FR2643389B1 - Appareil de depot chimique en phase vapeur pour former un film mince - Google Patents
Appareil de depot chimique en phase vapeur pour former un film minceInfo
- Publication number
- FR2643389B1 FR2643389B1 FR9002202A FR9002202A FR2643389B1 FR 2643389 B1 FR2643389 B1 FR 2643389B1 FR 9002202 A FR9002202 A FR 9002202A FR 9002202 A FR9002202 A FR 9002202A FR 2643389 B1 FR2643389 B1 FR 2643389B1
- Authority
- FR
- France
- Prior art keywords
- forming
- thin film
- vapor deposition
- chemical vapor
- deposition apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45517—Confinement of gases to vicinity of substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45519—Inert gas curtains
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45576—Coaxial inlets for each gas
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45582—Expansion of gas before it reaches the substrate
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1041891A JPH02222134A (ja) | 1989-02-23 | 1989-02-23 | 薄膜形成装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2643389A1 FR2643389A1 (fr) | 1990-08-24 |
FR2643389B1 true FR2643389B1 (fr) | 1993-12-03 |
Family
ID=12620910
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9002202A Expired - Fee Related FR2643389B1 (fr) | 1989-02-23 | 1990-02-22 | Appareil de depot chimique en phase vapeur pour former un film mince |
Country Status (5)
Country | Link |
---|---|
US (1) | US4989541A (fr) |
JP (1) | JPH02222134A (fr) |
DE (1) | DE4005796C2 (fr) |
FR (1) | FR2643389B1 (fr) |
GB (1) | GB2229739B (fr) |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5356672A (en) * | 1990-05-09 | 1994-10-18 | Jet Process Corporation | Method for microwave plasma assisted supersonic gas jet deposition of thin films |
JPH04348031A (ja) * | 1990-12-28 | 1992-12-03 | Mitsubishi Electric Corp | 化学気相成長装置 |
US5173336A (en) * | 1991-01-22 | 1992-12-22 | Santa Barbara Research Center | Metal organic chemical vapor deposition (MOCVD) reactor with recirculation suppressing flow guide |
US5134963A (en) * | 1991-10-28 | 1992-08-04 | International Business Machines Corporation | LPCVD reactor for high efficiency, high uniformity deposition |
JP2763222B2 (ja) * | 1991-12-13 | 1998-06-11 | 三菱電機株式会社 | 化学気相成長方法ならびにそのための化学気相成長処理システムおよび化学気相成長装置 |
US5229171A (en) * | 1991-12-23 | 1993-07-20 | Research Triangle Institute | Apparatus and method for uniformly coating a substrate in an evacuable chamber |
US5306345A (en) * | 1992-08-25 | 1994-04-26 | Particle Solutions | Deposition chamber for deposition of particles on semiconductor wafers |
US5662770A (en) * | 1993-04-16 | 1997-09-02 | Micron Technology, Inc. | Method and apparatus for improving etch uniformity in remote source plasma reactors with powered wafer chucks |
US6242049B1 (en) * | 1994-09-08 | 2001-06-05 | Sandia Corporation | Sealable stagnation flow geometries for the uniform deposition of materials and heat |
US5571332A (en) * | 1995-02-10 | 1996-11-05 | Jet Process Corporation | Electron jet vapor deposition system |
US5653806A (en) * | 1995-03-10 | 1997-08-05 | Advanced Technology Materials, Inc. | Showerhead-type discharge assembly for delivery of source reagent vapor to a substrate, and CVD process utilizing same |
US5746834A (en) * | 1996-01-04 | 1998-05-05 | Memc Electronics Materials, Inc. | Method and apparatus for purging barrel reactors |
US5741363A (en) * | 1996-03-22 | 1998-04-21 | Advanced Technology Materials, Inc. | Interiorly partitioned vapor injector for delivery of source reagent vapor mixtures for chemical vapor deposition |
US6070551A (en) * | 1996-05-13 | 2000-06-06 | Applied Materials, Inc. | Deposition chamber and method for depositing low dielectric constant films |
US6039812A (en) * | 1996-10-21 | 2000-03-21 | Abb Research Ltd. | Device for epitaxially growing objects and method for such a growth |
JP3925566B2 (ja) * | 1996-11-15 | 2007-06-06 | キヤノンアネルバ株式会社 | 薄膜形成装置 |
US5976623A (en) * | 1996-12-03 | 1999-11-02 | Lucent Technologies Inc. | Process for making composite films |
EP0854210B1 (fr) * | 1996-12-19 | 2002-03-27 | Toshiba Ceramics Co., Ltd. | Appareillage pour le dépôt de films minces à partir de la phase vapeur |
US6794308B2 (en) | 1998-01-07 | 2004-09-21 | Texas Instruments Incorporated | Method for reducing by-product deposition in wafer processing equipment |
US6730613B1 (en) * | 1998-01-07 | 2004-05-04 | Texas Instruments Incorporated | Method for reducing by-product deposition in wafer processing equipment |
US6143078A (en) * | 1998-11-13 | 2000-11-07 | Applied Materials, Inc. | Gas distribution system for a CVD processing chamber |
US6486081B1 (en) | 1998-11-13 | 2002-11-26 | Applied Materials, Inc. | Gas distribution system for a CVD processing chamber |
US6179913B1 (en) * | 1999-04-16 | 2001-01-30 | Cbl Technologies, Inc. | Compound gas injection system and methods |
WO2002087787A1 (fr) * | 2001-04-30 | 2002-11-07 | University Of Virginia Patent Foundation | Procede et appareil permettant l'application efficace d'un revetement de substrat |
US20040060514A1 (en) * | 2002-01-25 | 2004-04-01 | Applied Materials, Inc. A Delaware Corporation | Gas distribution showerhead |
WO2004011688A2 (fr) * | 2002-07-25 | 2004-02-05 | University Of Virginia Patent Foundation | Procede et appareil de dispersion de revetements de liaison renforces pour revetements barrieres thermiques |
US7335609B2 (en) * | 2004-08-27 | 2008-02-26 | Applied Materials, Inc. | Gap-fill depositions introducing hydroxyl-containing precursors in the formation of silicon containing dielectric materials |
US7431967B2 (en) * | 2002-09-19 | 2008-10-07 | Applied Materials, Inc. | Limited thermal budget formation of PMD layers |
US20070212850A1 (en) * | 2002-09-19 | 2007-09-13 | Applied Materials, Inc. | Gap-fill depositions in the formation of silicon containing dielectric materials |
US7456116B2 (en) | 2002-09-19 | 2008-11-25 | Applied Materials, Inc. | Gap-fill depositions in the formation of silicon containing dielectric materials |
US7141483B2 (en) * | 2002-09-19 | 2006-11-28 | Applied Materials, Inc. | Nitrous oxide anneal of TEOS/ozone CVD for improved gapfill |
US7118781B1 (en) * | 2003-04-16 | 2006-10-10 | Cree, Inc. | Methods for controlling formation of deposits in a deposition system and deposition methods including the same |
JP2006041250A (ja) * | 2004-07-28 | 2006-02-09 | Canon Inc | プラズマ処理装置および方法 |
US7642171B2 (en) * | 2004-08-04 | 2010-01-05 | Applied Materials, Inc. | Multi-step anneal of thin films for film densification and improved gap-fill |
US20070212847A1 (en) * | 2004-08-04 | 2007-09-13 | Applied Materials, Inc. | Multi-step anneal of thin films for film densification and improved gap-fill |
WO2007005832A2 (fr) * | 2005-06-30 | 2007-01-11 | University Of Virginia Patent Foundation | Systeme de couche barriere thermique fiable, procedes s'y rapportant et appareil de production du systeme |
JP5500953B2 (ja) * | 2009-11-19 | 2014-05-21 | 株式会社ニューフレアテクノロジー | 成膜装置および成膜方法 |
FI124113B (fi) * | 2010-08-30 | 2014-03-31 | Beneq Oy | Laitteisto ja menetelmä substraatin pinnan muokkaamiseksi |
US9695510B2 (en) * | 2011-04-21 | 2017-07-04 | Kurt J. Lesker Company | Atomic layer deposition apparatus and process |
US9388494B2 (en) | 2012-06-25 | 2016-07-12 | Novellus Systems, Inc. | Suppression of parasitic deposition in a substrate processing system by suppressing precursor flow and plasma outside of substrate region |
US9018108B2 (en) | 2013-01-25 | 2015-04-28 | Applied Materials, Inc. | Low shrinkage dielectric films |
US9399228B2 (en) * | 2013-02-06 | 2016-07-26 | Novellus Systems, Inc. | Method and apparatus for purging and plasma suppression in a process chamber |
US9758868B1 (en) | 2016-03-10 | 2017-09-12 | Lam Research Corporation | Plasma suppression behind a showerhead through the use of increased pressure |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB912636A (en) * | 1959-01-21 | 1962-12-12 | Commw Engineering Corp | Method and apparatus for producing submicron metals |
NL270518A (fr) * | 1960-11-30 | |||
NL270516A (fr) * | 1960-11-30 | |||
GB1056430A (en) * | 1962-11-13 | 1967-01-25 | Texas Instruments Inc | Epitaxial process and apparatus for semiconductors |
US3297501A (en) * | 1963-12-31 | 1967-01-10 | Ibm | Process for epitaxial growth of semiconductor single crystals |
GB1456194A (en) * | 1972-10-26 | 1976-11-17 | British Steel Corp | Production of ferrous bodies |
GB1477692A (en) * | 1973-08-27 | 1977-06-22 | Hobeg Hochtemperaturreaktor | Method of and an apparatus for coating in a fluidised bed |
JPS5858316B2 (ja) * | 1975-06-24 | 1983-12-24 | 日本電気株式会社 | 3−5 ゾクカゴウブツノキソウセイチヨウホウホウ |
JPS6047202B2 (ja) * | 1976-01-13 | 1985-10-21 | 東北大学金属材料研究所長 | 超硬高純度の配向多結晶質窒化珪素 |
JPS5354181A (en) * | 1976-10-28 | 1978-05-17 | Fujitsu Ltd | Chemical evaporation apparatus |
US4147571A (en) * | 1977-07-11 | 1979-04-03 | Hewlett-Packard Company | Method for vapor epitaxial deposition of III/V materials utilizing organometallic compounds and a halogen or halide in a hot wall system |
GB1600286A (en) * | 1977-07-19 | 1981-10-14 | Secr Defence | Doping of group iii-v semiconductor materials |
JPS5678497A (en) * | 1979-11-27 | 1981-06-27 | Fujitsu Ltd | Vapor growth apparatus |
DE3326043A1 (de) * | 1983-07-20 | 1985-02-07 | Licentia Gmbh | Verfahren zur herstellung eines aerosolstromes und dessen verwendung |
JPS6036395A (ja) * | 1983-08-09 | 1985-02-25 | Matsushita Electric Ind Co Ltd | 3−5族化合物半導体結晶成長方法 |
US4645687A (en) * | 1983-11-10 | 1987-02-24 | At&T Laboratories | Deposition of III-V semiconductor materials |
JPS615515A (ja) * | 1984-06-07 | 1986-01-11 | Fujitsu Ltd | 化学気相成長装置 |
US4592933A (en) * | 1984-06-29 | 1986-06-03 | International Business Machines Corporation | High efficiency homogeneous chemical vapor deposition |
DE3427323A1 (de) * | 1984-07-25 | 1986-03-27 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Verfahren zur herstellung eines aerosolstromes |
JPS61143579A (ja) * | 1984-12-14 | 1986-07-01 | Nachi Fujikoshi Corp | プラズマイオン供給方法 |
JPS61181122A (ja) * | 1985-02-06 | 1986-08-13 | Nec Corp | 気相成長装置用反応管 |
JPS61194838A (ja) * | 1985-02-25 | 1986-08-29 | Hitachi Electronics Eng Co Ltd | Cvd法による薄膜形成方法 |
JPS6266621A (ja) * | 1985-09-19 | 1987-03-26 | Matsushita Electric Ind Co Ltd | 気相成長装置 |
JPS62158867A (ja) * | 1986-01-07 | 1987-07-14 | Hitachi Electronics Eng Co Ltd | Cvd薄膜形成装置 |
CA1333040C (fr) * | 1986-04-11 | 1994-11-15 | Canon Kabushiki Kaisha | Methode de depot de couches minces |
US4911102A (en) * | 1987-01-31 | 1990-03-27 | Toyoda Gosei Co., Ltd. | Process of vapor growth of gallium nitride and its apparatus |
JPS63318734A (ja) * | 1987-06-22 | 1988-12-27 | Toshiba Corp | 気相成長装置 |
-
1989
- 1989-02-23 JP JP1041891A patent/JPH02222134A/ja active Pending
-
1990
- 1990-02-14 US US07/479,941 patent/US4989541A/en not_active Expired - Fee Related
- 1990-02-16 GB GB9003602A patent/GB2229739B/en not_active Expired - Fee Related
- 1990-02-22 FR FR9002202A patent/FR2643389B1/fr not_active Expired - Fee Related
- 1990-02-23 DE DE4005796A patent/DE4005796C2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB9003602D0 (en) | 1990-04-11 |
US4989541A (en) | 1991-02-05 |
GB2229739B (en) | 1993-08-25 |
GB2229739A (en) | 1990-10-03 |
JPH02222134A (ja) | 1990-09-04 |
DE4005796A1 (de) | 1990-08-30 |
DE4005796C2 (de) | 1998-10-01 |
FR2643389A1 (fr) | 1990-08-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
TP | Transmission of property | ||
ST | Notification of lapse |