DE3768121D1 - Sonde fuer ein elektrisches messsystem. - Google Patents

Sonde fuer ein elektrisches messsystem.

Info

Publication number
DE3768121D1
DE3768121D1 DE8787302056T DE3768121T DE3768121D1 DE 3768121 D1 DE3768121 D1 DE 3768121D1 DE 8787302056 T DE8787302056 T DE 8787302056T DE 3768121 T DE3768121 T DE 3768121T DE 3768121 D1 DE3768121 D1 DE 3768121D1
Authority
DE
Germany
Prior art keywords
probe
measuring system
electrical measuring
electrical
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8787302056T
Other languages
English (en)
Inventor
Tran Thong
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Application granted granted Critical
Publication of DE3768121D1 publication Critical patent/DE3768121D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Surgical Instruments (AREA)
DE8787302056T 1986-04-07 1987-03-10 Sonde fuer ein elektrisches messsystem. Expired - Fee Related DE3768121D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/848,548 US4758779A (en) 1986-04-07 1986-04-07 Probe body for an electrical measurement system

Publications (1)

Publication Number Publication Date
DE3768121D1 true DE3768121D1 (de) 1991-04-04

Family

ID=25303595

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787302056T Expired - Fee Related DE3768121D1 (de) 1986-04-07 1987-03-10 Sonde fuer ein elektrisches messsystem.

Country Status (5)

Country Link
US (1) US4758779A (de)
EP (1) EP0241142B1 (de)
JP (1) JPS6366470A (de)
CA (1) CA1258883A (de)
DE (1) DE3768121D1 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5235268A (en) * 1991-11-13 1993-08-10 Harthcock Jerry D Test and measurement system
US5293122A (en) * 1992-06-08 1994-03-08 Lecroy Corporation Signal probe with remote control function
US6028423A (en) * 1997-12-11 2000-02-22 Sanchez; Jorge Isolation instrument for electrical testing
US20060190204A1 (en) * 1996-03-27 2006-08-24 Mchardy John Analyzing the response of an electrochemical system to a time-varying electrical stimulation
US6990422B2 (en) * 1996-03-27 2006-01-24 World Energy Labs (2), Inc. Method of analyzing the time-varying electrical response of a stimulated target substance
US6094624A (en) * 1997-08-19 2000-07-25 Chao; Nathan Electronic test facility
US6351112B1 (en) * 1998-08-31 2002-02-26 Agilent Technologies, Inc. Calibrating combinations of probes and channels in an oscilloscope
US6426634B1 (en) * 1999-03-29 2002-07-30 George A. Spencer Circuit breaker with integrated self-test enhancements
JP4450892B2 (ja) * 1999-06-22 2010-04-14 株式会社アドバンテスト アナログ信号処理回路、ａｄ変換装置、半導体デバイス試験装置およびオシロスコープ
US7180314B1 (en) * 2001-12-14 2007-02-20 Lecroy Corporation Self-calibrating electrical test probe calibratable while connected to an electrical component under test
US7505498B2 (en) 2002-01-08 2009-03-17 Jorge Sanchez Apparatus and method for measurement for dynamic laser signals
US7519874B2 (en) 2002-09-30 2009-04-14 Lecroy Corporation Method and apparatus for bit error rate analysis
US20040123018A1 (en) 2002-09-30 2004-06-24 Martin Miller Method and apparatus for analyzing serial data streams
US7437624B2 (en) 2002-09-30 2008-10-14 Lecroy Corporation Method and apparatus for analyzing serial data streams
US7299144B2 (en) * 2005-12-15 2007-11-20 International Business Machines Corporation Method and apparatus for implementing automatic-calibration of TDR probing system
DE102006052745A1 (de) * 2006-08-14 2008-02-21 Rohde & Schwarz Gmbh & Co. Kg Oszilloskop-Tastkopf
US7795860B2 (en) 2006-08-16 2010-09-14 Tektronix, Inc. Multiple probe acquisition system
JP5239267B2 (ja) * 2007-09-07 2013-07-17 横河電機株式会社 波形測定装置
JP5239395B2 (ja) * 2008-02-27 2013-07-17 横河電機株式会社 波形測定装置
US20090267590A1 (en) * 2008-04-29 2009-10-29 International Business Machines Corporation Method of enabling triggering an oscilloscope
CN103399287A (zh) * 2013-07-30 2013-11-20 重庆长安汽车股份有限公司 一种线束瞬断检测仪检测***及检测方法
US9625495B2 (en) * 2013-08-22 2017-04-18 Tektronix, Inc. Isolated probe with digital multimeter or digital voltmeter
US9476960B2 (en) * 2013-12-18 2016-10-25 Tektronix, Inc. Measurement system including accessory with internal calibration signal

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3725784A (en) * 1970-06-24 1973-04-03 Wandel & Goltermann Automatic calibrating and measuring system
US4042881A (en) * 1975-06-23 1977-08-16 Unitec, Inc. Voltage measuring device having an amplifier in the probe
US4403183A (en) * 1981-04-10 1983-09-06 Tektronix, Inc. Active voltage probe
JPS6030898B2 (ja) * 1981-05-15 1985-07-19 テクトロニクス・インコ−ポレイテツド ロジツク・アナライザの入力装置
US4514685A (en) * 1981-07-27 1985-04-30 Electric Power Research Institute, Inc. Integrating circuit for use with Hall effect sensors having offset compensation means
JPS5890176A (ja) * 1981-11-26 1983-05-28 Anritsu Corp プロ−ブ
US4450411A (en) * 1982-07-27 1984-05-22 Honeywell Inc. Automatic calibration system for signal amplifier circuits
JPS6048625A (ja) * 1983-08-29 1985-03-16 Anritsu Corp ２重スーパヘテロダイン受信機
JPS6093973A (ja) * 1983-10-28 1985-05-25 Mitsubishi Electric Corp 半導体試験装置の検査装置
US4672306A (en) * 1985-04-08 1987-06-09 Tektronix, Inc. Electronic probe having automatic readout of identification and status

Also Published As

Publication number Publication date
JPS6366470A (ja) 1988-03-25
CA1258883A (en) 1989-08-29
EP0241142B1 (de) 1991-02-27
EP0241142A1 (de) 1987-10-14
US4758779A (en) 1988-07-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee