EP1952204A4 - Scanning near field ultrasound holography - Google Patents

Scanning near field ultrasound holography

Info

Publication number
EP1952204A4
EP1952204A4 EP05808603A EP05808603A EP1952204A4 EP 1952204 A4 EP1952204 A4 EP 1952204A4 EP 05808603 A EP05808603 A EP 05808603A EP 05808603 A EP05808603 A EP 05808603A EP 1952204 A4 EP1952204 A4 EP 1952204A4
Authority
EP
European Patent Office
Prior art keywords
near field
scanning near
field ultrasound
ultrasound holography
holography
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP05808603A
Other languages
German (de)
French (fr)
Other versions
EP1952204A1 (en
Inventor
Gajendra Shekhawat
Vinayak P Dravid
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Northwestern University
Original Assignee
Northwestern University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Northwestern University filed Critical Northwestern University
Publication of EP1952204A1 publication Critical patent/EP1952204A1/en
Publication of EP1952204A4 publication Critical patent/EP1952204A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H3/00—Holographic processes or apparatus using ultrasonic, sonic or infrasonic waves for obtaining holograms; Processes or apparatus for obtaining an optical image from them
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G01N29/0663—Imaging by acoustic holography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G01N29/0681—Imaging by acoustic microscopy, e.g. scanning acoustic microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G01N29/069—Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/32—AC mode
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/22—Processes or apparatus for obtaining an optical image from holograms
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/0069—Fatigue, creep, strain-stress relations or elastic constants
    • G01N2203/0075—Strain-stress relations or elastic constants
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/0092—Visco-elasticity, solidification, curing, cross-linking degree, vulcanisation or strength properties of semi-solid materials
    • G01N2203/0094—Visco-elasticity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/012—Phase angle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/014—Resonance or resonant frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0232—Glass, ceramics, concrete or stone
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/024—Mixtures
    • G01N2291/02491—Materials with nonlinear acoustic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02827—Elastic parameters, strength or force
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0427—Flexural waves, plate waves, e.g. Lamb waves, tuning fork, cantilever

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Acoustics & Sound (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Power Engineering (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
EP05808603A 2005-10-06 2005-10-06 Scanning near field ultrasound holography Withdrawn EP1952204A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2005/036194 WO2007044002A1 (en) 2005-10-06 2005-10-06 Scanning near field ultrasound holography

Publications (2)

Publication Number Publication Date
EP1952204A1 EP1952204A1 (en) 2008-08-06
EP1952204A4 true EP1952204A4 (en) 2011-12-14

Family

ID=37943104

Family Applications (1)

Application Number Title Priority Date Filing Date
EP05808603A Withdrawn EP1952204A4 (en) 2005-10-06 2005-10-06 Scanning near field ultrasound holography

Country Status (5)

Country Link
EP (1) EP1952204A4 (en)
JP (1) JP4746104B2 (en)
KR (1) KR101033342B1 (en)
CN (1) CN101317138B (en)
WO (1) WO2007044002A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8322220B2 (en) * 2007-05-10 2012-12-04 Veeco Instruments Inc. Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection
JP5277378B2 (en) * 2008-10-27 2013-08-28 国立大学法人金沢大学 Scanning probe microscope
JP5223832B2 (en) * 2009-09-28 2013-06-26 富士通株式会社 Internal structure measuring method and internal structure measuring device
KR101716104B1 (en) 2010-06-08 2017-03-14 디씨지 시스템스 인코포레이티드 Three-dimensional hot spot localization
CN102698679B (en) * 2012-06-26 2014-04-16 南京航空航天大学 Method for operating nano matters
EP3179313B1 (en) * 2015-12-11 2021-11-10 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Apparatus and method for creating a holographic ultrasound field in an object
CN106097333A (en) * 2016-06-08 2016-11-09 上海交通大学 Microwave holography map generalization and reconstructing method and system thereof
EP3349018A1 (en) * 2017-01-13 2018-07-18 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Atomic force microscopy device, method and lithographic system
CN109580990B (en) * 2017-09-28 2021-08-06 中国医学科学院基础医学研究所 Method for detecting cell surface holes by adopting atomic force microscope
CN108760771B (en) * 2018-07-24 2022-10-14 电子科技大学 Method for tracing medicine by using near-field microwave microscope
US10512911B1 (en) * 2018-12-07 2019-12-24 Ultima Genomics, Inc. Implementing barriers for controlled environments during sample processing and detection
CN110133108B (en) * 2019-05-13 2020-09-22 浙江大学 Measuring system and measuring method for sub-surface micro-nano defects of ultra-precise element

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998008046A1 (en) * 1996-08-19 1998-02-26 Isis Innovation Limited Atomic force microscopy apparatus and a method thereof
US20050056782A1 (en) * 2003-08-12 2005-03-17 Gajendra Shekhawat Near field acoustic holography with scanning probe microscope (SPM)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3286565B2 (en) * 1997-07-28 2002-05-27 セイコーインスツルメンツ株式会社 Sampling scanning probe microscope
US6666075B2 (en) * 1999-02-05 2003-12-23 Xidex Corporation System and method of multi-dimensional force sensing for scanning probe microscopy
CN100387968C (en) * 1999-06-05 2008-05-14 株式会社大宇电子 Atomic force microscope and driving method therefor
US6577417B1 (en) * 2000-08-19 2003-06-10 Jehad Khoury Heterodyne-wavelength division demultiplexing for optical pick-ups, microscopy, tomography telecommunication and lidar
US6849844B2 (en) * 2000-10-12 2005-02-01 Jed Khoury 2-D microscopic tomographic systems utilizing 2-D deflection sensors
US6876791B2 (en) * 2001-09-03 2005-04-05 Sumitomo Electric Industries, Ltd. Diffraction grating device
AU2002365676A1 (en) * 2001-12-04 2003-06-17 Ecole Polytechnique Federale De Lausanne (Epfl) Apparatus and method for digital holographic imaging

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998008046A1 (en) * 1996-08-19 1998-02-26 Isis Innovation Limited Atomic force microscopy apparatus and a method thereof
US20050056782A1 (en) * 2003-08-12 2005-03-17 Gajendra Shekhawat Near field acoustic holography with scanning probe microscope (SPM)

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2007044002A1 *

Also Published As

Publication number Publication date
JP4746104B2 (en) 2011-08-10
CN101317138A (en) 2008-12-03
CN101317138B (en) 2011-05-04
WO2007044002A1 (en) 2007-04-19
KR101033342B1 (en) 2011-05-09
EP1952204A1 (en) 2008-08-06
KR20080068689A (en) 2008-07-23
JP2009511876A (en) 2009-03-19

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