EP0237259A2 - Massenspektrometer - Google Patents
Massenspektrometer Download PDFInfo
- Publication number
- EP0237259A2 EP0237259A2 EP87301870A EP87301870A EP0237259A2 EP 0237259 A2 EP0237259 A2 EP 0237259A2 EP 87301870 A EP87301870 A EP 87301870A EP 87301870 A EP87301870 A EP 87301870A EP 0237259 A2 EP0237259 A2 EP 0237259A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- quadrupole
- mass
- ions
- ion
- mass spectrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
- H01J49/4215—Quadrupole mass filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
Definitions
- This invention relates to a mass spectrometer, and more particularly to a low noise tandem quadrupole mass spectrometer.
- Tandem quadrupole mass spectrometers are known, and have been used in the study of ion-molecule reactions.
- a center RF only quadrupole has been added to a tandem quadrupole mass spectrometer for study of photo dissociation and for metastable ion studies.
- US-A-4234791 and US-A-4329582 disclose tandem quadrupole mass spectrometers including a highly efficient intermediate fragmentation stage which employs collision induced dissociation (CID) in the form of an RF only quadrupole.
- CID collision induced dissociation
- a mass spectrometer characterised by means for directing ions to be analyzed or filtered along a predetermined path; a quadrupole means for directing said ions away from said predetermined path; a quadrupole ion filter or analyzer for receiving the output of said quadrupole means; and detector means offset from said path and positioned to receive the output from said quadrupole ion filter or analyzer.
- the invention provides an improved tandem quadrupole mass spectrometer having low neutral particle and fast ion noise.
- the known tandem quadrupole mass spectrometer shown in Figure 1 includes an ion source 11 shown as including a chamber 12 with an electron source 13 and collector 14.
- the ion source 11 may be operated in electron impact (EI) mode or chemical ionization (CI) mode.
- EI electron impact
- CI chemical ionization
- Other suitable types of ion sources used in mass spectrometry are those which generate secondary ions from a sample liquid matrix or solid sample by bombardment with a beam of fast atoms or ions. These ion sources are used for analysis of high mass organic compounds.
- There are other ionization techniques for use in elemental or inorganic mass spectrometry. These types of ion source provide more neutral particles and fast ions giving rise to higher noise levels.
- the ion source generates ions which are accelerated and directed in a predetermined path by lens 16 into the quadrupole mass filter or analyzer 17. Neutral particles and fast ions also travel to the quadrupole mass filter.
- the quadrupole analyzer of filter 17 operates with a periodical voltage comprising an RF voltage and a d.c. voltage.
- the analyzer or filter 17 passes only ions of a selected charge to mass ration. That is, it filters the ions and only selects those having a charge to mass ratio within a predetermined range. The range is determined by the RF and d.c. voltages applied to the quadruopole rods 18.
- the ions which are not trapped or passed by the quadrupole filter or analyzer strike the walls of the enclosure or the qudrupole rods 18 and are neutralized.
- the selected or filtered ions pass through the analyzer 17.
- a lens 19 focuses the ions of selected mass to charge ratio which are passed by the analyzer 17 into the quadrupole region 21 which includes rods 22 operated RF only. By operating the quadrupole RF only, it passes substantially all the ions, that is, it acts as a very broad band high pass filter.
- the RF quadrupole 21 is in a separate volume defined by the walls 25 which also form part of the associated lens 19 and 24.
- a collision gas is introduced into the volume via a suitable inlet 23.
- the ions passed by quadrupole 21 collide with the gas to form daughters or fragments of the selected ions.
- the fragments or daughters are passed through lens 24 into a second quadrupole mass filter or analyzer 26 where particles of selected mass are selected and passed through the aperture 27 through the openings formed in the X-ray shield 28 to either dynodes 31 or 32 depending whether negative or positive ions are to be analyzed.
- the secondary ions or electrons leaving the dynodes are then collected by an electron multiplier 33 which provides an output signal.
- a preferred detector is described in US-A-4423324.
- a tandem quadrupole mass spectrometer of the type just described suffers from noise because of excited and fast neutral particles and fast ions which are generated in the ion source. It is believed that these neutral particles and fast ions travel in a straight line through the various quadrupoles and lenses and strike surfaces in the vicinity of the dynodes 31, 32. When they strike these surfaces, they cause emission of positive and negative ions (possibly electrons) which are attracted by the dynodes 31 or 32 and sensed by multiplier 32 and detected as a signal.
- Figure 2 shows a triple tandem mass spectrometer in accordance with the present invention. Like reference numerals have been applied to parts which correspond to those in Figure 1.
- the RF only quadrupole is bent as illustrated by quadrupole 36 so that the detector is no longer in line with the ion source 11.
- Neutral particles traveling in a straight line from the ion source 11 then strike either the walls of the enclosure or the quadrupole rods 37.
- any secondary particles are collected and dissipated, never finding their way to the vicinity of the detector.
- the excited neutrals impinge upon intervening surfaces and never reach the region of the detector where they can add to the signal.
- the neutrals are effectively filtered by the RF only quadrupole and never travel to the mass filter. Even if a secondary from an excited neutral would have a mass appropriate to allow it to traverse through the last quadrupole 26 to the detector, its initial position would most likely be such that its transmission through the quadrupole and to the detector would be highly unlikely.
- Bent quadrupoles have been known for bending of ion beams.
- the book "Quadrupole Mass Spectrometry and its Applications” edited by Peter H. Dawson provides criteria for operation of a bent quadrupole ion beam guide.
- the radius of curvature of the axis of the quadrupole structure must be much larger than the characteristic dimension of the quadrupole electrode structure.
- the quadruple mass filter operation occurs when the applied ratio of DC to RF is such that the pass band of the device is so narrow as to allow only a single ion mass to transmit.
- the specific range of ion masses passed by the quadrupole is theorectically solely a function of the device characteristic dimension, r o , the magnitudes of the applied RF and DC voltages, and the frequency of the applied RF.
- r o the magnitudes of the applied RF and DC voltages
- the effect of axial velocity on ion transmission is substantially different from the straight quadrupole.
- the strong focusing nature of the quadrupole field is sufficient to divert all ions within the pass band along the curved axis of the quadrupole.
- ions with masses near the limits of the pass band do not experience sufficient strong focusing to follow the curved ion path and are not transmitted.
- the effect of increased axial ion velocity is a progressive narrowing and smearing of the ion mass pass band limits. At very high axial ion velocities no ions can be transmitted.
- a spectrometer in accordance with the invention can otherwise include only a single mass filter or analyzer such as the mass spectrometer shown in Figure 3 wherein like reference numerals have been applied to like parts.
- this mass spectrometer the first tandem analyzer or filter stage of Figure 2 has been eliminated.
- the ions created in the ion source 11 are mass analyzed at high resolution and the parent ion beam exits at the exit slit 75.
- Low energy CID and high energy CID The low energy CID experiment is the same experiment that is performed with the instrument in Figure 1.
- the parent ion beam is transmitted through and decelerated in the deceleration lens system 77 into a conventional RF quadrupole collision cell 21 where it undergoes low energy CID at kinetic energies ranging from 2 to 200 eV.
- the daughter ions are in turn mass analyzed in the RF/DC quadrupole mass analyzer and detected at the detector. This experiment is very quiet as the noise causing particles generated in the ion source, as discussed before, do not transmit through the sector analyzer.
- the mass spectrometer may use one or more bent or angled sections to provide enhanced noise immunity.
- Figure 7 shows a system using three RF sections 46, 47 and 48, two of which are curved and one of which is straight.
- the center straight section 47 may have a gas inlet 49 and perform in the CID mode.
- the RF only quadrupole may be composed of combined straight and curved sections.
- Figure 8 shows a mass spectrometer including an RF section having outer straight sections 52 and 53 separated from a CID section 54 which includes a curved rod portion 56 and a straight portion 57.
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US83760086A | 1986-03-07 | 1986-03-07 | |
US837600 | 1986-03-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0237259A2 true EP0237259A2 (de) | 1987-09-16 |
EP0237259A3 EP0237259A3 (de) | 1989-04-05 |
Family
ID=25274923
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP87301870A Withdrawn EP0237259A3 (de) | 1986-03-07 | 1987-03-04 | Massenspektrometer |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0237259A3 (de) |
JP (1) | JPS62264546A (de) |
CA (1) | CA1249381A (de) |
Cited By (52)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2225159A (en) * | 1988-11-18 | 1990-05-23 | Vg Instr Group | Mass spectrometers |
GB2230896A (en) * | 1989-02-23 | 1990-10-31 | Finnigan Mat Gmbh | Process and apparatus for the mass-spectrometric investigation of isotopes |
FR2648230A1 (fr) * | 1989-06-12 | 1990-12-14 | Centre Nat Rech Scient | Procede et dispositif d'analyse d'un echantillon par spectrometrie de masse a bon rendement de transmission des ions |
US5426301A (en) * | 1991-05-21 | 1995-06-20 | Turner; Patrick | Off-axis interface for a mass spectrometer |
US5481107A (en) * | 1993-09-20 | 1996-01-02 | Hitachi, Ltd. | Mass spectrometer |
EP0771019A1 (de) * | 1995-10-27 | 1997-05-02 | Hitachi, Ltd. | Verfahren und Vorrichtung zur Massenanalyse einer gelösten Probe |
WO1997030469A1 (en) * | 1996-02-16 | 1997-08-21 | Varian Associates, Inc. | Mass spectrometer system and method for transporting and analyzing ions |
US5663560A (en) * | 1993-09-20 | 1997-09-02 | Hitachi, Ltd. | Method and apparatus for mass analysis of solution sample |
DE19628093A1 (de) * | 1996-07-12 | 1998-01-22 | Deutsche Forsch Luft Raumfahrt | Verfahren und Vorrichtung zum Nachweis von Probenmolekülen |
US5825026A (en) * | 1996-07-19 | 1998-10-20 | Bruker-Franzen Analytik, Gmbh | Introduction of ions from ion sources into mass spectrometers |
WO1998052209A1 (en) * | 1997-05-12 | 1998-11-19 | Mds Inc. | Rf-only mass spectrometer with auxiliary excitation |
WO1999062101A1 (en) * | 1998-05-29 | 1999-12-02 | Analytica Of Branford, Inc. | Mass spectrometry with multipole ion guides |
US6028308A (en) * | 1996-11-18 | 2000-02-22 | Mds Inc. | Resolving RF mass spectrometer |
WO2001013100A2 (en) * | 1999-08-13 | 2001-02-22 | Bruker Daltonics, Inc. | Method and apparatus for multiple frequency multipole |
WO2001091159A1 (en) * | 2001-04-27 | 2001-11-29 | Varian Australia Pty Ltd | Mass spectrometer including a quadrupole mass analyser arrangement |
US6462338B1 (en) * | 1998-09-02 | 2002-10-08 | Shimadzu Corporation | Mass spectrometer |
AU778228B2 (en) * | 2001-04-27 | 2004-11-25 | Agilent Technologies Australia (M) Pty Ltd | Mass spectrometer including a quadrupole mass analyser arrangement |
US6891157B2 (en) * | 2002-05-31 | 2005-05-10 | Micromass Uk Limited | Mass spectrometer |
WO2005052984A1 (en) * | 2003-11-25 | 2005-06-09 | Syft Technologies Limited | Improvements in or relating to sift-ms instruments |
GB2436467A (en) * | 2006-03-22 | 2007-09-26 | Itt Mfg Enterprises Inc | Ion Detection System With Neutral Noise Suppression |
DE10340849B4 (de) * | 2002-09-04 | 2009-01-29 | Micromass Uk Ltd. | Verwendung eines Quadrupol-Stabsatzes und eines Ionendetektors eines Massenspektrometers |
WO2009036569A1 (en) * | 2007-09-19 | 2009-03-26 | Mds Analytical Technologies, A Business Unit Of Mds Inc. Doing Business Through Its Sciex Division | Collision cell for mass spectrometer |
EP2150967A2 (de) * | 2007-05-31 | 2010-02-10 | Analytica of Branford, Inc. | Mehrpolige ionenführungsschnittstelle für minimiertes hintergrundrauschen in der massenspektrometrie |
WO2011061147A1 (en) * | 2009-11-17 | 2011-05-26 | Bruker Daltonik Gmbh | Utilizing gas flows in mass spectrometers |
US8384028B2 (en) | 2008-01-30 | 2013-02-26 | Shimadzu Corporation | MS/MS mass spectrometer |
US8450681B2 (en) | 2011-06-08 | 2013-05-28 | Mks Instruments, Inc. | Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets |
CN103650101A (zh) * | 2011-06-28 | 2014-03-19 | 株式会社岛津制作所 | 三重四极型质量分析装置 |
US8796638B2 (en) | 2011-06-08 | 2014-08-05 | Mks Instruments, Inc. | Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens |
US8796620B2 (en) | 2011-06-08 | 2014-08-05 | Mks Instruments, Inc. | Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens |
EP2801999A1 (de) * | 1998-09-16 | 2014-11-12 | Thermo Fisher Scientific (Bremen) GmbH | Mittel zum Entfernen von ungewünschten Ionen aus einem Ionentransportsystem und Massenspektrometer |
US8921803B2 (en) | 2011-03-04 | 2014-12-30 | Perkinelmer Health Sciences, Inc. | Electrostatic lenses and systems including the same |
USRE45553E1 (en) | 2002-05-13 | 2015-06-09 | Thermo Fisher Scientific Inc. | Mass spectrometer and mass filters therefor |
US9123516B2 (en) | 2010-10-08 | 2015-09-01 | Hitachi High-Technologies Corporation | Multipole segments aligned in an offset manner in a mass spectrometer |
US9773656B2 (en) | 2014-05-14 | 2017-09-26 | Shimadzu Corporation | Ion transport apparatus and mass spectrometer using the same |
WO2020021255A1 (en) * | 2018-07-27 | 2020-01-30 | Micromass Uk Limited | Ion transfer interace for tof ms |
US10593533B2 (en) | 2015-11-16 | 2020-03-17 | Micromass Uk Limited | Imaging mass spectrometer |
US10629425B2 (en) | 2015-11-16 | 2020-04-21 | Micromass Uk Limited | Imaging mass spectrometer |
US10741376B2 (en) | 2015-04-30 | 2020-08-11 | Micromass Uk Limited | Multi-reflecting TOF mass spectrometer |
US10950425B2 (en) | 2016-08-16 | 2021-03-16 | Micromass Uk Limited | Mass analyser having extended flight path |
US11081332B2 (en) | 2017-08-06 | 2021-08-03 | Micromass Uk Limited | Ion guide within pulsed converters |
US11205568B2 (en) | 2017-08-06 | 2021-12-21 | Micromass Uk Limited | Ion injection into multi-pass mass spectrometers |
US11211238B2 (en) | 2017-08-06 | 2021-12-28 | Micromass Uk Limited | Multi-pass mass spectrometer |
US11239067B2 (en) | 2017-08-06 | 2022-02-01 | Micromass Uk Limited | Ion mirror for multi-reflecting mass spectrometers |
US11295944B2 (en) | 2017-08-06 | 2022-04-05 | Micromass Uk Limited | Printed circuit ion mirror with compensation |
US11328920B2 (en) | 2017-05-26 | 2022-05-10 | Micromass Uk Limited | Time of flight mass analyser with spatial focussing |
US11342175B2 (en) | 2018-05-10 | 2022-05-24 | Micromass Uk Limited | Multi-reflecting time of flight mass analyser |
US11367608B2 (en) | 2018-04-20 | 2022-06-21 | Micromass Uk Limited | Gridless ion mirrors with smooth fields |
US11587779B2 (en) | 2018-06-28 | 2023-02-21 | Micromass Uk Limited | Multi-pass mass spectrometer with high duty cycle |
US11621156B2 (en) | 2018-05-10 | 2023-04-04 | Micromass Uk Limited | Multi-reflecting time of flight mass analyser |
US11817303B2 (en) | 2017-08-06 | 2023-11-14 | Micromass Uk Limited | Accelerator for multi-pass mass spectrometers |
US11848185B2 (en) | 2019-02-01 | 2023-12-19 | Micromass Uk Limited | Electrode assembly for mass spectrometer |
US11881387B2 (en) | 2018-05-24 | 2024-01-23 | Micromass Uk Limited | TOF MS detection system with improved dynamic range |
Families Citing this family (4)
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JPH1097838A (ja) * | 1996-07-30 | 1998-04-14 | Yokogawa Analytical Syst Kk | 誘導結合プラズマ質量分析装置 |
JP4978700B2 (ja) * | 2008-01-30 | 2012-07-18 | 株式会社島津製作所 | Ms/ms型質量分析装置 |
WO2013057822A1 (ja) * | 2011-10-20 | 2013-04-25 | 株式会社島津製作所 | 質量分析装置 |
US10636645B2 (en) * | 2018-04-20 | 2020-04-28 | Perkinelmer Health Sciences Canada, Inc. | Dual chamber electron impact and chemical ionization source |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3410997A (en) * | 1964-09-08 | 1968-11-12 | Bell & Howell Co | Multipole mass filter |
US3473020A (en) * | 1967-06-19 | 1969-10-14 | Bell & Howell Co | Mass analyzer having series aligned curvilinear and rectilinear analyzer sections |
US3487207A (en) * | 1967-04-13 | 1969-12-30 | Us Air Force | Instrument for varying the angle of incidence between ion beams and a spectrometer |
US4234791A (en) * | 1978-11-13 | 1980-11-18 | Research Corporation | Tandem quadrupole mass spectrometer for selected ion fragmentation studies and low energy collision induced dissociator therefor |
GB2129607A (en) * | 1982-10-16 | 1984-05-16 | Finnigan Mat Gmbh | Hybrid mass spectrometer |
-
1987
- 1987-03-04 EP EP87301870A patent/EP0237259A3/de not_active Withdrawn
- 1987-03-06 CA CA000531311A patent/CA1249381A/en not_active Expired
- 1987-03-06 JP JP62051825A patent/JPS62264546A/ja active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3410997A (en) * | 1964-09-08 | 1968-11-12 | Bell & Howell Co | Multipole mass filter |
US3487207A (en) * | 1967-04-13 | 1969-12-30 | Us Air Force | Instrument for varying the angle of incidence between ion beams and a spectrometer |
US3473020A (en) * | 1967-06-19 | 1969-10-14 | Bell & Howell Co | Mass analyzer having series aligned curvilinear and rectilinear analyzer sections |
US4234791A (en) * | 1978-11-13 | 1980-11-18 | Research Corporation | Tandem quadrupole mass spectrometer for selected ion fragmentation studies and low energy collision induced dissociator therefor |
GB2129607A (en) * | 1982-10-16 | 1984-05-16 | Finnigan Mat Gmbh | Hybrid mass spectrometer |
Non-Patent Citations (1)
Title |
---|
JOURNAL OF APPLIED PHYSICS, vol. 40, no. 8, July 1969, pages 3127-3134; D.A. CHURCH: "Storage-ring ion trap derived from the linear quadrupole radio-frequency mass filter" * |
Cited By (82)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5036195A (en) * | 1988-11-18 | 1991-07-30 | Vg Instruments Group Limited | Gas analyzer |
GB2225159B (en) * | 1988-11-18 | 1993-05-05 | Vg Instr Group | Gas analyzer |
GB2225159A (en) * | 1988-11-18 | 1990-05-23 | Vg Instr Group | Mass spectrometers |
GB2230896A (en) * | 1989-02-23 | 1990-10-31 | Finnigan Mat Gmbh | Process and apparatus for the mass-spectrometric investigation of isotopes |
US5043575A (en) * | 1989-02-23 | 1991-08-27 | Finnigan Mat Gmbh | Process for the mass-spectrometric investigation of isotopes, as well as isotope mass spectrometer |
FR2648230A1 (fr) * | 1989-06-12 | 1990-12-14 | Centre Nat Rech Scient | Procede et dispositif d'analyse d'un echantillon par spectrometrie de masse a bon rendement de transmission des ions |
US5426301A (en) * | 1991-05-21 | 1995-06-20 | Turner; Patrick | Off-axis interface for a mass spectrometer |
US5663560A (en) * | 1993-09-20 | 1997-09-02 | Hitachi, Ltd. | Method and apparatus for mass analysis of solution sample |
US5481107A (en) * | 1993-09-20 | 1996-01-02 | Hitachi, Ltd. | Mass spectrometer |
EP0771019A1 (de) * | 1995-10-27 | 1997-05-02 | Hitachi, Ltd. | Verfahren und Vorrichtung zur Massenanalyse einer gelösten Probe |
GB2314967B (en) * | 1996-02-16 | 2000-12-06 | Varian Associates | Mass spectrometer system and method for transporting and analyzing ions |
GB2314967A (en) * | 1996-02-16 | 1998-01-14 | Varian Associates | Mass spectrometer system and method for transporting and analyzing ion |
US5818041A (en) * | 1996-02-16 | 1998-10-06 | Varian Associates, Inc. | Mass spectrometer system and method for transporting and analyzing ions |
US5672868A (en) * | 1996-02-16 | 1997-09-30 | Varian Associates, Inc. | Mass spectrometer system and method for transporting and analyzing ions |
WO1997030469A1 (en) * | 1996-02-16 | 1997-08-21 | Varian Associates, Inc. | Mass spectrometer system and method for transporting and analyzing ions |
DE19628093B4 (de) * | 1996-07-12 | 2006-09-21 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Verfahren und Vorrichtung zum Nachweis von Probenmolekülen |
DE19628093A1 (de) * | 1996-07-12 | 1998-01-22 | Deutsche Forsch Luft Raumfahrt | Verfahren und Vorrichtung zum Nachweis von Probenmolekülen |
US5825026A (en) * | 1996-07-19 | 1998-10-20 | Bruker-Franzen Analytik, Gmbh | Introduction of ions from ion sources into mass spectrometers |
US6028308A (en) * | 1996-11-18 | 2000-02-22 | Mds Inc. | Resolving RF mass spectrometer |
US6114691A (en) * | 1997-05-12 | 2000-09-05 | Mds Inc. | RF-only mass spectrometer with auxiliary excitation |
WO1998052209A1 (en) * | 1997-05-12 | 1998-11-19 | Mds Inc. | Rf-only mass spectrometer with auxiliary excitation |
WO1999062101A1 (en) * | 1998-05-29 | 1999-12-02 | Analytica Of Branford, Inc. | Mass spectrometry with multipole ion guides |
US6462338B1 (en) * | 1998-09-02 | 2002-10-08 | Shimadzu Corporation | Mass spectrometer |
EP2801999A1 (de) * | 1998-09-16 | 2014-11-12 | Thermo Fisher Scientific (Bremen) GmbH | Mittel zum Entfernen von ungewünschten Ionen aus einem Ionentransportsystem und Massenspektrometer |
USRE45386E1 (en) | 1998-09-16 | 2015-02-24 | Thermo Fisher Scientific (Bremen) Gmbh | Means for removing unwanted ions from an ion transport system and mass spectrometer |
WO2001013100A2 (en) * | 1999-08-13 | 2001-02-22 | Bruker Daltonics, Inc. | Method and apparatus for multiple frequency multipole |
WO2001013100A3 (en) * | 1999-08-13 | 2002-03-07 | Bruker Daltonics Inc | Method and apparatus for multiple frequency multipole |
US6762407B2 (en) * | 2001-04-27 | 2004-07-13 | Varian Australia Pty Ltd | Mass spectrometer including a quadrupole mass analyzer arrangement |
AU778228B2 (en) * | 2001-04-27 | 2004-11-25 | Agilent Technologies Australia (M) Pty Ltd | Mass spectrometer including a quadrupole mass analyser arrangement |
WO2001091159A1 (en) * | 2001-04-27 | 2001-11-29 | Varian Australia Pty Ltd | Mass spectrometer including a quadrupole mass analyser arrangement |
USRE45553E1 (en) | 2002-05-13 | 2015-06-09 | Thermo Fisher Scientific Inc. | Mass spectrometer and mass filters therefor |
US6891157B2 (en) * | 2002-05-31 | 2005-05-10 | Micromass Uk Limited | Mass spectrometer |
DE10340849B4 (de) * | 2002-09-04 | 2009-01-29 | Micromass Uk Ltd. | Verwendung eines Quadrupol-Stabsatzes und eines Ionendetektors eines Massenspektrometers |
DE10362251B3 (de) * | 2002-09-04 | 2012-10-31 | Micromass Uk Limited | Verwendung einer Mehrmodus-Wechselspannungs- oder HF-Ionenführung und eines lonendetektors eines Massenspektrometers |
WO2005052984A1 (en) * | 2003-11-25 | 2005-06-09 | Syft Technologies Limited | Improvements in or relating to sift-ms instruments |
EP1695374A1 (de) * | 2003-11-25 | 2006-08-30 | Syft technologies Limited | Verbesserungen in bezug auf sift-ms-instrumente |
EP1695374A4 (de) * | 2003-11-25 | 2008-04-16 | Syft Technologies Ltd | Verbesserungen in bezug auf sift-ms-instrumente |
US7429730B2 (en) | 2003-11-25 | 2008-09-30 | Syft Technologies Limited | SIFT-MS instruments |
GB2436467A (en) * | 2006-03-22 | 2007-09-26 | Itt Mfg Enterprises Inc | Ion Detection System With Neutral Noise Suppression |
GB2436467B (en) * | 2006-03-22 | 2011-03-23 | Itt Mfg Enterprises Inc | Ion detection system with neutral noise suppression |
EP2150967A4 (de) * | 2007-05-31 | 2012-12-05 | Perkinelmer Health Sci Inc | Mehrpolige ionenführungsschnittstelle für minimiertes hintergrundrauschen in der massenspektrometrie |
US8507850B2 (en) | 2007-05-31 | 2013-08-13 | Perkinelmer Health Sciences, Inc. | Multipole ion guide interface for reduced background noise in mass spectrometry |
EP2150967A2 (de) * | 2007-05-31 | 2010-02-10 | Analytica of Branford, Inc. | Mehrpolige ionenführungsschnittstelle für minimiertes hintergrundrauschen in der massenspektrometrie |
US8723107B2 (en) | 2007-05-31 | 2014-05-13 | Perkinelmer Health Sciences, Inc. | Multipole ion guide interface for reduced background noise in mass spectrometry |
US7923681B2 (en) | 2007-09-19 | 2011-04-12 | Dh Technologies Pte. Ltd. | Collision cell for mass spectrometer |
EP2198448A4 (de) * | 2007-09-19 | 2015-08-19 | Dh Technologies Dev Pte Ltd | Kollisionszelle für ein massenspektrometer |
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Also Published As
Publication number | Publication date |
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EP0237259A3 (de) | 1989-04-05 |
JPS62264546A (ja) | 1987-11-17 |
CA1249381A (en) | 1989-01-24 |
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