DE3485063D1 - Logisches gate und testverfahren. - Google Patents
Logisches gate und testverfahren.Info
- Publication number
- DE3485063D1 DE3485063D1 DE8585900324T DE3485063T DE3485063D1 DE 3485063 D1 DE3485063 D1 DE 3485063D1 DE 8585900324 T DE8585900324 T DE 8585900324T DE 3485063 T DE3485063 T DE 3485063T DE 3485063 D1 DE3485063 D1 DE 3485063D1
- Authority
- DE
- Germany
- Prior art keywords
- variable input
- gate
- input gates
- gates
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318516—Test of programmable logic devices [PLDs]
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US1984/001926 WO1986003592A1 (en) | 1984-12-11 | 1984-12-11 | Amenable logic gate and method of testing |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3485063D1 true DE3485063D1 (de) | 1991-10-17 |
Family
ID=22182338
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8585900324T Expired - Fee Related DE3485063D1 (de) | 1984-12-11 | 1984-12-11 | Logisches gate und testverfahren. |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0204697B1 (de) |
JP (1) | JPS62501519A (de) |
DE (1) | DE3485063D1 (de) |
WO (1) | WO1986003592A1 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3726570A1 (de) * | 1987-08-10 | 1989-02-23 | Siemens Ag | Verfahren und schaltungsanordnung fuer halbleiterbausteine mit in hochintegrierter schaltkreistechnik zusammengefassten logischen verknuepfungsschaltungen |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3783254A (en) * | 1972-10-16 | 1974-01-01 | Ibm | Level sensitive logic system |
US3958110A (en) * | 1974-12-18 | 1976-05-18 | Ibm Corporation | Logic array with testing circuitry |
US4225957A (en) * | 1978-10-16 | 1980-09-30 | International Business Machines Corporation | Testing macros embedded in LSI chips |
DE3015992A1 (de) * | 1980-04-25 | 1981-11-05 | Ibm Deutschland Gmbh, 7000 Stuttgart | Programmierbare logische anordnung |
US4435805A (en) * | 1981-06-04 | 1984-03-06 | International Business Machines Corporation | Testing of logic arrays |
US4542508A (en) * | 1983-11-21 | 1985-09-17 | Aerojet-General Corporation | Amenable logic gate and method of testing |
-
1984
- 1984-12-11 JP JP50443684A patent/JPS62501519A/ja active Pending
- 1984-12-11 DE DE8585900324T patent/DE3485063D1/de not_active Expired - Fee Related
- 1984-12-11 EP EP85900324A patent/EP0204697B1/de not_active Expired - Lifetime
- 1984-12-11 WO PCT/US1984/001926 patent/WO1986003592A1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
JPS62501519A (ja) | 1987-06-18 |
EP0204697A1 (de) | 1986-12-17 |
WO1986003592A1 (en) | 1986-06-19 |
EP0204697A4 (de) | 1988-04-26 |
EP0204697B1 (de) | 1991-09-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |