DE69017857D1 - Röntgenanalysegerät mit einstellbarer Schlitzblende. - Google Patents
Röntgenanalysegerät mit einstellbarer Schlitzblende.Info
- Publication number
- DE69017857D1 DE69017857D1 DE69017857T DE69017857T DE69017857D1 DE 69017857 D1 DE69017857 D1 DE 69017857D1 DE 69017857 T DE69017857 T DE 69017857T DE 69017857 T DE69017857 T DE 69017857T DE 69017857 D1 DE69017857 D1 DE 69017857D1
- Authority
- DE
- Germany
- Prior art keywords
- ray analyzer
- slit diaphragm
- adjustable slit
- adjustable
- diaphragm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/316—Accessories, mechanical or electrical features collimators
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8903044A NL8903044A (nl) | 1989-12-12 | 1989-12-12 | Roentgen analyse apparaat met een instelbaar spleetdiafragma. |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69017857D1 true DE69017857D1 (de) | 1995-04-20 |
DE69017857T2 DE69017857T2 (de) | 1996-01-11 |
Family
ID=19855771
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69017857T Expired - Fee Related DE69017857T2 (de) | 1989-12-12 | 1990-12-07 | Röntgenanalysegerät mit einstellbarer Schlitzblende. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5115460A (de) |
EP (1) | EP0432844B1 (de) |
JP (1) | JP2941065B2 (de) |
DE (1) | DE69017857T2 (de) |
NL (1) | NL8903044A (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6417605B1 (en) * | 1994-09-16 | 2002-07-09 | Micron Technology, Inc. | Method of preventing junction leakage in field emission devices |
EP1336096B1 (de) * | 2000-11-20 | 2008-10-08 | PANalytical B.V. | Verfahren und vorrichtung zur untersuchung des zustands einer probe unter verwendung von strahlung, die von der probe auf einen positionsempfindlichen detektor reflektiert wird |
JP4278108B2 (ja) * | 2006-07-07 | 2009-06-10 | 株式会社リガク | 超小角x線散乱測定装置 |
CN103808745B (zh) * | 2014-01-24 | 2016-04-06 | 杭州电子科技大学 | 一种实现小角x射线衍射功能的方法 |
EP3719484B1 (de) * | 2019-04-04 | 2024-02-14 | Malvern Panalytical B.V. | Röntgenstrahlformungsvorrichtung und -verfahren |
JP7492261B2 (ja) * | 2021-01-29 | 2024-05-29 | 株式会社リガク | X線分析装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3238371A (en) * | 1963-02-11 | 1966-03-01 | Picker X Ray Corp Waite Mfg | X-ray beam attenuator |
US3852594A (en) * | 1973-07-25 | 1974-12-03 | Pepi Inc | X-ray diffraction apparatus |
US4380820A (en) * | 1980-06-19 | 1983-04-19 | The Machlett Laboratories, Incorporated | Compact X-ray collimator |
US4466112A (en) * | 1982-01-29 | 1984-08-14 | Technicare Corporation | Variable detector aperture |
NL8201343A (nl) * | 1982-03-31 | 1983-10-17 | Philips Nv | Roentgen analyse apparaat met instelbare strooistralenspleet. |
DE3604935A1 (de) * | 1986-02-17 | 1987-08-20 | Siemens Ag | Blende mit kontinuierlich veraenderbarer wirksamer blendenoeffnung fuer diffraktometrische messeinrichtungen |
NL8800738A (nl) * | 1988-03-24 | 1989-10-16 | Philips Nv | Roentgenonderzoekapparaat met een instelbaar spleetvormig diafragma. |
-
1989
- 1989-12-12 NL NL8903044A patent/NL8903044A/nl not_active Application Discontinuation
-
1990
- 1990-12-07 EP EP90203223A patent/EP0432844B1/de not_active Expired - Lifetime
- 1990-12-07 DE DE69017857T patent/DE69017857T2/de not_active Expired - Fee Related
- 1990-12-10 JP JP2407221A patent/JP2941065B2/ja not_active Expired - Lifetime
- 1990-12-11 US US07/626,085 patent/US5115460A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US5115460A (en) | 1992-05-19 |
DE69017857T2 (de) | 1996-01-11 |
EP0432844A1 (de) | 1991-06-19 |
JP2941065B2 (ja) | 1999-08-25 |
NL8903044A (nl) | 1991-07-01 |
EP0432844B1 (de) | 1995-03-15 |
JPH03251799A (ja) | 1991-11-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N |
|
8339 | Ceased/non-payment of the annual fee |