ES2194154T3 - Dispositivo de conversion fotoelectrica que utiliza el barrido superficial de cargas. - Google Patents
Dispositivo de conversion fotoelectrica que utiliza el barrido superficial de cargas.Info
- Publication number
- ES2194154T3 ES2194154T3 ES97301258T ES97301258T ES2194154T3 ES 2194154 T3 ES2194154 T3 ES 2194154T3 ES 97301258 T ES97301258 T ES 97301258T ES 97301258 T ES97301258 T ES 97301258T ES 2194154 T3 ES2194154 T3 ES 2194154T3
- Authority
- ES
- Spain
- Prior art keywords
- leveling
- loads
- photoelectric conversion
- conversion device
- mos transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000006243 chemical reaction Methods 0.000 title abstract 4
- 238000009825 accumulation Methods 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/621—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming
- H04N25/622—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming by controlling anti-blooming drains
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/621—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
LA INVENCION SUMINISTRA UN ELEMENTO QUE TIENE UNA FUNCION DE TRANSFERENCIA DE CARGA NIVELADORA EN UN DISPOSITIVO DE CONVERSION FOTOELECTRICO DEL TIPO DE DIRECCION X-Y, P.EJ., UN SENSOR CMOS, Y UN DISPOSITIVO DE CONVERSION FOTOELECTRICO QUE ACUMULA LAS CARGAS DE SEÑALES FOTOELECTRICAS PRODUCIDAS POR UN ELEMENTO DE CONVERSION FOTOELECTRICO (1) EN UN ELECTRODO DE CONTROL (PUERTA) DE UN TRANSISTOR MOS (2) PARA OBTENER UNA SEÑAL CON UN ALTO PORCENTAJE DE S/N ELIMINANDO LOS COMPONENTES DE SEÑAL PRODUCIDOS POR LA RADIACION DE FONDO SIN USAR NINGUN CCD COMO UN MEDIO DE ACUMULACION DE CARGAS NIVELADORAS, TIENE UN ELECTRODO NIVELADOR (12) PARA TRANSFERIR CARGAS NIVELADORAS DE ESAS PRODUCIDAS POR EL ELEMENTO DE CONVERSION FOTOELECTRICO (1), UNA REGION DEL TIPO N{SUP, +} (31) PARA ACUMULAR LAS CARGAS NIVELADORAS TRANSFERIDAS, UN TRANSISTOR MOS (2) PARA LEER LAS CARGAS POTENCIALES PROVOCADAS POR LAS CARGAS NIVELADORAS, Y UN CIRCUITO (51,52) PARA CONTROLAR AUTOMATICAMENTE LA CANTIDAD DE CARGAS NIVELADORAS QUE VAN A SER TRANSFERIDAS.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03961496A JP3559640B2 (ja) | 1996-02-27 | 1996-02-27 | 光電変換装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2194154T3 true ES2194154T3 (es) | 2003-11-16 |
Family
ID=12557995
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES97301258T Expired - Lifetime ES2194154T3 (es) | 1996-02-27 | 1997-02-26 | Dispositivo de conversion fotoelectrica que utiliza el barrido superficial de cargas. |
Country Status (6)
Country | Link |
---|---|
US (2) | US6064431A (es) |
EP (1) | EP0793378B1 (es) |
JP (1) | JP3559640B2 (es) |
DE (1) | DE69721109T2 (es) |
ES (1) | ES2194154T3 (es) |
HK (1) | HK1002576A1 (es) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3559640B2 (ja) * | 1996-02-27 | 2004-09-02 | キヤノン株式会社 | 光電変換装置 |
US6141045A (en) * | 1997-09-22 | 2000-10-31 | Xerox Corporation | Method for detecting defective photosensor circuits in a photosensor array |
TW421962B (en) * | 1997-09-29 | 2001-02-11 | Canon Kk | Image sensing device using mos type image sensing elements |
JP4200545B2 (ja) | 1998-06-08 | 2008-12-24 | ソニー株式会社 | 固体撮像素子およびその駆動方法、並びにカメラシステム |
EP0999698B1 (en) * | 1998-11-02 | 2013-06-19 | Canon Kabushiki Kaisha | Solid-state image pickup device and method of resetting the same |
US6288387B1 (en) * | 1999-04-21 | 2001-09-11 | Raytheon Company | Apparatus and method for performing optical signal intensity correction in electro-optical sensor arrays |
EP1073267B1 (en) * | 1999-07-30 | 2010-12-22 | Canon Kabushiki Kaisha | Radiation image pickup device |
FR2798994A1 (fr) * | 1999-09-24 | 2001-03-30 | Commissariat Energie Atomique | Dispositif et procede de lecture de circuit detecteur de rayonnement |
US6504141B1 (en) * | 2000-09-29 | 2003-01-07 | Rockwell Science Center, Llc | Adaptive amplifier circuit with enhanced dynamic range |
US6900839B1 (en) | 2000-09-29 | 2005-05-31 | Rockwell Science Center, Llc | High gain detector amplifier with enhanced dynamic range for single photon read-out of photodetectors |
US6873359B1 (en) | 2000-09-29 | 2005-03-29 | Rockwell Science Center, Llc. | Self-adjusting, adaptive, minimal noise input amplifier circuit |
US6965707B1 (en) | 2000-09-29 | 2005-11-15 | Rockwell Science Center, Llc | Compact active pixel with low-noise snapshot image formation |
US6888572B1 (en) | 2000-10-26 | 2005-05-03 | Rockwell Science Center, Llc | Compact active pixel with low-noise image formation |
US6538245B1 (en) | 2000-10-26 | 2003-03-25 | Rockwell Science Center, Llc. | Amplified CMOS transducer for single photon read-out of photodetectors |
JP2005050951A (ja) | 2003-07-31 | 2005-02-24 | Toshiba Corp | 固体撮像装置および電荷転送装置 |
US20050083421A1 (en) * | 2003-10-16 | 2005-04-21 | Vladimir Berezin | Dynamic range enlargement in CMOS image sensors |
JP4678676B2 (ja) * | 2004-12-10 | 2011-04-27 | 株式会社堀場製作所 | 物理現象または化学現象の測定方法または測定装置 |
JP4459064B2 (ja) * | 2005-01-14 | 2010-04-28 | キヤノン株式会社 | 固体撮像装置、その制御方法及びカメラ |
JP4416668B2 (ja) * | 2005-01-14 | 2010-02-17 | キヤノン株式会社 | 固体撮像装置、その制御方法及びカメラ |
JP2006197392A (ja) * | 2005-01-14 | 2006-07-27 | Canon Inc | 固体撮像装置、カメラ、及び固体撮像装置の駆動方法 |
US7489351B2 (en) * | 2005-01-21 | 2009-02-10 | Bae Systems Information And Electronic Systems Integration Inc. | Dynamic range extension for focal plane arrays |
US7508434B2 (en) * | 2005-06-28 | 2009-03-24 | Motorola, Inc. | Image sensor architecture employing one or more floating gate devices |
US7710481B2 (en) * | 2006-01-30 | 2010-05-04 | Motorola, Inc. | Image sensor architecture employing one or more non-volatile memory cells |
JP3996618B1 (ja) * | 2006-05-11 | 2007-10-24 | 総吉 廣津 | 半導体撮像素子 |
US7696545B2 (en) | 2006-08-29 | 2010-04-13 | Micron Technology, Inc. | Skimmed charge capture and charge packet removal for increased effective pixel photosensor full well capacity |
JP4866257B2 (ja) * | 2007-02-09 | 2012-02-01 | 株式会社Kenzan | 半導体撮像素子 |
US8009216B2 (en) * | 2008-07-16 | 2011-08-30 | International Business Machines Corporation | Pixel sensor cell with frame storage capability |
US8009215B2 (en) * | 2008-07-16 | 2011-08-30 | International Business Machines Corporation | Pixel sensor cell with frame storage capability |
US8605181B2 (en) | 2010-11-29 | 2013-12-10 | Teledyne Dalsa B.V. | Pixel for correlated double sampling with global shutter |
US9526468B2 (en) | 2014-09-09 | 2016-12-27 | General Electric Company | Multiple frame acquisition for exposure control in X-ray medical imagers |
JP6871797B2 (ja) | 2017-04-24 | 2021-05-12 | キヤノン株式会社 | 光電変換装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4866496A (en) * | 1986-06-24 | 1989-09-12 | U.S. Philips Corp. | Charger transfer device (CTD), eliminating the background level of a detected signal, detection structure and method of using such a CTD |
US4743959A (en) * | 1986-09-17 | 1988-05-10 | Frederiksen Jeffrey E | High resolution color video image acquisition and compression system |
JPH0748826B2 (ja) * | 1988-12-01 | 1995-05-24 | 三菱電機株式会社 | 固体撮像装置 |
WO1991004633A1 (en) * | 1989-09-23 | 1991-04-04 | Vlsi Vision Limited | I.c. sensor |
JPH04172085A (ja) * | 1990-11-05 | 1992-06-19 | Mitsubishi Electric Corp | 固体撮像装置 |
CA2095739A1 (en) * | 1992-05-27 | 1993-11-28 | Michael J. Mcnutt | Charge skimming and variable integration time in focal plane arrays |
JP3271808B2 (ja) | 1992-12-02 | 2002-04-08 | チッソ株式会社 | ドレイン材およびその製造方法 |
US5717199A (en) * | 1996-01-26 | 1998-02-10 | Cid Technologies, Inc. | Collective charge reading and injection in random access charge transfer devices |
JP3559640B2 (ja) * | 1996-02-27 | 2004-09-02 | キヤノン株式会社 | 光電変換装置 |
-
1996
- 1996-02-27 JP JP03961496A patent/JP3559640B2/ja not_active Expired - Fee Related
-
1997
- 1997-02-25 US US08/805,968 patent/US6064431A/en not_active Expired - Lifetime
- 1997-02-26 ES ES97301258T patent/ES2194154T3/es not_active Expired - Lifetime
- 1997-02-26 EP EP97301258A patent/EP0793378B1/en not_active Expired - Lifetime
- 1997-02-26 DE DE69721109T patent/DE69721109T2/de not_active Expired - Lifetime
-
1998
- 1998-02-27 HK HK98101574A patent/HK1002576A1/xx not_active IP Right Cessation
-
1999
- 1999-09-29 US US09/407,298 patent/US6342920B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP3559640B2 (ja) | 2004-09-02 |
EP0793378A2 (en) | 1997-09-03 |
DE69721109D1 (de) | 2003-05-28 |
EP0793378B1 (en) | 2003-04-23 |
US20010040634A1 (en) | 2001-11-15 |
JPH09233392A (ja) | 1997-09-05 |
US6064431A (en) | 2000-05-16 |
EP0793378A3 (en) | 1998-07-01 |
HK1002576A1 (en) | 1998-09-04 |
DE69721109T2 (de) | 2003-12-04 |
US6342920B2 (en) | 2002-01-29 |
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