DE69825095D1 - Elektronische Temperaturmessvorrichtung und elektronisches Schaltungsgerät dieselbe enthaltend - Google Patents

Elektronische Temperaturmessvorrichtung und elektronisches Schaltungsgerät dieselbe enthaltend

Info

Publication number
DE69825095D1
DE69825095D1 DE69825095T DE69825095T DE69825095D1 DE 69825095 D1 DE69825095 D1 DE 69825095D1 DE 69825095 T DE69825095 T DE 69825095T DE 69825095 T DE69825095 T DE 69825095T DE 69825095 D1 DE69825095 D1 DE 69825095D1
Authority
DE
Germany
Prior art keywords
electronic
same
temperature measuring
measuring device
switching device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69825095T
Other languages
English (en)
Other versions
DE69825095T2 (de
Inventor
Seiki Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Publication of DE69825095D1 publication Critical patent/DE69825095D1/de
Application granted granted Critical
Publication of DE69825095T2 publication Critical patent/DE69825095T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
DE1998625095 1997-03-31 1998-03-31 Elektronische Temperaturmessvorrichtung und elektronisches Schaltungsgerät dieselbe enthaltend Expired - Lifetime DE69825095T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8014097 1997-03-31
JP8014097 1997-03-31

Publications (2)

Publication Number Publication Date
DE69825095D1 true DE69825095D1 (de) 2004-08-26
DE69825095T2 DE69825095T2 (de) 2004-11-18

Family

ID=13709964

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1998625095 Expired - Lifetime DE69825095T2 (de) 1997-03-31 1998-03-31 Elektronische Temperaturmessvorrichtung und elektronisches Schaltungsgerät dieselbe enthaltend

Country Status (3)

Country Link
US (1) US6088208A (de)
EP (1) EP0869342B1 (de)
DE (1) DE69825095T2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2404505B (en) * 2003-07-31 2006-04-19 Zetex Plc A temperature dependent switching circuit
US20050144576A1 (en) * 2003-12-25 2005-06-30 Nec Electronics Corporation Design method for semiconductor circuit device, design method for semiconductor circuit, and semiconductor circuit device
JP4477952B2 (ja) * 2004-07-09 2010-06-09 株式会社ルネサステクノロジ 半導体装置、ｄｃ／ｄｃコンバータおよび電源システム
JP4765858B2 (ja) 2006-09-15 2011-09-07 三菱電機株式会社 温度検出装置
DE102010051406A1 (de) * 2010-11-16 2012-05-16 Init Innovative Informatikanwendungen In Transport-, Verkehrs- Und Leitsystemen Gmbh Stromquelle
US20120292740A1 (en) * 2011-05-19 2012-11-22 Macronix International Co., Ltd. High voltage resistance semiconductor device and method of manufacturing a high voltage resistance semiconductor device
TWI506798B (zh) * 2011-06-16 2015-11-01 Macronix Int Co Ltd 高壓電阻半導體裝置與製造高壓電阻半導體裝置的方法
HRP20110689B1 (hr) * 2011-09-26 2016-05-20 KONÄŚAR - ELEKTRIÄŚNA VOZILA d.d. Postupak i uređaj za mjerenje temperature silicija i nadtemperaturnu zaštitu učinskih bipolarnih tranzistora s izoliranom upravljačkom elektrodom
CN104075823B (zh) * 2013-03-26 2017-02-08 海洋王（东莞）照明科技有限公司 一种报警电路
US9917578B2 (en) 2016-02-19 2018-03-13 Infineon Technologies Austria Ag Active gate-source capacitance clamp for normally-off HEMT
FR3081265B1 (fr) * 2018-05-17 2020-06-12 Valeo Siemens Eautomotive France Sas Circuit de protection d’un interrupteur
CN111240391B (zh) * 2020-01-16 2021-09-07 唐山国芯晶源电子有限公司 一种低电源电压大斜率温度传感器电路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3701004A (en) * 1971-05-13 1972-10-24 Us Army Circuit for generating a repeatable voltage as a function of temperature
JPS58221507A (ja) * 1982-06-18 1983-12-23 Toshiba Corp トランジスタ回路
JPH0693485B2 (ja) * 1985-11-29 1994-11-16 日本電装株式会社 半導体装置
GB2224846A (en) * 1988-11-14 1990-05-16 Philips Electronic Associated Temperature sensing circuit
US5336943A (en) * 1991-07-19 1994-08-09 U.S. Philips Corporation Temperature sensing circuit
GB9206058D0 (en) * 1992-03-20 1992-05-06 Philips Electronics Uk Ltd A semiconductor switch and a temperature sensing circuit for such a switch
DE4437461C2 (de) * 1994-10-19 1998-08-20 Siemens Ag Integrierter Temperatursensor

Also Published As

Publication number Publication date
EP0869342B1 (de) 2004-07-21
EP0869342A1 (de) 1998-10-07
US6088208A (en) 2000-07-11
DE69825095T2 (de) 2004-11-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PANASONIC CORP., KADOMA, OSAKA, JP