EP1719144A1 - Hochfrequenz-mems-schalter mit gebogenem schaltelement und verfahren zu seiner herstellung - Google Patents
Hochfrequenz-mems-schalter mit gebogenem schaltelement und verfahren zu seiner herstellungInfo
- Publication number
- EP1719144A1 EP1719144A1 EP05715021A EP05715021A EP1719144A1 EP 1719144 A1 EP1719144 A1 EP 1719144A1 EP 05715021 A EP05715021 A EP 05715021A EP 05715021 A EP05715021 A EP 05715021A EP 1719144 A1 EP1719144 A1 EP 1719144A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- switching element
- substrate
- signal conductor
- mems switch
- switching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 13
- 239000000758 substrate Substances 0.000 claims abstract description 52
- 239000004020 conductor Substances 0.000 claims abstract description 36
- 238000005452 bending Methods 0.000 claims description 31
- 238000000034 method Methods 0.000 claims description 13
- 238000005516 engineering process Methods 0.000 claims description 6
- 238000004093 laser heating Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 5
- 239000010409 thin film Substances 0.000 claims description 3
- 238000013459 approach Methods 0.000 description 4
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 230000007774 longterm Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H59/00—Electrostatic relays; Electro-adhesion relays
- H01H59/0009—Electrostatic relays; Electro-adhesion relays making use of micromechanics
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H59/00—Electrostatic relays; Electro-adhesion relays
- H01H59/0009—Electrostatic relays; Electro-adhesion relays making use of micromechanics
- H01H2059/0081—Electrostatic relays; Electro-adhesion relays making use of micromechanics with a tapered air-gap between fixed and movable electrodes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49105—Switch making
Definitions
- the present invention relates to a high-frequency MEMS switch with a curved switching element according to the preamble of claim 1 and a method for producing a high-frequency MEMS switch with a curved switching element according to the preamble of claim 11.
- MEMS Micro Electro Mechanical Systems
- High-frequency MEMS switches are also used in particular in radar systems, satellite communication systems, wireless communication systems and instrument systems. For example, high-frequency MEMS switches are also required in phase antenna systems and in phase shifters for satellite-based radar systems.
- High frequency MEMS switches offer a number of advantages, such as extremely low power consumption, good insulation or low interference capacities, low insertion loss or low insertion losses and low manufacturing costs.
- MEMS switches In the article “RF-MEMS Switches, Switch Circuits, and Phase Shifters,” by Gabriel M. Rebeiz et al. in. Revue HF No. 2/2001 MEMS switches are described which are used in the high frequency range, in a range between 0.1 and 100 GHz. These MEMS switches have self-supporting switching arms designed as mechanical springs that can be opened by electrostatic force or closing a circuit.
- the self-supporting switching arm or cantilever bar is attached to a substrate and is electrostatically attracted by an electrode to close a contact. With no voltage applied, the switching arm returns to its starting position through elastic restoring forces, and the contact is opened.
- a switching element influences the progression of an electromagnetic wave on a signal line by opening or closing a transmission path. This can take the form of a series switch, a shunt switch or a series shunt switch. In general, a large distance from the contact area is necessary when the switching element is open, since the capacitance in this state should be as small as possible in order to obtain an undisturbed line. However, a small distance is required for the switching process itself, since only small electrostatic forces act.
- the upwardly bent switching element contacts the base electrode by electrostatic forces, so that the free end of the switching element comes into contact with a signal line Without the switching voltage applied, the switching element is brought back into the upward position by an elastic tension, i n the it from the signal line is far away.
- the switching element moves like the tongue of a frog.
- the problem with MEMS switches is that the elastic restoring forces are generally very small, so that there is a risk that the switching element will adhere to the surface of the signal line due to adhesion. As a result, the switching elements often lack sufficient reliability, which is necessary for long-term use, for example in space.
- the high-frequency MEMS switch comprises a signal conductor which is arranged on a substrate, an elongated switching element which has a curved elastic bending region and is cantileveredly fastened to the substrate, and an electrode arrangement for producing an electrostatic force acting on the switching element in order to bend the switching element towards the signal conductor, the switching element being arranged in its longitudinal direction parallel to the signal conductor and having a contact area which extends partially or completely across the signal conductor transversely to the switching element, and wherein the elastic bending area of the switching element progressively approaches the electrode arrangement parallel to the signal line when the electrostatic force acts.
- the voltage required to close the element is kept low, but a large switching path is still possible, so that the distance is large in the open state and the capacitance is therefore small.
- a further miniaturization is also achieved by arranging the switching element in its longitudinal direction parallel to the signal conductor, the switching element nevertheless being able to be made relatively long, thereby achieving greater mechanical stability and greater switching force.
- a greater restoring force or stronger configuration of the switching element is also possible. Due to the large possible length and area of the switching element, larger electrostatic forces on the one hand and larger restoring forces or a thicker configuration of the switching element on the other hand can be achieved.
- the switching element preferably comprises at least two switching arms with a curved elastic bending region, which are arranged on both sides of the signal conductor and extend in the longitudinal direction parallel to the signal conductor, the switching arms being connected to one another by a bridge positioned above the signal conductor, which bridge is formed by the respective contact region. Due to the arrangement on both sides with a bridge-like contact area, the reliability of the MEMS switch is increased even further, since even greater restoring forces and electrostatic forces can be achieved with a small space and energy requirement and thus a particularly high mechanical stability and with a small space and energy requirement Switching force is achieved.
- the electrode arrangement is advantageously formed by at least one base or base electrode, which is arranged flatly on the substrate under the switching element in order to attract the switching element electrostatically. In the case of switching arms arranged on both sides, the base electrode or bottom electrode is arranged below each switching arm.
- the electrode arrangement is formed by a ground electrode arranged below the substrate or by the substrate itself. This results in a simplified production and thus reduced production costs.
- the substrate can be made from high-resistance silicon.
- the electrode arrangement advantageously extends parallel to the substrate surface in order to progressively draw the switching element to the substrate surface in its bending region due to the electrostatic force.
- the bent bending area is preferably formed by bimorph material.
- a further advantageous embodiment provides that the bending area to generate a tensile stress e.g. has melted surface by laser heating.
- the tensile stress can also be achieved by suitably controlling the layer deposition during production.
- the switching element is advantageously manufactured using thin-film technology. This achieves cost-effective production and a small design.
- the contact area of the switching element preferably comes into direct contact with the signal conductor when the electrostatic force acts.
- the Contact area when the electrostatic force acts a minimal distance from the signal conductor, ie it does not come into direct contact with the signal conductor. This results in a large capacitance between the signal conductor and the switching element, so that the signal line is interrupted.
- the minimum distance can be achieved or maintained, for example, by means of suitable dielectric insulation.
- the following steps are carried out: forming a signal line on a substrate; optionally forming an electrode arrangement on the substrate, for example if the substrate has no intrinsic line; Forming an elongated switching element with a bent elastic bending area on the substrate such that it is pulled longitudinally towards the substrate by an electrostatic force in its bending area from the electrode arrangement and moves away from the substrate by elastic restoring force in the bending area; the switching element being arranged in its longitudinal direction parallel to the signal conductor in such a way that a laterally projecting contact area of the switching element extends across the signal conductor, so that the elastic bending area of the switching element progressively approaches the electrode arrangement parallel to the signal line when the electrostatic force acts to bring the contact area closer to the signal conductor.
- the electrode arrangement can also be formed by an intrinsically conductive substrate or an intrinsically conductive substrate region.
- the method produces a particularly reliable high-frequency MEMS switch with a curved switching element in a cost-effective manner, which has increased mechanical stability and increased switching forces.
- the switching element is advantageously shaped in such a way that it has at least two switching arms with a curved elastic bending region, the switching arms being arranged on both sides of the signal conductor, so that they are in their Extend longitudinally parallel to the signal conductor and the switching arms are connected to each other by a bridge positioned above the signal conductor, which is formed by the respective contact area.
- At least one base electrode is preferably arranged as a surface arrangement on the substrate under the switching element.
- At least one ground electrode arranged below the substrate can also be formed as the electrode arrangement.
- the bending area is advantageously formed by bimophous material. However, it is particularly advantageous if the surface of the bending region is melted on by means of laser heating in order to generate a tensile stress.
- the method can be used to manufacture the high-frequency MEMS switch designed according to the invention, as is generally described above.
- FIG. 1 schematically shows a perspective illustration of a high-frequency MEMS switch according to a particularly preferred embodiment of the invention
- 3a-f schematically illustrate different switch configurations of MEMS switches.
- FIG. 1 shows, as a particularly preferred exemplary embodiment, a MEMS switch 10 which is suitable for high-frequency applications and has two parallel switching arms.
- the MEMS switch 10 comprises a substrate 11, on which a signal line 12 is formed, which extends in one direction over the substrate 11.
- the switching arms 13a, 13b of the switching element 13 are each fixed with one end flat on the substrate surface and parallel to it, while their remaining part is bent upwards, so that the other end of the switching arms 13a, 13b is removed from the substrate surface.
- each switching arm 13a, 13b of the switching element 13 has a central elastic bending region 131, 132, which is bent or curved upwards in the switch position shown here.
- An electrode arrangement which in this example is formed by two bottom electrodes 14a, 14b, is provided on the substrate surface below each switching arm 13a, 13b of the switching element 13.
- the base electrodes 14a, 14b serve to exert an electrostatic attraction force on the cantilevered switching arms 13a, 13b in the presence of a switching voltage, so that they move towards the substrate surface, the elastic bending areas 131, 132 taking on a straight shape.
- the switching element 13 further comprises a contact area 15, which extends across the signal line 12 in this example.
- a contact area 15 When an electrostatic force is exerted on the bending areas 131, 132 and the free ends of the switching arms 13a, 13b by the electrode arrangement 14a, 14b, the contact area 15 approaches the signal line 12 for direct electrical contact or capacitive coupling to cause the signal line 15. In this case, the MEMS switch 10 is in its closed state.
- the switching element 13 is provided with a tensile stress in its bending areas 131, 132, which causes a restoring force, so that the switching arms 13a, 13b return to the bent state if there is no electrostatic attraction force through the base electrodes 14a, 14b on the switching arms 13a, 13b is exercised.
- the MEMS switch 10 assumes its open state, in which the contact area 15 is removed from the signal line 12 and thus there is no electrical contact and no or only very little capacitive coupling to the signal line 12.
- the switching element 13 is arranged in its longitudinal direction parallel to the signal line 12 with its self-supporting switching arms 13a, 13b designed as elongated bars.
- the contact area 15 forms a bridge which connects the two switching arms 13a, 13b to one another in the area of their free ends and in this exemplary embodiment extends completely across the signal line 12 transversely to the latter.
- FIG. 2 shows a top view of an arrangement of MEMS switches 20, in which the individual switching elements 23 each have only one elongated, self-supporting switching arm 23a, which runs parallel to the signal line 22.
- Each of the switching elements 23 has one or more contact areas 25 arranged laterally on the respective switching arm 23a, which extends across the signal line 22.
- the respective contact area 25 can either extend completely across the entire width of the signal line 22 or only partially.
- a plurality of contact areas 25 can also be arranged laterally on a switching element 23, as shown on the right-hand side in FIG. 2.
- the high-frequency MEMS switch 10 shown in FIG. 1 is designed in a shunt configuration.
- the switching arms 13a, 13b arranged as cantilever elements or self-supporting the coupling capacitance very low due to the distance between the signal line 12 and the contact area 15. Therefore, the influence on the progression of an electromagnetic wave on the signal line 12 is also small.
- the curved switching element 13 is caused to bend downward, so that the bridge-like contact region 25 reaches the signal line 12 or in its immediate vicinity, so that a high capacitance between the signal line 12 and the switching element 13 arises, as a result of which the progression of the electromagnetic wave on the transmission or signal line 12 is hindered or interrupted.
- the switching elements 13, 23 shown with their switching arms 13a, 13b, 23a and contact areas 15, 25 are manufactured using thin-film technology, the bent switching elements with their switching arms being arranged parallel to the signal line 12, 25 and in the embodiment shown in FIG a bridge, which is formed by the contact region 15, are connected.
- the signal line 12, 22, which runs below the bridge or the contact area 15, 25 on the substrate 11, 21, typically has an electrical resistance of, for example, approximately 50 ⁇ . However, it can also be designed with other resistors, depending on the requirements of the respective application.
- the MEMS switch forms an RF relay.
- FIGS. 3a-f show as examples various switch configurations that are possible with the MEMS switch according to the invention.
- 3a and 3b show a circuit in series with the signal line 12, the signal line being interrupted in FIG. 3a and the signal line 12 being closed in FIG. 3b.
- Figure 3c and d show a shunt switch configuration in which the switching is done by an electrical shunt.
- the signal line 12 is closed since the switch is open and therefore no shunt occurs. lies.
- the signal line 12 is interrupted because the switch is closed and there is a shunt.
- FIGS. 3e and f show a combination of series and shunt configuration, the switch in signal line 12 being open in FIG. 3e and the shunt closed in FIG. 3f.
- the substrate 11, 21 is made of a semiconductor material, while the signal line 12, 22 and the switching element 13, 23 are made of highly conductive material, such as Al, Cu, Au, etc.
- electrically conductive layers are first formed as a signal line and electrode arrangement on the substrate, and then the switching element 13, 23 is attached to the substrate surface in a self-supporting manner.
- the switching element 13, 23 is attached to the substrate surface in a self-supporting manner.
- its surface is melted by means of laser heating in order to create the necessary tensile stress in the elastic bending area.
- bimorphic material can also be used bimorphic material to bring about the curvature and the restoring force in the bent state.
- a high-resistance substrate can also be used to generate an electrostatic attraction, this being provided on its rear side with a metallization 17 which serves as a ground, this possibility also being shown schematically in FIG. 1 for illustration.
- the so-called sacrificial layer used in known processes can be replaced by a suitable surface modification, for example by hydrophobization.
- a suitable surface modification for example by hydrophobization.
- the distance between the switching element and the base electrode or the substrate surface becomes even smaller, so that considerably larger electric fields and correspondingly lower operating voltages are achieved.
- a higher mechanical stability is achieved by the arrangement according to the invention.
- the switching elements can be provided with a greater restoring force, since the geometrical arrangement of the electrodes and the switching elements enables a greater electrostatic attraction force to be achieved, although there is little interference capacity in the open state.
- the inventive design of the high-frequency MEMS switch achieves improved long-term stability and greater reliability. This also reduces or eliminates the risk of adhesion or generally getting caught or snagging the switching element on the substrate surface or the surface of the signal line.
Landscapes
- Micromachines (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004010150A DE102004010150B9 (de) | 2004-02-27 | 2004-02-27 | Hochfrequenz-MEMS-Schalter mit gebogenem Schaltelement und Verfahren zu seiner Herstellung |
PCT/DE2005/000317 WO2005083734A1 (de) | 2004-02-27 | 2005-02-25 | Hochfrequenz-mems-schalter mit gebogenem schaltelement und verfahren zu seiner herstellung |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1719144A1 true EP1719144A1 (de) | 2006-11-08 |
EP1719144B1 EP1719144B1 (de) | 2015-10-14 |
Family
ID=34877249
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP05715021.1A Not-in-force EP1719144B1 (de) | 2004-02-27 | 2005-02-25 | Hochfrequenz-mems-schalter mit gebogenem schaltelement und verfahren zu seiner herstellung |
Country Status (5)
Country | Link |
---|---|
US (1) | US7786829B2 (de) |
EP (1) | EP1719144B1 (de) |
JP (1) | JP4927701B2 (de) |
DE (1) | DE102004010150B9 (de) |
WO (1) | WO2005083734A1 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006061386B3 (de) * | 2006-12-23 | 2008-06-19 | Atmel Germany Gmbh | Integrierte Anordnung, ihre Verwendung und Verfahren zu ihrer Herstellung |
JP6478397B2 (ja) * | 2015-03-13 | 2019-03-06 | 国立大学法人山形大学 | フェーズドアレイアンテナ |
US10222265B2 (en) * | 2016-08-19 | 2019-03-05 | Obsidian Sensors, Inc. | Thermomechanical device for measuring electromagnetic radiation |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58201218A (ja) * | 1982-05-20 | 1983-11-24 | オムロン株式会社 | 片持梁の製造方法 |
EP0205450A1 (de) * | 1984-12-19 | 1986-12-30 | SIMPSON, George, R. | Elektrostatische binäre schalt- und speicheranordnungen |
JPH09257832A (ja) * | 1996-03-26 | 1997-10-03 | Matsushita Electric Works Ltd | エレクトレット応用装置及びその製造方法 |
JPH10154456A (ja) * | 1996-11-25 | 1998-06-09 | Omron Corp | マイクロリレー、その製造方法およびその制御方法 |
DE19736674C1 (de) * | 1997-08-22 | 1998-11-26 | Siemens Ag | Mikromechanisches elektrostatisches Relais und Verfahren zu dessen Herstellung |
US6127908A (en) * | 1997-11-17 | 2000-10-03 | Massachusetts Institute Of Technology | Microelectro-mechanical system actuator device and reconfigurable circuits utilizing same |
IT1307131B1 (it) * | 1999-02-02 | 2001-10-29 | Fiat Ricerche | Dispositivo di micro-rele' a controllo elettrostatico. |
US6373682B1 (en) * | 1999-12-15 | 2002-04-16 | Mcnc | Electrostatically controlled variable capacitor |
JP3675312B2 (ja) * | 2000-07-10 | 2005-07-27 | 松下電器産業株式会社 | 薄膜構造体、及びその応力調整方法 |
US6456420B1 (en) * | 2000-07-27 | 2002-09-24 | Mcnc | Microelectromechanical elevating structures |
JP2002100276A (ja) * | 2000-09-20 | 2002-04-05 | Matsushita Electric Ind Co Ltd | 微小機械スイッチ |
US7196599B2 (en) * | 2000-12-11 | 2007-03-27 | Dabbaj Rad H | Electrostatic device |
WO2002073673A1 (en) | 2001-03-13 | 2002-09-19 | Rochester Institute Of Technology | A micro-electro-mechanical switch and a method of using and making thereof |
JP3651404B2 (ja) * | 2001-03-27 | 2005-05-25 | オムロン株式会社 | 静電マイクロリレー、並びに、該静電マイクロリレーを利用した無線装置及び計測装置 |
US6657525B1 (en) * | 2002-05-31 | 2003-12-02 | Northrop Grumman Corporation | Microelectromechanical RF switch |
JP4109498B2 (ja) * | 2002-06-11 | 2008-07-02 | 松下電器産業株式会社 | スイッチ |
US7453339B2 (en) * | 2005-12-02 | 2008-11-18 | Palo Alto Research Center Incorporated | Electromechanical switch |
-
2004
- 2004-02-27 DE DE102004010150A patent/DE102004010150B9/de not_active Expired - Fee Related
-
2005
- 2005-02-25 US US10/590,699 patent/US7786829B2/en active Active
- 2005-02-25 WO PCT/DE2005/000317 patent/WO2005083734A1/de active Application Filing
- 2005-02-25 JP JP2007500039A patent/JP4927701B2/ja not_active Expired - Fee Related
- 2005-02-25 EP EP05715021.1A patent/EP1719144B1/de not_active Not-in-force
Non-Patent Citations (1)
Title |
---|
See references of WO2005083734A1 * |
Also Published As
Publication number | Publication date |
---|---|
JP4927701B2 (ja) | 2012-05-09 |
DE102004010150A1 (de) | 2005-09-22 |
JP2007525805A (ja) | 2007-09-06 |
DE102004010150B4 (de) | 2011-12-29 |
US20070215446A1 (en) | 2007-09-20 |
US7786829B2 (en) | 2010-08-31 |
DE102004010150B9 (de) | 2012-01-26 |
WO2005083734A1 (de) | 2005-09-09 |
EP1719144B1 (de) | 2015-10-14 |
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