | 2007-07-24 | Dupont Air Products Nanomaterials Llc | CMP method for copper, tungsten, titanium, polysilicon, and other substrates using organosulfonic acids as oxidizers |
US6946396B2 (en) * | 2003-10-30 | 2005-09-20 | Nissan Chemical Indusries, Ltd. | Maleic acid and ethylene urea containing formulation for removing residue from semiconductor substrate and method for cleaning wafer |
JP2005336342A (ja) * | 2004-05-27 | 2005-12-08 | Tosoh Corp | 洗浄用組成物 |
US7700533B2 (en) * | 2005-06-23 | 2010-04-20 | Air Products And Chemicals, Inc. | Composition for removal of residue comprising cationic salts and methods using same |
-
2005
- 2005-05-19 TW TW094116223A patent/TWI282363B/zh active
-
2006
- 2006-05-16 IT IT000968A patent/ITMI20060968A1/it unknown
- 2006-05-16 JP JP2006136097A patent/JP4475538B2/ja active Active
- 2006-05-18 US US11/436,749 patent/US8063006B2/en active Active
- 2006-05-18 DE DE102006023506.1A patent/DE102006023506B4/de active Active
- 2006-05-18 KR KR1020060044526A patent/KR101083474B1/ko active IP Right Grant
- 2006-05-19 SG SG200603385A patent/SG127840A1/en unknown
- 2006-05-19 FR FR0651858A patent/FR2885910B1/fr not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2885910B1 (fr) | 2012-02-03 |
US8063006B2 (en) | 2011-11-22 |
KR20060120443A (ko) | 2006-11-27 |
SG127840A1 (en) | 2006-12-29 |
JP2007002227A (ja) | 2007-01-11 |
JP4475538B2 (ja) | 2010-06-09 |
TWI282363B (en) | 2007-06-11 |
ITMI20060968A1 (it) | 2006-11-20 |
US20070066508A1 (en) | 2007-03-22 |
DE102006023506A1 (de) | 2007-01-11 |
TW200641121A (en) | 2006-12-01 |
KR101083474B1 (ko) | 2011-11-16 |
DE102006023506B4 (de) | 2015-06-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20160129 |