DE112009002702T8 - Automatischer Analysator - Google Patents

Automatischer Analysator Download PDF

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Publication number
DE112009002702T8
DE112009002702T8 DE112009002702T DE112009002702T DE112009002702T8 DE 112009002702 T8 DE112009002702 T8 DE 112009002702T8 DE 112009002702 T DE112009002702 T DE 112009002702T DE 112009002702 T DE112009002702 T DE 112009002702T DE 112009002702 T8 DE112009002702 T8 DE 112009002702T8
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DE
Germany
Prior art keywords
automatic analyzer
analyzer
automatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE112009002702T
Other languages
English (en)
Other versions
DE112009002702B4 (de
DE112009002702T5 (de
Inventor
Isao Yamazaki
Hiroaki Ishizawa
Sakuichiro Adachi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp, Hitachi High Tech Corp filed Critical Hitachi High Technologies Corp
Publication of DE112009002702T5 publication Critical patent/DE112009002702T5/de
Publication of DE112009002702T8 publication Critical patent/DE112009002702T8/de
Application granted granted Critical
Publication of DE112009002702B4 publication Critical patent/DE112009002702B4/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/82—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a precipitate or turbidity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods
    • G01N2201/1293—Using chemometrical methods resolving multicomponent spectra
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis
    • Y10T436/111666—Utilizing a centrifuge or compartmented rotor

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Plasma & Fusion (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
DE112009002702T 2008-11-17 2009-11-12 Automatischer Analysator Active DE112009002702B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008-293544 2008-11-17
JP2008293544 2008-11-17
PCT/JP2009/069291 WO2010055890A1 (ja) 2008-11-17 2009-11-12 自動分析装置

Publications (3)

Publication Number Publication Date
DE112009002702T5 DE112009002702T5 (de) 2013-03-28
DE112009002702T8 true DE112009002702T8 (de) 2013-06-20
DE112009002702B4 DE112009002702B4 (de) 2013-09-05

Family

ID=42170021

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112009002702T Active DE112009002702B4 (de) 2008-11-17 2009-11-12 Automatischer Analysator

Country Status (5)

Country Link
US (1) US8936754B2 (de)
JP (1) JP5319696B2 (de)
CN (1) CN102216784B (de)
DE (1) DE112009002702B4 (de)
WO (1) WO2010055890A1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5711564B2 (ja) * 2011-02-17 2015-05-07 ベックマン コールター， インコーポレイテッド 自動分析機
JP5822534B2 (ja) * 2011-05-13 2015-11-24 株式会社日立ハイテクノロジーズ 自動分析装置
EP2657681A1 (de) * 2012-04-26 2013-10-30 Roche Diagnostics GmbH Verbesserung der Empfindlichkeit und des dynamischen Bereichs von photometrischen Assays durch Erzeugung mehrerer Kalibrierkurven
JP6110710B2 (ja) * 2013-04-02 2017-04-05 株式会社日立ハイテクノロジーズ 分析装置及び自動分析装置
EP2811300A1 (de) 2013-06-07 2014-12-10 Roche Diagniostics GmbH Kalibrierung für Mehrkomponenten-Assays
CN105116156B (zh) * 2015-07-22 2017-12-12 江苏英诺华医疗技术有限公司 一种优化的适合医学检验的生化检测方法
JP6513762B2 (ja) * 2016-12-15 2019-05-15 株式会社堀場製作所 分析装置、分析装置用プログラム及び分析方法
CN110997147B (zh) 2017-07-14 2022-04-12 迈恩医疗解决方案有限公司 用于执行化学、生化和/或免疫化学分析的自动分析器和方法
US11635443B2 (en) 2017-07-14 2023-04-25 Meon Medical Solutions Gmbh & Co Kg Automatic analyzer and method for carrying out chemical, biochemical, and/or immunochemical analyses
CN112362885B (zh) * 2018-02-11 2023-06-16 科美博阳诊断技术(上海)有限公司 一种全自动光激化学发光检测仪
US20210197188A1 (en) 2018-04-23 2021-07-01 Meon Medical Solutions Gmbh & Co Kg Automatic analyzer and optical measurement method for obtaining measurement signals from liquid media
CN108760050A (zh) * 2018-05-24 2018-11-06 宁波美康盛德生物科技有限公司 吸光度检测电路
CN112912712B (zh) * 2018-11-21 2023-11-21 北京迈瑞医疗器械有限公司 样本吸光度差的测量方法、样本分析仪和存储介质
CN111175238B (zh) * 2020-01-09 2021-04-02 中国原子能科学研究院 一种含铀钚的硝酸溶液中微量草酸浓度的分析方法
US11677409B2 (en) * 2021-03-19 2023-06-13 Microsoft Technology Licensing, Llc Cloud assisted calibration of analog-to-digital converters
CN114002424A (zh) * 2021-12-31 2022-02-01 深圳市帝迈生物技术有限公司 一种样本分析仪及其检测方法
CN115575340B (zh) * 2022-11-08 2023-03-10 杭州谱育科技发展有限公司 吸光度检测装置和方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5484781A (en) * 1977-12-19 1979-07-05 Hitachi Ltd Absorptiometric analysis method
GB2020009B (en) 1978-04-08 1982-12-01 Bodenseewerk Perkin Elmer Co Apparatus for determining the concentration of components of a sample
JPS60196669A (ja) * 1984-03-21 1985-10-05 Hitachi Ltd 抗原抗体反応用分析方法および装置
JPS6182169A (ja) 1985-06-12 1986-04-25 Japan Spectroscopic Co フロ−インジエクシヨン分析法
JPH0723871B2 (ja) 1986-01-31 1995-03-15 株式会社島津製作所 多項目生化学分析方法
JPH0792432B2 (ja) 1988-09-22 1995-10-09 株式会社東芝 自動化学分析装置
JPH07280814A (ja) * 1994-04-14 1995-10-27 Hitachi Ltd 検体検査自動化システム
JPH0875740A (ja) 1994-08-31 1996-03-22 Shimadzu Corp 免疫比濁分析方法
JP3229498B2 (ja) * 1994-09-21 2001-11-19 シスメックス株式会社 検体の自動分析方法および装置
JP3298332B2 (ja) * 1994-10-19 2002-07-02 株式会社日立製作所 生体試料分析システム
JP3357494B2 (ja) 1995-02-13 2002-12-16 日本電子株式会社 生化学分析装置
EP1059522A1 (de) * 1999-06-11 2000-12-13 F. Hoffmann-La Roche Ag Verfahren und Vorrichtung zur Untersuchung von Flüssigkeiten biologischen Ursprungs
CN101151534A (zh) * 2005-03-29 2008-03-26 希森美康株式会社 标本分析方法及标本分析装置
JP5140390B2 (ja) 2007-11-22 2013-02-06 株式会社日立製作所 エレベーター制御システム

Also Published As

Publication number Publication date
CN102216784A (zh) 2011-10-12
DE112009002702B4 (de) 2013-09-05
JPWO2010055890A1 (ja) 2012-04-12
DE112009002702T5 (de) 2013-03-28
US8936754B2 (en) 2015-01-20
WO2010055890A1 (ja) 2010-05-20
JP5319696B2 (ja) 2013-10-16
US20110223066A1 (en) 2011-09-15
CN102216784B (zh) 2014-07-09

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R012 Request for examination validly filed
R083 Amendment of/additions to inventor(s)
R016 Response to examination communication
R079 Amendment of ipc main class

Free format text: PREVIOUS MAIN CLASS: G01N0035000000

Ipc: G01N0021270000

R018 Grant decision by examination section/examining division
R079 Amendment of ipc main class

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Ipc: G01N0021270000

Effective date: 20130424

R020 Patent grant now final

Effective date: 20131206

R081 Change of applicant/patentee

Owner name: HITACHI HIGH-TECH CORPORATION, JP

Free format text: FORMER OWNER: HITACHI HIGH-TECHNOLOGIES CORPORATION, TOKYO, JP

R082 Change of representative

Representative=s name: STREHL SCHUEBEL-HOPF & PARTNER MBB PATENTANWAE, DE