DE69605643T2 - Verfahren und vorrichtung zur messung eines zonenflusses in einem plasma - Google Patents
Verfahren und vorrichtung zur messung eines zonenflusses in einem plasmaInfo
- Publication number
- DE69605643T2 DE69605643T2 DE69605643T DE69605643T DE69605643T2 DE 69605643 T2 DE69605643 T2 DE 69605643T2 DE 69605643 T DE69605643 T DE 69605643T DE 69605643 T DE69605643 T DE 69605643T DE 69605643 T2 DE69605643 T2 DE 69605643T2
- Authority
- DE
- Germany
- Prior art keywords
- plasma
- measuring
- zone flow
- zone
- flow
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32917—Plasma diagnostics
- H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/0006—Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature
- H05H1/0081—Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature by electric means
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9511181A FR2738984B1 (fr) | 1995-09-19 | 1995-09-19 | Procede et dispositif de mesure d'un flux d'ions dans un plasma |
PCT/FR1996/001451 WO1997011587A1 (fr) | 1995-09-19 | 1996-09-18 | Procede et dispositif de mesure d'un flux d'ions dans un plasma |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69605643D1 DE69605643D1 (de) | 2000-01-20 |
DE69605643T2 true DE69605643T2 (de) | 2000-04-06 |
Family
ID=9482863
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69605643T Expired - Lifetime DE69605643T2 (de) | 1995-09-19 | 1996-09-18 | Verfahren und vorrichtung zur messung eines zonenflusses in einem plasma |
Country Status (6)
Country | Link |
---|---|
US (1) | US5936413A (de) |
EP (1) | EP0792571B1 (de) |
JP (1) | JP3937453B2 (de) |
DE (1) | DE69605643T2 (de) |
FR (1) | FR2738984B1 (de) |
WO (1) | WO1997011587A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006014106B3 (de) * | 2006-03-24 | 2007-08-30 | RUHR-UNIVERSITäT BOCHUM | Vorrichtung und Verfahren zur Messung der Dichte eines Plasmas |
Families Citing this family (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6326794B1 (en) * | 1999-01-14 | 2001-12-04 | International Business Machines Corporation | Method and apparatus for in-situ monitoring of ion energy distribution for endpoint detection via capacitance measurement |
US6741944B1 (en) * | 1999-07-20 | 2004-05-25 | Tokyo Electron Limited | Electron density measurement and plasma process control system using a microwave oscillator locked to an open resonator containing the plasma |
US6646386B1 (en) | 1999-07-20 | 2003-11-11 | Tokyo Electron Limited | Stabilized oscillator circuit for plasma density measurement |
DE60035513T2 (de) * | 1999-07-21 | 2008-03-20 | Tokyo Electron Ltd. | System zur messung der elektronendichte und plasmaprozesssteuerung, das änderungen in der resonanzfrequenz eines plasma enthaltenden offenen resonators verwendet |
US6861844B1 (en) | 1999-07-21 | 2005-03-01 | Tokyo Electron Limited | Electron density measurement and plasma process control system using changes in the resonant frequency of an open resonator containing the plasma |
JP2001203097A (ja) * | 2000-01-17 | 2001-07-27 | Canon Inc | プラズマ密度計測装置および方法並びにこれを利用したプラズマ処理装置および方法 |
JP4633881B2 (ja) * | 2000-02-21 | 2011-02-16 | 株式会社日立製作所 | プラズマ処理装置及びそれを用いた処理方法 |
US6653852B1 (en) | 2000-03-31 | 2003-11-25 | Lam Research Corporation | Wafer integrated plasma probe assembly array |
JP3670206B2 (ja) * | 2000-11-06 | 2005-07-13 | アルプス電気株式会社 | プラズマ処理装置又はプラズマ処理システムの性能評価方法、保守方法、性能管理システム、及び性能確認システム、並びにプラズマ処理装置 |
AU2003224727A1 (en) * | 2002-03-28 | 2003-10-13 | Tokyo Electron Limited | A system and method for determining the state of a film in a plasma reactor using an electrical property |
JP3773189B2 (ja) * | 2002-04-24 | 2006-05-10 | 独立行政法人科学技術振興機構 | 窓型プローブ、プラズマ監視装置、及び、プラズマ処理装置 |
US6894474B2 (en) | 2002-06-07 | 2005-05-17 | Applied Materials, Inc. | Non-intrusive plasma probe |
US6972582B2 (en) * | 2003-02-10 | 2005-12-06 | Solid State Measurements, Inc. | Apparatus and method for measuring semiconductor wafer electrical properties |
US6902646B2 (en) * | 2003-08-14 | 2005-06-07 | Advanced Energy Industries, Inc. | Sensor array for measuring plasma characteristics in plasma processing environments |
US20050284570A1 (en) * | 2004-06-24 | 2005-12-29 | Doran Daniel B | Diagnostic plasma measurement device having patterned sensors and features |
US20060043063A1 (en) * | 2004-09-02 | 2006-03-02 | Mahoney Leonard J | Electrically floating diagnostic plasma probe with ion property sensors |
US7578301B2 (en) | 2005-03-28 | 2009-08-25 | Lam Research Corporation | Methods and apparatus for determining the endpoint of a cleaning or conditioning process in a plasma processing system |
US7319316B2 (en) | 2005-06-29 | 2008-01-15 | Lam Research Corporation | Apparatus for measuring a set of electrical characteristics in a plasma |
US7479207B2 (en) | 2006-03-15 | 2009-01-20 | Lam Research Corporation | Adjustable height PIF probe |
US7413672B1 (en) * | 2006-04-04 | 2008-08-19 | Lam Research Corporation | Controlling plasma processing using parameters derived through the use of a planar ion flux probing arrangement |
US7829468B2 (en) * | 2006-06-07 | 2010-11-09 | Lam Research Corporation | Method and apparatus to detect fault conditions of plasma processing reactor |
EP2114112B1 (de) * | 2008-04-29 | 2015-09-23 | Plasmetrex GmbH | Vorrichtung für industrielle Plasmaprozesse |
US8849585B2 (en) | 2008-06-26 | 2014-09-30 | Lam Research Corporation | Methods for automatically characterizing a plasma |
KR101606736B1 (ko) * | 2008-07-07 | 2016-03-28 | 램 리써치 코포레이션 | 플라즈마 프로세싱 챔버에서 플라즈마 불안정성을 검출하기 위한 패시브 용량성-결합된 정전식 (cce) 프로브 장치 |
WO2010005929A2 (en) * | 2008-07-07 | 2010-01-14 | Lam Research Corporation | Passive capacitively-coupled electrostatic (cce) probe arrangement for detecting in-situ arcing events in a plasma processing chamber |
CN104320899A (zh) * | 2008-07-07 | 2015-01-28 | 朗姆研究公司 | 用于检测等离子处理室中激发步骤的电容耦合静电(cce)探针装置及其方法 |
KR20110046437A (ko) * | 2008-07-07 | 2011-05-04 | 램 리써치 코포레이션 | 플라즈마 처리 챔버 내의 막을 특성화하기 위한 rf 바이어스된 용량-결합형 정전 프로브 장치 |
KR101588482B1 (ko) * | 2008-07-07 | 2016-01-25 | 램 리써치 코포레이션 | 플라즈마 처리 챔버에 사용하기 위한 진공 갭을 포함하는 플라즈마 대향 프로브 장치 |
WO2010005931A2 (en) * | 2008-07-07 | 2010-01-14 | Lam Research Corporation | Capacitively-coupled electrostatic (cce) probe arrangement for detecting dechucking in a plasma processing chamber and methods thereof |
IES20090733A2 (en) * | 2009-09-22 | 2011-03-30 | Donal O'sullivan | Sensor for measuring plasma parameters |
US20120197570A1 (en) * | 2011-01-27 | 2012-08-02 | Mehran Ramezani | Measurement of Parameters Within an Integrated Circuit Chip Using a Nano-Probe |
US20120283973A1 (en) | 2011-05-05 | 2012-11-08 | Imec | Plasma probe and method for plasma diagnostics |
US9404183B2 (en) | 2012-06-08 | 2016-08-02 | Novellus Systems, Inc. | Diagnostic and control systems and methods for substrate processing systems using DC self-bias voltage |
CN102928701A (zh) * | 2012-10-24 | 2013-02-13 | 上海市电力公司 | 用于直流输电下离子流场分布特性测量的测量*** |
KR101999720B1 (ko) * | 2012-11-20 | 2019-07-16 | 삼성디스플레이 주식회사 | 기판 정전기 검사 장치 및 기판 제조 방법 |
TWI635197B (zh) * | 2013-06-10 | 2018-09-11 | 諾發系統有限公司 | 用於使用直流自偏壓之基板處理系統的診斷及控制系統與方法 |
DE102013110722A1 (de) * | 2013-09-27 | 2015-04-02 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Plasma-ionengestütztes Beschichtungsverfahren und Plasmasonde |
WO2016177740A1 (en) | 2015-05-04 | 2016-11-10 | ECOLE POLYTECHNIQUE FéDéRALE DE LAUSANNE | Method and device for determining plasma characteristics |
US11867643B2 (en) | 2019-01-31 | 2024-01-09 | Korea Research Institute Of Standards And Science | Planar-type plasma diagnosis apparatus, wafer-type plasma diagnosis apparatus in which planar-type plasma diagnosis apparatus is buried, and electrostatic chuck in which planar-type plasma diagnosis apparatus is buried |
US11996274B2 (en) | 2022-04-07 | 2024-05-28 | Mks Instruments, Inc. | Real-time, non-invasive IEDF plasma sensor |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2696584A (en) * | 1948-06-02 | 1954-12-07 | Kurt S Lion | Electric circuit |
US4006404A (en) * | 1976-01-30 | 1977-02-01 | The United States Of America As Represented By The Secretary Of The Navy | Pulsed plasma probe |
US4336532A (en) * | 1980-05-22 | 1982-06-22 | Radiation Engineering Inc. | Integrated nuclear radiation detector and monitor |
JPS60126832A (ja) * | 1983-12-14 | 1985-07-06 | Hitachi Ltd | ドライエツチング方法および装置 |
SU1733975A1 (ru) * | 1988-05-18 | 1992-05-15 | Научно-производственное объединение им.С.А.Лавочкина | Способ определени электронной температуры плазмы тлеющего разр да |
US5339039A (en) * | 1992-09-29 | 1994-08-16 | Arizona Board Of Regents On Behalf Of The University Of Arizona | Langmuir probe system for radio frequency excited plasma processing system |
US5467013A (en) * | 1993-12-07 | 1995-11-14 | Sematech, Inc. | Radio frequency monitor for semiconductor process control |
-
1995
- 1995-09-19 FR FR9511181A patent/FR2738984B1/fr not_active Expired - Lifetime
-
1996
- 1996-09-18 EP EP96931869A patent/EP0792571B1/de not_active Expired - Lifetime
- 1996-09-18 WO PCT/FR1996/001451 patent/WO1997011587A1/fr active IP Right Grant
- 1996-09-18 US US08/836,036 patent/US5936413A/en not_active Expired - Lifetime
- 1996-09-18 DE DE69605643T patent/DE69605643T2/de not_active Expired - Lifetime
- 1996-09-18 JP JP51243797A patent/JP3937453B2/ja not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006014106B3 (de) * | 2006-03-24 | 2007-08-30 | RUHR-UNIVERSITäT BOCHUM | Vorrichtung und Verfahren zur Messung der Dichte eines Plasmas |
US7878045B2 (en) | 2006-03-24 | 2011-02-01 | Ralf-Peter Brinkmann | Apparatus and use of the apparatus for the determination of the density of a plasma |
Also Published As
Publication number | Publication date |
---|---|
WO1997011587A1 (fr) | 1997-03-27 |
JP3937453B2 (ja) | 2007-06-27 |
JPH10509557A (ja) | 1998-09-14 |
DE69605643D1 (de) | 2000-01-20 |
EP0792571A1 (de) | 1997-09-03 |
FR2738984A1 (fr) | 1997-03-21 |
EP0792571B1 (de) | 1999-12-15 |
FR2738984B1 (fr) | 1997-11-21 |
US5936413A (en) | 1999-08-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69605643T2 (de) | Verfahren und vorrichtung zur messung eines zonenflusses in einem plasma | |
DE59610354D1 (de) | Verfahren und vorrichtung zur winkelmessung bei einem drehbaren körper | |
DE69431497T2 (de) | Verfahren und Vorrichtung zur Messung eines streuenden Mediums | |
DE69433677D1 (de) | Verfahren und Vorrichtung zur Messung eines streuenden Mediums | |
DE69632438D1 (de) | Verfahren und Vorrichtung zum Kalibrieren eines Abstandssensors in einem Fahrzeugnavigationssystem | |
DE69424241T2 (de) | Vorrichtung und Verfahren zur Dimensionsmessung in einem Bohrloch | |
DE69521451T2 (de) | Verfahren und Vorrichtung zum Messen von einem Gaskomponenten | |
DE69622121T2 (de) | Verfahren un Vorrichtung zum Messen von einem vorbestimmten Gaskomponenten eines Messgases | |
DE69617509D1 (de) | Vorrichtung und Verfahren zur Feststellung von Objekttypen in einem verteilten Objektsystem | |
DE69635500D1 (de) | Verfahren und Vorrichtung zur Erkennung eines nahen Sprachsignals | |
DE59607829D1 (de) | Verfahren und vorrichtung zur überwachung eines kraftstoffzumesssystems | |
DE69403205T2 (de) | Verfahren und vorrichtung zur feststellung von teilchen in einer strömung | |
DE69635790D1 (de) | Vorrichtung und Verfahren zur Messung eines streuenden Mediums | |
DE59207075D1 (de) | Verfahren und Vorrichtung zur Messung eines Innendrucks in einem Schlauch | |
DE69430886D1 (de) | Verfahren und Vorrichtung zur Messung eines Pulvermassenstroms | |
DE59606636D1 (de) | Verfahren und vorrichtung zur überwachung eines kraftstoffzumesssystems | |
DE59507839D1 (de) | Verfahren und Vorrichtung zur Positionsbestimmung eines Fahrzeugs | |
DE69607847D1 (de) | Vorrichtung und verfahren zur beschichtung eines festpartikels | |
DE69416326T2 (de) | Verfahren und vorrichtung zur überwachung der entwicklung des aktuellen strömungswertes in einem zähler | |
DE69906310T2 (de) | Verfahren und vorrichtung zur messung eines flüssigkeitströpfchen | |
DE69506382D1 (de) | Verfahren und vorrichtung zur dosierung eines gasförmigen brennstoffs | |
DE69619630T2 (de) | Vorrichtung und Verfahren zum Bestimmen von Fehlern eines Luftdurchflussmengenmessers | |
DE69111300T2 (de) | Vorrichtung und Verfahren zur Fehlererfassung in einem Geschwindigkeitsmessystem. | |
DE69623703T2 (de) | Verfahren und Vorrichtung zur grossvolumigen Flüssigprobenaufgabe in einem Gaschromatographen | |
DE69611469D1 (de) | Verfahren und Vorrichtung zur Verdampfung eines Flüssigkeitstromes |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |