DE3481687D1 - Vorrichtung zum pruefen und sortieren von elektronischen bauteilen. - Google Patents
Vorrichtung zum pruefen und sortieren von elektronischen bauteilen.Info
- Publication number
- DE3481687D1 DE3481687D1 DE8787110137T DE3481687T DE3481687D1 DE 3481687 D1 DE3481687 D1 DE 3481687D1 DE 8787110137 T DE8787110137 T DE 8787110137T DE 3481687 T DE3481687 T DE 3481687T DE 3481687 D1 DE3481687 D1 DE 3481687D1
- Authority
- DE
- Germany
- Prior art keywords
- testing
- magazine
- component
- class
- receiving portions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Branching, Merging, And Special Transfer Between Conveyors (AREA)
- Die Bonding (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE8787110137T DE3481687D1 (de) | 1983-11-07 | 1984-10-31 | Vorrichtung zum pruefen und sortieren von elektronischen bauteilen. |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19833340183 DE3340183A1 (de) | 1983-11-07 | 1983-11-07 | Vorrichtung zum weiterleiten von bauteilen, insbesondere von integrierten chips, von einem eingangsmagazin zu einem ausgangsmagazin |
DE8787110137T DE3481687D1 (de) | 1983-11-07 | 1984-10-31 | Vorrichtung zum pruefen und sortieren von elektronischen bauteilen. |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3481687D1 true DE3481687D1 (de) | 1990-04-26 |
Family
ID=6213647
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19833340183 Withdrawn DE3340183A1 (de) | 1983-11-07 | 1983-11-07 | Vorrichtung zum weiterleiten von bauteilen, insbesondere von integrierten chips, von einem eingangsmagazin zu einem ausgangsmagazin |
DE8484113097T Expired DE3473573D1 (en) | 1983-11-07 | 1984-10-31 | Device for transferring components, in particular integrated chips, from an input tray to an output tray |
DE8787110137T Expired - Lifetime DE3481687D1 (de) | 1983-11-07 | 1984-10-31 | Vorrichtung zum pruefen und sortieren von elektronischen bauteilen. |
Family Applications Before (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19833340183 Withdrawn DE3340183A1 (de) | 1983-11-07 | 1983-11-07 | Vorrichtung zum weiterleiten von bauteilen, insbesondere von integrierten chips, von einem eingangsmagazin zu einem ausgangsmagazin |
DE8484113097T Expired DE3473573D1 (en) | 1983-11-07 | 1984-10-31 | Device for transferring components, in particular integrated chips, from an input tray to an output tray |
Country Status (4)
Country | Link |
---|---|
US (1) | US4694964A (de) |
EP (2) | EP0144715B1 (de) |
AT (2) | ATE36659T1 (de) |
DE (3) | DE3340183A1 (de) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3531143A1 (de) * | 1985-06-04 | 1986-12-04 | Hans-Heinrich 8000 München Willberg | Einrichtung zum pruefen und sortieren von elektronischen bauelementen, insbesondere integrierten chips |
US4889242A (en) * | 1985-06-04 | 1989-12-26 | Multitest Elektronische Systeme | Device for testing and sorting electronic components, more particularly integrated circuit chips |
DE3638430A1 (de) * | 1986-11-11 | 1988-05-19 | Multitest Elektronische Syst | Vorrichtung zum testen und sortieren von elektronischen bauelementen, insbesondere ic's |
DE3638431A1 (de) * | 1986-11-11 | 1988-05-26 | Multitest Elektronische Syst | Einrichtung zum testen und sortieren von elektronischen bauelementen, insbesondere von dual-in-line-ic's |
US4926118A (en) * | 1988-02-22 | 1990-05-15 | Sym-Tek Systems, Inc. | Test station |
DE3912589A1 (de) * | 1989-04-17 | 1990-10-25 | Ekkehard Ueberreiter | Einrichtung zum testen von elektronischen bauelementen mit einer ladestation, einer teststation und eine entladestation fuer die bauelemente |
US5184068A (en) * | 1990-09-24 | 1993-02-02 | Symtek Systems, Inc. | Electronic device test handler |
JP3224483B2 (ja) * | 1994-12-05 | 2001-10-29 | 富士通株式会社 | ライブラリ装置及びその装置による複写ディスク選別方法 |
JP3417528B2 (ja) * | 1996-04-05 | 2003-06-16 | 株式会社アドバンテスト | Ic試験装置 |
TW358162B (en) * | 1996-06-04 | 1999-05-11 | Advantest Corp | Semiconductor device testing apparatus |
JP3344548B2 (ja) | 1997-04-16 | 2002-11-11 | 株式会社アドバンテスト | Ic試験装置 |
US5940466A (en) * | 1997-10-29 | 1999-08-17 | Micron Electronics, Inc. | Apparatus for counting parts in a tray |
US6135291A (en) | 1998-01-16 | 2000-10-24 | Micron Electronics, Inc. | Vertical magazine method for integrated circuit device dispensing, receiving, storing, testing or binning |
US6112940A (en) * | 1998-01-16 | 2000-09-05 | Micron Electronics, Inc. | Vertical magazine apparatus for integrated circuit device dispensing, receiving or storing |
US5996996A (en) * | 1998-02-20 | 1999-12-07 | Micron Electronics, Inc. | Method of sorting computer chips |
US5998751A (en) * | 1998-02-20 | 1999-12-07 | Micron Electronics, Inc. | Sorting system for computer chips |
US6563070B2 (en) | 1999-03-30 | 2003-05-13 | Micron Technology, Inc. | Enhanced grading and sorting of semiconductor devices using modular “plug-in” sort algorithms |
KR100972502B1 (ko) * | 2003-12-30 | 2010-07-26 | 엘지디스플레이 주식회사 | 액정표시장치의 등급표시 자동화 장치 및 이의 동작 방법 |
US9193525B2 (en) * | 2014-03-12 | 2015-11-24 | Asm Technology Singapore Pte Ltd | Apparatus for handling electronic components |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US431699A (en) * | 1890-07-08 | Pneumatic dispatch-tube | ||
US3032191A (en) * | 1959-04-20 | 1962-05-01 | Sylvania Electric Prod | Testing and sorting apparatus |
US3017025A (en) * | 1960-04-26 | 1962-01-16 | Western Electric Co | Apparatus for distributing an article to one of several receiving locations |
US3142382A (en) * | 1962-03-12 | 1964-07-28 | Motorola Inc | Comprehensive testing system |
US3573748A (en) * | 1969-02-24 | 1971-04-06 | Ibm | Postal system |
US3716786A (en) * | 1970-10-02 | 1973-02-13 | Cogar Corp | Module tester and sorter for use in a module test system |
US3664499A (en) * | 1970-11-06 | 1972-05-23 | Fairchild Camera Instr Co | High speed automatic sequential tester-handler |
US3727757A (en) * | 1972-06-12 | 1973-04-17 | C Boissicat | Dip handling apparatus |
US3896935A (en) * | 1973-11-26 | 1975-07-29 | Ramsey Eng Co | Integrated circuit handler |
US4170290A (en) * | 1977-02-28 | 1979-10-09 | Motorola, Inc. | Lift and feed mechanism for high speed integrated circuit handler |
US4230985A (en) * | 1978-01-12 | 1980-10-28 | Fairchild Camera And Instrument Corporation | Fixturing system |
US4234418A (en) * | 1978-06-23 | 1980-11-18 | Contrel Corporation | Dip-handling apparatus |
JPS5937785B2 (ja) * | 1978-08-18 | 1984-09-12 | 松下電器産業株式会社 | 電子部品検査装置 |
DE2855913C2 (de) * | 1978-12-23 | 1983-05-19 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Vorrichtung zum Sortieren von Bauelementen |
JPS5677765A (en) * | 1979-11-28 | 1981-06-26 | Tokyo Seimitsu Co Ltd | Measurement/selection device of semiconductor device |
SU980027A1 (ru) * | 1981-01-12 | 1982-12-07 | Предприятие П/Я А-1178 | Устройство автоматического контрол электронных систем |
SU970386A1 (ru) * | 1981-02-11 | 1982-10-30 | Кировский Политехнический Институт | Устройство дл разбраковки изделий на группы |
US4478352A (en) * | 1982-05-19 | 1984-10-23 | Micro Component Technology, Inc. | Integrated circuit component handler singulation apparatus |
-
1983
- 1983-11-07 DE DE19833340183 patent/DE3340183A1/de not_active Withdrawn
-
1984
- 1984-10-31 DE DE8484113097T patent/DE3473573D1/de not_active Expired
- 1984-10-31 DE DE8787110137T patent/DE3481687D1/de not_active Expired - Lifetime
- 1984-10-31 AT AT84113097T patent/ATE36659T1/de not_active IP Right Cessation
- 1984-10-31 EP EP84113097A patent/EP0144715B1/de not_active Expired
- 1984-10-31 EP EP87110137A patent/EP0246672B1/de not_active Expired - Lifetime
- 1984-10-31 AT AT87110137T patent/ATE51166T1/de not_active IP Right Cessation
-
1986
- 1986-10-08 US US06/917,292 patent/US4694964A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
ATE36659T1 (de) | 1988-09-15 |
EP0144715A1 (de) | 1985-06-19 |
DE3473573D1 (en) | 1988-09-29 |
ATE51166T1 (de) | 1990-04-15 |
EP0144715B1 (de) | 1988-08-24 |
EP0246672A3 (en) | 1988-01-20 |
EP0246672B1 (de) | 1990-03-21 |
DE3340183A1 (de) | 1985-05-15 |
US4694964A (en) | 1987-09-22 |
EP0246672A2 (de) | 1987-11-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |