DE69017857D1 - Röntgenanalysegerät mit einstellbarer Schlitzblende. - Google Patents

Röntgenanalysegerät mit einstellbarer Schlitzblende.

Info

Publication number
DE69017857D1
DE69017857D1 DE69017857T DE69017857T DE69017857D1 DE 69017857 D1 DE69017857 D1 DE 69017857D1 DE 69017857 T DE69017857 T DE 69017857T DE 69017857 T DE69017857 T DE 69017857T DE 69017857 D1 DE69017857 D1 DE 69017857D1
Authority
DE
Germany
Prior art keywords
ray analyzer
slit diaphragm
adjustable slit
adjustable
diaphragm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69017857T
Other languages
English (en)
Other versions
DE69017857T2 (de
Inventor
Lange Roelof De
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronics NV filed Critical Philips Electronics NV
Publication of DE69017857D1 publication Critical patent/DE69017857D1/de
Application granted granted Critical
Publication of DE69017857T2 publication Critical patent/DE69017857T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
DE69017857T 1989-12-12 1990-12-07 Röntgenanalysegerät mit einstellbarer Schlitzblende. Expired - Fee Related DE69017857T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8903044A NL8903044A (nl) 1989-12-12 1989-12-12 Roentgen analyse apparaat met een instelbaar spleetdiafragma.

Publications (2)

Publication Number Publication Date
DE69017857D1 true DE69017857D1 (de) 1995-04-20
DE69017857T2 DE69017857T2 (de) 1996-01-11

Family

ID=19855771

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69017857T Expired - Fee Related DE69017857T2 (de) 1989-12-12 1990-12-07 Röntgenanalysegerät mit einstellbarer Schlitzblende.

Country Status (5)

Country Link
US (1) US5115460A (de)
EP (1) EP0432844B1 (de)
JP (1) JP2941065B2 (de)
DE (1) DE69017857T2 (de)
NL (1) NL8903044A (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6417605B1 (en) * 1994-09-16 2002-07-09 Micron Technology, Inc. Method of preventing junction leakage in field emission devices
EP1336096B1 (de) * 2000-11-20 2008-10-08 PANalytical B.V. Verfahren und vorrichtung zur untersuchung des zustands einer probe unter verwendung von strahlung, die von der probe auf einen positionsempfindlichen detektor reflektiert wird
JP4278108B2 (ja) * 2006-07-07 2009-06-10 株式会社リガク 超小角ｘ線散乱測定装置
CN103808745B (zh) * 2014-01-24 2016-04-06 杭州电子科技大学 一种实现小角x射线衍射功能的方法
EP3719484B1 (de) * 2019-04-04 2024-02-14 Malvern Panalytical B.V. Röntgenstrahlformungsvorrichtung und -verfahren
JP7492261B2 (ja) * 2021-01-29 2024-05-29 株式会社リガク Ｘ線分析装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3238371A (en) * 1963-02-11 1966-03-01 Picker X Ray Corp Waite Mfg X-ray beam attenuator
US3852594A (en) * 1973-07-25 1974-12-03 Pepi Inc X-ray diffraction apparatus
US4380820A (en) * 1980-06-19 1983-04-19 The Machlett Laboratories, Incorporated Compact X-ray collimator
US4466112A (en) * 1982-01-29 1984-08-14 Technicare Corporation Variable detector aperture
NL8201343A (nl) * 1982-03-31 1983-10-17 Philips Nv Roentgen analyse apparaat met instelbare strooistralenspleet.
DE3604935A1 (de) * 1986-02-17 1987-08-20 Siemens Ag Blende mit kontinuierlich veraenderbarer wirksamer blendenoeffnung fuer diffraktometrische messeinrichtungen
NL8800738A (nl) * 1988-03-24 1989-10-16 Philips Nv Roentgenonderzoekapparaat met een instelbaar spleetvormig diafragma.

Also Published As

Publication number Publication date
US5115460A (en) 1992-05-19
DE69017857T2 (de) 1996-01-11
EP0432844A1 (de) 1991-06-19
JP2941065B2 (ja) 1999-08-25
NL8903044A (nl) 1991-07-01
EP0432844B1 (de) 1995-03-15
JPH03251799A (ja) 1991-11-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N

8339 Ceased/non-payment of the annual fee