EP1001314A3 - Système optique durable pour appareil d' exposition par projection et méthode pour sa fabrication - Google Patents
Système optique durable pour appareil d' exposition par projection et méthode pour sa fabrication Download PDFInfo
- Publication number
- EP1001314A3 EP1001314A3 EP99121982A EP99121982A EP1001314A3 EP 1001314 A3 EP1001314 A3 EP 1001314A3 EP 99121982 A EP99121982 A EP 99121982A EP 99121982 A EP99121982 A EP 99121982A EP 1001314 A3 EP1001314 A3 EP 1001314A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- optical system
- exposure apparatus
- projection exposure
- manufacturing
- same
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 title abstract 5
- 238000004519 manufacturing process Methods 0.000 title 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 abstract 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 229910052801 chlorine Inorganic materials 0.000 abstract 2
- 239000000460 chlorine Substances 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70241—Optical aspects of refractive lens systems, i.e. comprising only refractive elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/14—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation
- G02B13/143—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation for use with ultraviolet radiation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
- G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Toxicology (AREA)
- Optics & Photonics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Glass Compositions (AREA)
- Microscoopes, Condenser (AREA)
- Lenses (AREA)
- Glass Melting And Manufacturing (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31847298 | 1998-11-10 | ||
JP10318472A JP2000143278A (ja) | 1998-11-10 | 1998-11-10 | 耐久性の向上された投影露光装置及び結像光学系の製造方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP1001314A2 EP1001314A2 (fr) | 2000-05-17 |
EP1001314A3 true EP1001314A3 (fr) | 2004-11-24 |
EP1001314B1 EP1001314B1 (fr) | 2009-10-28 |
Family
ID=18099504
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP99121982A Expired - Lifetime EP1001314B1 (fr) | 1998-11-10 | 1999-11-10 | Système optique durable pour appareil d' exposition par projection et méthode pour sa fabrication |
Country Status (5)
Country | Link |
---|---|
US (2) | US6373554B1 (fr) |
EP (1) | EP1001314B1 (fr) |
JP (1) | JP2000143278A (fr) |
AT (1) | ATE447201T1 (fr) |
DE (1) | DE69941592D1 (fr) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001270731A (ja) * | 2000-03-28 | 2001-10-02 | Nikon Corp | 合成石英ガラス部材及びこれを用いた光リソグラフィー装置 |
US20070076161A1 (en) * | 2000-06-07 | 2007-04-05 | Kabushiki Kaisha Advanced Display | Liquid-crystal display device and process of fabricating it |
JP2002244034A (ja) * | 2001-02-21 | 2002-08-28 | Nikon Corp | 投影光学系および該投影光学系を備えた露光装置 |
JP4763159B2 (ja) * | 2001-06-15 | 2011-08-31 | シスメックス株式会社 | フローサイトメータ |
JP4324957B2 (ja) * | 2002-05-27 | 2009-09-02 | 株式会社ニコン | 照明光学装置、露光装置および露光方法 |
US7289277B2 (en) * | 2002-07-09 | 2007-10-30 | Asml Holding N.V. | Relay lens used in an illumination system of a lithography system |
JP4305611B2 (ja) * | 2002-07-18 | 2009-07-29 | 株式会社ニコン | 照明光学装置、露光装置および露光方法 |
WO2004073052A1 (fr) * | 2003-02-17 | 2004-08-26 | Nikon Corporation | Appareil d'exposition et élément optique destiné audit appareil |
US7265070B2 (en) * | 2003-11-26 | 2007-09-04 | Corning Incorporated | Synthetic silica glass optical material having high resistance to optically induced index change |
US7375794B2 (en) * | 2004-08-04 | 2008-05-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0401845A2 (fr) * | 1989-06-09 | 1990-12-12 | Heraeus Quarzglas GmbH | Membres optiques et ébauches de verre en silice synthétique et leur méthode de fabrication |
EP0546196A1 (fr) * | 1991-06-29 | 1993-06-16 | Shin-Etsu Quartz Products Co., Ltd. | Element optique en quartz de synthese pour laser a excimere et realisation de cet element |
JPH0840736A (ja) * | 1994-08-03 | 1996-02-13 | Shin Etsu Chem Co Ltd | エキシマレーザ光学素材用合成石英ガラス部材およびその製造方法 |
EP0908716A1 (fr) * | 1997-10-07 | 1999-04-14 | Nikon Corporation | Méthode pour estimer la résistance d'un composant optique à l'irradiation par un laser excimère et méthode pour la sélection d'un composant optique en verre de silice |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0717396B2 (ja) * | 1983-12-22 | 1995-03-01 | アメリカン テレフオン アンド テレグラフ カムパニ− | 高珪酸ガラス物品の作成 |
US5702495A (en) * | 1993-02-10 | 1997-12-30 | Nikon Corporation | Silica glass member for UV-lithography, method for silica glass production, and method for silica glass member production |
US6087283A (en) * | 1995-01-06 | 2000-07-11 | Nikon Corporation | Silica glass for photolithography |
US5707908A (en) * | 1995-01-06 | 1998-01-13 | Nikon Corporation | Silica glass |
US6094941A (en) * | 1995-06-06 | 2000-08-01 | Shin-Etsu Quartz Products Co., Ltd. | Process for manufacturing optical member for excimer laser |
JP3491212B2 (ja) * | 1995-06-23 | 2004-01-26 | 株式会社ニコン | 露光装置、照明光学装置、照明光学系の設計方法及び露光方法 |
US6291377B1 (en) * | 1997-08-21 | 2001-09-18 | Nikon Corporation | Silica glass and its manufacturing method |
JPH1067521A (ja) | 1996-08-22 | 1998-03-10 | Nikon Corp | フッ素含有石英ガラス、その製造方法、及び投影露光装置 |
JP3823436B2 (ja) * | 1997-04-03 | 2006-09-20 | 株式会社ニコン | 投影光学系 |
US5969803A (en) * | 1998-06-30 | 1999-10-19 | Nikon Corporation | Large NA projection lens for excimer laser lithographic systems |
-
1998
- 1998-11-10 JP JP10318472A patent/JP2000143278A/ja active Pending
-
1999
- 1999-10-25 US US09/437,780 patent/US6373554B1/en not_active Expired - Lifetime
- 1999-11-10 DE DE69941592T patent/DE69941592D1/de not_active Expired - Lifetime
- 1999-11-10 EP EP99121982A patent/EP1001314B1/fr not_active Expired - Lifetime
- 1999-11-10 AT AT99121982T patent/ATE447201T1/de not_active IP Right Cessation
-
2002
- 2002-03-12 US US10/095,106 patent/US6587181B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0401845A2 (fr) * | 1989-06-09 | 1990-12-12 | Heraeus Quarzglas GmbH | Membres optiques et ébauches de verre en silice synthétique et leur méthode de fabrication |
EP0546196A1 (fr) * | 1991-06-29 | 1993-06-16 | Shin-Etsu Quartz Products Co., Ltd. | Element optique en quartz de synthese pour laser a excimere et realisation de cet element |
JPH0840736A (ja) * | 1994-08-03 | 1996-02-13 | Shin Etsu Chem Co Ltd | エキシマレーザ光学素材用合成石英ガラス部材およびその製造方法 |
EP0908716A1 (fr) * | 1997-10-07 | 1999-04-14 | Nikon Corporation | Méthode pour estimer la résistance d'un composant optique à l'irradiation par un laser excimère et méthode pour la sélection d'un composant optique en verre de silice |
Non-Patent Citations (1)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 1996, no. 06 28 June 1996 (1996-06-28) * |
Also Published As
Publication number | Publication date |
---|---|
EP1001314A2 (fr) | 2000-05-17 |
US6373554B1 (en) | 2002-04-16 |
US20020135746A1 (en) | 2002-09-26 |
DE69941592D1 (de) | 2009-12-10 |
US6587181B2 (en) | 2003-07-01 |
JP2000143278A (ja) | 2000-05-23 |
EP1001314B1 (fr) | 2009-10-28 |
ATE447201T1 (de) | 2009-11-15 |
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