JPS5677765A - Measurement/selection device of semiconductor device - Google Patents
Measurement/selection device of semiconductor deviceInfo
- Publication number
- JPS5677765A JPS5677765A JP15478379A JP15478379A JPS5677765A JP S5677765 A JPS5677765 A JP S5677765A JP 15478379 A JP15478379 A JP 15478379A JP 15478379 A JP15478379 A JP 15478379A JP S5677765 A JPS5677765 A JP S5677765A
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- nondefective
- semiconductor
- products
- selection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Relating To Insulation (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To prevent the defective product from being mixed into the nondefective products without selecting twice the products through measurement of the electrical properties, by detecting the defective product at the 1st measurement part and then exhausting it immediately and supplying only the nondefective products to the 2nd measurement part.
CONSTITUTION: The semiconductor device 11 drops by its empty weight along the supply chute 12 which is installed obliquely and then supplied to the measurement position A by the individual sending device 13 to receive the measurement and selection at the 1st measurement part 14 only for the quality. The switching shute 15 is provided at the position B under the part 14, and the semiconductor 11, if decided nondefective, is supplied to the 2nd measurement part 19 at the position C. In case the semiconductor is decided defective, it is exhausted to the defective product storing box 21. The semiconductor 11 supplied to the part 19 as a nondefective product undergoes a measurement of the electrical properties. According to the result of this measurement, the rotary chute 22 turns up to the fixed position to store the nondefective product into one of the boxes 23, 23'...n through selection. In such way, the double selection can be avoided, at the same time preventing the defective product from being mixed into the nondefective products.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15478379A JPS5677765A (en) | 1979-11-28 | 1979-11-28 | Measurement/selection device of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15478379A JPS5677765A (en) | 1979-11-28 | 1979-11-28 | Measurement/selection device of semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5677765A true JPS5677765A (en) | 1981-06-26 |
Family
ID=15591793
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15478379A Pending JPS5677765A (en) | 1979-11-28 | 1979-11-28 | Measurement/selection device of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5677765A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60106123A (en) * | 1983-11-14 | 1985-06-11 | ローム株式会社 | Electronic part handler |
| US4694964A (en) * | 1983-11-07 | 1987-09-22 | Ekkehard Ueberreiter | Device for conveying components particularly integrated chips, from an input magazine to an output magazine |
| US4976356A (en) * | 1988-03-31 | 1990-12-11 | Tdk Corporation | Method of and apparatus for optically checking the appearances of chip-type components and sorting the chip-type components |
-
1979
- 1979-11-28 JP JP15478379A patent/JPS5677765A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4694964A (en) * | 1983-11-07 | 1987-09-22 | Ekkehard Ueberreiter | Device for conveying components particularly integrated chips, from an input magazine to an output magazine |
| JPS60106123A (en) * | 1983-11-14 | 1985-06-11 | ローム株式会社 | Electronic part handler |
| JPH0336196B2 (en) * | 1983-11-14 | 1991-05-30 | Rohm Kk | |
| US4976356A (en) * | 1988-03-31 | 1990-12-11 | Tdk Corporation | Method of and apparatus for optically checking the appearances of chip-type components and sorting the chip-type components |
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