DE602006013268D1 - Überlastungsschutzverfahren - Google Patents

Überlastungsschutzverfahren

Info

Publication number
DE602006013268D1
DE602006013268D1 DE602006013268T DE602006013268T DE602006013268D1 DE 602006013268 D1 DE602006013268 D1 DE 602006013268D1 DE 602006013268 T DE602006013268 T DE 602006013268T DE 602006013268 T DE602006013268 T DE 602006013268T DE 602006013268 D1 DE602006013268 D1 DE 602006013268D1
Authority
DE
Germany
Prior art keywords
frequency
measurement system
alternating current
overload protection
current line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006013268T
Other languages
English (en)
Inventor
Thomas Bruce Meagher
Kenneth John Murphy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ICS Triplex Technology Ltd
Original Assignee
ICS Triplex Technology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ICS Triplex Technology Ltd filed Critical ICS Triplex Technology Ltd
Publication of DE602006013268D1 publication Critical patent/DE602006013268D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits

Landscapes

  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Electronic Switches (AREA)
  • Analogue/Digital Conversion (AREA)
  • Compression, Expansion, Code Conversion, And Decoders (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Amplifiers (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Synchronizing For Television (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
  • Control Of Eletrric Generators (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Hardware Redundancy (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Control Of Direct Current Motors (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
DE602006013268T 2006-03-24 2006-05-31 Überlastungsschutzverfahren Active DE602006013268D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US78553706P 2006-03-24 2006-03-24

Publications (1)

Publication Number Publication Date
DE602006013268D1 true DE602006013268D1 (de) 2010-05-12

Family

ID=36764483

Family Applications (4)

Application Number Title Priority Date Filing Date
DE602006013269T Active DE602006013269D1 (de) 2006-03-24 2006-05-31 Verfahren und Vorrichtung für Ausgangsstromsteuerung
DE602006013783T Active DE602006013783D1 (de) 2006-03-24 2006-05-31 Netzfrequenzsynchronisierung
DE602006013268T Active DE602006013268D1 (de) 2006-03-24 2006-05-31 Überlastungsschutzverfahren
DE602006020243T Active DE602006020243D1 (de) 2006-03-24 2006-05-31 Überlastungsschutz für ein digitales Ausgangsmodul

Family Applications Before (2)

Application Number Title Priority Date Filing Date
DE602006013269T Active DE602006013269D1 (de) 2006-03-24 2006-05-31 Verfahren und Vorrichtung für Ausgangsstromsteuerung
DE602006013783T Active DE602006013783D1 (de) 2006-03-24 2006-05-31 Netzfrequenzsynchronisierung

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE602006020243T Active DE602006020243D1 (de) 2006-03-24 2006-05-31 Überlastungsschutz für ein digitales Ausgangsmodul

Country Status (3)

Country Link
EP (7) EP1837671B1 (de)
AT (4) ATE499747T1 (de)
DE (4) DE602006013269D1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2096506B1 (de) 2008-02-29 2013-04-24 Rockwell Automation Limited Verfahren und Vorrichtung zum Schutz digitaler Ausgangsschaltungen
CN102238752B (zh) * 2010-04-30 2014-02-12 电信科学技术研究院 一种mtc设备随机接入控制方法及mtc设备
CN102346206A (zh) * 2011-09-13 2012-02-08 深圳桑菲消费通信有限公司 一种过热器件保护装置及方法
CN105807686B (zh) * 2016-04-05 2018-08-10 中国船舶重工集团公司第七一二研究所 一种通用的隔离型开关量输入输出模块
CN106338983B (zh) * 2016-09-29 2018-12-21 北京精密机电控制设备研究所 一种三余度数字伺服***一度故障试验方法
US10033400B1 (en) 2017-10-18 2018-07-24 Schweitzer Engineering Laboratories, Inc. Analog-to-digital converter verification using quantization noise properties
US9985646B1 (en) 2017-10-18 2018-05-29 Schweitzer Engineering Laboratories, Inc. Analog-to-digital converter verification using quantization noise properties
CN110132361B (zh) * 2019-06-05 2021-08-06 重庆大学 一种超导限流器状态监测***及状态监测方法
EP3786649A1 (de) 2019-08-29 2021-03-03 Siemens Aktiengesellschaft Verfahren zum überprüfen von lastkreisen in einer technischen anlage

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US4535378A (en) * 1982-11-16 1985-08-13 Tokyo Shibaura Denki Kabushiki Kaisha Overcurrent detector for an inverter
JPS60236073A (ja) * 1984-05-09 1985-11-22 Sumitomo Electric Ind Ltd 送電線用フオ−ルトロケ−タ
US4679028A (en) * 1986-03-31 1987-07-07 Motorola Inc. Fault detection algorithm for successive-approximation A/D converters
SE459946B (sv) * 1987-12-29 1989-08-21 Asea Ab Relaeskydd med selektivt fasval foer dubbelledningar
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US5068657A (en) * 1990-05-25 1991-11-26 At&T Bell Laboratories Method and apparatus for testing delta-sigma modulators
US5324989A (en) * 1992-12-17 1994-06-28 Thornton Roger D Power controller module providing user selectable overload protection
US6125024A (en) * 1993-06-03 2000-09-26 Texas Instruments Incorporated Externally programmable solid state power controller with power switch protection apparatus and method for making
US5552881A (en) * 1994-03-17 1996-09-03 Teradyne, Inc. Method and apparatus for scanning a fiber optic network
JPH0823244A (ja) * 1994-07-08 1996-01-23 Shibaura Eng Works Co Ltd 信号伝達装置
US5594439A (en) * 1994-08-24 1997-01-14 Crystal Semiconductor Corporation Diagnosing problems in an electrical system by monitoring changes in nonlinear characteristics
US5909660A (en) * 1994-10-13 1999-06-01 National Instruments Corporation Signal conditioning module for sensing multiform field voltage signals
US5621603A (en) * 1995-07-26 1997-04-15 United Technologies Corporation Pulse width modulated solenoid driver controller
KR0158505B1 (ko) * 1995-08-30 1998-12-15 김광호 부하보호기능을 갖는 전원 공급 회로
DE69614659T2 (de) * 1996-02-09 2004-04-08 Co.Ri.M.Me. Consorzio Per La Ricerca Sulla Microelettronica Nel Mezzogiorno Schaltung mit Überstromschutz für Leistungstransistoren
JPH10139491A (ja) * 1996-11-14 1998-05-26 Central Glass Co Ltd 低反射濃色グレ−ガラス
US5808415A (en) * 1997-03-19 1998-09-15 Scientific Systems Research Limited Apparatus for sensing RF current delivered to a plasma with two inductive loops
US5896263A (en) * 1997-06-27 1999-04-20 Allen-Bradley Company, Llc Output circuit having electronic overload protection activated by voltage drop across output transistor
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US6351835B1 (en) * 1998-07-31 2002-02-26 Nec Corporation High speed LSI spectral analysis testing apparatus and method
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US6400163B1 (en) * 1999-09-08 2002-06-04 Rolf Melcher Circuit arrangement for monitoring an electronic switch controlling a load
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US6557131B1 (en) * 1999-12-23 2003-04-29 Cirrus Logic, Inc. Apparatus and method for automated testing of integrated analog to digital converters
US6459599B1 (en) * 2001-06-01 2002-10-01 Otis Elevator Company Determining phase of AC mains in PWM controlled converters without voltage sensors
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US6944231B2 (en) * 2001-09-06 2005-09-13 Litton Systems, Inc. Demodulation of multiple-carrier phase-modulated signals
EP1322139A1 (de) * 2001-12-19 2003-06-25 Toyoda Gosei Co., Ltd. LED-Leuchte für Kraftfahrzeuge
DE10215405A1 (de) 2002-04-08 2003-10-16 Bosch Gmbh Robert Verfahren und Vorrichtung zur Funktionsprüfung eines Analog-Digital-Wandlers sowie Analog-Digital-Wandler
US6768350B1 (en) * 2002-04-10 2004-07-27 Hamilton Sundstrand Corporation Microprocessor based solid state DC power controller
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ITVA20020057A1 (it) 2002-11-14 2004-05-15 St Microelectronics Srl Convertitore analogico digitale integrato con funzione di rilevamento di guasti esterni al dispositivo.
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Also Published As

Publication number Publication date
EP1837971B1 (de) 2010-03-31
EP1837995B1 (de) 2010-04-21
ATE499747T1 (de) 2011-03-15
EP1837995A1 (de) 2007-09-26
EP1837991A1 (de) 2007-09-26
ATE465551T1 (de) 2010-05-15
ATE463077T1 (de) 2010-04-15
DE602006020243D1 (de) 2011-04-07
EP1837991B1 (de) 2010-03-31
EP1837671A1 (de) 2007-09-26
DE602006013269D1 (de) 2010-05-12
EP1837992B1 (de) 2011-02-23
ATE463066T1 (de) 2010-04-15
EP1837670A1 (de) 2007-09-26
EP1837672B1 (de) 2013-01-16
EP1837671B1 (de) 2017-07-12
DE602006013783D1 (de) 2010-06-02
EP1837992A1 (de) 2007-09-26
EP1837672A1 (de) 2007-09-26
EP1837670B1 (de) 2018-01-03
EP1837971A1 (de) 2007-09-26

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