DE602004004049D1 - Vorrichtung zur Analyse eines temperaturprogrammiert desorbierten gases - Google Patents

Vorrichtung zur Analyse eines temperaturprogrammiert desorbierten gases

Info

Publication number
DE602004004049D1
DE602004004049D1 DE602004004049T DE602004004049T DE602004004049D1 DE 602004004049 D1 DE602004004049 D1 DE 602004004049D1 DE 602004004049 T DE602004004049 T DE 602004004049T DE 602004004049 T DE602004004049 T DE 602004004049T DE 602004004049 D1 DE602004004049 D1 DE 602004004049D1
Authority
DE
Germany
Prior art keywords
analyzing
temperature
desorbed gas
programmed
programmed desorbed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004004049T
Other languages
English (en)
Other versions
DE602004004049T2 (de
Inventor
Tadashi Arii
Yoshihiro Takata
Shuichi Matsuo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Publication of DE602004004049D1 publication Critical patent/DE602004004049D1/de
Application granted granted Critical
Publication of DE602004004049T2 publication Critical patent/DE602004004049T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Sampling And Sample Adjustment (AREA)
DE602004004049T 2003-10-27 2004-10-26 Vorrichtung zur Analyse eines temperaturprogrammiert desorbierten Gases Active DE602004004049T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003365417 2003-10-27
JP2003365417A JP4162138B2 (ja) 2003-10-27 2003-10-27 昇温脱離ガス分析装置

Publications (2)

Publication Number Publication Date
DE602004004049D1 true DE602004004049D1 (de) 2007-02-15
DE602004004049T2 DE602004004049T2 (de) 2007-06-06

Family

ID=34463599

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004004049T Active DE602004004049T2 (de) 2003-10-27 2004-10-26 Vorrichtung zur Analyse eines temperaturprogrammiert desorbierten Gases

Country Status (4)

Country Link
US (1) US7155960B2 (de)
EP (1) EP1536452B1 (de)
JP (1) JP4162138B2 (de)
DE (1) DE602004004049T2 (de)

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Publication number Priority date Publication date Assignee Title
CA2480549A1 (fr) 2004-09-15 2006-03-15 Phytronix Technologies Inc. Source d'ionisation pour spectrometre de masse
DE102004063613A1 (de) * 2004-12-27 2006-07-06 Elementar Analysensysteme Gmbh Verfahren und Vorrichtung zur Elementaranalyse und/oder zum präparativen Trennen von mindestens zwei Gasen im Trägergas eines Hauptgasstroms
DE102005044307B4 (de) * 2005-09-16 2008-04-17 Bruker Daltonik Gmbh Ionisierung desorbierter Moleküle
US7385839B2 (en) * 2005-12-01 2008-06-10 International Business Machines Corporation Memory devices using carbon nanotube (CNT) technologies
JP4958258B2 (ja) * 2006-03-17 2012-06-20 株式会社リガク ガス分析装置
JP5215589B2 (ja) * 2007-05-11 2013-06-19 キヤノン株式会社 絶縁ゲート型トランジスタ及び表示装置
JP4557266B2 (ja) * 2008-04-30 2010-10-06 キヤノンアネルバ株式会社 質量分析装置及び質量分析方法
IL193003A (en) * 2008-07-23 2011-12-29 Aviv Amirav Open probe method and device for sample introduction for mass spectrometry analysis
JP2010085222A (ja) * 2008-09-30 2010-04-15 Canon Anelva Technix Corp 質量分析装置及び質量分析方法
CN101871914A (zh) 2009-04-24 2010-10-27 岛津分析技术研发（上海）有限公司 一种解吸电离方法及其装置
JP5508118B2 (ja) * 2010-04-26 2014-05-28 日本碍子株式会社 発生気体分析装置
JP5363408B2 (ja) * 2010-04-26 2013-12-11 日本碍子株式会社 発生気体分析装置
JP5304749B2 (ja) * 2010-08-05 2013-10-02 株式会社島津製作所 真空分析装置
US8881587B2 (en) * 2011-01-27 2014-11-11 Schlumberger Technology Corporation Gas sorption analysis of unconventional rock samples
US8754369B2 (en) * 2012-06-04 2014-06-17 The Boeing Company System and method for measuring hydrogen content in a sample
JP5885299B2 (ja) * 2012-07-26 2016-03-15 株式会社リガク スキマー型インターフェース構造
CN103743772B (zh) * 2013-12-19 2016-02-24 西安交通大学 一种固体有机物热解特性快速分析的***与方法
KR102096162B1 (ko) * 2018-04-26 2020-04-01 이무남 대기압 전용 잔류가스 분석장치에 연결되는 잔류가스 공급장치
JP7412768B2 (ja) 2020-08-11 2024-01-15 株式会社リガク 発生ガス分析装置とオリフィス位置決め方法
CN113866281B (zh) * 2021-10-25 2024-03-12 北京卫星环境工程研究所 一种跨温区全压程材料吸附脱附特性测试装置及方法

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US4902891A (en) * 1988-06-03 1990-02-20 Vestec Corporation Thermospray methods and apparatus for interfacing chromatography and mass spectrometry
US5565679A (en) * 1993-05-11 1996-10-15 Mds Health Group Limited Method and apparatus for plasma mass analysis with reduced space charge effects
GB9417700D0 (en) * 1994-09-02 1994-10-19 Fisons Plc Apparatus and method for isotopic ratio plasma mass spectrometry
US5552600A (en) * 1995-06-07 1996-09-03 Barringer Research Limited Pressure stabilized ion mobility spectrometer
JP3582213B2 (ja) * 1996-03-19 2004-10-27 株式会社島津製作所 大気圧イオン化質量分析計
US5869344A (en) * 1996-07-19 1999-02-09 Micromass Uk Limited Apparatus and methods for the analysis of trace constituents in gases
US5742050A (en) * 1996-09-30 1998-04-21 Aviv Amirav Method and apparatus for sample introduction into a mass spectrometer for improving a sample analysis
JP3721715B2 (ja) * 1997-05-23 2005-11-30 株式会社島津製作所 液体クロマトグラフ質量分析装置
US6265717B1 (en) * 1998-07-15 2001-07-24 Agilent Technologies Inductively coupled plasma mass spectrometer and method
JP4581184B2 (ja) * 2000-06-07 2010-11-17 株式会社島津製作所 質量分析装置
US7053367B2 (en) * 2001-11-07 2006-05-30 Hitachi High-Technologies Corporation Mass spectrometer
US7081620B2 (en) * 2001-11-26 2006-07-25 Hitachi High -Technologies Corporation Atmospheric pressure ionization mass spectrometer system
US6649909B2 (en) * 2002-02-20 2003-11-18 Agilent Technologies, Inc. Internal introduction of lock masses in mass spectrometer systems
JP2003331776A (ja) * 2002-05-10 2003-11-21 Hitachi Ltd イオン源および質量分析装置および質量分析方法
JP3791783B2 (ja) * 2002-07-02 2006-06-28 キヤノンアネルバ株式会社 イオン付着質量分析装置、イオン化装置、およびイオン化方法

Also Published As

Publication number Publication date
DE602004004049T2 (de) 2007-06-06
US7155960B2 (en) 2007-01-02
US20050086997A1 (en) 2005-04-28
EP1536452A1 (de) 2005-06-01
JP2005127931A (ja) 2005-05-19
EP1536452B1 (de) 2007-01-03
JP4162138B2 (ja) 2008-10-08

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