DE69204917D1 - Messverfahren und -vorrichtung. - Google Patents

Messverfahren und -vorrichtung.

Info

Publication number: DE69204917D1
Authority: DE; Germany
Prior art keywords: measuring method; measuring
Prior art date: 1991-06-21
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

DE69204917T

Other languages

English (en)

Other versions

DE69204917T2 (de

Inventor

Katsuyuki Kobayashi

Atsushi Tanaka

Yuichiro Yoshimura

Kiyoshi Kaneko

Masaki Tokioka

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Canon Inc

Original Assignee

Canon Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1991-06-21

Filing date

1992-06-19

Publication date

1995-10-26

1991-06-21 Priority claimed from JP3150047A external-priority patent/JP2996538B2/ja

1991-06-21 Priority claimed from JP3150046A external-priority patent/JP2996537B2/ja

1992-06-19 Application filed by Canon Inc filed Critical Canon Inc

1995-10-26 Application granted granted Critical

1995-10-26 Publication of DE69204917D1 publication Critical patent/DE69204917D1/de

1996-03-14 Publication of DE69204917T2 publication Critical patent/DE69204917T2/de

2012-06-20 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
- G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S73/00—Measuring and testing
- Y10S73/01—Vibration

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)

DE69204917T 1991-06-21 1992-06-19 Messverfahren und -vorrichtung. Expired - Fee Related DE69204917T2 (de)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
JP3150047A JP2996538B2 (ja)	1991-06-21	1991-06-21	測定方法及び装置
JP3150046A JP2996537B2 (ja)	1991-06-21	1991-06-21	測定方法及び装置

Publications (2)

Publication Number	Publication Date
DE69204917D1 true DE69204917D1 (de)	1995-10-26
DE69204917T2 DE69204917T2 (de)	1996-03-14

Family

ID=26479759

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE69204917T Expired - Fee Related DE69204917T2 (de)	1991-06-21	1992-06-19	Messverfahren und -vorrichtung.

Country Status (3)

Country	Link
US (1)	US5438872A (de)
EP (1)	EP0519476B1 (de)
DE (1)	DE69204917T2 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP3244895B2 (ja) *	1993-12-02	2002-01-07	キヤノン株式会社	距離測定装置及びそれを用いた座標入力装置、及び距離測定方法及びそれを用いた座標入力方法
US5665907A (en) *	1994-09-06	1997-09-09	The University Of Chicago	Ultrasonic imaging system for in-process fabric defect detection
JPH09190273A (ja)	1996-01-10	1997-07-22	Canon Inc	座標入力装置
JPH1011207A (ja) *	1996-06-25	1998-01-16	Canon Inc	座標入力装置及びその制御方法
US5686652A (en) *	1996-09-09	1997-11-11	Pfund; Bruce	Portable test hammer apparatus
US5996415A (en) *	1997-04-30	1999-12-07	Sensys Instruments Corporation	Apparatus and method for characterizing semiconductor wafers during processing
US6026688A (en) *	1997-10-03	2000-02-22	The Board Of Trustees Of The Leland Stanford Junior University	Ultrasonic photoresist process monitor and method
US6250161B1 (en)	1997-10-03	2001-06-26	Board Of Trustees Of The Leland Stanford Junior University	Ultrasonic photoresist process monitor and method
US6019000A (en) *	1997-11-20	2000-02-01	Sensys Instruments Corporation	In-situ measurement of deposition on reactor chamber members
US5965818A (en) *	1998-01-15	1999-10-12	Shell Oil Company	Ultrasonic Lamb wave technique for measurement of pipe wall thickness at pipe supports
US6715354B2 (en)	1998-02-24	2004-04-06	Massachusetts Institute Of Technology	Flaw detection system using acoustic doppler effect
US6029521A (en) *	1998-10-19	2000-02-29	National Science Council	Method for measuring cover thickness of reinforcing bar in concrete by using stress wave
US6728515B1 (en)	2000-02-16	2004-04-27	Massachusetts Institute Of Technology	Tuned wave phased array
US6360609B1 (en) *	2000-02-23	2002-03-26	Massachusetts Institute Of Technology	Method and system for interpreting and utilizing multimode dispersive acoustic guided waves
US6497159B1 (en)	2000-06-12	2002-12-24	Hydro-Quebec	Bracelet for moving ultrasonic sensors along a pipe
US6833554B2 (en) *	2000-11-21	2004-12-21	Massachusetts Institute Of Technology	Laser-induced defect detection system and method
GB0114455D0 (en) *	2001-06-14	2001-08-08	Koninkl Philips Electronics Nv	Data inut system
JP3658382B2 (ja) *	2001-08-21	2005-06-08	キヤノン株式会社	信号出力装置、シート材の判別方法、画像形成装置、シート材搬送装置、及び信号出力方法
US6904806B2 (en) *	2002-07-18	2005-06-14	Wayne State University	Electronic intelligent indenter
US7111092B1 (en) *	2004-04-16	2006-09-19	Cisco Technology, Inc.	Buffer management technique for a hypertransport data path protocol
JP2008226386A (ja) *	2007-03-14	2008-09-25	Fujitsu Ltd	記憶装置、制御装置、振動検出方法
JP5395417B2 (ja) *	2008-12-09	2014-01-22	テイ・エステック株式会社	測定方法および測定装置
US9518959B2 (en) *	2013-08-12	2016-12-13	Texas Instruments Incorporated	Structural health monitoring system and method
FR3075947B1 (fr) *	2017-12-21	2020-01-03	Centre Technique Des Industries Mecaniques	Methode et dispositif de determination de l'epaisseur d'une couche traitee d'une piece metallique

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS57175952A (en) *	1981-04-24	1982-10-29	Kyoei Giken:Kk	Non-destructive test device of non-metallic object by impulsive elastic wave
JPS601553A (ja) *	1983-06-20	1985-01-07	Mitsubishi Electric Corp	超音波検査装置
JPS63175712A (ja) *	1987-01-16	1988-07-20	Toshiba Corp	超音波厚み計
SU1525455A1 (ru) *	1987-07-01	1989-11-30	Каунасский Политехнический Институт Им.Антанаса Снечкуса	Способ определени изменени физико-механических свойств материалов по толщине
SU1569534A1 (ru) *	1987-08-11	1990-06-07	Предприятие П/Я М-5953	Ультразвуковой способ контрол толщины изделий
SU1631410A1 (ru) *	1988-08-09	1991-02-28	В.В. Драгинич, М.В. Носаль, Г.О. Драгинич, С.А. Половко и Ю.М. Носаль	Устройство дл контрол акустических характеристик материалов
US5035144A (en) *	1989-07-31	1991-07-30	National Research Council Of Canada	Frequency broadband measurement of the characteristics of acoustic waves

1992
- 1992-06-18 US US07/900,324 patent/US5438872A/en not_active Expired - Fee Related
- 1992-06-19 DE DE69204917T patent/DE69204917T2/de not_active Expired - Fee Related
- 1992-06-19 EP EP92110322A patent/EP0519476B1/de not_active Expired - Lifetime

Also Published As

Publication number	Publication date
DE69204917T2 (de)	1996-03-14
EP0519476A1 (de)	1992-12-23
EP0519476B1 (de)	1995-09-20
US5438872A (en)	1995-08-08

Legal Events

Date	Code	Title	Description
1996-10-17	8364	No opposition during term of opposition
2006-04-13	8339	Ceased/non-payment of the annual fee

Publication	Publication Date	Title
DE69133626D1 (de)	2010-03-11	Messverfahren und -vorrichtung
DE69225964D1 (de)	1998-07-23	Messverfahren und gerät
DE69204917D1 (de)	1995-10-26	Messverfahren und -vorrichtung.
DE69219612D1 (de)	1997-06-12	Prüfungsvorrichtung
DE69222259T2 (de)	1998-04-02	Bilderzeugungsgerät und -verfahren
DE69203215D1 (de)	1995-08-03	Spektroskopisches Gerät und Verfahren.
DE59209450D1 (de)	1998-09-10	Stereografie-vorrichtung und -verfahren
DE69231845T2 (de)	2001-10-31	Nachrichtenübertragungsverfahren und -vorrichtung
NO178909C (no)	1996-06-26	Måleanordning
DE69202724D1 (de)	1995-07-06	Kondensator-Messanordnung und -verfahren.
DE68902684D1 (de)	1992-10-08	Umwickelverfahren und -vorrichtung.
DE69232149D1 (de)	2001-11-29	Messgerät
DE69006648D1 (de)	1994-03-24	Messvorrichtung und -verfahren.
DE69020937D1 (de)	1995-08-24	Abbildungsverfahren und -vorrichtung.
DE69215884D1 (de)	1997-01-23	Messapparat
DE69203386D1 (de)	1995-08-17	Übertragungsverfahren und -vorrichtung.
DE69201145D1 (de)	1995-02-23	Dimensionsmessvorrichtung.
DE69219498D1 (de)	1997-06-12	Lagedetektierungsgerät und -verfahren
DE69129713D1 (de)	1998-08-13	Ausgabeverfahren und -gerät
DE69212819D1 (de)	1996-09-19	Aufbaumethode und -vorrichtung
DE69211086D1 (de)	1996-07-04	Messverfahren und Messgerät
DE69228447D1 (de)	1999-04-01	Ausgabeverfahren und -gerät
DE69217695D1 (de)	1997-04-10	Ausgabeverfahren und -gerät
DE59202529D1 (de)	1995-07-20	Kraftmesseinrichtung.
DE4290948T1 (de)	1994-01-13	Funktionswählverfahren und -vorrichtung