EP0966694B1 - Vorrichtung und verfahren zur bestimmung der bidirektionalen reflektanzverteilung - Google Patents
Vorrichtung und verfahren zur bestimmung der bidirektionalen reflektanzverteilung Download PDFInfo
- Publication number
- EP0966694B1 EP0966694B1 EP98910611A EP98910611A EP0966694B1 EP 0966694 B1 EP0966694 B1 EP 0966694B1 EP 98910611 A EP98910611 A EP 98910611A EP 98910611 A EP98910611 A EP 98910611A EP 0966694 B1 EP0966694 B1 EP 0966694B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- ccd line
- scanning camera
- optical
- camera
- vertical axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47C—CHAIRS; SOFAS; BEDS
- A47C7/00—Parts, details, or accessories of chairs or stools
- A47C7/36—Support for the head or the back
- A47C7/40—Support for the head or the back for the back
- A47C7/42—Support for the head or the back for the back of detachable or loose type
Definitions
- the invention relates to a device and a method for determining the bidirectional reflectance distribution.
- BRDF bidirectional reflectance distribution function
- the bidirectional reflectance distribution function depends on the wavelength of the examined light and the radiance of the incident unreflected Radiation. These in turn depend on the azimuth and zenith angles the position of the sun or the observation azimuth and the observation time angle.
- the expression bidirectional therefore indicates that the function not only from the zenith and azimuth of the observation point, but also from Zenith and azimuth of the light source (sun) is dependent.
- spectrophotometer is such. B. from the Brochure "SP1A” from Dr. Schulz & Partner, by means of which the Global radiation is measured.
- the spectrophotometer is attached to one Rotary device attached to the pivoting of the spectrophotometer two axes allowed in all directions.
- To from the measured radiance To determine the reflectance factor is usually the radiance above one Reference surface ("white disk") determined. This is preferably a spectral plate with a well-defined reflectivity that is independent on the direction of the incoming and outgoing radiation. Disadvantageous the known device is its lack of resolution.
- MAGNER THOMAS J "Moderate-resolution imaging spectrometer-tilt baseline concept "1991, EARTH AND ATMOSPHERIC REMOTE SENSING; ORLANDO, FL, USA APR 2-4 1991, PROC SPIE INT SOC OPT ENG; PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING 1991 PUBL BY INT SOC FOR OPTICAL ENGINEERING, BELLINGHAM, WA, USA, PAGE (S) 272-285; and KOVALICK W M ET AL: "Data processing and calibration of the Advanced Solid-State Array Spectroradiometer ", IGARSS'94.
- KARNER KONRAD F ET AL 'Image based measurrment system for anisotropic reflection "August 26, 1996, PROCEEDINGS OF THE 1996 17TH ANNUAL CONFERENCE AND EXHIBITION OF THE EUROPEAN ASSOCIATION FOR COMPUTER GRAPHICS, EUROGRAPHICS'96; POI TIERS, FR AUG 26-30 1996, COMPUT GRAPHICS FORUM; COMPUTER GRAPHICS FORUM; GRAPHICS-VIRTUAL REALITY-GRAPHICS HIGHWAYS SEP 1996 BLACKWELL SCIENTIFIC PUBLISHERS, OXFORD, ENGL; PAGE (S) 119-128; a BRDF soil survey with a CCD camera known. A single picture is taken with the one under a fixed one Angle of the CCD camera aligned to the surface to be measured. The one with this The achievable accuracies of the BRDF measurement are low and for many use cases are not sufficient.
- the invention is therefore based on the technical problem of a device and a method for determining the bidirectional reflectance distribution create, with an improved resolution of the bidirectional reflectance distribution function is achievable.
- the optical detector device as a CCD line camera can each simultaneously, according to the Opening angle of the camera, a segment of the surface to be scanned measured and a horizontal adjustment of the detector device for It is not necessary to record individual measuring points. This allows the measurement surface faster by a factor of 2000, so that the errors are due to a change in the position of the sun is negligible.
- the length of time for a series of measurements including polarization measurement is approx. 65 seconds with a resolution of up to 0.5 °.
- Such wide-angle CCD line cameras have long been known from aerospace technology.
- Measurement errors caused can include at least one further reference measurement be performed at certain points on the surface be measured in a different CCD line position. Because the polarization the CCD line camera is known can by means of the two Measurement data of the measurement errors can be deducted.
- the device for determining the bidirectional reflectance distribution comprises a CCD line camera 1 and a rotating device 2 on which the CCD line camera 1 is mounted.
- the CCD line camera 1 By means of the rotating device 2 is the CCD line camera 1 both about a vertical axis 3 and about a horizontal axis 4 swiveling.
- Known CCD line cameras usually have three CCD lines with a line width of 5184 pixels. These lines are for the purpose the stereo image processing arranged so that the middle line is vertical look down and the two others look 25 ° forwards and backwards, where only to determine the bidirectional reflectance distribution middle CCD line is used.
- a slit-shaped diffuse protection is arranged in the camera optics.
- the CCD line camera 1 is aligned so that one end of the middle CCD line looks perpendicular to surface 5 and thereby an imaginary Circle center 6 of the surface 5 defined. The opposite The end of the CCD line is thus directed to a point 7 off-nadir.
- the opening angle of 80 ° is the optical axis of the CCD line camera 1 to the surface 5 at an angle of 40 °.
- the segment shown in dashed lines is included.
- the CCD line camera 1 by a certain angle vertical axis 3 rotated and another segment added. This The process is repeated until the CCD line camera 1 is rotated through 360 ° was and thus measured a circle 8 of the surface 5.
- the Gradual vertical rotation can be done either manually or automatically by means of a suitable programmable control.
- the detected radiation density has to be determined with a reference quantity corresponding to the incident radiation be compared.
- the CCD line camera 1 according to FIG horizontal axis 4 rotated by 180 ° and the incident radiation density again recorded in segments. This means that for each point on the surface 5 both the incident as well as the reflected radiation density are known, so that from it the resulting bidirectional reflectance distribution function of the surface 5 can be derived.
- the CCD line camera 1 or the camera optics Due to the large opening angle and the optical components the CCD line camera 1 or the camera optics have a certain intrinsic polarization on.
- the intrinsic polarization of the camera optics is in the area of optical Axis almost zero and increases towards both ends of the CCD line.
- Both Previously known CCD line cameras 1 can use the self-polarization Margins up to 20%.
- the polarization of the incident, from the earth's surface Depending on the background, reflected light can be up to 30% red Light and up to 60% in blue light.
- the decreasing Wavelength increasing measurement errors due to the polarization up to be 6% or 12%.
- To determine and suppress these measurement errors due to the intrinsic polarization of the CCD line cameras 1, according to FIG another reference measurement can be made. For this, e.g.
- the CCD line camera 1 aligned such that the optical axis of the CCD line camera 1 is directed to the off-nadir point 7 of the first measurement, ie the points where the largest self-polarization of the CCD line camera 1 in the previous measurement occurred. Since in the area of the optical axis Eigenpolarisation is zero, the measurement error is due to polarization for the off-nadir point 7 in the reference measurement zero. By means of a comparison between The two measured values can thus be based on the degree of polarization of the Surface 5 reflected radiation can be inferred. Because the polarization and their distribution over the CCD line a fixed, determinable Device size, the measurement error can be due to the polarization for everyone Points of a segment and thus the entire surface 5 are eliminated become.
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- Investigating Or Analysing Materials By Optical Means (AREA)
Description
- Fig. 1
- eine perspektivische Darstellung der Vorrichtung bei Erfassung der Meßdaten,
- Fig. 2
- eine perspektivische Darstellung der Vorrichtung bei Erfassung der Referenz und
- Fig 3
- eine perspektivische Darstellung der Vorrichtung bei Erfassung einer weiteren Referenz zur Kompensation der Meßfehler aufgrund der Eigenpolarisation der CCD-Zeilen-Kamera.
Claims (4)
- Verfahren zur Bestimmung der bidirektionalen Reflektanzverteilung, mittels einer CCD-Zeilen-Kamera (1), die auf einer Drehvorrichtung (2) angeordnet ist, wobei die Drehvorrichtung (2) um eine vertikale Achse (3) und eine horizontale Achse (4) schwenkbar ausgebildet ist, umfassend folgende Verfahrenschritte:a) Ausrichten der mittleren CCD-Zeile auf die Oberfläche (5) derart, daß ein Ende der CCD-Zeile senkrecht zur Oberfläche (5) blickt und dadurch einen imaginären Kreismittelpunkt (6) der Oberfläche (5) definiert,b) simultanes Erfassen der optischen Strahldichte eines Segments der Oberfläche (5),c) Abspeichern der erfaßten Strahldichte gemäß Verfahrenschritt b),d) Drehen der CCD-Zeilen-Kamera (1) um die vertikale Achse (3) um einen bestimmten Winkel und Wiederholen der Verfahrensschritte b), c) und d) solange, bis die CCD-Zeilen-Kamera (1) um 360° um die vertikale Achse (3) gedreht wurde,e) Verschieben der optischen Achse der CCD-Zeilen-Kamera (1) mittels der horizontalen Achse (4) der Drehvorrichtung (2) um 180°,f) segmentweises Erfassen und Abspeichern der einfallenden Strahlung,g) Drehen der CCD-Zeilen-Kamera (1) um die vertikale Achse (3) um einen bestimmten Winkel und Wiederholen der Verfahrensschritte f) und g) solange, bis die CCD-Zeilen-Kamera (1) um 360° geschwenkt wurde.
- Verfahren nach Anspruch 1, wobei die Bestimmung der Referenz gemäß der Verfahrensschritte e) bis g) vor und/oder nach der Erfassung der optischen Strahldichte der Oberfläche (5) durchgeführt wird.
- Verfahren nach Anspruch 1 oder 2, wobei zur Bestimmung der Eigenpolarisation der CCD-Zeilen-Kamera (1) die optische Achse auf den off-Nadir Punkt (7) gerichtet wird und die optische Strahldichte erfaßt und abgespeichert wird.
- Vorrichtung zur Durchführung des Verfahrens nach einem der vorangegangenen Ansprüche, umfassend eine als CCD-Zeilen-Kamera (1) ausgebildete optische Detektoreinrichtung und eine die CCD-Zeilen-Kamera (1) schwenkende Drehvorrichtung (2), die um eine vertikale Achse (3) und eine horizontale Achse (4) schwenkbar ausgebildet ist.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19711127 | 1997-03-10 | ||
DE19711127A DE19711127C2 (de) | 1997-03-10 | 1997-03-10 | Vorrichtung und Verfahren zur Bestimmung der bidirektionalen Reflektanzverteilung |
PCT/DE1998/000384 WO1998040765A1 (de) | 1997-03-10 | 1998-02-02 | Vorrichtung und verfahren zur bestimmung der bidirektionalen reflektanzverteilung |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0966694A1 EP0966694A1 (de) | 1999-12-29 |
EP0966694B1 true EP0966694B1 (de) | 2003-10-22 |
Family
ID=7823700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP98910611A Expired - Lifetime EP0966694B1 (de) | 1997-03-10 | 1998-02-02 | Vorrichtung und verfahren zur bestimmung der bidirektionalen reflektanzverteilung |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0966694B1 (de) |
JP (1) | JP2002500754A (de) |
DE (2) | DE19711127C2 (de) |
WO (1) | WO1998040765A1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102608074B (zh) * | 2012-03-21 | 2014-09-24 | 中国科学院安徽光学精密机械研究所 | 一种新型双向反射分布函数测量装置 |
JP6410451B2 (ja) | 2014-03-31 | 2018-10-24 | キヤノン株式会社 | 情報処理装置、計測システム、情報処理方法およびプログラム。 |
US11131583B2 (en) | 2016-08-22 | 2021-09-28 | National University Corporation Hokkaido University | Object state detection and transmission system |
CN110083176B (zh) * | 2019-05-05 | 2020-07-24 | 宁夏大学 | 一种基于无人机载高光谱成像的brdf数据采集***和方法 |
CN110794382A (zh) * | 2019-10-30 | 2020-02-14 | 上海禾赛光电科技有限公司 | 激光雷达及其探测方法 |
JP7228860B1 (ja) | 2022-02-07 | 2023-02-27 | 国立大学法人北海道大学 | 分光計測器 |
-
1997
- 1997-03-10 DE DE19711127A patent/DE19711127C2/de not_active Expired - Fee Related
-
1998
- 1998-02-02 EP EP98910611A patent/EP0966694B1/de not_active Expired - Lifetime
- 1998-02-02 JP JP53905098A patent/JP2002500754A/ja active Pending
- 1998-02-02 WO PCT/DE1998/000384 patent/WO1998040765A1/de active IP Right Grant
- 1998-02-02 DE DE59809972T patent/DE59809972D1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE59809972D1 (de) | 2003-11-27 |
DE19711127A1 (de) | 1998-09-24 |
JP2002500754A (ja) | 2002-01-08 |
DE19711127C2 (de) | 2000-09-14 |
EP0966694A1 (de) | 1999-12-29 |
WO1998040765A1 (de) | 1998-09-17 |
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