DE68924080T2 - Halbleiterspeichervorrichtung. - Google Patents

Halbleiterspeichervorrichtung.

Info

Publication number
DE68924080T2
DE68924080T2 DE68924080T DE68924080T DE68924080T2 DE 68924080 T2 DE68924080 T2 DE 68924080T2 DE 68924080 T DE68924080 T DE 68924080T DE 68924080 T DE68924080 T DE 68924080T DE 68924080 T2 DE68924080 T2 DE 68924080T2
Authority
DE
Germany
Prior art keywords
memory device
semiconductor memory
semiconductor
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68924080T
Other languages
English (en)
Other versions
DE68924080D1 (de
Inventor
Kiyokazu Hashimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Electronics Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of DE68924080D1 publication Critical patent/DE68924080D1/de
Application granted granted Critical
Publication of DE68924080T2 publication Critical patent/DE68924080T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/26Sensing or reading circuits; Data output circuits
    • G11C16/28Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/067Single-ended amplifiers
DE68924080T 1988-02-29 1989-02-28 Halbleiterspeichervorrichtung. Expired - Lifetime DE68924080T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63048313A JPH01220295A (ja) 1988-02-29 1988-02-29 半導体記憶装置

Publications (2)

Publication Number Publication Date
DE68924080D1 DE68924080D1 (de) 1995-10-12
DE68924080T2 true DE68924080T2 (de) 1996-05-02

Family

ID=12799925

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68924080T Expired - Lifetime DE68924080T2 (de) 1988-02-29 1989-02-28 Halbleiterspeichervorrichtung.

Country Status (4)

Country Link
US (1) US4974207A (de)
EP (1) EP0331113B1 (de)
JP (1) JPH01220295A (de)
DE (1) DE68924080T2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5148397A (en) * 1989-03-16 1992-09-15 Oki Electric Industry Co. Ltd. Semiconductor memory with externally controlled dummy comparator
IT1246241B (it) * 1990-02-23 1994-11-17 Sgs Thomson Microelectronics Circuito per la lettura dell'informazione contenuta in celle di memoria non volatili
JP2668150B2 (ja) * 1990-05-23 1997-10-27 三菱電機株式会社 不揮発性半導体記憶装置
EP0491105B1 (de) * 1990-12-13 1996-05-01 STMicroelectronics S.r.l. Verbesserte Abfühlschaltung für Speicheranordnungen, wie nichtflüchtige Speicher, mit verbesserter Abfühlunterscheidung
US5142496A (en) * 1991-06-03 1992-08-25 Advanced Micro Devices, Inc. Method for measuring VT 's less than zero without applying negative voltages
KR930008886B1 (ko) * 1991-08-19 1993-09-16 삼성전자 주식회사 전기적으로 프로그램 할 수 있는 내부전원 발생회로
JPH0574181A (ja) * 1991-09-10 1993-03-26 Nec Corp 半導体メモリ装置のデータ読み出し回路
US5483494A (en) * 1993-04-07 1996-01-09 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device having a reduced delay in reading data after changing from standby to an operation mode
US5477499A (en) * 1993-10-13 1995-12-19 Advanced Micro Devices, Inc. Memory architecture for a three volt flash EEPROM
US5396467A (en) * 1994-03-30 1995-03-07 United Microelectronics Corp. Sense amplifier
US5528543A (en) * 1994-09-16 1996-06-18 Texas Instruments Incorporated Sense amplifier circuitry
US5487045A (en) * 1994-09-16 1996-01-23 Philips Electroics North America Corporation Sense amplifier having variable sensing load for non-volatile memory
US5539695A (en) * 1995-01-23 1996-07-23 Solidas Corporation Fast access multi-bit random access memory
FR2801719B1 (fr) * 1999-11-30 2002-03-01 St Microelectronics Sa Dispositif de lecture pour memoire en circuit integre
US6707715B2 (en) * 2001-08-02 2004-03-16 Stmicroelectronics, Inc. Reference generator circuit and method for nonvolatile memory devices
US9135962B2 (en) * 2007-06-15 2015-09-15 Micron Technology, Inc. Comparators for delta-sigma modulators

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58208990A (ja) * 1982-05-28 1983-12-05 Nec Corp 記憶装置
JPS61172300A (ja) * 1985-01-26 1986-08-02 Toshiba Corp 半導体記憶装置
JPS6258495A (ja) * 1985-09-09 1987-03-14 Toshiba Corp 半導体記憶装置
JPS6276098A (ja) * 1985-09-30 1987-04-08 Toshiba Corp センスアンプ回路
JPS62197996A (ja) * 1986-02-24 1987-09-01 Toshiba Corp 半導体メモリのセンスアンプ

Also Published As

Publication number Publication date
JPH01220295A (ja) 1989-09-01
DE68924080D1 (de) 1995-10-12
EP0331113A2 (de) 1989-09-06
US4974207A (en) 1990-11-27
EP0331113B1 (de) 1995-09-06
EP0331113A3 (de) 1991-05-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP