DE69016153D1 - Nichtflüchtige Halbleiterspeicheranordnung. - Google Patents
Nichtflüchtige Halbleiterspeicheranordnung.Info
- Publication number
- DE69016153D1 DE69016153D1 DE69016153T DE69016153T DE69016153D1 DE 69016153 D1 DE69016153 D1 DE 69016153D1 DE 69016153 T DE69016153 T DE 69016153T DE 69016153 T DE69016153 T DE 69016153T DE 69016153 D1 DE69016153 D1 DE 69016153D1
- Authority
- DE
- Germany
- Prior art keywords
- memory device
- semiconductor memory
- volatile semiconductor
- volatile
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
- H01L27/105—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including field-effect components
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
- G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Non-Volatile Memory (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27396889A JP2859658B2 (ja) | 1989-10-20 | 1989-10-20 | 不揮発性半導体記憶装置 |
JP27396789A JP2908483B2 (ja) | 1989-10-20 | 1989-10-20 | 不揮発性半導体記憶装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69016153D1 true DE69016153D1 (de) | 1995-03-02 |
DE69016153T2 DE69016153T2 (de) | 1995-05-18 |
Family
ID=26550837
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69016153T Expired - Fee Related DE69016153T2 (de) | 1989-10-20 | 1990-10-19 | Nichtflüchtige Halbleiterspeicheranordnung. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5642308A (de) |
EP (1) | EP0424172B1 (de) |
KR (1) | KR910008733A (de) |
DE (1) | DE69016153T2 (de) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3114620B2 (ja) * | 1996-05-30 | 2000-12-04 | 日本電気株式会社 | 半導体記憶装置 |
KR100486444B1 (ko) * | 1996-08-30 | 2005-06-16 | 산요덴키가부시키가이샤 | 반도체기억장치 |
US5940334A (en) * | 1996-09-30 | 1999-08-17 | Advanced Micro Devices, Inc. | Memory interface circuit including bypass data forwarding with essentially no delay |
US5883826A (en) * | 1996-09-30 | 1999-03-16 | Wendell; Dennis Lee | Memory block select using multiple word lines to address a single memory cell row |
US5920517A (en) * | 1996-09-30 | 1999-07-06 | Advanced Micro Devices, Inc. | Memory array test and characterization using isolated memory cell power supply |
JP3532721B2 (ja) * | 1996-12-19 | 2004-05-31 | 株式会社東芝 | 定電圧発生回路 |
US5920515A (en) * | 1997-09-26 | 1999-07-06 | Advanced Micro Devices, Inc. | Register-based redundancy circuit and method for built-in self-repair in a semiconductor memory device |
KR100548587B1 (ko) * | 1998-09-10 | 2006-04-07 | 주식회사 하이닉스반도체 | 플래시 메모리의 기준셀 모니터링 회로 |
JP3805543B2 (ja) * | 1998-11-19 | 2006-08-02 | 三菱電機株式会社 | 半導体集積回路 |
US6232801B1 (en) * | 1999-08-04 | 2001-05-15 | Vlsi Technology, Inc. | Comparators and comparison methods |
KR100604068B1 (ko) * | 1999-09-14 | 2006-07-24 | 주식회사 엘지생활건강 | 자유라디칼 소거제 혹은 항산화제로서 폴리에톡실레이티드 비타민 씨 유도체를 함유하는 조성물 |
US6407946B2 (en) * | 1999-12-08 | 2002-06-18 | Matsushita Electric Industrial Co., Ltd. | Nonvolatile semiconductor memory device |
US6411549B1 (en) | 2000-06-21 | 2002-06-25 | Atmel Corporation | Reference cell for high speed sensing in non-volatile memories |
US6538922B1 (en) | 2000-09-27 | 2003-03-25 | Sandisk Corporation | Writable tracking cells |
US6744671B2 (en) * | 2000-12-29 | 2004-06-01 | Intel Corporation | Kicker for non-volatile memory drain bias |
US6570789B2 (en) | 2000-12-29 | 2003-05-27 | Intel Corporation | Load for non-volatile memory drain bias |
US6535423B2 (en) | 2000-12-29 | 2003-03-18 | Intel Corporation | Drain bias for non-volatile memory |
US6434049B1 (en) * | 2000-12-29 | 2002-08-13 | Intel Corporation | Sample and hold voltage reference source |
US6456540B1 (en) | 2001-01-30 | 2002-09-24 | Intel Corporation | Method and apparatus for gating a global column select line with address transition detection |
US6950341B2 (en) * | 2001-06-07 | 2005-09-27 | Kabushiki Kaisha Toshiba | Semiconductor memory device having plural sense amplifiers |
US6940772B1 (en) * | 2002-03-18 | 2005-09-06 | T-Ram, Inc | Reference cells for TCCT based memory cells |
US6862223B1 (en) * | 2002-07-05 | 2005-03-01 | Aplus Flash Technology, Inc. | Monolithic, combo nonvolatile memory allowing byte, page and block write with no disturb and divided-well in the cell array using a unified cell structure and technology with a new scheme of decoder and layout |
US7064978B2 (en) * | 2002-07-05 | 2006-06-20 | Aplus Flash Technology, Inc. | Monolithic, combo nonvolatile memory allowing byte, page and block write with no disturb and divided-well in the cell array using a unified cell structure and technology with a new scheme of decoder and layout |
US7237074B2 (en) * | 2003-06-13 | 2007-06-26 | Sandisk Corporation | Tracking cells for a memory system |
US7301807B2 (en) | 2003-10-23 | 2007-11-27 | Sandisk Corporation | Writable tracking cells |
KR100618840B1 (ko) * | 2004-06-29 | 2006-09-01 | 삼성전자주식회사 | 저 전원전압 플래쉬 메모리장치의 감지회로 |
US8259505B2 (en) * | 2010-05-28 | 2012-09-04 | Nscore Inc. | Nonvolatile memory device with reduced current consumption |
JP6749021B2 (ja) * | 2015-05-15 | 2020-09-02 | 国立大学法人東北大学 | 抵抗変化型素子を備えた記憶回路 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4301518A (en) * | 1979-11-01 | 1981-11-17 | Texas Instruments Incorporated | Differential sensing of single ended memory array |
JPS57180169A (en) * | 1981-04-30 | 1982-11-06 | Nec Corp | Insulating gate type protective device |
US4434479A (en) * | 1981-11-02 | 1984-02-28 | Mcdonnell Douglas Corporation | Nonvolatile memory sensing system |
JPS5999760A (ja) * | 1982-11-29 | 1984-06-08 | Mitsubishi Electric Corp | 半導体記憶装置 |
JPS6177199A (ja) * | 1984-09-21 | 1986-04-19 | Toshiba Corp | 半導体記憶装置 |
JPS6461063A (en) * | 1987-09-01 | 1989-03-08 | Fujitsu Ltd | Semiconductor device and manufacture thereof |
JP2507529B2 (ja) * | 1988-03-31 | 1996-06-12 | 株式会社東芝 | 不揮発性半導体記憶装置 |
-
1990
- 1990-10-19 DE DE69016153T patent/DE69016153T2/de not_active Expired - Fee Related
- 1990-10-19 EP EP90311510A patent/EP0424172B1/de not_active Expired - Lifetime
- 1990-10-20 KR KR1019900016787A patent/KR910008733A/ko not_active Application Discontinuation
-
1995
- 1995-05-26 US US08/451,905 patent/US5642308A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0424172A2 (de) | 1991-04-24 |
EP0424172B1 (de) | 1995-01-18 |
EP0424172A3 (en) | 1992-01-08 |
KR910008733A (ko) | 1991-05-31 |
US5642308A (en) | 1997-06-24 |
DE69016153T2 (de) | 1995-05-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |