FR2806529B1 - Procede d'ajustage d'un parametre electrique sur un composant electronique integre - Google Patents

Procede d'ajustage d'un parametre electrique sur un composant electronique integre

Info

Publication number
FR2806529B1
FR2806529B1 FR0003260A FR0003260A FR2806529B1 FR 2806529 B1 FR2806529 B1 FR 2806529B1 FR 0003260 A FR0003260 A FR 0003260A FR 0003260 A FR0003260 A FR 0003260A FR 2806529 B1 FR2806529 B1 FR 2806529B1
Authority
FR
France
Prior art keywords
adjusting
electronic component
electrical parameter
integrated electronic
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0003260A
Other languages
English (en)
Other versions
FR2806529A1 (fr
Inventor
Ova Francis Dell
Pierre Rizzo
Frank Lhermet
Dominique Poirot
Stephane Rayon
Bertrand Gomez
Nicole Lessoile
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Priority to FR0003260A priority Critical patent/FR2806529B1/fr
Priority to EP01913999A priority patent/EP1264338A1/fr
Priority to PCT/FR2001/000750 priority patent/WO2001069671A1/fr
Priority to AU39391/01A priority patent/AU3939101A/en
Priority to US10/276,509 priority patent/US7704757B2/en
Publication of FR2806529A1 publication Critical patent/FR2806529A1/fr
Application granted granted Critical
Publication of FR2806529B1 publication Critical patent/FR2806529B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/64—Impedance arrangements
    • H01L23/66—High-frequency adaptations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
FR0003260A 2000-03-14 2000-03-14 Procede d'ajustage d'un parametre electrique sur un composant electronique integre Expired - Fee Related FR2806529B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR0003260A FR2806529B1 (fr) 2000-03-14 2000-03-14 Procede d'ajustage d'un parametre electrique sur un composant electronique integre
EP01913999A EP1264338A1 (fr) 2000-03-14 2001-03-13 Procede d'ajustage d'un parametre electrique sur un composant electronique integre
PCT/FR2001/000750 WO2001069671A1 (fr) 2000-03-14 2001-03-13 Procede d'ajustage d'un parametre electrique sur un composant electronique integre
AU39391/01A AU3939101A (en) 2000-03-14 2001-03-13 Method for adjusting an electrical parameter on an integrated electronic component
US10/276,509 US7704757B2 (en) 2000-03-14 2001-03-13 Method for adjusting an electrical parameter on an integrated electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0003260A FR2806529B1 (fr) 2000-03-14 2000-03-14 Procede d'ajustage d'un parametre electrique sur un composant electronique integre

Publications (2)

Publication Number Publication Date
FR2806529A1 FR2806529A1 (fr) 2001-09-21
FR2806529B1 true FR2806529B1 (fr) 2005-03-04

Family

ID=8848071

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0003260A Expired - Fee Related FR2806529B1 (fr) 2000-03-14 2000-03-14 Procede d'ajustage d'un parametre electrique sur un composant electronique integre

Country Status (5)

Country Link
US (1) US7704757B2 (fr)
EP (1) EP1264338A1 (fr)
AU (1) AU3939101A (fr)
FR (1) FR2806529B1 (fr)
WO (1) WO2001069671A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7022251B2 (en) * 2003-06-19 2006-04-04 Agilent Technologies, Inc. Methods for forming a conductor on a dielectric
US6953698B2 (en) * 2003-06-19 2005-10-11 Agilent Technologies, Inc. Methods for making microwave circuits
US20040258841A1 (en) * 2003-06-19 2004-12-23 Casey John F. Methods for depositing a thickfilm dielectric on a substrate
JP2017116297A (ja) * 2015-12-21 2017-06-29 株式会社ミツトヨ 画像測定方法及び画像測定機

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4769883A (en) * 1983-03-07 1988-09-13 Westinghouse Electric Corp. Method for tuning a microwave integrated circuit
US5079600A (en) * 1987-03-06 1992-01-07 Schnur Joel M High resolution patterning on solid substrates
EP0496491A1 (fr) * 1991-01-22 1992-07-29 National Semiconductor Corporation Support de chip, résistance, capacité dépourvu de pattes de connexion et son procédé de fabrication
FR2710192B1 (fr) * 1991-07-29 1996-01-26 Gen Electric Composant micro-onde ayant des caractéristiques fonctionnelles ajustées et procédé d'ajustement.
US5442297A (en) * 1994-06-30 1995-08-15 International Business Machines Corporation Contactless sheet resistance measurement method and apparatus
US5528153A (en) * 1994-11-07 1996-06-18 Texas Instruments Incorporated Method for non-destructive, non-contact measurement of dielectric constant of thin films

Also Published As

Publication number Publication date
EP1264338A1 (fr) 2002-12-11
WO2001069671A1 (fr) 2001-09-20
US20040023482A1 (en) 2004-02-05
FR2806529A1 (fr) 2001-09-21
AU3939101A (en) 2001-09-24
US7704757B2 (en) 2010-04-27

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Legal Events

Date Code Title Description
ST Notification of lapse
RN Application for restoration
RN Application for restoration
D3 Ip right revived
ST Notification of lapse

Effective date: 20120511